High-frequency dielectric measurements (English)
- New search for: Baker-Jarvis, James
- New search for: Janezic, Michael
- New search for: Degroot, Donald
- New search for: Baker-Jarvis, James
- New search for: Janezic, Michael
- New search for: Degroot, Donald
In:
IEEE Instrumentation & Measurement Magazine
;
13
, 2
;
24-31
;
2010
- Article (Journal) / Electronic Resource
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Title:High-frequency dielectric measurements
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Contributors:
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Published in:IEEE Instrumentation & Measurement Magazine ; 13, 2 ; 24-31
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Publisher:
- New search for: IEEE
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Publication date:2010-04-01
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Size:4986172 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 13, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Table of contents| 2010
- 4
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Applications of control theory to real life [From the Editor's Bench]Engelberg, Shlomo et al. | 2010
- 4
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From the Editor's BenchHarnett, Cindy et al. | 2010
- 6
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President's PerspectivesChisnell, Dana et al. | 2010
- 6
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Adcom volunteer effort - [President's Perspectives]Fowler, Kim et al. | 2010
- 8
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Nanotechnology in environmental sensorsHarnett, Cindy et al. | 2010
- 13
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Usability testing: Taking the experience into accountChisnell, Dana et al. | 2010
- 16
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Rotational Speed Sensors: Limitations, Pre-processing and Automotive Applications: Tutorial 23| 2010
- 16
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Rotational speed sensors: limitations, pre-processing and automotive applicationsGustafsson, F. et al. | 2010
- 24
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High-frequency dielectric measurementsBaker-Jarvis, James / Janezic, Michael / Degroot, Donald et al. | 2010
- 24
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High-Frequency Dielectric Measurements: Tutorial 24| 2010
- 32
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A capacitive-sensing based simple serial mouse [Instrumentationnotes]Engelberg, Shlomo / Hazout, Haim Hay / Hirshowitz, Jonathan et al. | 2010
- 32
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Instrumentation Notes| 2010
- 38
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By the Numbers| 2010
- 38
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Least-squares fitting of data by rational functions: Levy's method (part 2) [Bythenumbers]Dyer, Stephen A. / Dyer, Justin S. et al. | 2010
- 43
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In metrology, simpler is better [Recalibration]Kibble, Bryan P. et al. | 2010
- 43
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Recalibration| 2010
- 46
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NewproductsGoldberg, Robert et al. | 2010
- 52
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Technical committee reports on technical and standards activities fall 2009 [TCnews]Lee, Kang et al. | 2010
- 52
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TC News| 2010
- 60
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TC Listing| 2010
- 60
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IEEE I&M society technical committee listing| 2010
- 61
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Calendar| 2010
- 62
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Society News| 2010
- 64
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The 2010 IEEEE Instrumentation & Measurement Society| 2010
- 64
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Society OfficersVovard-Le Bray, Chloé et al. | 2010
- c1
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IEEE Instrumentation & Measurement Magazine - Front cover| 2010