Computing steady-state mean time to failure for non-coherent repairable systems (English)
- New search for: Dazhi Wang,
- New search for: Trivedi, K.S.
- New search for: Dazhi Wang,
- New search for: Trivedi, K.S.
In:
IEEE Transactions on Reliability
;
54
, 3
;
506-516
;
2005
- Article (Journal) / Electronic Resource
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Title:Computing steady-state mean time to failure for non-coherent repairable systems
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Contributors:Dazhi Wang, ( author ) / Trivedi, K.S. ( author )
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Published in:IEEE Transactions on Reliability ; 54, 3 ; 506-516
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Publisher:
- New search for: IEEE
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Publication date:2005-09-01
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Size:487104 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 54, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 370
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A bibliography of accelerated test plans part II - referencesNelson, W.B. et al. | 2005
- 370
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Burn-in and Accelerated Testing - A Bibliography of Accelerated Test Plans: Part II -- ReferencesNelson, W.B. et al. | 2005
- 374
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Parameter estimation for a modified Weibull distribution, for progressively type-II censored samplesNg, H.K.T. et al. | 2005
- 374
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Parametrics - Parameter Estimation for a Modified Weibull Distribution, for Progressively Type-II Censored SamplesNg, H.K.T. et al. | 2005
- 381
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On the use of data compression measures to analyze robust designsBen-Gal, I. et al. | 2005
- 381
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Parametrics - On the Use of Data Compression Measures to Analyze Robust DesignsBen-Gal, I. et al. | 2005
- 389
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Robust weighted likelihood estimation of exponential parametersAhmed, E.S. / Volodin, A.I. / Hussein, A.A. et al. | 2005
- 389
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Parametrics - Robust Weighted Likelihood Estimation of Exponential ParametersAhmed, E.S. et al. | 2005
- 396
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Parametrics - The NBUT Class of Life DistributionsAhmad, I.A. et al. | 2005
- 396
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The NBUT class of life distributionsAhmad, I.A. / Kayid, M. / Xiaohu Li, et al. | 2005
- 402
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Optimal, and reliable communication in hypercubes using extended safety vectorsJie Wu, / Feng Gao, / Zhongcheng Li, / Yinghua Min, et al. | 2005
- 402
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Networks - Optimal, and Reliable Communication in Hypercubes Using Extended Safety VectorsWu, J. et al. | 2005
- 412
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Circular sequential k-out-of-n congestion systemLi Bai, et al. | 2005
- 412
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Networks - Circular Sequential k-Out-of-n Congestion SystemBai, L. et al. | 2005
- 421
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Networks - Reliability Optimization of Distributed Access Networks With Constrained Total CostShao, F.-M. et al. | 2005
- 421
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Reliability optimization of distributed access networks with constrained total costFang-Ming Shao, / Xuemin Shen, / Pin-Han Ho, et al. | 2005
- 431
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Networks - Reliability of Two-Stage Weighted-k-out-of-n Systems With Components in CommonChen, Y. et al. | 2005
- 431
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Reliability of two-stage weighted-k-out-of-n systems with components in commonYong Chen, / Qingyu Yang, et al. | 2005
- 441
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Defect detection in analog and mixed circuits by neural networks using wavelet analysisStopjakova, V. / Malosek, P. / Matej, M. / Nagy, V. / Margala, M. et al. | 2005
- 441
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Networks - Defect Detection in Analog and Mixed Circuits by Neural Networks Using Wavelet AnalysisStopjaková, V. et al. | 2005
- 449
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Networks - On Constructing the Minimum Orthogonal Convex Polygon for the Fault-Tolerant Routing in 2-D Faulty MeshesWu, J. et al. | 2005
- 449
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On constructing the minimum orthogonal convex polygon for the fault-tolerant routing in 2-D faulty meshesJie Wu, / Zhen Jiang, et al. | 2005
- 459
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Enhanced reliability of finite-state machines in FPGA through efficient fault detection and correctionTiwari, A. / Tomko, K.A. et al. | 2005
- 459
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Electronics - Enhanced Reliability of Finite-State Machines in FPGA Through Efficient Fault Detection and CorrectionTiwari, A. et al. | 2005
- 468
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Dependability evaluation of a fault-tolerant processor by GSPN modelingConstantinescu, C. et al. | 2005
- 468
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Electronics - Dependability Evaluation of a Fault-Tolerant Processor by GSPN ModelingConstantinescu, C. et al. | 2005
- 475
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Quality-reliability chain modeling for system-reliability analysis of complex manufacturing processesYong Chen, / Jionghua Jin, et al. | 2005
- 475
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Manufacturing Systems - Quality-Reliability Chain Modeling for System-Reliability Analysis of Complex Manufacturing ProcessesChen, Y. et al. | 2005
- 489
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Marginally monotonic maintenance policies for a multi-state deteriorating machine with probabilistic monitoring, and silent failuresIvy, J.S. / Pollock, S.M. et al. | 2005
- 489
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Manufacturing Systems - Marginally Monotonic Maintenance Policies for a Multi-State Deteriorating Machine With Probabilistic Monitoring, and Silent FailuresIvy, J.S. et al. | 2005
- 498
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Dependability metrics to assess safety-critical systemsDeLong, T.A. / Smith, D.T. / Johnson, B.W. et al. | 2005
- 498
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Manufacturing Systems - Dependability Metrics to Assess Safety-Critical SystemsDeLong, T.A. et al. | 2005
- 506
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Computing steady-state mean time to failure for non-coherent repairable systemsDazhi Wang, / Trivedi, K.S. et al. | 2005
- 506
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Repaiarable Systems Modeling - Computing Steady-State Mean Time to Failure for Non-Coherent Repairable SystemsWang, D. et al. | 2005
- 517
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Composite importance measures for multi-state systems with multi-state componentsRamirez-Marquez, J.E. / Coit, D.W. et al. | 2005
- 517
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Repaiarable Systems Modeling - Composite Importance Measures for Multi-State Systems with Multi-State ComponentsRamirez-Marquez, J.E. et al. | 2005
- 530
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New cumulative damage models for failure using stochastic processes as initial damagePark, C. / Padgett, W.J. et al. | 2005
- 530
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Repaiarable Systems Modeling - New Cumulative Damage Models for Failure Using Stochastic Processes as Initial DamagePark, C. et al. | 2005
- 541
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A workload-based analysis of software aging, and rejuvenationYujuan Bao, / Xiaobai Sun, / Trivedi, K.S. et al. | 2005
- 541
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Software - A Workload-Based Analysis of Software Aging, and RejuvenationBao, Y. et al. | 2005
- 549
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Penalty function approach in heuristic algorithms for constrained redundancy reliability optimizationAgarwal, M. / Gupta, R. et al. | 2005
- 549
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Reliability Optimization - Penalty Function Approach in Heuristic Algorithms for Constrained Redundancy Reliability OptimizationAgarwal, M. et al. | 2005
- 559
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Information for Readers and Authors| 2005
- 559
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IEEE Transactions on Reliability information for authors| 2005
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Table of contents| 2005
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IEEE Transactions on Reliability publication information| 2005