Comments, with reply, on "2-dimensional consecutive-k-out-of-n:F models" by A.A. Salvia and W.C. Lasher (English)
- New search for: Ksir, B.
- New search for: Ksir, B.
In:
IEEE Transactions on Reliability
;
41
, 4
;
575
;
1992
- Article (Journal) / Electronic Resource
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Title:Comments, with reply, on "2-dimensional consecutive-k-out-of-n:F models" by A.A. Salvia and W.C. Lasher
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Contributors:Ksir, B. ( author )
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Published in:IEEE Transactions on Reliability ; 41, 4 ; 575
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Publisher:
- New search for: IEEE
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Publication date:1992-12-01
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Size:76015 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 41, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 489
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Failure Mechanism Models for Ductile FractureDasgupta, A. / Hu, J. M. et al. | 1992
- 496
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Boundary Walking Test: An Accelerated Scan Method for Greater System ReliabilityChan, J. C. et al. | 1992
- 503
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Correction to: Minimal Paths & Cuts of Networks Exposed to Common-Cause FailuresNahman, J. et al. | 1992
- 504
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Computationally-Efficient Phased-Mission Reliability Analysis for Systems with Variable ConfigurationsSomani / Ritcey / Au et al. | 1992
- 512
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An O(nlog(n)) Algorithm to Compute the All-Terminal Reliability of (K~5, K~2~,~2~,~2) Free NetworksPolitof et al. et al. | 1992
- 518
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Statistical Analysis of the Geometric De-Eutrophication Software-Reliability ModelGaudoin, O. / Soler, J. et al. | 1992
- 525
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Optimal Properties of the Laplace Trend Test for Software-Reliability ModelsGaudoin, O. et al. | 1992
- 533
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Evaluating the Performance of Software-Reliability ModelsDowns, T. / Scott, A. et al. | 1992
- 539
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Predictability of Software-Reliability ModelsMalaiya, Y. K. / Karunanithi, N. / Verma, P. et al. | 1992
- 547
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A Reliability & Cost Analysis of an Automatic Prototype Generator Test ParadigmMaghsoodloo, S. / Brown, D. / Lin, C. et al. | 1992
- 554
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A Statistical Method for Obtaining the Factors in Electronic-Component Reliability-Prediction ModelsYang, Z. / Raafat, H. et al. | 1992
- 558
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Predicting Performability of a Fault-Tolerant Microcomputer for Process ControlConstantinescu, C. et al. | 1992
- 565
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Gaussian Parametric Failure-Rate Model With Application To Quartz-Crystal Device AgingFeinberg, A. A. et al. | 1992
- 572
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On the Optimal Design of k-out-of-n:G SubsystemPham, H. et al. | 1992
- 575
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Comments, with reply, on "2-dimensional consecutive-k-out-of-n:F models" by A.A. Salvia and W.C. LasherKsir, B. et al. | 1992
- 575
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Comment on: 2-Dimensional Consecutive-k-out-of-n:F ModelsKsir, B. et al. | 1992
- 576
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Optimal Apportionment of Reliability & Redundancy in Series Systems Under Multiple ObjectivesDhingra, A. K. et al. | 1992
- 583
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Optimal Design of Parallel-Series Systems with Competing Failure ModesPham, H. et al. | 1992
- 588
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Selecting the Most Reliable Design under Type-II Censored Accelerated TestingChang, D. / Huang, D. / Tseng, S. et al. | 1992
- 593
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Goodness-of-Fit Tests for the Power-Law Process Based on the TTT-PlotKlefsjoe, B. / Kumar, U. et al. | 1992
- 599
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Modification of: Error Log Analysis: Statistical Modeling and Heuristic Trend AnalysisAscher / Lin / Siewiorek et al. | 1992
- 602
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A Class of Efficient Tests for Increasing-Failure-Rate-Average Distribution Under Random CensoringTiwari / Zalkikar et al. | 1992
- 608
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Bayes Parameter Estimation for the Bivariate Weibull Model of Marshall-Olkin for Censored DataLu, J. et al. | 1992
- 616
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A Bayes Procedure for Estimation of Current System ReliabilityCalabria, R. / Guida, M. / Pulcini, G. et al. | 1992
- 621
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Bayes Computation for Life Testing and Reliability EstimationDey, D. K. / Lee, T. et al. | 1992
- 627
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Conservative Bayes Experimental DesignCanfield, R. V. et al. | 1992