k-Terminal Reliability of Ad Hoc Networks Considering the Impacts of Node Failures and Interference (English)
- New search for: Xiang, Shihu
- Further information on Xiang, Shihu:
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https://orcid.org/0000-0001-5647-0210
- New search for: Yang, Jun
- Further information on Yang, Jun:
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https://orcid.org/0000-0002-1428-0280
- New search for: Xiang, Shihu
- Further information on Xiang, Shihu:
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https://orcid.org/0000-0001-5647-0210
- New search for: Yang, Jun
- Further information on Yang, Jun:
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https://orcid.org/0000-0002-1428-0280
In:
IEEE Transactions on Reliability
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69
, 2
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725-739
;
2020
- Article (Journal) / Electronic Resource
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Title:k-Terminal Reliability of Ad Hoc Networks Considering the Impacts of Node Failures and Interference
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Contributors:Xiang, Shihu ( author ) / Yang, Jun ( author )
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Published in:IEEE Transactions on Reliability ; 69, 2 ; 725-739
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Publisher:
- New search for: IEEE
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Publication date:2020-06-01
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Size:1139650 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 69, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 414
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Reliabilities of Some Multistate Consecutive-k SystemsYi, He / Cui, Lirong / Gao, Hongda et al. | 2020
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An Adjustable and Fast Error Repair Scrubbing Method Based on Xilinx Essential Bits Technology for SRAM-Based FPGAZhang, Rongsheng / Xiao, Liyi / Li, Jie / Cao, Xuebing / Li, Linzhe et al. | 2020
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Improved Decomposed-Coordinated Kriging Modeling Strategy for Dynamic Probabilistic Analysis of Multicomponent StructuresLu, Cheng / Feng, Yun-Wen / Fei, Cheng-Wei / Bu, Si-Qi et al. | 2020
- 458
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Color Degradation of Printed ImagesWang, Ziyi / Elsayed, Elsayed A. et al. | 2020
- 471
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Extend GO Methodology to Support Common-Cause Failures Modeling Explicitly by Means of Bayesian NetworksYe, Tianyuan / Zhou, Yuan / Chen, Anran / Liu, Linlin / Liu, Shouwen et al. | 2020
- 484
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A Model-Ranking Approach for Estimation Based on Accelerated Degradation Test DataLi, Ling / Ng, Hon Keung Tony / Algarni, Ali H. / Almarashi, Abdullah M. / Abo-Eleneen, Zaher A. et al. | 2020
- 497
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Algorithm for Solving Optimal Arrangement Problem in Connected-$(r,s)$-out-of-$(m,n)$:F Lattice SystemNakamura, Taishin / Yamamoto, Hisashi et al. | 2020
- 510
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Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated CircuitsYuan, Tao / Bae, Suk Joo / Kuo, Yue et al. | 2020
- 522
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A New Study on Reliability Importance Analysis of Phased Mission SystemsHuang, Xianzhen / Coolen, Frank P. A. / Coolen-Maturi, Tahani / Zhang, Yimin et al. | 2020
- 533
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Objective Comparison of Confidence Bound Methods for Binomial Series System ReliabilitySchuberg, Edward / Myhre, Janet / Jeske, Daniel R. / McQuarrie, Allan D. / Warfield, Joseph D. et al. | 2020
- 545
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Time-Dependent Reliability Analysis of Deteriorating Structures Based on Phase-Type DistributionsLi, Junxiang / Chen, Jianqiao / Zhang, Xiaosheng et al. | 2020
- 558
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An Empirical Study of Regression Bug Chains in LinuxXiao, Guanping / Zheng, Zheng / Jiang, Bo / Sui, Yulei et al. | 2020
- 571
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Reliability Improvement Allocation Method Considering Common Cause FailuresCao, Yingsai / Liu, Sifeng / Fang, Zhigeng / Dong, Wenjie et al. | 2020
- 581
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Modeling of Timing Constraints in Hybrid Systems Using Event-BSu, Wen et al. | 2020
- 594
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A System-Level Framework for Analytical and Empirical Reliability Exploration of STT-MRAM CachesCheshmikhani, Elham / Farbeh, Hamed / Asadi, Hossein et al. | 2020
- 611
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Diversity-Oriented Test Suite Generation for EFSM ModelZhao, Ruilian / Wang, Weiwei / Song, Yuqi / Li, Zheng et al. | 2020
- 632
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Automated Prototype Generation From Formal Requirements ModelYang, Yilong / Li, Xiaoshan / Ke, Wei / Liu, Zhiming et al. | 2020
- 657
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Semiautomated Metamorphic Testing Approach for Geographic Information Systems: An Empirical StudyHui, Zhan-Wei / Huang, Song / Chua, Caslon / Chen, Tsong Yueh et al. | 2020
- 674
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Runtime Verification on Hierarchical Properties of ROS-Based Robot SwarmsHu, Chi / Dong, Wei / Yang, Yonghui / Shi, Hao / Zhou, Ge et al. | 2020
- 690
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Vulnerabilities and Reliability of ReRAM Based PUFs and Memory LogicSchultz, Thomas / Jha, Rashmi / Casto, Matt / Dupaix, Brian et al. | 2020
- 699
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A Moment Approach to Positioning Accuracy Reliability Analysis for Industrial RobotsWu, Jinhui / Zhang, Dequan / Liu, Jie / Han, Xu et al. | 2020
- 715
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On Reliability of Multiprocessor System Based on Star GraphLv, Mengjie / Zhou, Shuming / Chen, Gaolin / Chen, Lanxiang / Liu, Jiafei / Chang, Chin-Chen et al. | 2020
- 725
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k-Terminal Reliability of Ad Hoc Networks Considering the Impacts of Node Failures and InterferenceXiang, Shihu / Yang, Jun et al. | 2020
- 740
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An FTA Method for the Unavailability of Supply in Gas Networks Supported by Physical ModelsGjorgiev, Blaze / Antenucci, Andrea / Volkanovski, Andrija / Sansavini, Giovanni et al. | 2020
- 754
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Entropy Based Fault Classification Using the Case Western Reserve University Data: A Benchmark StudyLi, Yongbo / Wang, Xianzhi / Si, Shubin / Huang, Shiqian et al. | 2020
- 768
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Nonlinear-Drifted Fractional Brownian Motion With Multiple Hidden State Variables for Remaining Useful Life Prediction of Lithium-Ion BatteriesZhang, Heng / Mo, Zhenling / Wang, Jianyu / Miao, Qiang et al. | 2020
- 781
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A Hybrid Condition-Based Maintenance Model for Deteriorating Systems Subject to Nonmemoryless Imperfect Repairs and Perfect ReplacementsHuynh, Khac Tuan et al. | 2020
- 816
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A Generic Framework for Generalized Virtual Age ModelsDoyen, Laurent / Drouilhet, Remy / Breniere, Lea et al. | 2020
- 833
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Aging Mitigation in FPGAs Considering Delay, Power, and TemperatureMottaghi, Mohammad Hadi / Sedighi, Mehdi / Zamani, Morteza Saheb et al. | 2020
- C1
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Table of Contents| 2020
- C2
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IEEE Reliability Society| 2020