Study of Floating Gate MOS Structures to improve the noise and sensitivity as Radiation Dosimeter (English)
- New search for: Cesari, J.
- New search for: Brucoli, M.
- New search for: Danzeca, S.
- New search for: Pineda, A.
- New search for: Masi, A.
- New search for: Brugger, M.
- New search for: Gilardoni, S.
- New search for: Isern, E.
- New search for: Roca, M.
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- New search for: Cesari, J.
- New search for: Brucoli, M.
- New search for: Danzeca, S.
- New search for: Pineda, A.
- New search for: Masi, A.
- New search for: Brugger, M.
- New search for: Gilardoni, S.
- New search for: Isern, E.
- New search for: Roca, M.
- New search for: Garcia-Moreno, E.
In:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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1-4
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2017
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ISSN:
- Conference paper / Electronic Resource
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Title:Study of Floating Gate MOS Structures to improve the noise and sensitivity as Radiation Dosimeter
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Contributors:Cesari, J. ( author ) / Brucoli, M. ( author ) / Danzeca, S. ( author ) / Pineda, A. ( author ) / Masi, A. ( author ) / Brugger, M. ( author ) / Gilardoni, S. ( author ) / Isern, E. ( author ) / Roca, M. ( author ) / Garcia-Moreno, E. ( author )
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Published in:
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Publisher:
- New search for: IEEE
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Publication date:2017-10-01
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Size:334219 byte
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Design and Test with Proton Beam of a 1.2 Gb/s Semi-custom Serialiser Implemented in 180 nm CMOS with SEU Mitigation by TMRLupi, Matteo / Rinella, G. Aglieri / Bonora, M. / Hillemanns, H. / Kim, D. / Kugathasan, T. / Lattuca, A. / Mazza, G. / Sielewicz, K. M. / Snoeys, W. et al. | 2017
- 1
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Combined x-ray and gamma ray testing to investigate the TID tolerance of flip-chip FPGAsRezzak, Nadia / Wang, Jih-Jong / Nguyen, Victor / Dsilva, Durwyn et al. | 2017
- 1
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MOSFETs SEB & SEGR Qualification Results with SOA EstimationIakovlev, Sergey A. / Anashin, Vasily S. / Chubunov, Pavel A. / Koziukov, Aleksandr E. / Bu-Khasan, Kais B. / Maksimenko, Timofey A. / Chlenov, Aleksandr M. et al. | 2017
- 1
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Identification of Pulsed-Neutron-Induced Upset Bursts in Static Random Access Memories using Monte-Carlo SimulationsQi, Chao / Chen, Wei / Liu, Yan / Jin, Xiaoming / Yang, Shanchao / Guo, Xiaoqiang et al. | 2017
- 1
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Calculation Method of Maximum Radiation Conditions and Reliability using Quasi-Dynamic Radiation Belt ModelMatsumoto, H. et al. | 2017
- 1
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Single event latchup in ICs with integrated latchup protection technologyKostyuchenko, D.S. / Karakozov, A.B / Nekrasov, P.V. / Pechenkin D.V.Savchenkov, A.A. / Nikiforov, A.Yu. et al. | 2017
- 1
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ELDRS Characterization to of Texas Instruments LMP2012 RRO Precision AmplifierKruckmeyer, Kirby et al. | 2017
- 1
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TID in-situ measurement of temperature coefficient of various commercial voltage referencesHofman, Jiri / Sharp, Richard / Haze, Jiri et al. | 2017
- 1
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SEE Testing on PADI-X for JUICE 8-Channel Ultrafast Charge Pre-Amplifier ASICLopez-Calle, I. / Sirin, A. / Andersson, H. / Kerenyi, M. / Gonzalez, JJ. / Poivey, C. / Bonora, L. / Munoz, E. / Dominguez, M. / Fernandez, G. et al. | 2017
- 1
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Impact of the Trapped Proton Anisotropy on the Ionizing Dose at Low Earth OrbitsVarotsou, Athina / Pourrouquet, Pierre / Fonta, Romain / Boscher, Daniel / Ecoffet, Robert et al. | 2017
- 1
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Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image SensorAllanche, T. / Goiffon, V. / Rizzolo, S. / Paillet, P. / Duhamel, O. / Chabane, A. / Muller, C. / Magnan, P. / Corbiere, F. / Rolando, S. et al. | 2017
- 1
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Temperature Effects on the Total Ionizing Dose Response of TaOx-based Memristive Bit CellsMcLain, Michael L. / McDonald, J. Kyle / Hjalmarson, Harold P. / Serrano, Jason D. / Cuoco, Roy P. / Hanson, Don / Hughart, David R. / Marinella, Matthew J. / Hartman, E. Fredrick et al. | 2017
- 1
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Extended TID, ELDRS and SEE Hardening and Testing on Mixed Signal Telemetry LX7730 ControllerSureau, Mathieu / Stevens, Russell / Leuenberger, Marco / Rezzak, Nadia / Johnson, Dorian / Zhang, Kathy et al. | 2017
- 1
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New Setup for SEE Measurements in South AmericaAguiar, Y. A. P / Medina, N. H. / Added, N. / Macchione, E. L. A. / Nascimento, S. G. / Leite, A. R. / Silveira, M. A. G. et al. | 2017
- 1
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SEL and cell failures in MRAM under ion and focused laser irradiationPechenkin, Alexander A. / Boruzdina, Anna B. / Yanenko, Andrey V. / Protasov, Dmitry. E. / Shvetsov-Shilovskiy, Ivan I. / Sangalov, Anton A. et al. | 2017
- 1
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Multiple Cell Event Partitioning for Simulation of Soft Error Rates in Space Systems with Embedded Error Correcting CodesZebrev, Gennady I. / Galimov, Artur M. / Mrozovskaya, Liza V. / Gorbunov, Maxim S. / Petrov, Konstantin A. et al. | 2017
- 1
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Radiation Tolerant 6.25 Gbps 850nm Optical TransceiverTanskanen, A. / Karppinen, M. / Polo, C. Boatella / Jansen, R. J. E. / McKenzie, I. et al. | 2017
- 1
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Design of an In-Air Heavy Ion Irradiation Facility at KVI-CARTJones, Brian N. / Goethem, Marc-Jan van / Graaf, Emiel van der / Brandenburg, Sytze et al. | 2017
- 1
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The structural changes of surfaces of solar cell protective coatings under combined electron-proton irradiationKhasanshin, R. H. / Novikov, L. S. et al. | 2017
- 1
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Radiation Evaluation of Digital Isolators for Space ApplicationsBeck, Peter / Wind, Michael / Clemens, Peter / KUndgen, Tobias / Latocha, Marcin / Lennartz, Wilhelm / Metzger, Stefan / Poizat, Marc / Ruge, Sven / Steffens, Michael et al. | 2017
- 1
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Approach to Estimation of Modern IC’s Sustainability After Series of Single EventsDavydov, Georgii G. / Skorobogatov, Petr K. / Boychenko, Dmitriy V. / Dyatlov, Nikolay S. et al. | 2017
- 1
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Radiation Hard Optical Link Developments at CERNOlantera, Lauri / Detraz, Stephane / Kraxner, Andrea / Scarcella, Carmelo / Sigaud, Christophe / Sooos, Csaba / Troska, Jan / Vasey, Francois et al. | 2017
- 1
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CELESTA Demonstrator Radiation Characterization in a LEO Representative Environment at CHARM.Merlenghi, A.S. / Brugger, M. / Chesta, E. / Danzeca, S. / Alia, R. Garcia / Masi, A. / Peronnard, P. / Secondo, R. / Bernard, M. / Dusseau, L. et al. | 2017
- 1
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The effect of preliminary neutron irradiation on IR-LED characteristics during operationSimonova, Anastasiia V. / Gradoboev, Alexandr V. / Orlova, Ksenia N. et al. | 2017
- 1
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Simulation and Experiment in Neutron Induced Single Event Effects in SRAMJin, Xiaoming / Wang, Chenhui / Guo, Xiaoqiang / Qi, Chao / Yang, Shanchao / Liu, Yan / Chen, Wei / Gerardin, Simone / Bagatin, Marta / Bonaldo, Stefano et al. | 2017
- 1
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Bayesian Modeling of COTS Power MOSFET Ionizing Dose Impact on Circuit ResponseWitulski, A. F. / Smith, M. B. / Mahadevan, N. / Sternberg, A. L. / Barnes, C. / Sheldon, D. / Schrimpf, R. D. / Karsai, G. / McCurdy, M. W. et al. | 2017
- 1
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TID test on ITER Interlock Discharge Loop Interface Box (DLIB) system, an example of radiation test at equipment level.Fernandez, Gonzalo / Barcena, Javier / Munoz, Eugenio et al. | 2017
- 1
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SEE Test Guidelines and Characterisation of GaAs Power DevicesCueto, J. / Chuan, J. / Pablo, L. de / Boatella, C. / Marec, R. / Muraro, J.L. / Guillope, A. / Rousset, A. / Vignon, G. et al. | 2017
- 1
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Total Dose and Single-Event Effects Testing of the Intersil ISL70040SEH Gallium Nitride (GaN) FET Drivervan Vonno, N. W. / Satterfield, H. W. / Pearce, L. G. / Ballou, F. C. / Newman, W. H. / Gill, J. S. / Thomson, E. J. et al. | 2017
- 1
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Radiation-Induced Attenuation Data of Polarization-Maintaining FibresCaussanel, M. / Beauvois, G. / Duval, H. / Grieu, S. / Montay, G. / Gilard, O. et al. | 2017
- 1
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Investigation into SEU Effects and Hardening Strategies in SRAM Based FPGALi, Tianwen / Yang, Haigang / Zhao, He / Wang, Nan / Wei, Yuanfeng / Jia, Yiping et al. | 2017
- 1
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Radiation Hardness Studies on a Novel CMOS Process for Depleted Monolithic Active Pixel SensorsSchioppa, Enrico Junior / Bates, Richard / Buttar, Craig / Dalla, Marco / Van Hoorne, Jacobus Willem / Kugathasan, Thanushan / Maneuski, Dzmitry / Tobon, Cesar Augusto Marin / Musa, Luciano / Pernegger, Heinz et al. | 2017
- 1
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TCAD prediction of dose effects on MOSFETs with ECORCEMichez, A. / Boch, J. / Dardie, J. / Wrobel, F. / Touboul, A. D. / Maraine, T. / Saigne, F. / Lorfevre, E. / Bezerra, F. et al. | 2017
- 1
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Proton Radiation Effects on Hamamatsu InGaAs PIN PhotodiodesAniceto, Raichelle / Milanowski, Randall / Moro, Slaven / Cahoy, Kerri / Schlenvogt, Garrett et al. | 2017
- 1
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Study of Floating Gate MOS Structures to improve the noise and sensitivity as Radiation DosimeterCesari, J. / Brucoli, M. / Danzeca, S. / Pineda, A. / Masi, A. / Brugger, M. / Gilardoni, S. / Isern, E. / Roca, M. / Garcia-Moreno, E. et al. | 2017
- 1
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Single Event Effects And Total Dose Testing Of Digital To Analog ConvertersKarakozov, A.B. / Nekraso, P.V. / Bobrovsky, D. V. / Sorokoumov, G.S. / Telets, V.A. et al. | 2017
- 1
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Internal Electrostatic Discharge Testing of a RF Cable and ConnectorsKim, Wousik / Chinn, James Z. / Figueroa, Harry S. / Thorbourn, Dennis O. et al. | 2017
- 1
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Single-Event Transient Analysis and Hardening in a 180 nm CMOS Embedded Low-Dropout RegulatorWang, Liang / Han, Xupeng / Zhao, Yuanfu / Bian, Qiang / Yue, Suge / Lu, Shijin / Shu, Lei / Liu, Jiaqi / Li, Tongde et al. | 2017
- 1
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Worst-Case Proton Contribution to the Direct Ionization SEU RateGuillermin, J. / Sukhaseum, N. / Pourrouquet, P. / Chatry, N. / Bezerra, F. / Ecoffet, R. et al. | 2017
- 1
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Hardened By Design All-Digital Pulsed Multiplying DLL for DDR2-3 InterfacesRamamurthy, Chandarasekaran / Clark, Lawrence T. et al. | 2017
- 1
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A Survey on Analog-to-Digital Converter Performance with Respect to Ionizing RadiationMueller, Steffen / Weigel, Robert / Koelpin, Alexander et al. | 2017
- 1
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A novel combined charge balance termination structure insensitive to ionizing radiation effectSong, Limei / Xiao, Chao / Zhang, Yanfei / Sun, Botao / Wang, Lixin / Luo, Jiajun et al. | 2017
- 1
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Mechanism Behind Long Line-Type MCUs in Thin-BOX SOI SRAMs: Resistance-Based Modeling and CountermeasureChung, Chin-Han / Kobayashi, Daisuke / Hirose, Kazuyuki et al. | 2017
- 1
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Impact of the Electric Field in the Modelling of the Dark Current Non Uniformity in Pixel ArraysUrsule, M. C. / Nuns, T. / Inguimbert, C. / Bugnet, H. / Mayer, F. / Pratlong, J. et al. | 2017
- 1
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Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAsSwift, Gary M. / Stone, Stephen E. / Garcia, Sebastian E. / Wray, Kevin W. / Rowe, William J. / Pfau, Krysten H. / Liu, Robert / Holden, Jonathan / Angeles, Asa / Willits, Barry L. et al. | 2017
- 1
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MELAF -a 50 MeV Electron Accelerator Facility for Research in Radiation EffectsSchuller, Andreas / Makowski, Christoph / Kapsch, Ralf-Peter / Nolte, Ralf / Beck, Peter et al. | 2017
- 1
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Effective Characterization of Radiation-induced SET on Flash-based FPGAsSterpone, Luca / Azimi, Sarah et al. | 2017
- 1
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Study of Total Ionizing Dose Effects in 65nm Digital Circuits with the DRAD Digital RADiation Test ChipCasas, L. M. Jara / Ceresa, D. / Kulis, S. / Miryala, S. / Christiansen, J. / Francisco, R. / Gnani, D. et al. | 2017
- 1
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Advanced In-Situ Instrumentation of RF Circuits for Mixed-Field Irradiation Testing PurposeMueller, Steffen / Danzeca, Salvatore / Alia, Ruben Garcia / Brugger, Markus / Weigel, Robert / Koelpin, Alexander et al. | 2017
- 1
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Impact of the Detector Definition on the Reverse Monte Carlo Calculation ResultsPourrouquet, Pierre / Traisnel, Vincent / Varotsou, Athina / Rolland, Guy / Ecoffet, Robert et al. | 2017
- 1
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Proton Test Results for a Commercial Fanout Buffer, a Variable Gain Amplifier, and a ±40V Operational AmplifierMilanowski, Randall / Moro, Slaven / Hall, Norm / Aniceto, Raichelle / Vermeire, Bert / Nicholson, Neal et al. | 2017
- 1
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Total dose radiation hardening of MOS transistors by fluorine implantationShaw, Chris / Potter, Kenneth / Morgan, Katrina / Ashburn, Peter / de Groot, Kees / Redman-White, Bill et al. | 2017
- 1
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Compendium of Recent SEE, and TID Test Results conducted by CNES from 2011-2016Pilia, Roberta / Malou, Florence / Dangla, David / Bezerra, Francoise / Standarovski, Denis / Ecoffet, Robert / Tastet, Pierre et al. | 2017
- 1
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Move the Laser Spot, Not the DUT: Investigating the New Micro-mirror Capability and Challenges for Localizing SEE Sites on Large Modern ICsCannon, Matthew / Perez-Celis, Andres / Swift, Gary / Wong, Richard / Wen, Shi-Jie / Wirthlin, Michaell et al. | 2017
- 1
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Muller C-element Self-corrected Triple Modular Redundant Logic with Multithreading and Low Power ModesRamamurthy, C. / Gujja, A. / Vashishtha, V. / Chellappa, Srivatsan / Clark, L. T. et al. | 2017
- 1
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Microdose effects in SRAM cells under heavy ion irradiationBoruzdina, Anna B. / Yanenko, Andrey V. / Ulanova, Anastasia V. / Chumakov, Alexander I. / Bobrovskiy, Dmitriy V. / Uzhegov, Vyacheslav M. et al. | 2017
- 1
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Radiation Effects on 1 Mb HfO2-based Resistive MemoryBi, Jinshun / Zhang, Feng / Chen, Li / Duan, Yuan / Xi, Kai / Li, Bo / Liu, Ming et al. | 2017
- 1
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Assessment of a Setup for the Characterization of Electronic Devices under Protons at Cryogenic Temperature.Bezerra, F. / Boutillier, M. / Baradat, B. / Chatry, N. / Dossat, C. / Garcia, P. / Pourrouquet, P. et al. | 2017
- 1
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RadFxSat: A Flight Campaign for Recording Single-Event Effects in Commercial Off-the-Shelf MicroelectronicsAustin, Rebekah A. / Sierawski, Brian D. / Trippe, James M. / Sternberg, Andrew L. / Warren, Kevin M. / Reed, Robert A. / Weller, Robert A. / Schrimpf, Ronald D. / Alles, Michael L. / Massengill, Lloyd W. et al. | 2017
- 1
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The Difficulties and Solutions in SEE Radiation Experiments, Test Samples and Setup PreparationKoziukov, Aleksandr E. / Anashin, Vasily S. / Yakovlev, Sergey A. / Bychkov, Anton S. / Mazharov, Vadim A. et al. | 2017
- 1
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Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR CircuitsAguiar, Y. Q. / Kastensmidt, F. L. / Meinhardt, C. / Artola, L. / Hubert, G. / Reis, R. et al. | 2017
- 1
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Hardening application programs by the operating system on COTS processors: what protection to SED can be expected and at what performance costAssogba, Emery K. / Lobelle, Marc et al. | 2017
- 1
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Radiation Evaluation of Analog Devices’ RT6804-1 Radiation Tolerant Multicell Battery MonitorHart, Shirley C. / Pandol, Philip G. / Wendel, Nathan R. / Peralta, Ryan et al. | 2017
- 1
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The STG DICE Cell with the Decoder for Reading Data in Steady and Unsteady States for Hardened SRAMKatunin, Yuri V. / Stenin, Vladimir Ya. et al. | 2017
- 1
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Testing the Tester: Lessons Learned During the Testing of a State-of-the-Art Commercial 14nm Processor Under Proton IrradiationSzabo, C. M. / Duncan, A. R. / LaBel, K. A. et al. | 2017
- 1
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In-Beam Programming of Radiation-Hardened Flash-Based FPGA—RTG4Wang, Jih-Jong / Rezzak, Nadia / Varela, Stephen / Nguyen, Victor / Samiee, Salim / Hawley, Frank / Hamdy, Esmat et al. | 2017
- 1
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Pulsed laser beam identification of SEEsensitive regions and observation of additional failure modes relevant for RHA in Digital IsolatorsWolf, Raphael / Steffens, Michael / Metzger, Stefan / Beck, Peter / Wind, Michael / Poizat, Marc et al. | 2017
- 1
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A mechanism for Destructive Single-Event Efect in Gallium Nitride Power HEMTsScheick, L. et al. | 2017
- 1
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Ionizing Radiation Response of the 4530 Parallel-to- Serial Driver and 4527 Registered ReceiverWitczak, Steven C. / Williamson, Eric V. / Calderone, Matthew J. / Jarvis, David L. / Marino, Kristin E. / Macejik, Glen E. et al. | 2017
- 1
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Single Event Effect Analysis for Command and Data Handling Electronics of a Millimeter-Wave Radiometer 6U-Class Satellite InstrumentOgut, Mehmet / Goncharenko, Yuriy / Reising, Steven C. / Kilmer, Braxton / Bosch-Lluis, Xavier / Kangaslahti, Pekka / Schlecht, Erich et al. | 2017
- 1
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Validation of flux models to characterize the radiation environment in space based on current Rosetta-dataWyrwoll, Vanessa / Ludeke, Sascha / Evans, Hugh / Poppe, Bjorn et al. | 2017
- 1
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Total ionizing dose tests of Power Bipolar Transistors and SiC power devices for JUICESteffens, Michael / Hoffgen, Stefan K. / Poizat, Marc et al. | 2017
- 1
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Architecture Choice for Radiation-Hard AlGaN/GaN HEMT Power DevicesWellekens, D. / Stoffels, S. / Luu, A. / Haussy, M. / Melotte, M. / Agten, D. / Decoutere, S. et al. | 2017
- 1
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Effects of SiH Groups on ELDRS Quantified by XPS with Combined Use of Gamma-ray and Electron-beam IrradiationToguchi, Shintaro / Kobayashi, Daisuke / Makino, Takahiro / Ohshima, Takeshi / Hirose, Kazuyuki et al. | 2017
- 1
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Evaluation of an Alternative Low Cost Approach for SEE Assessment of a SoCBezerra, F. / Dangla, D. / Manni, F. / Mekki, J. / Standarovski, D. / Alia, R. G. / Brugger, M. / Danzeca, S. et al. | 2017
- 1
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Validation of a Geant4 full model for the MIXS instrument at BepiColomboPortillo-Caurcel, P. / Ibarmia, S. / Benito-Parejo, M. / Mas-Hesse, J. M. / Balado, A. / Martindale, A. / Pearson, J. / Butcher, G. / Feldman, C. / Bunce, E. et al. | 2017
- 1
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AXEL lab.: Representative Ground Simulation for Investigating Radiation effects in Materials and ElectronicsDuzellier, S. / Artola, L. / Hubert, G. / Inguimbert, C. / Nuns, T. / Lewandowski, S. / Paulmier, T. / Dirassen, B. / Rey, R. / Pons, C. et al. | 2017
- 1
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Complex environmental and synergetic effects on space materials: lesson learned from THERME in-flight dataVanhove, E. / Duzellier, S. / Faye, D. / Remaury, S. et al. | 2017
- 1
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Farmer chamber response to different filter box and surrounding configurationsMartin-Holgado, Pedro / Morilla, Y. / Dominguez, M. / Fernandez, G. et al. | 2017
- 1
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Proton dosimetry at the accelerator COSY for radiation effect testingBaum, Max / Felden, Olaf / Weinand, Udo / Hoffgen, Stefan / Kuhnhenn, Jochen / Metzger, Stefan et al. | 2017
- 1
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Multi-MGy Total Ionizing Dose Induced MOSFET Variability Effects on Radiation Hardened CMOS Image Sensor PerformancesRizzolo, Serena / Goiffon, Vincent / Sergent, Marius / Corbiere, Franck / Rolando, Sebastien / Chabane, Aziouz / Paillet, Philippe / Marcandella, Claude / Girard, Sylvain / Magnan, Pierre et al. | 2017
- 1
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600 Mrad TID effects on a new generation high rate Pixel Readout ASIC in 65nm CMOS with low-power, low noise synchronous analog front-end using Fast ToT encodingand auto-zeroingMonteil, Ennio / Demaria, Natale / Pacher, Luca / Rivetti, Angelo / Rolo, Manuel Dionisio Da Rocha / Wheadon, Richard / Paterno, Andrea / Panati, Serena et al. | 2017
- 1
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Extrapolated degradation of optical systems at MGy levels due to radiation-induced refractive index changeMuller, Cyprien / Lepine, Thierry / Allanche, Timothe / Paillet, Philippe / Goiffon, Vincent / Ouerdane, Youcef / Boukenter, Aziz / Girard, Sylvain et al. | 2017
- 1
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Evaluation of spacecraft materials behavior to JUICE environment (Synergistic effect of radiations and cryogenic temperature)Dagras, Sabine / Eck, Julien / Tonon, Claire / Duzellier, Sophie / Paulmier, Thierry / Sukhaseum, Nicolas / Maliki, Michal / Semprimoschnig, Christopher et al. | 2017
- 1
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Estimation of the Radiation Hardness of Bipolar Voltage Comparators in Wide Operation Temperature RangeBakerenkov, Alexander S. / Rodin, Alexander S. / Felitsyn, Vladislav A. / Pershenkov, Viacheslav S. / Butin, Valentin I. et al. | 2017
- 1
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Investigation on the Sensitivity Degradation of Dosimeters based on Floating Gate StructureBrucoli, M. / Danzeca, S. / Cesari, J. / Brugger, M. / Masi, A. / Gilardoni, S. / Pineda, A. / Dusseau, L. / Wrobel, F. et al. | 2017
- 1
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Low Level Radiation and Fault Protection Techniques Suitable for Nanosatellite MissionsSelcan, David / Kirbis, Gregor / Kramberger, Iztok et al. | 2017
- 1
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Superimposed In-Circuit Fault Mitigation for Dynamically Reconfigurable FPGAsKourfali, Alexandra / Codinachs, David Merodio / Stroobandt, Dirk et al. | 2017
- 1
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Incidents and Accidents: The Way of the Single Event TesterLaBel, Kenneth A. et al. | 2017
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Temperature dependence of the radiation degradation at high total dose levelsPershenkov, Viacheslav S. / Bakerenkov, Alexander S. / Telets, Vitaly A. / Belyakov, Vladimir V. / Shurenkov, Vladimir V. / Felitsyn, Vladislav A. / Rodin, Alexander S. et al. | 2017
- 1
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Radiation induced background characterization for a next generation of space telescopeSierra, Luz Maria Martinez / Jun, Insoo / Morrissey, Patrick et al. | 2017
- 1
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Comparison of Single Event Transients in AlGaN/GaN Schottky-Gate HEMTs Using Four Sources for Charge InjectionKhachatrian, A. / Roche, N. J-H / Buchner, S. / Koehler, A. D. / Anderson, T. J. / Hobart, K. D. / McMorrow, D. / LaLumondiere, S. D. / Wells, N. P. / Tockstein, M. A. et al. | 2017
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Irradiation Facilities at CERNGkotse, B. / Brugger, M. / Carbonez, P. / Danzeca, S. / Fabich, A. / Alia, R. Garcia / Glaser, M. / Gorine, G. / Jaekel, M. R. / Suau, I. Mateu et al. | 2017
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Estimation of System Survival Reliability in a Radiation Environment Based on the Available Radiation Data at Component LevelFerraro, R. / Danzeca, S. / Dilillo, L. / Brugger, M. / Masi, A. / Gilardoni, S. et al. | 2017
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Modelling voltage dependence of photocurrent in proton irradiated GaAs cellsSalzberger, Manuel / Rutzinger, Martin / Nomayr, Christel / Lugli, Paolo / Zimmermann, Claus G. et al. | 2017
- 1
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Destructive Failure Heavy Ion Testing of Different AmplifiersKalashnikova, Anastasia A. / Chubunov, Pavel A. / Anashin, Vasily S. / Iakovlev, Sergey A. / Koziukov, Aleksandr E. / Faradian, Konstantin Z. / Chlenov, Aleksandr M. et al. | 2017
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The Radiation Performance of Intersil’s Commercial Space Plastic PartsNewman, W. H. / van Vonno, N. W. / Bernard, S. K. / Pearce, L. G. / Broline, J. / Mansilla, O. E. / Thomson, E. J. et al. | 2017
- 1
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Review and Comparison of Irradiation Response and Annealing Models for High-Sensitivity RADFETsBenito-Parejo, M. / Ibarmia, S. / Portillo, P. et al. | 2017
- 1
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Options for Radiation Tolerant High-Performance MemoryGuertin, Steven M. / Yang-Scharlotta, Jean / Blaisdell-Pijuan, Paris / Some, Raphael et al. | 2017
- 1
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Towards a Unified Environmental Monitoring, Control and Data Management System for Irradiation Facilities: the CERN IRRAD Use CaseGkotse, B. / Glaser, M. / Jouvelot, P. / Matli, E. / Pezzullo, G. / Ravotti, F. et al. | 2017
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Radiation Testing of an SAR ADC for Use in Quench Detection Systems for the HiLumi LHCSpasic, Jelena / Denz, Reiner / Kopal, Josef / Steckert, Jens et al. | 2017
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UCL irradiation facilities statusStandaert, L. / Postiau, N. / Loiselet, M. et al. | 2017
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Alpha radiation testing of materials: a technique with excellent dosimetry and no radioactive contaminationSharp, Richard E. et al. | 2017
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Destructive Single-Events and Latchup in Radiation-Hardened Switching RegulatorsVartanian, Sergeh / Allen, Gregory R. / Irom, Farokh / Scheick, Leif Z. / Hart, Shirley / Vonno, Nick W. van / Pearce, Larry et al. | 2017
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Photobleaching effects in multi-mode radiation resistant optical fibersBillat, Adrien / Blanc, Jeremy / Kuhnhenn, Jochen / Ricci, Daniel et al. | 2017
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Analysis of Image Lag Degradation in PPD CISs Induced by Total Ionizing Dose and Displacement Radiation DamageWang, Zujun / Xue, Yuanyuan / Liu, Jing / Chen, Wei / Ma, Wuying / He, Baoping / Yao, Zhibin / Sheng, Jiangkun et al. | 2017
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RADECS 2017 Cover Page| 2017
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RADECS 2017 TOC| 2017
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RADECS 2017 Breaker Page| 2017
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RADECS 2017 List of Reviewers| 2017
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RADECS 2017 Commentary| 2017
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RADECS 2017 Awards Page| 2017
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RADECS 2017 Technical Program Committee Sessions| 2017
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RADECS 2017 Preface| 2017
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RADECS 2017 Committees| 2017
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RADECS 2017 Ad Page| 2017
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RADECS 2017 Author Index| 2017