High Mobility TMD NMOS and PMOS Transistors and GAA Architecture for Ultimate CMOS Scaling (English)
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In:
2023 International Electron Devices Meeting (IEDM)
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2023
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- Conference paper / Electronic Resource
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Title:High Mobility TMD NMOS and PMOS Transistors and GAA Architecture for Ultimate CMOS Scaling
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Contributors:Penumatcha, A. ( author ) / O'Brien, K. P. ( author ) / Maxey, K. ( author ) / Mortelmans, W. ( author ) / Steinhardt, R. ( author ) / Dutta, S. ( author ) / Dorow, C. J. ( author ) / Naylor A., C. H. ( author ) / Kitamura, Kitamura ( author ) / Zhong, T. ( author )
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Publication date:2023-12-09
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Superior retention (>1 year, 85 °C) and memory window (~1.8 V) using ultra-thin HZO FTJ with OTS selector for X-point memory applicationsJung, Laeyong / Lee, Jangseop / Oh, Seungyeol / Hwang, Hyunsang et al. | 2023
- 1
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First Demonstration of Highly Scaled Atomic Layer Deposited Ultrathin InSnZnO Channel Thin Film Transistor Exhibiting Superior Electrical CharacteristicsLiang, Yan-Kui / Zheng, Jun-Yang / Lin, Yu-Lon / Chen, Yu / Chen, Kuan-Lun / Hsieh, Dong-Ru / Peng, Li-Chi / Chiu, Ching-Hua / Lu, Yu-Chcng / Chou, Tsung-Te et al. | 2023
- 1
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First Demonstration of Annealing-Free Top Gate La:HZO-IGZO FeFET with Record Memory Window and EnduranceZeng, Min / Hu, Qianlan / Li, Qijun / Liu, Honggang / Yan, Shiwei / Gu, Chengru / Zhao, Wenjie / Huang, Ru / Wu, Yanqing et al. | 2023
- 1
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DrGaN: an Integrated CMOS Driver-GaN Power Switch Technology on 300mm GaN-on-Si with E-mode GaN MOSHEMT and 3D Monolithic Si PMOSThen, Han Wui / Radosavljevic, M. / Bader, S. / Zubair, A. / Vora, H. / Nair, N. / Koirala, P. / Beumer, M. / Nordeen, P. / Vyatskikh, A. et al. | 2023
- 1
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Hardware Demonstration of Feedforward Stochastic Neural Networks with Fast MTJ-based p-bitsSingh, Nihal Sanjay / Niazi, Shaila / Chowdhury, Shuvro / Selcuk, Kemal / Kaneko, Haruna / Kobayashi, Keito / Kanai, Shun / Ohno, Hideo / Fukami, Shunsuke / Camsari, Kerem Y. et al. | 2023
- 1
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A 0.5µm Pixel 3-layer Stacked CMOS Image Sensor with Deep Contact and In-pixel Cu-Cu Bonding TechnologyLee, Gwi-Deok Ryan / Kim, Dae-Hoon / Kwon, Doowon / Park, Jong-Eun / Cho, Dongseok / Kang, Jeongsoon / Park, Gyunha / Kang, Junha / Jang, Minho / Oh, Seungjae et al. | 2023
- 1
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A cost effective RF-SOI Drain Extended MOS transistor featuring PSAT=19dBm @28GHz & VDD=3V for 5G Power Amplifier applicationGarros, X. / Divay, A. / Lacord, J. / Serhan, A. / Fache, T. / Antonijevic, J. / Cremer, S. / Knopik, V. / Giry, A. / Charlet, I. et al. | 2023
- 1
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High Peformance 3D Flash Memory with 3.2Gbps Interface and 205MB/s Program Throughput based on CBA(CMOS Directly Bonded to Array) TechnologyKobayashi, S. / Tashiro, K. / Minemura, Y. / Nakagami, K. / Arita, K. / Oohashi, T. / Funayama, K. / Sakai, H. / Mushiga, M. / Okabe, K. et al. | 2023
- 1
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CMOS Directly Bonded to Array (CBA) Technology for Future 3D Flash MemoryTagami, Masayoshi et al. | 2023
- 1
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Cradle-to-gate Life Cycle Assessment of CMOS Logic TechnologiesBoakes, L. / Garcia Bardon, M. / Schellekens, V. / Liu, I-Y. / Vanhouche, B. / Mirabelli, G. / Sebaai, F. / Van Winckel, L. / Gallagher, E. / Rolin, C. et al. | 2023
- 1
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Bipolar p-FET with Enhanced Conduction Capability on E-mode GaN-on-Si HEMT PlatformTang, Jinjin / Jiang, Zuoheng / Wang, Chengcai / Chen, Junting / Chen, Haohao / Zhang, Yihan / Zheng, Zheyang / Wang, Xinyu / Ma, Jun / Zhao, Junlei et al. | 2023
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A Novel Universal Model for Extracting Specific Contact Resistivity Featuring High Resolution, Strong Variation Immunity, and Simple Fabrication ProcessHan, Kaizhen / Kang, Yuye / Chen, Yue / Gong, Xiao et al. | 2023
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Active-Matrix Potentiometric Sensors with Low Operating Voltage of 0.05 V for High-Resolution Mapping of pH and Cellular MicroenvironmentRen, Huihui / Li, Dingwei / Wang, Min / Tang, Yingjie / Chen, Yitong / Wang, Yan / Huang, Qi / Guo, Chengchen / Zhu, Bowen et al. | 2023
- 1
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Ab initio quantum transport simulations of InAs avalanche photo-diodes within the GW approximationCao, J. / Ziogas, A. / Deuschle, L. / Ding, Q. / Vetsch, N. / Winka, A. / Maillou, V. / Maeder, A. / Luisier, M. et al. | 2023
- 1
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Poly-Bounded Silicon-Controlled-Rectifier for ESD Protection in FinFET TechnologyHuang, S. / Parthasarathy, S. / Zhou, Y. / Hajjar, J. / Rosenbaum, E. et al. | 2023
- 1
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Tunnel and capacitive coupling optimization in FDSOI spin-qubit devicesBertrand, B. / Martinez, B. / Li, J. / Paz, B. Cardoso / Millory, V. / Labracherie, V. / Brevard, L. / Sahin, H. / Roussely, G. / Sarrazin, A. et al. | 2023
- 1
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Improved Multi-bit Statistics of Novel Dual-gate IGZO 2T0C DRAM with In-cell VTH Compensation and ΔVSN/ΔVDATA Boosting TechniqueChen, Kaifei / Zhu, Zhengyong / Lu, Wendong / Liu, Menggan / Liao, Fuxi / Wu, Zijing / Niu, Jiebin / Kang, Bok-Moon / Dan, Wang / Wu, Xie-Shuai et al. | 2023
- 1
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Three-Dimensional Phase-Field based Quantum Transport Simulations of Polar Topological StatesLee, H. / Shin, M. et al. | 2023
- 1
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Hybrid-Domain In-Memory Polynomial Acceleration based on 40nm RRAM Multi-Core Chip for Machine Vision CalibrationBao, Lin / Wang, Zongwei / Wang, Qishen / Yang, Yuhang / Gao, Yi / Shan, Linbo / Sun, Jingwei / Yang, Yunfan / Ling, Yaotian / Zhang, Haisu et al. | 2023
- 1
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First BEOL-compatible IGZO Ferroelectic-Modulated Diode with Drastically Enhanced Memory Window: Experiment, Modeling, and Deep UnderstandingJiao, Leming / Zhou, Zuopu / Zheng, Zijie / Han, Kaizhen / Kong, Qiwen / Wang, Xiaolin / Xu, Haiwen / Zhang, Jishen / Sun, Chen / Kang, Yuye et al. | 2023
- 1
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Making Memory Magic and the Economics Beyond Moore’s LawTran, Thy / Barry, Beau / Parekh, Kunal et al. | 2023
- 1
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Silicon Device-Based Sensing for SustainabilityZafar, S. / Picunko, T. / Cabral, C. / Hopstaken, Marinus / Solomon, P. / Hamann, H. F. et al. | 2023
- 1
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Physical Origin of Recovable Ferroelectric Fatigue and Recovery for Doped-HfO2: Toward Endurance ImmunityChen, Jiajia / Qian, Haoji / Zhang, Hongrui / Shen, Rongzong / Lin, Gaobo / Gu, Jiani / Jin, Chengji / Zhang, Miaomiao / Liu, Huan / Liu, Yan et al. | 2023
- 1
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High RA Dual-MTJ SOT-MRAM devices for High Speed (10ns) Compute-in-Memory ApplicationsSong, M. Y. / Chen, K. L. / Chen, K. M. / Chang, K. T. / Wang, I. J. / Hsin, Y. C. / Lin, C. Y. / Ambrosi, E. / Khwa, Win-San / Lu, Y. L. et al. | 2023
- 1
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A Holistic Approach to Predict Wirebond Corrosion Failure in Extreme Operating EnvironmentsAsaduz Zaman Mamun, M. / Mavinkurve, Amar / Rongen, Rene / Van Soestbergen, Michiel / Alam, Muhammad A. et al. | 2023
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Wavelength – Tunable Grating – Resonance InGaAs Narrowband Photodetector with Infrared Optical PCM, Antimony Triselenide (Sb2Se3)Jang, Junho / Kang, Il-Suk / Oh, Yeon-Wha / Jung, Sanghee / Cho, Huijae / Kim, SangHyeon et al. | 2023
- 1
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Backside Power Delivery: Game Changer and Key Enabler of Advanced Logic Scaling and New STCO OpportunitiesVeloso, A. / Vermeersch, B. / Chen, R. / Matagne, P. / Bardon, M. Garcia / Eneman, G. / Serbulova, K. / Zografos, O. / Chen, S. H. / Sisto, G. et al. | 2023
- 1
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Cryogenic InGaAs HEMTs with Reduced On-Resistance using Strained Ohmic ContactsCha, E. / Ferraris, A. / Mueller, P. / Han, H. -C. / Caimi, D. / Sousa, M. / Enz, C. / Zota, C. B. et al. | 2023
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CMOS-Fabricated Ring Surface Ion Trap with TSV IntegrationZhao, Peng / Lim, Yu Dian / Li, Hongyu / Likforman, Jean-Pierre / Guidoni, Luca / Desormeaux, Lilay Gros / Tan, Chuan Seng et al. | 2023
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Cool-CIM: Cryogenic Operation of Analog Compute-In-Memory for Improved Power-efficiencyWang, Wei-Chun / Saligram, Rakshith / Sharma, Sudarshan / Lee, Minah / Gaidhane, Amol / Cao, Yu / Raychowdhury, Arijit / Datta, Suman / Mukhopadhyay, Saibal et al. | 2023
- 1
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Advanced Packaging Technologies in Memory Applications for Future Generative AI EraMoon, Ki-Ill / Son, Ho-Young / Lee, Kangwook et al. | 2023
- 1
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Generative AI on a Budget: Processing Transformer- based Neural Networks at the EdgeTanurhan, Y. / Paulin, P. / Michiels, T. et al. | 2023
- 1
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Redefining Innovation: A Journey forward in New Dimension EraChoi, Siyoung et al. | 2023
- 1
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Self-Aligned in 2Pitch Cell Array Transistor (S2CAT) for 4F2 Based DRAM Generation ExtensionPark, Seokhan / Oh, Gyuhwan / Yoo, Bowon / Jeong, Moonyoung / Lee, Kiseok / Lee, Sangho / Hong, Seongbin / Sung, Sang Hyun / Choi, Hyungeun / Jo, Taegeun et al. | 2023
- 1
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High-Performance GaN Electronic Metadevices: Towards 6G TelecommunicationsNikoo, M. Samizadeh / Lin, B. / Liu, Y. / Wang, H. et al. | 2023
- 1
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Scaling the SOT track – A path towards maximizing efficiency in SOT-MRAMVan Beek, S. / Cai, K. / Yasin, F. / Hody, H. / Talmelli, G. / Nguyen, V.D. / Vergel, N. Franchina / Palomino, A. / Trovato, A. / Wostyn, K. et al. | 2023
- 1
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RF performance enhancement of 28nm FD-SOI transistors down to cryogenic temperature using back biasingBerlingard, Q. / Lugo-Alvarez, J. / Bawedin, M. / Puyal, V. / Bergamaschi, F. / Casse, M. et al. | 2023
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Robust Recovery Scheme for MFIS-FeFETs at Optimal Timing with Prolonged Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02 %), and Self-Tracking Circuit DesignWu, C.-H. / Liu, J. / Zheng, X.-T. / Tseng, Y.-M. / Kobayashi, M. / Hu, V. P.-H. / Su, C.-J. et al. | 2023
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Defying Temperature: Reliable Compute-in-Memory in Monolithic 3D using BEOL Ferroelectric TFTChatterjee, Swetaki / Kumar, Shubham / Sunil, Athira / De, Sourav / Lehninger, David / Jank, Michael / Kampfe, Thomas / Chauhan, Yogesh Singh / Amrouch, Hussam et al. | 2023
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Hybrid FeRAM/RRAM Synaptic Circuit Enabling On-Chip Inference and Learning at the EdgeMartemucci, M. / Rummens, F. / Hirtzlin, T. / Martin, S. / Guille, O. / Januel, T. / Carabasse, C. / Billoint, O. / Laguerre, J. / Coignus, J. et al. | 2023
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First Demonstration of Hafnia-based Selector-Free FeRAM with High Disturb Immunity through Design Technology Co-OptimizationFu, Zhiyuan / Cao, Shengjie / Zheng, Hao / Luo, Jin / Huang, Qianqian / Huang, Ru et al. | 2023
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650-V GaN-on-Si Power Integration Platform Using Virtual-Body p-GaN Gate HEMT to Screen Substrate-Induced CrosstalkYang, Junjie / Wei, Jin / Wang, Maojun / Nuo, Muqin / Yang, Han / Li, Teng / Yu, Jingjing / Yang, Xuelin / Hao, Yilong / Wang, Jinyan et al. | 2023
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First BEOL-compatible, 10 ns-fast, and Durable 55 nm Top-pSOT-MRAM with High TMR (>130%)Li, Kai-Shin / Shieh, Jia-Min / Chen, Yi-Ju / Hsu, Cho-Lun / Shen, Chang-Hong / Hou, Tuo-Hung / Lin, Chia-Ping / Lai, Chih-Huang / Tang, Denny D. / Yuan-Chen Sun, Jack et al. | 2023
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Experimental demonstration and modeling of a ferroelectric gate stack with a tunnel dielectric insert for NAND applicationsDas, Dipjyoti / Park, Hyeonwoo / Wang, Zekai / Zhang, Chengyang / Ravindran, Prasanna Venkatesan / Park, Chinsung / Afroze, Nashrah / Hsu, Po-Kai / Tian, Mengkun / Chen, Hang et al. | 2023
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Fundamental Issues in VNAND Integration Toward More Than 1K LayersHan, Jeehoon / Kang, Seogoo / Kim, Kyungdong / Jang, Jaehoon / Song, Jaihyuk et al. | 2023
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First Demonstration of True 4-bit Memory with Record High Multibit Retention >103s and Read Window >105 by Hydrogen Self-Adaptive-Doping for IGZO DRAM ArraysYan, Gangping / Luo, Yanna / Wang, Jianjian / Song, Zhiyu / Niu, Chuqiao / Yang, Shangbo / Tian, Guoliang / Yao, Jiaxin / Ma, Xueli / Zhang, Qingzhu et al. | 2023
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Demonstration of Millimeter-Wave GaN IMPATT Oscillator at Ka-bandBian, Z. / Marshall, A. / Pao, C. / Lee, T. / Chowdhury, S. et al. | 2023
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Process Innovations for Future Technology Nodes with Back-Side Power Delivery and 3D Device StackingKobrinsky, M. / Silva, J. D / Mannebach, E. / Mills, S. / El Qader, M. Abd / Adebayo, O. / Radhakrishna, N. Arkali / Beasley, M. / Chawla, J. / Chugh, S. et al. | 2023
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Organic Active-Matrix Imager with Ultra-low Illumination Detection Capacity for Lens-Free Optical AnalysisShan, Tong / Li, Jun / Zhou, Chao / Chang, Fangyuan / Guo, Xiaojun et al. | 2023
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Reversing a decades-long scaling law of dielectric breakdown for ReRAM forming voltage reduction - Modeling competition among defect generation and annihilation processes (invited)Wu, Ernest / Ando, Takashi / Jamison, Paul et al. | 2023
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6.6W/mm 200mm CMOS compatible AlN/GaN/Si MIS-HEMT with in-situ SiN gate dielectric and low temperature ohmic contactsMorvan, E. / Gobil, Y. / Morisot, F. / Biscarat, J. / Charles, M. / Lugo, J. / Divay, A. / Medbouhi, M. / Charlet, I. / Delprato, J. et al. | 2023
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The case for hybrid analog neuromorphic chips based on silicon and 2D materialsIannaccone, G. / Rizzo, T. / Paliy, M. / Sfrangio, S. et al. | 2023
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A Target-Read Retry Scheme for 3D Charge Trap NAND Flash MemoryChou, Y. L. / Lu, C. C. / Tsai, W. J. / Lu, T. C. / Chen, K.C. / Lu, C. Y. et al. | 2023
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3-STAR: A Super-steep switching, Stackable, and Strongly Reliable Transistor Array RAM for Sub-10nm DRAM and beyondLee, Kynghwan / Yoo, Sungwon / Hong, Jaeho / Kim, Hyun-Cheol / Kim, YongSeok / Kim, Ilgweon / Ha, Daewon / Shin, Yu-Gyun / Song, Jaihyuk et al. | 2023
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Heterogeneous Power Delivery for Large Chiplet-based Systems using Integrated GaN/Si-Interconnect Fabric with sub-10 μm Bond PitchRen, Haoxiang / Sahoo, Krutikesh / Guo, Ziyi / Pugazhendhi, Rishi / Wong, Zachary / Xiang, Tianyu / Fisher, Timothy S. / Iyer, Subramanian S. et al. | 2023
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COPS: An Efficient and Reliability-Enhanced Programming Scheme for Analog RRAM and On-Chip Implementation of Denoising Diffusion Probabilistic ModelJiang, Zhixing / Xi, Yue / Tang, Jianshi / Lu, Yuyao / Yu, Ruihua / Hu, Ruofei / Hu, Qi / Gao, Bin / Qian, He / Wu, Huaqiang et al. | 2023
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Scalable biosensors using standard CMOS processNoyan, Utku / Lu, Sheung / Christen, Jennifer Blain / Abshire, Pamela / Shah, Sahil et al. | 2023
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2.16µm Back Side Illuminated Voltage Domain Global Shutter CMOS Image Sensor with single silicon layer pixelMalinge, P. / Lalanne, F. / Herault, D. / Ferrotti, T. / Simony, L. / Bigault, S. / Favreau, J. / Nassiet, T. / Sacchettini, Y. / Augier, C. et al. | 2023
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First Demonstration of Monolithic Self-aligned Heterogeneous Nanosheet Channel Complementary FETs with Matched VT by Band Alignments of Individual ChannelsTu, Chien-Te / Hsieh, Wan-Hsuan / Chen, Yu-Rui / Huang, Bo-Wei / Liao, Yu-Tsung / Chen, Wei-Jen / Liu, Yi-Chun / Cheng, Chun-Yi / Chou, Hung-Chun / Lu, Hao-Yi et al. | 2023
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Modeling the Performance and Reliability of Two-Dimensional Semiconductor TransistorsKnobloch, T. / Waldhoer, D. / Davoudi, M. R. / Karl, A. / Khakbaz, P. / Matzinger, M. / Zhang, Y. / Smithe, K. K. H. / Nazir, A. / Liu, C. et al. | 2023
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A 256 Kbit Hf0.5Zr0.5O2-based FeRAM Chip with Scaled Film Thickness (sub-8nm), Low Thermal Budget (350oC), 100% Initial Chip Yield, Low Power Consumption (0.7 pJ/bit at 2V write voltage), and Prominent Endurance (>1012)Jiang, Pengfei / Jiang, Haijun / Yang, Yang / Tai, Lu / Wei, Wei / Gong, Tiancheng / Wang, Yuan / Xu, Pan / Lv, Shuxian / Wang, Boping et al. | 2023
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Sustainable Environmental Technologies for Advanced Semiconductor Manufacturing Intelligent FABLee, Hyun Chul / Oh, Sehyeong / Yang, Dong Sik / Koo, Min Seok / Ham, Dong Jin / Jeong, Joonseon / Kang, Sungwoo / Chang, Jaehee / Heo, Hyeon-Su / Kim, Mijong et al. | 2023
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On-chip zero-field spin wave frequency multiplier and its application on qubit quantum controlLiu, Jiacheng / Wu, Jiahao / Ren, Zheyu / Yang, Sen / Shao, Qiming et al. | 2023
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A highly reliable 1.8 V 1 Mb Hf0.5Zr0.5O2-based 1T1C FeRAM Array with 3-D CapacitorsOkuno, Jun / Kunihiro, Takafumi / Yonai, Tsubasa / Ono, Ryo / Shuto, Yusuke / Alcala, Ruben / Lederer, Maximilian / Seidel, Konrad / Mikolajick, Thomas / Schroeder, Uwe et al. | 2023
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The First CMOS-Integrated Voltage-Controlled MRAM with 0.7ns Switching TimeSuhail, H. / He, H. / Yang, J. / Shu, Q. / Wang, C. -Y. / Yang, S. -Y. / Hsin, Y. -C. / Shih, C. -Y. / Lee, H. -H. / Wu, D. et al. | 2023
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3D Stacked Devices and MOL Innovations for Post-Nanosheet CMOS ScalingHoriguchi, N. / Mertens, H. / Chiarella, T. / Demuynck, S. / Vega-Gonzalez, V. / Vandooren, A. / Veloso, A. / Bardon, M. Garcia / Sisto, G. / Gupta, A. et al. | 2023
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High Performance mm Wave AlN/GaN MISHEMTs on 200 mm Si SubstrateYadav, S. / Alian, A. / ElKashlan, R. / O'Sullivan, B. J. / Khaled, A. / Kazemi, B. / Peralagu, U. / Banerjee, S. / Parvais, B. / Collaert, N. et al. | 2023
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Impact of the channel thickness fluctuation on the subthreshold swing of InGaAs HEMTs at cryogenic temperature down to4K for ultra-low power LNAsJeong, Jaeyong / Kim, Jongmin / Lee, Jisung / Suh, Yoon-Je / Rheem, Nahyun / Kim, Seong Kwang / Park, Juhyuk / Kim, Bong Ho / Kim, Joon Pyo / Park, Seung-Young et al. | 2023
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6500-V E-mode Active-Passivation p-GaN Gate HEMT with Ultralow Dynamic RONCui, Jiawei / Wei, Jin / Wang, Maojun / Wu, Yanlin / Yang, Junjie / Li, Teng / Yu, Jingjing / Yang, Han / Yang, Xuelin / Wang, Jinyan et al. | 2023
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1200V E-mode GaN Monolithic Integration Platform on Sapphire with Ultra-thin Buffer TechnologyLi, Sheng / Ma, Yanfeng / Lu, Weihao / Li, Mingfei / Wang, Lixi / Zhang, Zikang / Zhu, Tinggang / Li, Yiheng / Wei, Jiaxing / Zhang, Long et al. | 2023
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The Era of Generative Artificial Intelligence: In-Memory Computing PerspectiveKang, Shin-Haeng / Lee, Sukhan / Sohn, Kyomin et al. | 2023
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New Insights into the Interface Trap Generation during Hot Carrier Degradation: Impacts of Full-band Electronic Resonance, (100) vs (110), and nMOS vs pMOSWang, Zirui / Lu, Haoran / Sun, Zixuan / Shen, Cong / Peng, Baokang / Li, Wen-Feng / Xue, Yongkang / Wang, Da / Ji, Zhigang / Zhang, Lining et al. | 2023
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Optical design of dispersive metasurface nano-prism structure for high sensitivity CMOS image sensorChoi, Chulsoo / Park, Jonghoon / Lee, Yunki / Kim, Bumsuk / Kim, Junghoon / Kim, Sunwook / Kim, Junghyun / Roh, Sookyoung / Ahn, Sungmo / Mun, Sangeun et al. | 2023
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Variability of Trap-induced Mobility Fluctuations in Nanoscale Bulk and FD-SOI MOSFETsGauthier, O. / Haendler, S. / Rafhay, Q. / Theodorou, C. et al. | 2023
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Designing networks of resistively-coupled stochastic Magnetic Tunnel Junctions for energy-based optimum searchDanouchi, K. / Soumah, L. / Bouchard, C. / Disdier, F. / Fassatoui, A. / Phan, N.-T. / Ezzadeen, M. / Delaet, B. / Viala, B. / Prenat, G. et al. | 2023
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First demonstration of 3-dimensional stacked FET with top/bottom source-drain isolation and stacked n/p metal gatePark, Jaehyun / Kim, Wukang / Park, Sungil / Yun, Jinchan / Hwang, Kyuman / Yang, Jinwook / Kim, Dahye / Jeong, Jae Won / Yun, Chuljin / Bae, Jinho et al. | 2023
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Thin Sc0.2Al0.8N Film Based 15 GHz Wideband Filter: Towards mmWave Acoustic FiltersWang, Xinghua / Liu, Chen / Zhang, Ying / Yang, Wenjia / Qian, You / Liu, Peng / Quek, Zhan Jiang / Hong, Yan / Yi, Eugene / Woo, Zhun et al. | 2023
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Simulation in action: the application of modelling to SPAD architecture designPellegrini, S. / Nicholson, I. / Helleboid, R. / Mamdy, B. / Forcolin, G. / Al-Rawhani, M. / Buj, C. / Marchand, G. / Rae, B. / Golanski, D. et al. | 2023
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Modeling 300mm Wafer Fab Carbon EmissionsJones, Scotten W. et al. | 2023
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3D Stackable CNTFET/RRAM 1T1R Array with CNT CMOS Peripheral Circuits as BEOL Buffer Macro for Monolithic 3D Integration with Analog RRAM-based Computing-In-MemoryZhang, Yibei / Li, Yijun / Tang, Jianshi / Gao, Ningfei / Gao, Lei / Xu, Haitao / An, Ran / Qin, Qi / Liu, Zhengwu / Wu, Dong et al. | 2023
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An SRAM-based reconfigurable analog in-memory computing circuit for solving linear algebra problemsMannocci, P. / Melacarne, E. / Pezzoli, A. / Pedretti, G. / Villa, C. / Sancandi, F. / Spagnolini, U. / Ielmini, D. et al. | 2023
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Gain Cell Memory on Logic Platform – Device Guidelines for Oxide Semiconductor Transistor Materials DevelopmentLiu, Shuhan / Jana, Koustav / Toprasertpong, Kasidit / Chen, Jian / Liang, Zheng / Jiang, Qi / Wahid, Sumaiya / Qin, Shengjun / Chen, Wei-Chen / Wong, H.-S. Philip et al. | 2023
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High Performance Nanosheet Technology Optimized for 77 KBao, R. / Qin, L. / Frougier, J. / Suk, S. / Rabie, M. / Bajpai, U. / Chou, A. / Nechay, B. / Mohamed, M. / Pujari, R. et al. | 2023
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Charge Movement in Back Barrier Induced Time-Dependent On-State Breakdown of GaN HEMTYu, Hao / Fang, J. / Vermeersch, B. / Peralagu, U. / Han, H. / Richard, O. / Alian, A. / de Almeida Braga, N. / Esfeh, B. Kazemi / Banerjee, S. et al. | 2023
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Beyond Exascale: A Paradigm shift for AI and HPCGomes, W. et al. | 2023
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Bayesian In-Memory Computing with Resistive MemoriesTurck, C. / Bonnet, D. / Harabi, K.-E. / Dalgaty, T. / Ballet, T. / Hirtzlin, T. / Pontlevy, A. / Renaudineau, A. / Esmanhotto, E. / Bessiere, P. et al. | 2023
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Emerging Memory RRAM Embedded in 12FFC FinFET Technology for industrial ApplicationsWu, Chun-Yu / Yang, Chang-Feng / Lai, Chih-Wei / Wu, Yu-Tien / Chien, Ta-Chun / Yang, Ming-Han / Yang, Ming-Ta / Kao, Yu-Neng / Cheng, Chih-Lin / Wang, Chia-Yu et al. | 2023
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Highly Manufacturable, Cost-Effective, and Monolithically Stackable 4F2 Single-Gated IGZO Vertical Channel Transistor (VCT) for sub-10nm DRAMHa, Daewon / Lee, Wonsok / Cho, M.H. / Terai, M. / Yoo, S.-W. / Kim, H. / Lee, Y. / Uhm, S. / Ryu, M. / Sung, C. et al. | 2023
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Live-Cell Imaging with Integrated Capacitive Sensor ArraysRosenstein, J. K. / Yin, Y. / Hu, K. / Epstein, S. / Wanunu, M. / Adler, A. / Larkin, J. W. et al. | 2023
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Power-Efficient Clustering Using Programmable VT FETs in Neuromorphic ArchitecturesBarve, S. / Haehn, N. / Socolik, C. / Ruen, Aaron / Mayersky, Joshua / Reed, Amber / Leedy, Kevin / Jha, R. et al. | 2023
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2 kV, 0.7 mΩ•cm2 Vertical Ga2O3 Superjunction Schottky Rectifier with Dynamic RobustnessQin, Yuan / Porter, Matthew / Xiao, Ming / Du, Zhonghao / Zhang, Hongming / Ma, Yunwei / Spencer, Joseph / Wang, Boyan / Song, Qihao / Sasaki, Kohei et al. | 2023
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Enhancing Se-based Selector-only Memory with Ultra-fast Write Speed (~ 10 ns) and Superior Retention Characteristics (> 10 years at RT) via Material Design and UV Treatment EngineeringLee, Jangseop / Seo, Yoori / Ban, Sanghyun / Kim, Dongmin / Heo, Seongjae / Kang, Daehwan / Hwang, Hyunsang et al. | 2023
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Memcapacitor Crossbar Array with Charge Trapping Layer for Physical Unclonable Function in NAND Flash ArchitectureSong, Min Suk / Ahn, Suhyeon / Hwang, Hwiho / Kim, Hyungjin et al. | 2023
- 1
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A 2.2μm 2-Layer Stacked HDR Voltage Domain Global Shutter CMOS Image Sensor with Dual Conversion Gain and 1.2e- FPNGao, Zhe / Park, Geunsook / Fu, Linda / Chapinal, Genis / Yang, Joseph / Freson, Tom / Qin, Qing / Guo, Jiayu / Zhu, Fan / Ding, Shaomin et al. | 2023
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Counteractive Coupling IGZO/CNT Hybrid 2T0C DRAM Accelerating RRAM-based Computing-In-Memory via Monolithic 3D Integration for Edge AIShi, Mingcheng / Su, Yanbo / Tang, Jianshi / Li, Yijun / Du, Yiwei / An, Ran / Li, Jiaming / Li, Yuankun / Yao, Jian / Hu, Ruofei et al. | 2023
- 1
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ESD Challenges in 300nm Si Substrate of DTCO/STCO Scaling OptionsChen, W.-C. / Chen, S.-H. / Veloso, A. / Serbulova, K. / Hellings, G. / Groeseneken, G. et al. | 2023
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Demonstration of a Stacked CMOS Inverter at 60nm Gate Pitch with Power Via and Direct Backside Device ContactsRadosavljevic, Marko / Huang, C.-Y. / Galatage, R. / Qayyum, M. F. / Wiedemer, J. A. / Clinton, E. / Bennett, D. / Ryu, H. / Thomas, N. K. / Morrow, P. et al. | 2023
- 1
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Towards CMOS Capacitance Sensors for DNA Origami CharacterizationSajal, M. S. R. / Lin, K.-C. / Gilpin, Y. / Walawalkar, V. / Dehghandehnavi, F. / Taylor, R. E. / Dandin, M. et al. | 2023
- 1
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First Demonstration of Trench-shaped 6.5-kV n-channel SiC IGBT with Trench-etched Double-diffused MOS (TED-MOS) StructureWatanabe, Naoki / Shimizu, Haruka / Shima, Akio et al. | 2023
- 1
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Bayesian Neural Network Implemented by Dynamically Programmable Noise in Vanadium OxideOh, S. / Xiao, T. P. / Bennett, C. / Weiss, A. J / Bishop, S. R. / Finnegen, P. S. / Fuller, E. J. / Agarwal, S. / Talin, A. A. et al. | 2023
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Geometric Scattering Describing Mode-Coupling Effects in Non-Uniform Cross-Sections for Non-Equilibrium Green’s Function and Multi Subband Boltzmann Transport Equation SolversAhn, Phil-Hun / Hong, Sung-Min et al. | 2023
- 1
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Enhanced Endurance Characteristics in High Performance 16nm Selector Only Memory (SOM)Park, I.-M. / Lee, K. W. / Park, J.-H. / Song, S. J. / Kim, T. Y. / Wu, Z. / Lee, W. J. / Choi, B. D. / Jeong, Y. J. / Oh, S. C. et al. | 2023
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Reliability-Aware Ultra-Scaled IDG-InGaZnO-FET Compact Model to Enable Cross-layer Co-design for Highly Efficient Analog Computing in 2T0C-DRAMXu, Lihua / Chen, Kaifei / Li, Zhi / Guo, Jingrui / Wang, Linfang / Zhao, Yue / Huang, Shijie / Zhou, Zhidao / Dou, Chunmeng / Yang, Guanhua et al. | 2023
- 1
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Improved Reliability and Enhanced Performance in BEOL Compatible W-doped In2O3 Dual-Gate TransistorAabrar, Khandker Akif / Gopal Kirtania, Sharadindu / Deng, Sunbin / Choe, Gihun / Khan, Asif / Yu, Shimeng / Datta, Suman et al. | 2023
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Status and Performance of Integration Modules Toward Scaled CMOS with Transition Metal Dichalcogenide ChannelChou, Ang-Sheng / Hsu, Ching-Hao / Lin, Yu-Tung / Arutchelvan, Goutham / Chen, Edward / Hung, Terry Y.T. / Hsu, Chen-Feng / Chou, Sui-An / Lee, Tsung-En / Madia, Oreste et al. | 2023
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HyFET—A GaN/SiC Hybrid Field-Effect TransistorFeng, Sirui / Zheng, Zheyang / Wang, Yuru / Lyu, Gang / Liu, Kai / Cheng, Yan / Chen, Junting / Chen, Tao / Zhang, Li / Song, Wenjie et al. | 2023
- 1
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First Demonstration of a Bayesian Machine based on Unified Memory and Random Source Achieved by 16-layer Stacking 3D Fe-Diode with High Noise Density and High Area EfficiencyGong, Tiancheng / Wu, Qiqiao / Huang, Yuanquan / Jiang, Haijun / Yang, Jianguo / Luo, Qing / Chung, Steve S. / Liu, Ming et al. | 2023
- 1
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Comprehensive Study of NBTI and Off-State Reliabilty in Sub-20 nm DRAM Technology: Trap Identification, Compact Aging Model, and Impact on Retention DegradationSun, Zixuan / Cai, Puyang / Song, Jiahao / Wang, Da / Liu, Zhuyou / Zhou, Longda / Zhu, Tianxiang / Xue, Yongkang / Liu, Yong / Wang, Zirui et al. | 2023
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Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNANDLim, Suhwan / Kim, Taeyoung / Myeong, Ilho / Park, Sanghyun / Noh, Suseong / Lee, Seung Min / Woo, Jongho / Ko, Hanseung / Noh, Youngji / Choi, Moonkang et al. | 2023
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A Selective Overtone MEMS-based Quartz Oscillator with Low Acceleration SensitivityChang, Chin-Yu / Hsieh, Po-Cheng / Yao, Chun-Wei / Yang, Chien-Cheng / Li, Sheng-Shian et al. | 2023
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Dual-wavelength neural probe for simultaneous opto-stimulation and recording fabricated in a monolithically integrated CMOS/photonics technology platformNeutens, P. / O'Callaghan, J. / De Ceulaer, J. / Tonon, E. / Welkenhuysen, M. / Lopez, C. M. / Andrei, A. / Putzeys, J. / Mahmud-Ul-Hasan, Md. / Tilmans, H.A.C. et al. | 2023
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First Demonstration of Innovative 3D AND-Type Fully-Parallel Convolution Block with Ultra-High Area-and Energy-EfficiencyKim, Jangsaeng / Im, Jiseong / Ko, Jonghyun / Lee, Soochang / Kwon, Dongseok / Shin, Wonjun / Hwang, Joon / Koo, Ryun-Han / Choi, WooYoung / Lee, Jong-Ho et al. | 2023
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Comparative Advantages of 2T-nC FeRAM in Empowering High Density 3D Ferroelectric Capacitor MemoryDeng, Shan / Xiao, Yi / Zhao, Zijian / Huang, Tzu-Jung / Kampfe, Thomas / Narayanan, Vijaykrishnan / Ni, Kai et al. | 2023
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Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based ModelingWu, Junjie / Ren, Pengpeng / Zhang, Chenyang / Xiao, Yu / Xue, Yongkang / Li, Yu / Wang, Xiaolin / Zhang, Lining / Liu, Junhua / Zhang, Jianfu et al. | 2023
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Tungsten Interconnect Resistance Reduction Enabling Energy Efficient and High Performance Applications for 2nm Node and BeyondThareja, Gaurav / Pal, Ashish / Ma, Quan / Ching, Chi / Patel, Sahil / Gao, Xingyao / Dag, Sefa / Qi, Zhimin / Zhang, Aixi / Yue, Shiyu et al. | 2023
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Electromigration of Backside Power Delivery Networks for PPA-Reliability Tradeoffs at N2 NodeCai, Linlin / Chen, Yutao / Zhang, Haoyu / Lin, Jianwen / Yin, Binyu / Chen, Wangyong et al. | 2023
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EUV Energy EfficiencyThijssen, Theo / Van der Net, Ton / Janssen, Toni / Luijten, Carlo et al. | 2023
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Complementary Field-Effect Transistor (CFET) Demonstration at 48nm Gate Pitch for Future Logic Technology ScalingLiao, S. / Yang, L. / Chiu, T.K. / You, W.X. / Wu, T.Y. / Yang, K.F. / Woon, W.Y. / Ho, W.D. / Lin, Z.C. / Hung, H.Y. et al. | 2023
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Photonic BiCMOS Technology with 80 GHz Ge Photo Detectors and 100 GHz Ge Electro-Absorption ModulatorsSteckler, D. / Lischke, S. / Peczek, A. / Kroh, A. / Zimmermann, L. et al. | 2023
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Innovations For Energy Efficient Generative AINaffziger, S. et al. | 2023
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A silicon photonic 8λ, x 32Gbps/λ, WDM transceiver with integrated laser array and SOA for optical I/OHuang, D. / Xuan, Z. / Kumar, R. / Levy, C. / Su, G. / Ma, C. / Wu, X. / Liu, S. / Sharma, J. / Kim, J. et al. | 2023
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Thermal dissipation in stacked devicesWoon, W. Y. / Vaziri, Sam / Shih, C. C. / Datye, I. / Malakoutian, M. / Hsu, James / Yang, K. F. / Huang, J. R. / Shen, T. M. / Chowdhury, S. et al. | 2023
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Low N-Type Contact Resistance to Carbon Nanotubes in Highly Scaled Contacts through Dielectric DopingSafion, Nathaniel / Chiu, Hsin-Yuan / Chao, Tzu-Ang / Su, Sheng-Kai / Passlack, Matthias / Chiu, Kuang-Hsiang / Chen, Chien-Wei / Kei, Chi-Chung / Chou, Chen-Han / Lee, Tsung-En et al. | 2023
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In-Situ Encrypted NAND FeFET Array for Secure Storage and Compute-in-MemoryZhao, Zijian / Xu, Yixin / Read, James / Hsu, Po-Kai / Qin, Yixin / Huang, Tzu-Jung / Lim, Suhwan / Kim, Kijoon / Kim, Kwangsoo / Kim, Wanki et al. | 2023
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ReRAM-Based NeoHebbian Synapses for Faster Training-Time-to-Accuracy Neuromorphic HardwareBhattacharya, T. / Bezugam, S.S. / Pande, S. / Wlazlak, E. / Strukov, D. et al. | 2023
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Developing Sustainable Technologies for a more Sustainable FutureNicoleau, S. / Champseix, J-L. / Tagarian, D. / Boeuf, F. / Quinio, P. et al. | 2023
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1-Phototransistor-1-Threshold Switching Optoelectronic Neuron for In-Sensor Compression via Spiking Neuron NetworkWang, Rui / Li, Fanfan / Li, Dingwei / Wang, Chuanqing / Tang, Yingjie / Liu, Guolei / Wang, Saisai / Xie, Yong / Sawan, Mohamad / Ma, Xiaohua et al. | 2023
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Field programmable digital microfluidics chip for high-throughput droplet array manipulationYu, Jun / Jiang, Shengzhe / Wang, Dongping / Chang, Chunyu / Jia, Zhiqiang / Du, Maohua / Shi, Subao / Li, Jiahao / Dong, Wenfei / Ma, Hanbin et al. | 2023
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Highly Responsive Broadband (250~1000 nm) DUV-NIR Photodetector and Tunable Emitter Enabled by III-V Nanowire on Silicon for Integrated PhotonicsYu, Huabin / Wang, Rui / Xiao, Shudan / Fu, Lan / Sun, Haiding et al. | 2023
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BEOL Compatible High-Performance Monolayer WSe2 pFETs with Record Gm=190 μS/μm and Ion=350 μA/μm by Direct-Growth on SiO2 Substrate at Reduced TemperaturesWang, Xin / Shi, Xinhang / Xiong, Xiong / Huang, Ru / Wu, Yanqing et al. | 2023
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Power Conversion Semiconductor and Circuit Trends and Challenges for a Sustainable Energy FutureMcDonald, Timothy et al. | 2023
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BEOL Compatible Oxide Power Transistors for On- Chip Voltage Conversion in Heterogenous 3D (H3D) Integrated CircuitsDeng, Sunbin / Kwak, Jungyoun / Lee, Junmo / Aabrar, Khandker Akif / Kim, Tae-Hyeon / Choe, Gihun / Kirtania, Sharadindu Gopal / Zhang, Chengyang / Li, Wantong / Phadke, Omkar et al. | 2023
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Zeroth and higher-order logic with content addressable memoriesPedretti, G. / Bohm, F. / Hizzani, M. / Bhattacharya, T. / Bruel, P. / Moon, J. / Serebryakov, S. / Strukov, D. / Strachan, J.P. / Ignowski, J. et al. | 2023
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14nm High-Performance MTJ with Accelerated STT-Switching and High-Retention Doped Co-Pt Alloy Storage Layer for 1Znm MRAMNakayama, Masahiko / Oikawa, Soichi / Kamata, Chikayoshi / Toko, Masaru / Itai, Shogo / Takashima, Rina / Sugiyama, Hideyuki / Fukuda, Kenji / Koike, Takeo / Saitoh, Masumi et al. | 2023
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Ultrasensitive Retinomorphic Dim-Light Vision with In-Sensor Convolutional Processing Based on Reconfigurable Perovskite-Bi2O2Se HeterotransistorsXu, Lei / Liu, Junling / Liu, Shuo / Zhang, Liangliang / He, Ming / Huang, Ru et al. | 2023
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Pulse-Based Capacitive Memory Window with High Non-Destructive Read Endurance in Fully BEOL Compatible Ferroelectric CapacitorsMukherjee, S. / Bizindavyi, J. / Luo, Y-C. / Clima, S. / Read, J. / Popovici, M. I. / Xiang, Y. / Bazzazian, N. / Belmonte, A. / Delhougne, R. et al. | 2023
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New Gas Identification Method Using Gas Sensor-Amplifier Merged Array and In-Memory Computing-Based PreprocessingJung, Gyuweon / Kim, Jaehyeon / Jeong, Yujeong / Park, Jinwoo / Shin, Wonjun / Choi, Woo Young / Lee, Jong-Ho et al. | 2023
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Record-Low Metal to Semiconductor Contact Resistance in Atomic-Layer-Deposited In2O3 TFTs Reaching the Quantum LimitNiu, C. / Lin, Z. / Zhang, Z. / Tan, P. / Si, M. / Shang, Z. / Zhang, Y. / Wang, H. / Ye, P. D. et al. | 2023
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Unveiling the Influence of Channel Thickness on PBTI and LFN in Sub-10 nm-thick IGZO FETs: A Holistic Perspective for Advancing Oxide Semiconductor DevicesLiu, Gan / Kong, Qiwen / Wang, Xiaolin / Tu, Yi-Hsin / Zheng, Zijie / Sun, Chen / Zhang, Dong / Kang, Yuye / Han, Kaizhen / Liang, Gengchiau et al. | 2023
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Miniaturized Dual-Mode SAW Filters using 6-inch LiNbO3-on-SiC for 5GNR and WiFi 6Zheng, Pengcheng / Zhang, Shibin / Xu, Jin-Xu / Fang, Xiaoli / Chen, Yang / Huang, Kai / Sui, Dongchen / Zhang, Xiuyin / Ou, Xin et al. | 2023
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Record Power Performance of 33.1 W/mm with 62.9% PAE at X-band and 14.4 W/mm at Ka-band from AlGaN/GaN/AlN:Fe HeterostuctureYang, Ling / Jia, Fuchun / Lu, Hao / Hou, Bin / Zhang, Meng / Du, Jiale / Chang, Qingyuan / Deng, Longge / Yu, Qian / Li, Shiming et al. | 2023
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First Demonstration of Stacked 2T0C-DRAM Bit-Cell Constructed by Two-Layers of Vertical Channel-All-Around IGZO FETs Realizing 4F2 Area CostChen, Chuanke / Xiang, Jinjuan / Duan, Xinlv / Lu, Congyan / Niu, Jiebin / Zhang, Kaiping / Liu, Yu / Lu, Nianduan / Jiao, Zhengying / Shen, Yongqing et al. | 2023
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N3XT 3D Technology Foundations and Their Lab-to-Fab: Omni 3D Logic, Logic+Memory Ultra-Dense 3D, 3D Thermal ScaffoldingSrimani, T. / Bechdolt, A. / Choi, S. / Gilardi, C. / Kasperovich, A. / Li, S. / Lin, Q. / Malakoutian, M. / McEwen, P. / Radway, R.M. et al. | 2023
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First Demonstration of Defect Elimination for Cryogenic Ge FinFET CMOS Inverter Showing Steep Subthreshold Slope by Using Ge-on-Insulator StructureYu, X.-R. / Hsieh, C.-C. / Chuang, M.-H. / Chiu, M.-Y. / Sun, T.-C. / Geng, W.-Z. / Chang, W.-H. / Shih, Y.-J. / Lu, W.-H. / Chang, W.-C. et al. | 2023
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Ultimate Layer Stacking Technology for High Density Sequential 3D IntegrationRadu, I. / Nguyen, B-Y. / Chang, C-H. / Neve, C. Roda / Gaudin, G. / Besnard, G. / Batude, P. / Loup, V. / Brunet, L. / Vandooren, A. et al. | 2023
- 1
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ESD Reliability in Advanced NodesPoon, Steven S. / Kao, Ming-Hong / Chang, Wei-Chao / Huang, Teng-Fu et al. | 2023
- 1
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BEOL-compatible 4F2 Single Crystalline Semiconductor Oscillator for Low-power and Large-scale Oscillatory Neural Network HardwareKim, Joon Pyo / Kim, Hyun Wook / Jeong, Jaeyong / Park, Juhyuk / Kim, Seong Kwang / Kim, Jongmin / Woo, Jiyong / Kim, Sanghyeon et al. | 2023
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A Highly Pitch-Scalable Capacitor-less 3D DRAM Using Cross-bar Selection with Gate-Controlled Thyristor (GCT) Featuring High Endurance and Free Read-DisturbChen, Wei-Chen / Lue, Hang-Ting / Wu, Ming-Hung / Lin, Yu-Tang / Wang, Keh-Chung / Lu, Chih-Yuan et al. | 2023
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The Challenges and Solutions of Cu/SiCN Wafer-to-Wafer Hybrid Bonding Scaling Down to 400nm PitchChew, Soon-Aik / Zhang, Boyao / Vanstreels, Kris / Chery, Emmanuel / De Messemaeker, Joke / Witters, Liesbeth / Van Sever, Koen / Iacovo, Serena / Dewilde, Sven / Stucchi, Michele et al. | 2023
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Monolayer-MoS2 Stacked Nanosheet Channel with C-type Metal ContactChung, Yun-Yan / Yun, Wei-Sheng / Chou, Bo-Jhih / Hsu, Chen-Feng / Yu, Shao-Ming / Arutchelvan, G. / Li, Ming-Yang / Lee, Tsung-En / Lin, Bo-Jiun / Li, Chen-Yi et al. | 2023
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Role of Inter-Layer Dielectric on the Electrical and Heat Dissipation Characteristics in the Heterogeneous 3D Sequential CFETs with Ge p-FETs on Si n-FETsKim, Seong Kwang / Lim, Hyeong-Rak / Shim, Joonsup / Baek, Woojin / Kim, Seongho / Park, Youngkeun / Jeong, Jaejoong / Lim, Jinha / Kim, Joon Pyo / Jeong, Jaeyong et al. | 2023
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NVDRAM: A 32Gb Dual Layer 3D Stacked Non-volatile Ferroelectric Memory with Near-DRAM Performance for Demanding AI WorkloadsRamaswamy, N. / Calderoni, A. / Zahurak, J. / Servalli, G. / Chavan, A. / Chhajed, S. / Balakrishnan, M. / Fischer, M. / Hollander, M. / Ettisserry, D. P. et al. | 2023
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Evaluation of (110) versus (001) Channel Orientation for Improved nFET/pFET Device Performance Trade-Off in Gate-All-Around Nanosheet TechnologyMochizuki, Shogo / Loubet, Nicolas / Mirdha, Pial / Durfee, Curtis / Zhou, Huimei / Tsusui, Gen / Frougier, Julien / Vega, Reinaldo / Qin, Liqiao / Felix, Nelson et al. | 2023
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Scaling opportunities for Gate-All-Around: A patterning perspectiveSeshadri, I. / Miller, E. / Church, J. / Chu, A. / Zhang, J. / Greene, A. / Frougier, J. / Li, T. / Cabrera, Y. / Kenath, G. et al. | 2023
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Ultimate MRAM Scaling: Design Exploration of High-Density, High-Performance and Energy-Efficient VGSOT for Last Level CacheGupta, M. / Xiangt, Y. / Garcia-Redondo, F. / Cai, K. / Abdi, D. / Liu, H.-H. / Rao, S. / Hiblot, G. / Couet, S. / Garcia-Bardon, M. et al. | 2023
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Semiconductor Challenges in the 5G and 6G Technology PlatformsEkelund, Bjorn et al. | 2023
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A Noble Design Methodology to Minimize Plasma Induced Damage Using a Distributed Network Model in VNAND Flash MemoryLee, Se Hoon / Um, Junghwan / Kim, Kanglib / Lee, Kyoungseo / Chang, Seongpil / Lee, Jaeshin / Han, Hunhee / Cho, Sungil / Lim, Junhee / Park, Minchul et al. | 2023
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Status and Perspectives of Chalcogenide-based CrossPoint MemoriesPellizzer, F. / Pirovano, A. / Bez, R. / Meyer, R. L. et al. | 2023
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Negative-U Defect Passivation in Oxide-Semiconductor by Channel Defect Self-Compensation Effect to Achieve Low Bias Stress VTH Instability of Low-Thermal Budget IGZO TFT and FeFETsChen, Chun-Kuei / Xu, Zefeng / Hooda, Sonu / Pan, Jieming / Zamburg, Evgeny / Thean, Aaron Voon-Yew et al. | 2023
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Back-Illuminated SPAD in 40 nm CIS Technology Achieving 56 ps Timing Jitter With 15 V Breakdown Voltage for Short/Mid-Range LiDAR ApplicationsPark, Eunsung / Eom, Doyoon / Kim, Joo-Hyun / An, Hyuk / Yi, Suhyun / Kim, Kyung-Do / Kim, Jongchae / Oh, Hoon-Sang / Choi, Woo-Young / Lee, Myung-Jae et al. | 2023
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Multi-gate FeFET Discriminates Spatiotemporal Pulse Sequences for Dendrocentric LearningChen, Hugo J.-Y. / Beauchamp, Matthew / Toprasertpong, Kasidit / Huang, Fei / Le Coeur, Louis / Nemec, Thorgund / Wong, H.-S. Philip / Boahen, Kwabena et al. | 2023
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Polarization Engineering in AlSiO/p-type GaN MOSFETs Using AIN Interlayers Formed by Plasma-Enhanced Atomic Layer DepositionIto, Kenji / Narita, Tetsuo / Iguchi, Hiroko / Iwasaki, Shiro / Kikuta, Daigo / Kano, Emi / Ikarashi, Nobuyuki / Tomita, Kazuyoshi / Horita, Masahiro / Suda, Jun et al. | 2023
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IL Scavenging and Recovery Strategies to Improve the Performance and Reliability of HZO-Based FeFETsKim, Bong Ho / Kim, Seong Kwang / Kuk, Song-hyeon / Suh, Yoon-Je / Jeong, Jaeyong / Kim, Joon Pyo / Geum, Dae-Myeong / Kim, Sanghyeon et al. | 2023
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Wafer-scale CVD Monolayer WSe2 p-FETs with Record-high 727 μA/μm Ion and 490 μS/ μm gmax via Hybrid Charge Transfer and Molecular DopingLan, Hao-Yu / Tripathi, Rahul / Liu, Xiangkai / Appenzeller, Joerg / Chen, Zhihong et al. | 2023
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Interlayer Engineering to Achieve <1 m2K/GW Thermal Boundary Resistances to Diamond for Effective Device CoolingWoo, K. / Malakoutian, M. / Jo, Y. / Zheng, X. / Pfeifer, T. / Mandia, R. / Hwang, T. / Aller, H. / Field, D. / Kasperovich, A. et al. | 2023
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3D Monolithically Integrated Device of Si CMOS Logic, IGZO DRAM-like, and 2D MoS2 Phototransistor for Smart Image SensingLee, F.M. / Tseng, P. H. / Lin, Y. Y. / Lin, Y. H. / Weng, W. L. / Lin, N. C. / Sung, P. J. / Yang, C. C. / Wu, W. F. / Shen, C. H. et al. | 2023
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1.1 A/mm ß-Ga2O3-on-SiC RF MOSFETs with 2.3 W/mm Pout and 30% PAE at 2 GHz and fT/fmax of 27.6/57 GHzZhou, Min / Zhou, Hong / Huang, Sen / Si, Mengwei / Zhang, Yuhao / Luan, Tiantian / Yue, Hongqing / Dang, Kui / Wang, Chenlu / Liu, Zhihong et al. | 2023
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A Novel FeFET Array-Based PUF: Co-optimization of Entropy Source and CRP Generation for Enhanced Robustness in IoT SecurityShao, Hanyong / Zhou, Yuejia / Huang, Weiqin / Su, Chang / Fu, Zhiyuan / Luo, Wenpu / Tang, Kechao / Huang, Ru et al. | 2023
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In-Memory Compute Chips with Carbon-based Projected Phase-Change Memory DevicesSyed, G. S. / Brew, K. / Vasilopoulos, A. / Jonnalagadda, V. P. / Kersting, B. / Philip, T. / Bragaglia, V. / Ambrogio, S. / Buchel, J. / Giannopoulos, J. et al. | 2023
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High-Performance Monolayer and Bilayer MoS2 Vibrating Channel Transistors for Ultrasensitive Drain-Source Current Readout of Resonant MotionEnamul Hoque Yousuf, S M / Feng, Philip X.-L. et al. | 2023
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Engineering the kinetics of redox-based memristive devices for neuromorphic computingDittmann, R. / Sarantopoulos, A. / Bengel, C. / Gutsche, A. / Cuppers, F. / Hoffmann-Eifert, S. / Menzel, S. et al. | 2023
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Wafer Bonding as Next Generation Scaling BoosterWernicke, T. / Lindner, P. / Uhrmann, T. / Wimplinger, M. et al. | 2023
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Thermal Management in Multi-Finger GaN-on-Si HEMTs: Understanding and Mitigating Self-Heating and Thermal Crosstalk for Enhanced Device ReliabilityJeong, Jaeyong / Choi, Sung Joon / Shim, Joonsup / Kim, Eunjung / Kim, Seong Kwang / Kim, Bong Ho / Kim, Joon Pyo / Suh, Yoon-Je / Beak, Woo Jin / Geum, Dae-Myeong et al. | 2023
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Demonstration of AlN-based Vertical p-n Diodes with Dopant-Free Distributed-Polarization DopingKumabe, T. / Yoshikawa, A. / Kushimoto, M. / Honda, Y. / Arai, M. / Suda, J. / Amano, H. et al. | 2023
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Wake-Up of Ultrathin Ferroelectric Hf0.5Zr0.5O2: The Origin and Physical ModelingCho, Chen-Yi / Chao, Tzu-Yi / Lin, Tzu-Yao / Wang, I-Ting / Chen, Yu-Sheng / Ong, Yi-Ching / Lin, Yu-De / Yeh, Po-Chun / Sheu, Shyh-Shyuan / Hou, Tuo-Hung et al. | 2023
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High Mobility TMD NMOS and PMOS Transistors and GAA Architecture for Ultimate CMOS ScalingPenumatcha, A. / O'Brien, K. P. / Maxey, K. / Mortelmans, W. / Steinhardt, R. / Dutta, S. / Dorow, C. J. / Naylor A., C. H. / Kitamura, Kitamura / Zhong, T. et al. | 2023
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High-Performance Gate-all-around Junctionless Vertical-Channel Transistors with the Ultra-low Sub-threshold Swing for Next-generation 4F2 DRAMYoo, Abraham / Jiang, Yi / Qiu, Yunsong / Zheng, Yuhong / Yang, Chen / Feng, Daohuan / Liao, Yucheng / Kong, Xiangbo / Xiao, Jianfeng / Xie, Dongsheng et al. | 2023
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Sustainability-Aware Technology Development at Applied MaterialsGross, B. J. / Neville Reyes, E. / Kapadia, S. et al. | 2023
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An Ultrafast (< 200 ns) Sparse Solution Solver made by HfWOx/VOy Threshold Tunable NeuronsChen, Zirui / Zhou, Yue / Xu, Hanxi / Fu, Yaoyao / Li, Yi / He, Y. / Miao, X.-S. / Mannocci, Piergiulio / Ielmini, Daniele et al. | 2023
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Advancing High-Performance Large-Scale Quantum Computing with Cryogenic 2D-CMOSAgashiwala, Kunjesh / Pal, Arnab / Cui, Hang / Chavan, Tanmay / Cao, Wei / Banerjee, Kaustav et al. | 2023
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Nanowell Field-Effect Transistors for Highly Sensitive Molecular DetectionLiu, L. / Santermans, S. / Barge, D. / Delport, J. / Chaudhuri, A. Ray / Willems, K. / Ha, S. / Severi, S. / Van Dorpe, P. / Martens, K. et al. | 2023
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A 3D-Integrated 2-Megapixel Imager with Sparse Capture and Fine-Grain Power GatingBerkovich, A. / Alkalay, S. / Tsai, T. / Liu, C. / Laiho, M. / Paasio, A. / Poikonen, J. / Gronroos, M. / Kutila, M. / Maki, P. et al. | 2023
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A Sub-100nA Ultra-low Leakage MCU Embedding Always-on Domain Hybrid Tunnel FET-CMOS on 300mm Foundry PlatformHou, Yaoru / Wang, Kaifeng / Liu-Sun, Chenxing / Hang, Jianfeng / Tong, Xinfang / Peng, Chunyu / Wu, Yongqin / Ren, Ye / Bu, Weihai / Si, Xin et al. | 2023
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Barrier Booster for Remote Extension Doping and its DTCO for 1D & 2D FETsGilardi, Carlo / Zeevi, Gilad / Choi, Suhyeong / Su, Sheng-Kai / Hung, Terry Y.T. / Li, Shengman / Safron, Nate / Lin, Qing / Srimani, Tathagata / Passlack, Matthias et al. | 2023
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A Workfunction Engineered Middle-Silicon-TiN Gate (MSTG) Cell Transistor in 16Gbit DRAM for High Scalability and Long Data RetentionRyu, Seong-Wan / Min, Kyung Kyu / Hwang, Sunghwan / Seung, Hyunmin / Yoon, Sungsoo / Nam, Yoonjae / Moon, Jungmin / Kim, Yaeji / Kim, Euntae / Park, Jongkook et al. | 2023
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Cross Dual-Pixel Twisted-Photodiode Image Sensor for All-Directional Auto FocusShirahige, D. / Fukuda, K. / Ikeda, H. / Onuki, Y. / Toyoguchi, G. / Sekine, H. / Hayashi, S. / Okamoto, K. / Wakashima, S. / Yoshida, R. et al. | 2023
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30 Mb/mm2/layer 3D eDRAM Computing-in-Memory with Embedded BEOL Peripherals and Local Layer-wise Calibration based on First-Demonstrated Vertically-stacked CAA-IGZO 4F2 2T0C CellTang, Wenjun / Chen, Chuanke / Liu, Jialong / Zhang, Chunyu / Gu, Chen / Duan, Xinlv / Yang, Huazhong / Li, Ling / Li, Xueqing / Geng, Di et al. | 2023
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A Materials-Device Co-Design Framework for Realizing Ultra Energy-Efficient All-2D Spin-Logic Circuits with 2D-MaterialsZhang, Shuo / Pal, Arnab / Yin, Wenyan / Cao, Wei / Banerjee, Kaustav et al. | 2023
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Design of Analog-AI Hardware Accelerators for Transformer-based Language Models (Invited)Burr, G. W. / Tsai, H. / Simon, W. / Boybat, I. / Ambrogio, S. / Ho, C.-E. / Liou, Z.-W. / Rasch, M. / Buchel, J. / Narayanan, P. et al. | 2023
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Two-metal-level semi-damascene interconnect at metal pitch 18 nm and aspect-ratio 6 routed using fully self-aligned viaGupta, Anshul / Marti, Giulio / Delie, Gilles / Kundu, Souvik / Decoster, Stefan / Pedreira, Olalla Varela / Kenens, Bart / Farokhnejad, Anita / Hermans, Yannick / Wachter, Bart de et al. | 2023
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On-chip sample preparation and biosensing: Can porous silicon membranes do it all?Leichle, T. / He, Y. / Vasconcellos, D. Silvade / Imbemon, E. / Bourrier, D. et al. | 2023
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High-performance and low parasitic capacitance CNT MOSFET: 1.2 mA/μm at VDS of 0.75 V by self-aligned doping in sub-20 nm spacerLi, Shengman / Chao, Tzu-Ang / Gilardi, Carlo / Safron, Nathaniel / Su, Sheng-Kai / Zeevi, Gilad / Bechdolt, Andrew Denis / Passlack, Matthias / Oberoi, Aaryan / Lin, Qing et al. | 2023
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First Determination of Thermal Resistance and Thermal Capacitance of Atomic-Layer-Deposited In2O3 TransistorsLin, J.-Y. / Zhang, Z. / Alajlouni, S. / Liao, P.-Y. / Lin, Z. / Niu, C. / Shakouri, A. / Ye, P. D. et al. | 2023
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<1ppm Device to Chip Level Reliability Characterization for High-Density DDR5 DRAMsLee, N-H / Lee, S. / Kim, G J. / Kim, Y J. / Woo, B W. / Lee, Y Y. / Kim, H K. / Kim, E J. / Lee, Y S. / Hwang, Y C et al. | 2023
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Case Study of Tactile Sensors: System-level Approach to Analog In-sensor ComputingMun, Min Young / Kim, Sei Joon / Yun, Seok Ju / Kim, Sang Joon et al. | 2023
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Back-end-of-line integration of 2D materials on silicon microchipsLanza, M. / Pazos, S. / Zhu, K. / Yuan, Y. / Shen, Y. / Alharbi, O. / Zheng, W. / Zhang, X. / Alshareef, H. N. et al. | 2023
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A Logic-Process Compatible RRAM with 15.43 Mb/mm2 Density and 10years@150°C retention using STI-less Dynamic-Gate and Self-Passivation SidewallWang, Qishen / Yang, Yuhang / Wang, Zongwei / Bao, Shengyu / Sun, Jingwei / Shan, Linbo / Bao, Lin / Gao, Yi / Zhang, Haisu / Ling, Yaotian et al. | 2023
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First Demonstration of Sequential Integration for Stacked Gate-All-Around a-IGZO Nanosheet Transistors with Record Id = 2.05 mA/µm, gm = 1.13 mS/µm and Ultralow SS = 66 mV/decLi, Qijun / Zhao, Wenjie / Hu, Qianlan / Gu, Chengru / Zhu, Shenwu / Liu, Honggang / Huang, Ru / Wu, Yanqing et al. | 2023
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First Demonstration of Top-Gate Indium-Tin-Oxide RF Transistors with Record High Cut-off Frequency of 48 GHz, Id of 2.32 mA/μm and gm of 900 μS/μm on SiC Substrate with Superior Reliability at 85 °CHu, Qianlan / Gu, Chengru / Liu, Shiyuan / Zeng, Min / Zhu, Shenwu / Kang, Jiyang / Liu, Ranhui / Zhao, Wenjie / Tong, Anyu / Li, Qijun et al. | 2023
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High-Endurance FeFET with Metal-Doped Interfacial Layer for Controlled Charge Trapping and Stabilized PolarizationSuzuki, Kunifumi / Sakuma, Kiwamu / Yoshimura, Yoko / Ichihara, Reika / Matsuo, Kazuhiro / Hagishima, Daisuke / Fujiwara, Makoto / Saitoh, Masumi et al. | 2023
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A Device Design Approach to Mitigate Strain Impact on Stretchable Carbon-Nanotube Thin-Film TransistorsWu, Can / Zhong, Donglai / Wang, Weichen / Jiang, Yuanwen / Nishio, Yuya / Yuan, Yujia / Tok, Jeffrey B.-H. / Bao, Zhenan et al. | 2023
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Unveiling the Impact of High Frequency On-State and Off-State Operation on Gate Dielectric Reliability: A Comprehensive AnalysisChang, Y. K. / Liao, P. J. / Liu, Y. S. / Chen, P. S. / Sou, K. P. / Wang, C. H. / Huang, T. J. / Chuang, W. H. / Lee, J. H. et al. | 2023
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Point-of-Care Testing (POCT) System based on self-Recovery Memoristor Chip with Low Energy Consuption(1.547 TOPS/W) and High Recognition (1142 fram/s)Zheng, Xu / Wu, Lizhou / Liu, Yixuan / Wu, Qiqiao / Xie, Yuanlu / Li, Yi / Lai, Jinru / Sun, Wenxuan / Dong, Danian / Yu, Jie et al. | 2023
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ESD HBM 3kV Discharge for Monolithic GaN-on-Si HEMTs Integrated ChinsWang, Tz-Wun / Go, Chang-Lin / Hung, Sheng-Hsi / Chen, Chi-Yu / Chiu, Po-Jui / Chen, Ke-Homg / Zheng, Kuo-Lin / Lin, Ying-Hsi / Tsai, Tsung-Yen / Lin, Shian-Ru et al. | 2023
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A Liouville Model for Polycrystalline Ferroelectrics Emphasizing Kinetic Integrity and Deployability in Circuits with Charge and Current ConstraintsYau, Zhao-Yi / Zhao, Ruiting / Wang, Zhenze / Lu, Tian / Liu, Houfang / Xue, Kan-Hao / Miao, Xiangshui / Yang, Yi / Ren, Tian-Ling et al. | 2023
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Reliability Assessment of Double-Gated Wafer-Scale MoS2 Field Effect Transistors through Hysteresis and Bias Temperature Instability AnalysesProvias, A. / Knobloch, T. / Kitamura, A. / O'Brien, K. P. / Dorow, C. J. / Waldhoer, D. / Stampfer, B. / Penumatcha, A. V. / Lee, S. / Ramamurthy, R. et al. | 2023
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Paradigm Shift in Semiconductor Technology Scaling Calling for Advancements in Design ModellingPrasad, Divya / Kini, Girish / Chandrasekaran, Sriram / Gurumurthi, Sudhanva / Novak, Amy / Burd, Tom et al. | 2023
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Simultaneously Achieving Large Gate Swing and Enhanced Threshold Voltage Stability in Metal/Insulator/n-GaN Gate HEMTYang, Junjie / Wei, Jin / Wang, Maojun / Li, Teng / Yu, Jingjing / Yang, Xuelin / Wang, Jinyan / Hao, Yilong / Shen, Bo et al. | 2023
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Low voltage (<1.8 V) and high endurance (>1M) 1-Selector/1-STT-MRAM with ultra-low (1 ppb) read disturb for high density embedded memory arraysAmbrosi, E. / Wu, C. H. / Song, M. Y. / Lee, H. Y. / Li, K. S. / Lin, C. C. / Hsu, C. F. / Kuo, C. C. / Chang, W. N. / Chen, Y. J. et al. | 2023
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First Demonstration of HZO-LNOI Integrated Ferroelectric Electro-Optic Modulator and Memory to Enable Reconfigurable Photonic SystemsXu, Zefeng / Chen, Chun-Kuei / Lin, Hong-Lin / Gao, Yuan / Ke, Wei / Xu, Baochang / Dmitriev, Pavel / Arbiz, Carlan / Zamburg, Evgeny / Touzard, Steven et al. | 2023
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High-Speed Embedded Memory for AI and High-Performance ComputeWang, Yih / Chen, Yen-Huei / Chih, Y.D. / Fujiwara, Hidehiro / Mori, Haruki / Wang, Yu-Jen / Chang, Tsung-Yung Jonathan et al. | 2023
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THz InP/GaAsSb DHBTs with Record fAVG=800 GHz: Characterization to 330 GHzArabhavi, A.M. / Deng, M. / Ciabattini, F. / Hamzeloui, S. / Saranovac, T. / Chaudhary, R. / Ebrahimi, M. / Ostinelli, O. / Maneux, C. / Bolognesi, C.R. et al. | 2023
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A Low Phase Noise Piezoelectric MEMS Oscillator with Low Power ConsumptionLo, Pang-Che / Lin, Wei / Li, Sheng-Shian et al. | 2023
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3D sequential integration with Si CMOS stacked on 28nm industrial FDSOI with Cu-ULK iBEOL featuring RO and HDR pixelMota-Frutuoso, T. / Lapras, V. / Brunet, L. / Basset, L. / Lugo, J. / Fenouillet-Beranger, C. / Vinet, M. / Lattard, D. / Boulard, F. / Exbraya, Y. et al. | 2023
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High Area Efficiency (6 TOPS/mm2) Multimodal Neuromorphic Computing System Implemented by 3D Multifunctional RRAM ArraySun, Wenxuan / Li, Yi / Zhang, Woyu / Zheng, Xu / Dong, Danian / Yu, Jie / Lai, Jinru / Fan, Shaoyang / Wang, Hongzhou / Xu, Xiaoxin et al. | 2023
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AC Impedance Characteristics of Ferroelectric Hf0.5Zr0.5O2: from 1 kHz to 10 GHzKim, Taekyong / Borujeny, Elham Rafie / Sardinero-Meiras, Ignacio / Grajal, Jesus / Cadien, Kenneth C. / Antoniadis, Dimitri A. / Del Alamo, Jesus A. et al. | 2023
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Intercalated Graphene as Next Generation Back-end-of-Line ConductorsLi, S. W. / Chan, Y. C. / Hsu, C. H. / Yang, S. Y. / Liao, K. Y. / Ho, C. H. / Chen, C. Y. / Chen, H. P. / Lee, M. H. / Magyari-Kope, B. et al. | 2023