Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization (English)
- New search for: Mathialakan T.
- New search for: Karthik V. U.
- New search for: Hoole S. R.
- New search for: Jayakumar P.
- New search for: Thyagarajan R.
- New search for: Mathialakan T.
- New search for: Karthik V. U.
- New search for: Hoole S. R.
- New search for: Jayakumar P.
- New search for: Thyagarajan R.
2015
- Report / No indication
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Title:Depth Limits of Eddy Current Testing for Defects: A Computational Investigation and Smooth-Shaped Defect Synthesis from Finite Element Optimization
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Contributors:Mathialakan T. ( author ) / Karthik V. U. ( author ) / Hoole S. R. ( author ) / Jayakumar P. ( author ) / Thyagarajan R. ( author )
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Publisher:
- New search for: Michigan State Univ., East Lansing.
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Publication date:2015
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Size:12 pages
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Type of media:Report
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Type of material:No indication
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Language:English
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Contract Number:ADA626748/XAB; W56HZV-07-2-0001
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Keywords:Operations Research , Laboratory & Test Facility Design & Operation , Physics , Structural Mechanics , Defects(materials) , Nondestructive testing , Defect analysis , Eddy currents , Genetic algorithms , Magnetostatics , Mathematical models , Steel , Test methods , Ect(eddy current testing) , Defect detection , Defect characterization , Parametrization , Gpu(graphics processing unit)
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Source: