IC diagnosis using multiple supply pad I/sub DDQ/s (English)
- New search for: Plusquellic, J.
- New search for: Plusquellic, J.
In:
IEEE Design & Test of Computers
;
18
, 1
;
50-61
;
2001
- Article (Journal) / Electronic Resource
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Title:IC diagnosis using multiple supply pad I/sub DDQ/s
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Contributors:Plusquellic, J. ( author )
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Published in:IEEE Design & Test of Computers ; 18, 1 ; 50-61
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Publisher:
- New search for: IEEE
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Publication date:2001-01-01
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Size:140152 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 18, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 8
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Defect-oriented diagnosis for very deep-submicron systemsLombardi, F. / Metra, C. et al. | 2001
- 8
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Features - Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron SystemsLombardi, Fabrizio et al. | 2001
- 10
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Features - Using Atomic Force Microscopy for Deep-Submicron Failure AnalysisLo, Jien-Chung et al. | 2001
- 10
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Using atomic force microscopy for deep submicron failure analysisLo, J.-C. / Armitage, W.D. / Johnson, C.S. et al. | 2001
- 19
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Features - Poirot: Applications of a Logic Fault Diagnosis ToolVenkataraman, Srikanth et al. | 2001
- 19
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Poirot: applications of a logic fault diagnosis toolVenkataraman, S. / Drummonds, S.B. et al. | 2001
- 31
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Features - Defect-Oriented Testing and Defective-Part-Level PredictionDworak, Jennifer et al. | 2001
- 31
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Defect-oriented testing and defective-part-level predictionDworak, J. / Wicker, J.D. / Lee, S. / Grimaila, M.R. / Mercer, M.R. / Butler, K.M. / Stewart, B. / Wang, L.-C. et al. | 2001
- 42
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Fault detection and location using I/sub DD/ waveform analysisMuhammad, K. / Roy, K. et al. | 2001
- 42
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Features - Fault Detection and Location Using IDD Waveform AnalysisMuhammad, Khurram et al. | 2001
- 50
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IC diagnosis using multiple supply pad I/sub DDQ/sPlusquellic, J. et al. | 2001
- 50
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Features - IC Diagnosis Using Multiple Supply Pad IDDQsPlusquellic, Jim et al. | 2001
- 63
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Special Features - Modeling a Verification Test System for Mixed-Signal CircuitsSan Segundo Bello, David et al. | 2001
- 63
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Modeling a verification test system for mixed-signal circuitsBello, D.S.S. / Tangelder, R. / Kerkhoff, H. et al. | 2001
- 72
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Hierarchical ATPG for analog circuits and systemsSoma, M. / Huynh, S. / Zhang, J. / Kim, S. / Devarayanadurg, G. et al. | 2001
- 72
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Special Features - Hierarchical ATPG for Analog Circuits and SystemsSoma, Mani et al. | 2001
- 82
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Special Features - AD&T Roundtable: Are Single-Chip Multi-processors in Reach?| 2001
- 82
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Are single-chip multiprocessors in reach?Bergamaschi, R. / Bolsens, I. / Gupta, R. / Harr, R. / Jerraya, A. / Keutzer, K. / Olukotun, K. / Vissers, K. et al. | 2001