Automated X-ray inspection of aluminum castings (English)
- New search for: Boerner, H.
- New search for: Strecker, H.
- New search for: Boerner, H.
- New search for: Strecker, H.
In:
IEEE Transactions on Pattern Analysis and Machine Intelligence
;
10
, 1
;
79-91
;
1988
- Article (Journal) / Electronic Resource
-
Title:Automated X-ray inspection of aluminum castings
-
Contributors:Boerner, H. ( author ) / Strecker, H. ( author )
-
Published in:IEEE Transactions on Pattern Analysis and Machine Intelligence ; 10, 1 ; 79-91
-
Publisher:
- New search for: IEEE
-
Publication date:1988-01-01
-
Size:1757443 byte
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Source:
Table of contents – Volume 10, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 4
-
An automatic wafer inspection system using pipelined image processing techniquesYoda, H. / Ohuchi, Y. / Taniguchi, Y. / Ejiri, M. et al. | 1988
- 17
-
Measuring photolithographic overlay accuracy and critical dimensions by correlating binarized Laplacian of Gaussian convolutionsNishihara, H.K. / Crossley, P.A. et al. | 1988
- 31
-
Automatic solder joint inspectionBartlett, S.L. / Besl, P.J. / Cole, C.L. / Jain, R. / Mukherjee, D. / Skifstad, K.D. et al. | 1988
- 44
-
Structured highlight inspection of specular surfacesSanderson, A.C. / Weiss, L.E. / Nayar, S.K. et al. | 1988
- 56
-
A rule based approach for visual pattern inspectionDarwish, A.M. / Jain, A.K. et al. | 1988
- 69
-
A system for PCB automated inspection using fluorescent lightHara, Y. / Doi, H. / Karasaki, K. / Iida, T. et al. | 1988
- 79
-
Automated X-ray inspection of aluminum castingsBoerner, H. / Strecker, H. et al. | 1988
- 92
-
Texture measures for carpet wear assessmentSiew, L.H. / Hodgson, R.M. / Wood, E.J. et al. | 1988
- 106
-
A monolithic Hough transform processor based on restructurable VLSIRhodes, F.M. / Dituri, J.J. / Chapman, G.H. / Emerson, B.E. / Soares, A.M. / Raffel, J.I. et al. | 1988
- 110
-
A pipelined image analysis system using custom integrated circuitsPersoon, E. et al. | 1988
- 117
-
A line extraction method for automated SEM inspection of VLSI resistShu, D.B. / Li, C.C. / Mancuso, J.F. / Sun, Y.N. et al. | 1988
- 121
-
A real-time processor for the Hough transformHanahara, K. / Maruyama, T. / Uchiyama, T. et al. | 1988