IEEE Transactions on Nuclear Science publication information (English)
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IEEE Transactions on Nuclear Science
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69
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C2
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2022
- Article (Journal) / Electronic Resource
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Title:IEEE Transactions on Nuclear Science publication information
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Published in:IEEE Transactions on Nuclear Science ; 69, 5 ; C2
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Publisher:
- New search for: IEEE
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Publication date:2022-05-01
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Size:83712 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 69, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 990
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Announcing a New Associate Editor for the Real Time ConferenceBell, Zane W. et al. | 2022
- 991
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A Compact, Low-Field, Broadband Matching Section for Externally Powered X-Band Dielectric-Loaded Accelerating StructuresWei, Yelong / Grudiev, Alexej / Freemire, Ben / Jing, Chunguang et al. | 2022
- 1002
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Contextual Isotope Ranking Criteria for Peak Identification in Gamma Spectroscopy Using a Large DatabaseAguilar-Arevalo, Alexis / Bertou, Xavier / Canet, Carles / Cruz-Perez, Miguel A. / Deisting, Alexander / Dias, Adriana / D'Olivo, Juan Carlos / Favela-Perez, J. Francisco / Garces, Estela A. / Munoz, Adiv Gonzalez et al. | 2022
- 1014
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Electron Imaging Reconstruction for Pixelated Semiconductor Tracking Detectors in Transmission Electron Microscopes Using the Approach of Convolutional Neural NetworksEckert, Bjorn / Aschauer, Stefan / Holl, Peter / Majewski, Petra / Zabel, Thomas / Struder, Lothar et al. | 2022
- 1022
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Port-Hamiltonian Control of Nuclear ReactorsDong, Zhe / Li, Bowen / Li, Junyi / Huang, Xiaojin / Dong, Yujie / Zhang, Yajun / Zhang, Zuoyi et al. | 2022
- 1037
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Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETsPeng, Chao / Lei, Zhifeng / Zhang, Zhangang / Chen, Yiqiang / He, Yujuan / Yao, Bin / En, Yunfei et al. | 2022
- 1044
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Impact of High TID Irradiation on Stability of 65 nm SRAM CellsCui, Jiangwei / Zheng, Qiwen / Li, Yudong / Guo, Qi et al. | 2022
- 1051
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Synergistic Effects of Ionizing Dose and Displacement Damage on SiGe Heterojunction Bipolar TransistorsLi, Pei / He, Chaohui / Guo, Hongxia / Li, Yonghong / Wei, Jianan et al. | 2022
- 1057
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Role of Elastic Scattering in Low-Energy Neutron-Induced SEUs in a 40-nm Bulk SRAMQi, Chao / Wang, Yugang / Bai, Xiaoyan / Jin, Xiaoming / Li, Ruibin / Chen, Wei / Guo, Xiaoqiang / Li, Junlin / Wang, Chenhui et al. | 2022
- 1066
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The DIME-1 Experiment Flown as Part of NASA’s SET-1 Project on the DSX SatellitePoole, Kelvin F. / McNulty, Peter J. / Poole, John O. et al. | 2022
- 1072
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DIME-2 Flown as Part of NASA’s SET-1 on the DSX SatelliteMcNulty, Peter J. / Poole, Kelvin F. / Poole, John O. et al. | 2022
- 1079
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Total-Ionizing-Dose Response of SiGe HBTs at Elevated TemperaturesNergui, Delgermaa / Teng, Jeffrey W. / Hosseinzadeh, Mozghan / Mensah, Yaw / Li, Kan / Gorchichko, Mariia / Ildefonso, Adrian / Ringel, Brett L. / Zhang, En Xia / Fleetwood, Daniel M. et al. | 2022
- 1085
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Brass Material Analysis With Deep-Learning-Based CdTe Semiconductor X-Ray Fluorescence SystemJo, Ajin / Lee, Wonho et al. | 2022
- 1092
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Preventing Tritium Memory Effects in Ion Chambers Using Ultraviolet LEDsLarsen, George K. / Nguyen, Khai / Murph, Simona E. Hunyadi et al. | 2022
- 1098
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Effects of Shallow Carbon and Deep N++ Layer on the Radiation Hardness of IHEP-IME LGAD SensorsLi, Mengzhao / Fan, Yunyun / Jia, Xuewei / Cui, Han / Liang, Zhijun / Zhao, Mei / Yang, Tao / Wu, Kewei / Li, Shuqi / Yu, Chengjun et al. | 2022
- 1104
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Comments by the EditorsFleetwood, Dan / Brown, Dennis / Quinn, Heather / Robinson, William / Moss, Steven / Goiffon, Vincent / Paillet, Philippe / Ding, Lili / Loveless, Daniel et al. | 2022
- 1105
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Radiation Effects in AlGaN/GaN HEMTsFleetwood, Daniel M. / Zhang, En Xia / Schrimpf, Ronald D. / Pantelides, Sokrates T. et al. | 2022
- 1120
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The Study of Displacement Damage in AlGaN/GaN High Electron Mobility Transistors Based on Experiment and Simulation MethodWan, Pengfei / Yang, Jianqun / Lv, He / Guan, Enhao / Li, Huyang / Lv, Ling / Xu, Xiaodong / Wei, Yadong / Song, Yang / Li, Weiqi et al. | 2022
- 1127
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Application of Total Ionizing Dose Radiation Test Standards to SiC MOSFETsYu, Qingkui / Ali, Waqas / Cao, Shuang / Wang, He / Lv, He / Sun, Yi / Mo, Rigen / Wang, Qianyuan / Mei, Bo / Sun, Jiajia et al. | 2022
- 1134
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Investigation on Total-Ionizing-Dose Radiation Response for 700 V Double-RESURF SOI LDMOSZhou, Xin / Geng, Liming / Li, Yanfei / Fang, Xuelin / Wang, Zhao / Zhu, Shaoli / Wu, Jianwei / Qiao, Ming / Zhang, Bo et al. | 2022
- 1141
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ASET and TID Characterization of a Radiation Hardened Bandgap Voltage Reference in a 28-nm Bulk CMOS TechnologyChen, Jianjun / Chi, Yaqing / Liang, Bin / Yuan, Hengzhou / Wen, Yi / Xing, Haiyuan / Yao, Xiaohu et al. | 2022
- 1148
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Analysis of DC Characteristics in PDSOI pMOSFETs Under the Combined Effect of NBTI and TIDLiu, Chunmei / Xiao, Zhiyi / Ma, Shuying / Bi, Dawei / Hu, Zhiyuan / Zhang, Zhengxuan / Zou, Shichang et al. | 2022
- 1157
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Experimental Study of Transient Dose Rate Effects of Two Level-Shifting Transceivers and Simulations on Their ESD CircuitsGuo, Yaxin / Li, Yang / Li, Junlin / He, Chaohui / Li, Ruibin / Li, Yonghong / Li, Pei / Liu, Jiaxin et al. | 2022
- 1167
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Laser-Assisted Simulation of Dose-Rate Effects of Neutron-Irradiated NPN TransistorsTang, Ge / Sun, Peng / Kang, Jianbin / Wang, Lei / Li, Mo et al. | 2022
- 1176
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Characterization of Single-Event Upsets Induced by High-LET Heavy Ions in 16-nm Bulk FinFET SRAMsYaqing, Chi / Pengcheng, Huang / Qian, Sun / Bin, Liang / Zhenyu, Zhao et al. | 2022
- 1182
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MLFTCache: Multilevel Fault Tolerance Scheme for Write-Back L2 Cache Under IrradiationDu, Xiaozhi / Dong, Honglei / Zhang, Jinjin et al. | 2022
- C1
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Table of Contents| 2022
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IEEE Transactions on Nuclear Science publication information| 2022
- C3
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IEEE Transactions on Nuclear Science information for authors| 2022
- C4
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2022