Characterization of Brazilian high-ash coals by small-angle X-ray diffraction methods (English)
National licence
- New search for: González, H. J.
- New search for: Torriani, I. L.
- New search for: Luengo, C. A.
- New search for: González, H. J.
- New search for: Torriani, I. L.
- New search for: Luengo, C. A.
In:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
;
15
, Pt 3
;
251-254
;
1982
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Characterization of Brazilian high-ash coals by small-angle X-ray diffraction methods
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Contributors:
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Published in:JOURNAL OF APPLIED CRYSTALLOGRAPHY ; 15, Pt 3 ; 251-254
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Publisher:
- New search for: International Union of Crystallography
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Publication date:1982-06-01
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Size:4 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 15, Issue Pt 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 251
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Characterization of Brazilian high-ash coals by small-angle X-ray diffraction methodsGonzález, H. J. / Torriani, I. L. / Luengo, C. A. et al. | 1982
- 255
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The derivation of the axes of the conventional unit cell from the dimensions of the Buerger-reduced cellLe Page, Y. et al. | 1982
- 260
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Studies of the cation atom distribution in ZnCrxFe2−xO4 spinels using the channeling effect in electron-induced X-ray emissionTaftø, J. / Liliental, Z. et al. | 1982
- 266
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On `spike' diffuse reflections in electron diffraction patterns of diamondsSumida, N. / Lang, A. R. et al. | 1982
- 275
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Absolute lattice parameter measurements of epitaxial layersFewster, P. F. et al. | 1982
- 279
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Etude des composés à chaînes aliphatiques. I. Synthèse et caractérisation cristallographique des bis(n-alcanoates) de pipérazinium, 2[CxH2x−1O2 −].[C4H12N2 2+]Brisse, F. / Denault, J. / Sangin, J. P. et al. | 1982
- 282
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Study of the ordered structures of the Au–Mn system by high voltage–high-resolution electron microscopy. III. Two-dimensional antiphase structure of Au3Mn typeTerasaki, O. / Watanabe, D. et al. | 1982
- 289
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Information content and retrieval in solution scattering studies. I. Degrees of freedom and data reductionTaupin, D. / Luzzati, V. et al. | 1982
- 301
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Study of adsorption on powders by surface differential diffraction measurements. Argon on Co3O4Beaufils, J. P. / Barbaux, Y. et al. | 1982
- 308
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Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadeningde Keijser, Th. H. / Langford, J. I. / Mittemeijer, E. J. / Vogels, A. B. P. et al. | 1982
- 315
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The variance as a measure of line broadening: corrections for truncation, curvature and instrumental effectsLangford, J. I. et al. | 1982
- 323
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Reduction in a niobium tungsten bronze, 2Nb2O5.7WO3, studied by 1 MV HRTEMHoriuchi, S. et al. | 1982
- 330
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Macromolecular crystallography with synchrotron radiation: photographic data collection and polarization correctionKahn, R. / Fourme, R. / Gadet, A. / Janin, J. / Dumas, C. / André, D. et al. | 1982
- 338
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Oscillation camera data processing: reflecting range and prediction of partiality. I. Conventional X-ray sourcesGreenhough, T. J. / Helliwell, J. R. et al. | 1982
- 352
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Absorption effects from surface miscut in reflection diffractometryWalker, C. B. et al. | 1982
- 353
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Crystal data for 3Al2O3.4SO3.8H2OOssaka, J. / Hirabayashi, J. / Okada, K. / Harada, J. et al. | 1982
- 354
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Données cristallographiques de la dihydro-10,11 (quinuclidinyl 3)-5-5H-dibenzo[b, f]azépine (quinupramine)Reboul, J. P. / Cristau, B. / Caranoni, C. / Capella, L. et al. | 1982
- 356
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Conception et réalisation d'un dispositif de refroidissement par effet Peltier destiné à la diffractométrie X de poudres cristallinesAuby, R. / Bregeaut, P. / Massaux, M. et al. | 1982
- 357
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Suggested guidelines for the publication of Rietveld analyses and pattern decomposition studiesYoung, R. A. / Prince, E. / Sparks, R. A. et al. | 1982
- 357
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A technique for loading glass capillaries used in X-ray powder diffractionFoit Jnr, F. F. et al. | 1982
- 359
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Structure Reports| 1982
- 359
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Advances in X-ray analysis, Vol. 24 edited by D. K. Smith, C. S. Barrett, D. E. Leyden and P. K. PredeckiMeisel, A. et al. | 1982
- 359
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Crystallographers| 1982
- 360
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Quantitative X-ray spectrometry by R. Jenkins, R. W. Gould and D. GedckeFreiburg, C. et al. | 1982