Voltage-controlled negative resistance in p+-i-n+ planar diodes with injection gate (English)
- New search for: Supadech, S.
- New search for: Okazaki, S.
- New search for: Akiba, Y.
- New search for: Kurosu, T.
- New search for: Lida, M.
- New search for: Supadech, S.
- New search for: Okazaki, S.
- New search for: Akiba, Y.
- New search for: Kurosu, T.
- New search for: Lida, M.
In:
IEE Proceedings I (Solid-State and Electron Devices)
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133
, 1
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1-5
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1986
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ISSN:
- Article (Journal) / Print
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Title:Voltage-controlled negative resistance in p+-i-n+ planar diodes with injection gate
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Contributors:Supadech, S. ( author ) / Okazaki, S. ( author ) / Akiba, Y. ( author ) / Kurosu, T. ( author ) / Lida, M. ( author )
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Published in:IEE Proceedings I (Solid-State and Electron Devices) ; 133, 1 ; 1-5
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Publisher:
- New search for: IET Digital Library Archive
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Publication date:1986-02-01
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Size:5 pages
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ISSN:
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Coden:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:semiconductor diodes , positive gate voltage , elemental semiconductors , voltage-controlled negative resistance , gate location , silicon , phenomenological model , elemental semiconductor , negative resistance , Si , semiconductor device models , hole injecting gate , p+- i- n+ planar diodes , electrical properties
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Source:
Table of contents – Volume 133, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Voltage-controlled negative resistance in p+-i-n+ planar diodes with injection gateSupadech, S. / Okazaki, S. / Akiba, Y. / Kurosu, T. / Lida, M. et al. | 1986
- 6
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Analysis of optical writing mode in solid-state imaging devices with inherent MNOS memoryAndo, T. / Yamasaki, H. / Sugishita, T. et al. | 1986
- 13
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Taper etching of the thermal oxide layerChoi, Y.I. / Kim, C.K. / Kwon, Y.S. et al. | 1986
- 18
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Stability of Schottky barriers at high temperatures for use in GaAs MESFET technologyAllan, D.A. et al. | 1986
- 25
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Elimination of surface current induced failure in millimetre wave Baritt diodesFreyer, J. / Guettich, U. / Claassen, M. et al. | 1986
- 28
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Book review: Quick Reference Manual for Silicon Integrated Circuit TechnologyKemhadjian, H.A. et al. | 1986
- 29
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Acnowledgement| 1986