Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors (English)
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In:
IEEE Transactions on Nuclear Science
;
58
, 3
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1315-1323
;
2011
- Article (Journal) / Electronic Resource
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Title:Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel Detectors
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Contributors:Koybasi, O ( author ) / Alagoz, E ( author ) / Krzywda, A ( author ) / Arndt, K ( author ) / Bolla, G ( author ) / Bortoletto, D ( author ) / Hansen, Thor-Erik ( author ) / Hansen, T A ( author ) / Jensen, G U ( author ) / Kok, A ( author )
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Published in:IEEE Transactions on Nuclear Science ; 58, 3 ; 1315-1323
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Publisher:
- New search for: IEEE
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Publication date:2011-06-01
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Size:1544383 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 58, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 577
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Table of contents| 2011
- 579
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SCINTILLATORS AND DETECTORS - A Feasibility Study on the Use of Optical Fibers for the Transfer of Scintillation Light to Silicon PhotomultipliersHong, S J et al. | 2011
- 579
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A Feasibility Study on the Use of Optical Fibers for the Transfer of Scintillation Light to Silicon PhotomultipliersSeong Jong Hong, / Chan Mi Kim, / Sung Mook Cho, / Heon Woo, / Guen Bae Ko, / Sun Il Kwon, / June Tak Rhee, / In Chan Song, / Jae Sung Lee, et al. | 2011
- 590
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Study of PET Detector Performance With Varying SiPM Parameters and Readout SchemesXiaoli Li, / Lockhart, C / Lewellen, T K / Miyaoka, R S et al. | 2011
- 597
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Time-Based Readout of a Silicon Photomultiplier (SiPM) for Time of Flight Positron Emission Tomography (TOF-PET)Powolny, F / Auffray, E / Brunner, S E / Garutti, E / Goettlich, M / Hillemanns, H / Jarron, P / Lecoq, P / Meyer, T / Schultz-Coulon, H C et al. | 2011
- 605
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Gamma-Ray Point-Source Detection in Unknown Background Using 3D-Position-Sensitive Semiconductor DetectorsWahl, C G / Zhong He, et al. | 2011
- 614
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Evaluation of Energy Loss and Charge Sharing in Cadmium Telluride Detectors for Photon-Counting Computed TomographyCheng Xu, / Danielsson, M / Bornefalk, H et al. | 2011
- 626
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Ultra-High Resolution LYSO PQS-SSS Heptahedron Blocks for Low-Cost MuPETRamirez, R A / Shaohui An, / Shitao Liu, / Yuxuan Zhang, / Hongdi Li, / Baghaei, H / Chao Wang, / Wai-Hoi Wong, et al. | 2011
- 634
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Depth-of-Interaction Compensation Using a Focused-Cut Scintillator for a Pinhole Gamma CameraAlhassen, F / Kudrolli, H / Singh, B / Kim, S / Seo, Y / Gould, R G / Nagarkar, V V et al. | 2011
- 634
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CAMERA DESIGN AND IMAGING PERFORMANCE - Depth-of-Interaction Compensation Using a Focused-Cut Scintillator for a Pinhole Gamma CameraAlhassen, F et al. | 2011
- 639
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Towards Optimal Collimator Design for the PEDRO Hybrid Imaging SystemNguyen, C V / Gillam, J E / Brown, J M C / Martin, D V / Nikulin, D A / Dimmock, M R et al. | 2011
- 651
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Development of a Fillable, Tapered PET/CT PhantomWilson, J M / Lokitz, S J / Turkington, T G et al. | 2011
- 660
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Development of an Anthropomorphic Breast Phantom for Combined PET, B-Mode Ultrasound and Elastographic ImagingJun Dang, / Frisch, B / Lasaygues, P / Dachun Zhang, / Tavernier, S / Felix, N / Lecoq, P / Auffray, E / Varela, Joao / Mensah, Serge et al. | 2011
- 668
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Development of a Brain PET System, PET-Hat: A Wearable PET System for Brain ResearchYamamoto, S / Honda, M / Oohashi, T / Shimizu, K / Senda, M et al. | 2011
- 674
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Development of a PET-Transrectal Ultrasound Prostate Imaging SystemHuber, Jennifer S / Qiyu Peng, / Moses, William W / Reutter, Bryan W / Pouliot, Jean / Hsu, I Chow et al. | 2011
- 682
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Validation of a GATE Model of Formula Not Shown Lu Intrinsic Radioactivity in LSO PET SystemsMcIntosh, B. / Stout, D. B. / Goertzen, A. L. et al. | 2011
- 682
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Validation of a GATE Model of $^{176}$Lu Intrinsic Radioactivity in LSO PET SystemsMcIntosh, B / Stout, D B / Goertzen, A L et al. | 2011
- 687
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Monitoring Energy Calibration Drift Using the Scintillator Background RadiationConti, M / Eriksson, L / Hayden, C et al. | 2011
- 695
-
Reprogrammable Acquisition Architecture for Dedicated Positron Emission TomographySportelli, G / Belcari, N / Guerra, P / Spinella, F / Franchi, G / Attanasi, F / Moehrs, S / Rosso, V / Santos, A / Del Guerra, A et al. | 2011
- 703
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IMAGE RECONSTRUCTION AND DATA PROCESSING - Measurement of the MTF of a Cone-Beam Breast Computed Tomography Laboratory ScannerMettivier, G et al. | 2011
- 703
-
Measurement of the MTF of a Cone-Beam Breast Computed Tomography Laboratory ScannerMettivier, G / Russo, P et al. | 2011
- 714
-
Wavelet Thresholding-Based Denoising Method of List-Mode MLEM Algorithm for Compton ImagingFrandes, M / Magnin, I E / Prost, R et al. | 2011
- 724
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Data-Driven Problem Reduction for Image Reconstruction From Projections Using Gift WrappingGregor, Jens et al. | 2011
- 730
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Comparison of Brain Phantom Lesion Imaging Capability of the Brain and Whole-Body Modes of the Transformable HOTPET CameraBaghaei, H / Hongdi Li, / Yuxuan Zhang, / Ramirez, R A / Shitao Liu, / Chao Wang, / Shaohui An, / Wai-Hoi Wong, et al. | 2011
- 736
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PVE Correction in PET-CT Whole-Body Oncological Studies From PVE-Affected ImagesGallivanone, F / Stefano, A / Grosso, E / Canevari, C / Gianolli, L / Messa, C / Gilardi, M C / Castiglioni, I et al. | 2011
- 748
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Have you visited lately? www.ieee.org| 2011
- 753
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EDITORIAL - Comments by the EditorsSchwank, J et al. | 2011
- 753
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Comments by the EditorsSchwank, James / Marshall, Paul / Brown, Dennis et al. | 2011
- 754
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LIST OF REVIEWERS - List of Reviewers| 2011
- 754
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List of Reviewers| 2011
- 756
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NIEL Scaling: Comparison With Measured Defect Introduction Rate in SiliconArnolda, P / Inguimbert, C / Nuns, T / Boatella-Polo, C et al. | 2011
- 756
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SESSION A: BASIC MECHANISMS - NIEL Scaling: Comparison With Measured Defect Introduction Rate in SiliconArnolda, P et al. | 2011
- 764
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Effect of Ionizing Radiation on Defects and Formula Not Shown Noise in Ge pMOSFETsZhang, C. X. / Francis, S. A. / En Xia, Z. / Fleetwood, D. M. / Schrimpf, R. D. / Galloway, K. F. / Simoen, E. / Mitard, J. / Claeys, C. et al. | 2011
- 764
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Effect of Ionizing Radiation on Defects and $1/f$ Noise in Ge pMOSFETsZhang, Cher Xuan / Francis, S A / En Xia Zhang, / Fleetwood, D M / Schrimpf, R D / Galloway, K F / Simoen, E / Mitard, J / Claeys, C et al. | 2011
- 770
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Modeling of the Tunneling Current in MOS Devices After Proton Irradiation Using a Nonlinear Series Resistance CorrectionPalumbo, F / Miranda, E et al. | 2011
- 776
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TID-Induced Degradation in Static and Noise Behavior of Sub-100 nm Multifinger Bulk NMOSFETsRatti, L / Gaioni, L / Manghisoni, M / Re, V / Traversi, G et al. | 2011
- 785
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Verilog-A Modeling of Radiation-Induced Mismatch EnhancementGorbunov, M S / Danilov, I A / Zebrev, G I / Osipenko, P N et al. | 2011
- 785
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SESSION B: DEVICES AND INTEGRATED CIRCUITS - Verilog-A Modeling of Radiation-Induced Mismatch EnhancementGorbunov, M S et al. | 2011
- 793
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Modeling Inter-Device Leakage in 90 nm Bulk CMOS DevicesEsqueda, I S / Barnaby, H J / Holbert, K E / Boulghassoul, Y et al. | 2011
- 800
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Proton-Induced Mobility Degradation in FinFETs With Stressor Layers and Strained SOI SubstratesKobayashi, D / Simoen, E / Put, S / Griffoni, A / Poizat, M / Hirose, K / Claeys, C et al. | 2011
- 808
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Floating Gate PMOS Dosimeters Under Bias Controlled Cycled MeasurementInza, M G / Lipovetzky, J / Redin, E G / Carbonetto, S / Faigon, A et al. | 2011
- 813
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Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power DevicesMiller, F / Morand, S / Douin, A / Gaillard, R / Carriere, T / Buard, N et al. | 2011
- 820
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Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing TechniquesSchwank, J R / Shaneyfelt, M R / Dodd, P E / McMorrow, D / Vizkelethy, G / Ferlet-Cavrois, V / Gouker, P M / Flores, R S / Stevens, J / Buchner, S B et al. | 2011
- 820
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SESSION C: SINGLE-EVENT EFFECTS 1: MECHANISMS AND MODELING - Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing TechniquesSchwank, J R et al. | 2011
- 827
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Heavy-Ion Induced Threshold Voltage Shifts in Sub 70-nm Charge-Trap Memory CellsGerardin, S / Bagatin, M / Paccagnella, A / Visconti, A / Greco, E et al. | 2011
- 834
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Impact of Process Variations on SRAM Single Event UpsetsKauppila, A V / Bhuva, B L / Kauppila, J S / Massengill, L W / Holman, W T et al. | 2011
- 840
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Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological NodeRaine, M / Hubert, G / Gaillardin, M / Artola, L / Paillet, P / Girard, S / Sauvestre, J-E / Bournel, A et al. | 2011
- 848
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14 MeV Neutrons SEU Cross Sections in Deep Submicron Devices Calculated Using Heavy Ion SEU Cross SectionsHaran, A / Barak, J / Weissman, L / David, D / Keren, E et al. | 2011
- 855
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Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and NeutronsRech, P / Galliere, J-M / Girard, P / Wrobel, F / Saigne, F / Dilillo, L et al. | 2011
- 862
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Simulation of Single and Multi-Node Collection: Impact on SEU Occurrence in Nanometric SRAM CellsToure, G / Hubert, G / Castellani-Coulie, K / Duzellier, S / Portal, J et al. | 2011
- 870
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Circuit Effect on Collection Mechanisms Involved in Single Event Phenomena: Application to the Response of a NMOS Transistor in a 90 nm SRAM CellCastellani-Coulie, K / Toure, G / Portal, J-M / Ginez, O / Aziza, H / Lesea, A et al. | 2011
- 877
-
Accurate Modeling of Single-Event Transients in a SiGe Voltage Reference CircuitMoen, K A / Najafizadeh, L / Jung Seungwoo, / Raman, A / Turowski, M / Cressler, J D et al. | 2011
- 885
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Layout Technique for Single-Event Transient Mitigation via Pulse QuenchingAtkinson, N M / Witulski, A F / Holman, W T / Ahlbin, J R / Bhuva, B L / Massengill, L W et al. | 2011
- 891
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SESSION D: PHOTONICS - Dose Rate and Static/Dynamic Bias Effects on CCDs DegradationMartin, E et al. | 2011
- 891
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Dose Rate and Static/Dynamic Bias Effects on CCDs DegradationMartin, E / Nuns, T / David, Jean-Pierre / Gilard, O / Boutillier, M / Penquer, A et al. | 2011
- 899
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High Energy Electron-Induced Transients In A Shielded Focal PlaneAuden, Array E C et al. | 2011
- 899
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High Energy Electron-Induced Transients In a Shielded Focal Plane ArrayAuden, E C / Weller, R A / Mendenhall, M H / Reed, R A / Schrimpf, R D / King, M P / Dodds, N A / Arpin, L A / Asai, M et al. | 2011
- 906
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Comparison of the Radiation Sensitivity of Fiber Bragg Gratings Made by Four Different ManufacturersHoeffgen, S K / Henschel, H / Kuhnhenn, J / Weinand, U / Caucheteur, C / Grobnic, D / Mihailov, S J et al. | 2011
- 910
-
Modeling Neutron Interactions and Charge Collection in the Imaging Single-Event Effects MonitorXiao Xiao Cai, / Platt, S P et al. | 2011
- 916
-
In Flight Measurements of Radiation Environment on Board the French Satellite JASON-2Boscher, D / Bourdarie, S A / Falguere, D / Lazaro, D / Bourdoux, P / Baldran, T / Rolland, G / Lorfevre, E / Ecoffet, R et al. | 2011
- 916
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SESSION E: SPACE AND TERRESTRIAL ENVIRONMENTS - In Flight Measurements of Radiation Environment on Board the French Satellite JASON-2Boscher, D et al. | 2011
- 923
-
JOSE: A New Jovian Specification Environment ModelSicard-Piet, A / Bourdarie, S / Krupp, N et al. | 2011
- 932
-
FLUKA Simulations for SEE Studies of Critical LHC Underground AreasRoed, K / Boccone, V / Brugger, M / Ferrari, A / Kramer, D / Lebbos, E / Losito, R / Mereghetti, A / Spiezia, G / Versaci, R et al. | 2011
- 939
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First In-Flight Data Analysis of Displacement Damage on the OSL Sensor On-Board CARMEN-2Deneau, C / Vaille, J-R / Dusseau, L / Mekki, J / Garcia, P / Bezerra, F / Lorfevre, E / Ecoffet, R et al. | 2011
- 945
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Experimental Characterization of an Atmospheric Environment With a Stratospheric BalloonWrobel, F / Vaille, J / Pantel, D / Dilillo, L / Rech, P / Galliere, J / Touboul, A / Chadoutaud, P / Cocquerez, P / Lacourty, M et al. | 2011
- 952
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Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission NeutronsHands, A / Morris, P / Dyer, C / Ryden, K / Truscott, P et al. | 2011
- 952
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SESSION F: SINGLE-EVENT EFFECTS 2: DEVICES AND INTEGRATED CIRCUITS - Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission NeutronsHands, A et al. | 2011
- 960
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Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-RaysRoche, N J.-H / Dusseau, L / Mekki, J / Perez, S / Vaille, J.-R / Gonzalez Velo, Yago / Boch, J / Saigne, F / Marec, R / Calvel, P et al. | 2011
- 969
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Impact of Technology Scaling on the Heavy-Ion Upset Cross Section of Multi-Level Floating Gate CellsBagatin, M / Gerardin, S / Paccagnella, A / Visconti, A et al. | 2011
- 975
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Incremental Enhancement of SEU Hardened 90 nm CMOS Memory CellHaddad, N F / Kelly, A T / Lawrence, R K / Bin Li, / Rodgers, J C / Ross, J F / Warren, K M / Weller, R A / Mendenhall, M H / Reed, R A et al. | 2011
- 981
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Improving Memory Reliability Against Soft Errors Using Block ParityReviriego, P / Argyrides, C / Maestro, J A / Pradhan, D K et al. | 2011
- 987
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Application-Oriented SEU Cross-Section of a Processor Soft Core for Atmel RHBD FPGAsBattezzati, N / Margaglia, F / Violante, M / Decuzzi, F / Codinachs, D M / Bancelin, B et al. | 2011
- 993
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Detecting SEEs in Microprocessors Through a Non-Intrusive Hybrid TechniqueAzambuja, J R / Lapolli, A / Rosa, L / Kastensmidt, F L et al. | 2011
- 1001
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The Technology Demonstration Module On-Board PROBA-IIHarboe-Sorensen, R / Poivey, C / Fleurinck, N / Puimege, K / Zadeh, A / Guerre, F-X / Lochon, F / Kaddour, M / Li, L / Walter, D et al. | 2011
- 1008
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Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology NodeLoveless, T D / Jagannathan, S / Reece, T / Chetia, J / Bhuva, B L / McCurdy, M W / Massengill, L W / Wen, S-J / Wong, R / Rennie, D et al. | 2011
- 1015
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SEU Analysis of Complex Circuits Implemented in Actel RTAX-S FPGA DevicesBerg, M / Kim, H / Friendlich, M / Perez, C / Seidleck, C / LaBel, K / Ladbury, R et al. | 2011
- 1015
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SESSION G: RADIATION HARDNESS ASSURANCE - SEU Analysis of Complex Circuits Implemented in Actel RTAX-S FPGA DevicesBerg, M et al. | 2011
- 1023
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Analysis of Low Dose Rate Effects on Parasitic Bipolar Structures in CMOS Processes for Mixed-Signal Integrated CircuitsKruckmeyer, K / Prater, J S / Brown, B / Trinh, T et al. | 2011
- 1032
-
Experimental Demonstration of Pattern Influence on DRAM SEU and SEFI Radiation SensitivitiesBougerol, A / Miller, F / Guibbaud, N / Leveugle, R / Carriere, T / Buard, N et al. | 2011
- 1040
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Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate ArraysAllen, G / Edmonds, L D / Swift, G / Carmichael, C / Chen Wei Tseng, / Heldt, K / Anderson, S A / Coe, M et al. | 2011
- 1047
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Worst-Case Test Vectors for Logic Faults Induced by Total Dose in ASICs Using CMOS Processes Exhibiting Field-Oxide LeakageAbou-Auf, Ahmed A / Abdel-Aziz, H A / Wassal, A G et al. | 2011
- 1053
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Sensitivity Evaluation Method for Aerospace Digital Systems With Collaborative HardeningPortela-Garcia, M / Garcia-Valderas, M / San Millan, Enrique / Lopez-Ongil, C / Entrena, L / Martin-Ortega, A / de Mingo, Jose Ramon / Rodriguez, S et al. | 2011
- 1059
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A Novel Co-Design Approach for Soft Errors Mitigation in Embedded SystemsCuenca-Asensi, S / Martinez-Alvarez, A / Restrepo-Calle, F / Palomo, F R / Guzman-Miranda, H / Aguirre, M A et al. | 2011
- 1059
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SESSION H: TECHNOLOGY AND DESIGN HARDENING - A Novel Co-Design Approach for Soft Errors Mitigation in Embedded SystemsCuenca-Asensi, S et al. | 2011
- 1066
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Phase-Dependent Single-Event Sensitivity Analysis of High-Speed A/MS Circuits Extracted from Asynchronous MeasurementsArmstrong, S E / Loveless, T D / Hicks, J R / Holman, W T / McMorrow, D / Massengill, L W et al. | 2011
- 1072
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Increasing Reliability of FPGA-Based Adaptive Equalizers in the Presence of Single Event UpsetsShih-Fu Liu, / Sorrenti, G / Reviriego, P / Casini, F / Maestro, J A / Alderighi, M et al. | 2011
- 1078
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Analysis of SET Effects in a PIC Microprocessor for Selective HardeningEntrena, L / Lindoso, A / Valderas, M G / Portela, M / Ongil, C L et al. | 2011
- 1086
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Alpha-Particle Induced Soft-Error Rate in CMOS 130 nm SRAMMartinie, S / Autran, J L / Uznanski, S / Roche, P / Gasiot, G / Munteanu, D / Sauze, S et al. | 2011
- 1086
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SESSION I: GROUND LEVEL EFFECTS - Alpha-Particle Induced Soft-Error Rate in CMOS 130 nm SRAMMartinie, S et al. | 2011
- 1093
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Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS TechnologyGadlage, M J / Ahlbin, J R / Bhuva, B L / Hooten, N C / Dodds, N A / Reed, R A / Massengill, L W / Schrimpf, R D / Vizkelethy, G et al. | 2011
- 1098
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Uranium and Thorium Contribution to Soft Error Rate in Advanced TechnologiesGedion, M / Wrobel, F / Saigne, F / Schrimpf, R D et al. | 2011
- 1104
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SESSION J: DOSIMETRY - The Use of Electron-Beam Lithography for Localized Micro-Beam IrradiationsGonzalez-Velo, Y et al. | 2011
- 1104
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The Use of Electron-Beam Lithography for Localized Micro-Beam IrradiationsGonzalez-Velo, Y / Boch, J / Pichot, F / Mekki, J / Roche, N J.-H / Perez, S / Deneau, C / Vaille, J.-R / Dusseau, L / Saigne, F et al. | 2011
- 1112
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The Effect of Magnetic Field on Readout of Diodes Used as NIEL CountersMandic, I / Ravotti, F / Glaser, M / Sersa, I / Hartert, J / Franz, S / Cindro, V / Dolenc, I / Gorisek, A / Kramberger, G et al. | 2011
- 1117
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LHC RadMon SRAM Detectors Used at Different Voltages to Determine the Thermal Neutron to High Energy Hadron Fluence RatioKramer, D / Brugger, M / Klupak, V / Pignard, C / Roeed, K / Spiezia, G / Viererbl, L / Wijnands, T et al. | 2011
- 1123
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Design of a Detector for Characterizing Neutron Fields for Single-Event Effects TestingXiao Xiao Cai, / Platt, S P / Monk, S D et al. | 2011
- 1129
-
Conference Author Index| 2011
- 1132
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Leading the field since 1884| 2011
- 1135
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Radiation Hard Silicon Strips Detectors for the SLHCMiñano, Mercedes et al. | 2011
- 1135
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ADVANCEMENTS IN NUCLEAR INSTRUMENTATION, MEASUREMENT METHODS AND THEIR APPLICATIONS (ANIMMA 2009)MARSEILLES, FRANCE, JUNE 7-10, 2009 - Radiation Hard Silicon Strips Detectors for the SLHCMiñano, M et al. | 2011
- 1141
-
Development of On-Line Tritium Monitor Based Upon Artificial Diamond for Fusion ApplicationsPillon, M / Angelone, M / Batistoni, P / Villari, R / Almaviva, S / Marinelli, M / Milani, E / Prestopino, G / Verona, C / Rinati, G V et al. | 2011
- 1145
-
Extension of the Linear Depth Attenuation Method for the Radioactivity Depth Analysis Tool (RADPAT)Shippen, B A / Joyce, M J et al. | 2011
- 1151
-
Status of Development on $^{99}$Mo Production Technologies in JMTRInaba, Y / Iimura, K / Hosokawa, J / Izumo, H / Hori, N / Ishitsuka, E et al. | 2011
- 1151
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Status of Development on Formula Not Shown Mo Production Technologies in JMTRInaba, Y. / Iimura, K. / Hosokawa, J. / Izumo, H. / Hori, N. / Ishitsuka, E. et al. | 2011
- 1159
-
sIGAle, a New Code for Automatically Determining Radionuclide Activities Using CdZnTe SpectrometryEspagnon, I / Simon, A C / Lamadie, F / Mahe, C et al. | 2011
- 1166
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Application of the Modified Source Multiplication (MSM) Technique to Subcritical Reactivity Worth Measurements in Thermal and Fast Reactor SystemsBlaise, P / Mellier, F / Fougeras, P et al. | 2011
- 1177
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Development and Studies of Novel Microfabricated Radiation Hard Scintillation Detectors With High Spatial ResolutionMapelli, A / Gorini, B / Haguenauer, M / Jiguet, S / Vico Trivino, N / Renaud, P et al. | 2011
- 1181
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ACCELERATOR TECHNOLOGY - Computation of Cyclotron Electromagnetic FieldsVorozhtsov, S B et al. | 2011
- 1181
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Computation of Cyclotron Electromagnetic FieldsVorozhtsov, S B / Vorozhtsov, A S / Watanabe, S / Kubono, S / Goto, A et al. | 2011
- 1188
-
Influence of Cyclotron Magnet Gap Size on Stripping ExtractionRistic-Djurovic, J L / Neskovic, N et al. | 2011
- 1196
-
A Time-Pickoff Method Using Automatic Gain Control to Reduce Time WalkHansang Lim, et al. | 2011
- 1196
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ANALOG AND DIGITAL CIRCUITS - A Time-Pickoff Method Using Automatic Gain Control to Reduce Time WalkLim, H et al. | 2011
- 1201
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Cross-Talk Limits of Highly Segmented Semiconductor DetectorsPullia, A / Weisshaar, D / Zocca, F / Bazzacco, D et al. | 2011
- 1206
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ASTROPHYSICS AND SPACE INSTUMENTATION - Development and Characterization of New 256 × 256 Pixel DEPFET Detectors for X-Ray AstronomyMeuris, A et al. | 2011
- 1206
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Development and Characterization of New 256$\,\times\,$256 Pixel DEPFET Detectors for X-Ray AstronomyMeuris, A / Aschauer, F / De Vita, G / Guenther, B / Herrmann, S / Lauf, T / Lechner, P / Lutz, G / Majewski, P / Miessner, D et al. | 2011
- 1206
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Development and Characterization of New 256 Formula Not Shown 256 Pixel DEPFET Detectors for X-Ray AstronomyMeuris, A. / Aschauer, F. / De Vita, G. / Guenther, B. / Herrmann, S. / Lauf, T. / Lechner, P. / Lutz, G. / Majewski, P. / Miessner, D. et al. | 2011
- 1212
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COMPUTING, SIMULATION, ALGORITHMS, AND SOFTWARE - MAGE-a GEANT4-Based Monte Carlo Application Framework for Low-Background Germanium ExperimentsBoswell, M et al. | 2011
- 1212
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MaGe-a Geant4-Based Monte Carlo Application Framework for Low-Background Germanium ExperimentsBoswell, M / Yuen-Dat Chan, / Detwiler, J A / Finnerty, P / Henning, R / Gehman, V M / Johnson, R A / Jordan, D V / Kazkaz, K / Knapp, M et al. | 2011
- 1221
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CMS Workflow Execution Using Intelligent Job Scheduling and Data Access StrategiesHasham, K / Delgado Peris, Antonio / Anjum, A / Evans, D / Gowdy, S / Hernandez, J M / Huedo, E / Hufnagel, D / van Lingen, F / McClatchey, R et al. | 2011
- 1233
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Experimental and TCAD Study of Breakdown Voltage Temperature Behavior in $n^{+}/p$ SiPMsSerra, N / Giacomini, G / Piazza, A / Piemonte, C / Tarolli, A / Zorzi, N et al. | 2011
- 1233
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Experimental and TCAD Study of Breakdown Voltage Temperature Behavior in Formula Not Shown SiPMsSerra, N. / Giacomini, G. / Piazza, A. / Piemonte, C. / Tarolli, A. / Zorzi, N. et al. | 2011
- 1241
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Development of a High-Sensitivity Radiation Detector for ChromatographyHuber, J S / Hanrahan, S M / Moses, W W / Derenzo, S E / Reutter, B W / O'Neil, J P / Gullberg, G T et al. | 2011
- 1241
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INSTRUMENTATION FOR MEDICAL AND BIOLOGICAL APPLICATIONS - Development of a High-Sensitivity Radiation Detector for ChromatographyHuber, J S et al. | 2011
- 1249
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Fast Neutron Induced Nuclear Counter Effect in Hamamatsu Silicon PIN Diodes and APDsLiyuan Zhang, / Rihua Mao, / Ren-Yuan Zhu, et al. | 2011
- 1249
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NEUTRON DETECTION - Fast Neutron Induced Nuclear Counter Effect in Hamamatsu Silicon PIN Diodes and APDsZhang, L et al. | 2011
- 1257
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Extending Area Monitoring Networks Capabilities for Tracking a Mobile Radiation SourceCibils, R M / Nassif, E L et al. | 2011
- 1257
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NUCLEAR MONITORING - Extending Area Monitoring Networks Capabilities for Tracking a Mobile Radiation SourceCibils, R M et al. | 2011
- 1264
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NUCLEAR POWER INSTRUMENTATION AND CONTROL - A Three-Time-Scale Approach for Design of Linear State Regulator for Spatial Control of Advanced Heavy Water ReactorShimjith, S R et al. | 2011
- 1264
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A Three-Time-Scale Approach for Design of Linear State Regulator for Spatial Control of Advanced Heavy Water ReactorShimjith, Sreyas Rajagopal / Tiwari, Akhilanand Pati / Bandyopadhyay, Bijnan et al. | 2011
- 1277
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Saturated Output Feedback Dissipation Steam Temperature Control for the OTSG of MHTGRsZhe Dong, / Xiaojin Huang, / Liangju Zhang, et al. | 2011
- 1290
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PHOTODECTORS - Methods for Accurate Measurement of the Response of Photomultiplier Tubes and Intensity of Light Pulsesde Haas, J T M et al. | 2011
- 1290
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Methods for Accurate Measurement of the Response of Photomultiplier Tubes and Intensity of Light Pulsesde Haas, J T M / Dorenbos, P et al. | 2011
- 1297
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Silicon Photomultipliers as a Readout System for a Scintillator-Lead Shashlik CalorimeterBerra, A / Bolognini, D / Bonvicini, V / Bosisio, L / Cauz, D / Ciano, S / Driutti, A / Hasan, S / Iugovaz, D / Lietti, D et al. | 2011
- 1308
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Beam Test Measurements With Planar and 3D Silicon Strip Detectors Irradiated to sLHC FluencesKohler, M / Wiik, L / Bates, R / Dalla Betta, Gian-Franco / Fleta, C / Harkonen, J / Jakobs, K / Lozano, M / Maenpaa, T / Moilanen, H et al. | 2011
- 1308
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RADIATION DAMAGE EFFECTS - Beam Test Measurements With Planar and 3D Silicon Strip Detectors Irradiated to sLHC FluencesKöhler, M et al. | 2011
- 1315
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Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel DetectorsKoybasi, O / Alagoz, E / Krzywda, A / Arndt, K / Bolla, G / Bortoletto, D / Hansen, Thor-Erik / Hansen, T A / Jensen, G U / Kok, A et al. | 2011
- 1315
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RADIATION EFFECTS - Electrical Characterization and Preliminary Beam Test Results of 3D Silicon CMS Pixel DetectorsKoybasi, O et al. | 2011
- 1324
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Total Ionizing Dose Enhanced DIBL Effect for Deep Submicron NMOSFETZhangli Liu, / Zhiyuan Hu, / Zhengxuan Zhang, / Hua Shao, / Bingxu Ning, / Ming Chen, / Dawei Bi, / Shichang Zou, et al. | 2011
- 1332
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Simple Method for Extracting Effective Sheet Charge Density Along STI Sidewalls Due to RadiationZhiyuan Hu, / Zhangli Liu, / Hua Shao, / Zhengxuan Zhang, / Bingxu Ning, / Ming Chen, / Dawei Bi, / Shichang Zou, et al. | 2011
- 1338
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SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology NodeArtola, L / Hubert, G / Warren, K M / Gaillardin, M / Schrimpf, R D / Reed, R A / Weller, R A / Ahlbin, J R / Paillet, P / Raine, M et al. | 2011
- 1347
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Comprehensive Study on the Total Dose Effects in a 180-nm CMOS TechnologyZhiyuan Hu, / Zhangli Liu, / Hua Shao, / Zhengxuan Zhang, / Bingxu Ning, / Ming Chen, / Dawei Bi, / Shichang Zou, et al. | 2011
- 1355
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Radiation Hardening by Applying Substrate BiasZhiyuan Hu, / Zhangli Liu, / Hua Shao, / Zhengxuan Zhang, / Bingxu Ning, / Ming Chen, / Dawei Bi, / Shichang Zou, et al. | 2011
- 1361
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FPDR90—A Low Noise, Fast Pixel Readout Chip in 90 nm CMOS TechnologySzczygiel, R / Grybos, P / Maj, P et al. | 2011
- 1361
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READOUT ELECTRONICS - FPDR90 — A Low Noise, Fast Pixel Readout Chip in 90 nm CMOS TechnologySzczygiel, R et al. | 2011
- 1370
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Development of Low-Noise Front-End ASIC for Hybrid CdTe Pixel DetectorsSato, Goro / Kishishita, Tetsuichi / Ikeda, Hirokazu / Sakumura, Takuto / Takahashi, Tadayuki et al. | 2011
- 1376
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Front-End ASIC for a Liquid Argon TPCDe Geronimo, G / D'Andragora, A / Shaorui Li, / Nambiar, N / Rescia, S / Vernon, E / Hucheng Chen, / Lanni, F / Makowiecki, D / Radeka, V et al. | 2011
- 1386
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Thermal Neutron Scintillator Detectors Based on Poly (2-Vinylnaphthalene) Composite FilmsSen, I / Penumadu, D / Williamson, M / Miller, L F / Green, A D / Mabe, A N et al. | 2011
- 1386
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SCINTILLATION DETECTORS - Thermal Neutron Scintillator Detectors Based on Poly (2-Vinylnaphthalene) Composite FilmsSen, I et al. | 2011
- 1394
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Effect of Ca Co-Doping on the Luminescence Centers in LSO:Ce Single CrystalsKan Yang, / Melcher, Charles L / Koschan, Merry A / Zhuravleva, Mariya et al. | 2011
- 1400
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Sub-Pixel Position Sensing for Pixelated, 3-D Position Sensitive, Wide Band-Gap, Semiconductor, Gamma-Ray DetectorsYuefeng Zhu, / Anderson, S E / Zhong He, et al. | 2011
- 1400
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SOLID STATE DETECTORS - Sub-Pixel Position Sensing for Pixelated, 3-D Position Sensitive, Wide Band-Gap, Semiconductor, Gamma-Ray DetectorsZhu, Y et al. | 2011
- 1410
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Why we joined| 2011
- 1411
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2011 IEEE membership form| 2011
- C1
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frontcover| 2011
- C2
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IEEE Transactions on Nuclear Science publication information| 2011
- C3
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IEEE Transactions on Nuclear Science information for authors| 2011
- C4
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2011
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PART II OF THREE PARTS - SELECTED PAPERS FROM THE 2010 RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) CONFERENCE, Längenfeld, Austria, September 20-24, 2010| 2011
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PART I OF THREE PARTS - NUCLEAR MEDICAL AND IMAGING SCIENCES (NMIS)| 2011