Relations and Generalizations of Importance Measures in Reliability (English)
- New search for: Way Kuo,
- New search for: Xiaoyan Zhu,
- New search for: Way Kuo,
- New search for: Xiaoyan Zhu,
In:
IEEE Transactions on Reliability
;
61
, 3
;
659-674
;
2012
- Article (Journal) / Electronic Resource
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Title:Relations and Generalizations of Importance Measures in Reliability
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Contributors:Way Kuo, ( author ) / Xiaoyan Zhu, ( author )
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Published in:IEEE Transactions on Reliability ; 61, 3 ; 659-674
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Publisher:
- New search for: IEEE
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Publication date:2012-09-01
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Size:2713780 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 61, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 618
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Failure Models - Kernelized Proportional Intensity Model for Repairable Systems Considering Piecewise Operating ConditionsFuqing, Y et al. | 2012
- 618
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Kernelized Proportional Intensity Model for Repairable Systems Considering Piecewise Operating ConditionsYuan Fuqing, / Kumar, U. et al. | 2012
- 625
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The Extended Cumulative Exposure Model (ECEM) and Its Application to Oil Insulation TestsHirose, H. / Sakumura, T. et al. | 2012
- 634
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A Parametric Uncertainty Analysis Method for Markov Reliability and Reward ModelsDhople, S. V. / Dominguez-Garcia, A. D. et al. | 2012
- 649
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Intermittent Failure Dynamics CharacterizationCorrecher, A. / Garcia, E. / Morant, F. / Quiles, E. / Rodriguez, L. et al. | 2012
- 659
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Relations and Generalizations of Importance Measures in ReliabilityWay Kuo, / Xiaoyan Zhu, et al. | 2012
- 659
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Importance Measures - Relations and Generalizations of Importance Measures in ReliabilityKuo, W et al. | 2012
- 675
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Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor GatesIbrahim, W. / Beiu, V. / Beg, A. et al. | 2012
- 675
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Microcircuits - Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor GatesIbrahim, W et al. | 2012
- 687
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Reliability Evaluation for Single Event Transients on Digital CircuitsBaojun Liu, / Li Cai, et al. | 2012
- 692
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Quantifying the Impact of Correlated Failures on Stochastic Flow Network ReliabilityYi-Kuei Lin, / Ping-Chen Chang, / Fiondella, L. et al. | 2012
- 692
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Networks - Quantifying the Impact of Correlated Failures on Stochastic Flow Network ReliabilityLin, Y-K et al. | 2012
- 702
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A Modified Universal Generating Function Algorithm for the Acyclic Binary-State Network ReliabilityWei-Chang Yeh, et al. | 2012
- 710
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Inference From Lumen Degradation Data Under Wiener Diffusion ProcessTzong-Ru Tsai, / Chin-Wei Lin, / Yi-Ling Sung, / Pei-Ting Chou, / Chiu-Ling Chen, / Yuhlong Lio, et al. | 2012
- 710
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Prognostics and Health Management - Inference From Lumen Degradation Data Under Wiener Diffusion ProcessTsai, T-R et al. | 2012
- 719
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Estimating Mean Residual Life for a Case Study of Rail Wagon BearingsGhasemi, A. / Hodkiewicz, M. R. et al. | 2012
- 731
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Self-Tuning Routine Alarm Analysis of Vibration Signals in Steam Turbine GeneratorsCostello, J. J. A. / West, G. M. / McArthur, S. D. J. / Campbell, G. et al. | 2012
- 741
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A Block Replacement Policy for Systems Subject to Non-homogeneous Pure Birth ShocksShey-Huei Sheu, / Yen-Luan Chen, / Chin-Chih Chang, / Zhang, Z. G. et al. | 2012
- 741
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Repair And Replacement - A Block Replacement Policy for Systems Subject to Non-homogeneous Pure Birth ShocksSheu, S-H et al. | 2012
- 749
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Security Analysis of Compromised-Neighbor-Tolerant Networks Using StochasticsXiaohu Li, / Linxiong Li, et al. | 2012
- 749
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Security - Security Analysis of Compromised-Neighbor-Tolerant Networks Using StochasticsLi, X et al. | 2012
- 758
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Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release PlanningKapur, P. K. / Pham, H. / Aggarwal, A. G. / Kaur, G. et al. | 2012
- 758
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Software - Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release PlanningKapur, P K et al. | 2012
- 769
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Systems - Performance Measures for Systems With Markovian Missions and AgingÇekyay, B et al. | 2012
- 769
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Performance Measures for Systems With Markovian Missions and AgingCekyay, B. / Ozekici, S. et al. | 2012
- 779
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Weighted Estimation of Component Reliability in Series SystemsGamiz, M. L. et al. | 2012
- 787
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Linear $m$ -Consecutive-$k$ , $l$-Out-of-$n$: F SystemEryilmaz, S. / Mahmoud, B. et al. | 2012
- 787
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Linear Formula Not Shown -Consecutive- Formula Not Shown , Formula Not Shown -Out-of- Formula Not Shown : F SystemEryilmaz, S. / Mahmoud, B. et al. | 2012
- 792
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Residual Lifetime of Consecutive $k$-out-of- $n$ Systems Under Double MonitoringEryilmaz, S. / Bayramoglu, K. et al. | 2012
- 792
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Residual Lifetime of Consecutive Formula Not Shown -out-of- Formula Not Shown Systems Under Double MonitoringEryilmaz, S. / Bayramoglu, K. et al. | 2012
- 798
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Accelerated Life Tests of a Series System With Masked Interval Data Under Exponential Lifetime DistributionsTsai-Hung Fan, / Tsung-Ming Hsu, et al. | 2012
- 798
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Testing - Accelerated Life Tests of a Series System With Masked Interval Data Under Exponential Lifetime DistributionsFan, T-H et al. | 2012
- 809
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Multiple-Stress Model for One-Shot Device Testing Data Under Exponential DistributionBalakrishnan, N. / Man Ho Ling, et al. | 2012
- 822
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A New Warranty Policy With Failure Times and Warranty Servicing TimesMinjae Park, / Hoang Pham, et al. | 2012
- 822
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Warranty - A New Warranty Policy With Failure Times and Warranty Servicing TimesPark, M et al. | 2012
- 832
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Errata to “Reliability Analysis of $k$-out-of-$n$ Systems With Single Cold Standby Using Pearson Distributions” [Jun 12 526-532]van Gemund, Arjan J. C. / Reijns, Gerard L. et al. | 2012
- 832
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ERRATA - Errata to "Reliability Analysis of k-out-of-n Systems With Single Cold Standby Using Pearson Distributions"van Gemund, A J C et al. | 2012
- 833
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Call for papers for a special section on fuzzy reliability| 2012
- 834
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IEEE Transactions on Reliability information for authors| 2012
- 836
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IEEE Xplore Digital Library [advertisement]| 2012
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Table of contents| 2012
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IEEE Transactions on Reliability publication information| 2012
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[IEEE Transactions on Reliability institutional listings]| 2012