Nanoscale Scanning Force Imaging of Polarization Phenomena in Ferroelectric Thin Films (English)
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In:
MRS bulletin
;
23
, 1
; 33-42
;
1998
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ISSN:
- Article (Journal) / Print
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Title:Nanoscale Scanning Force Imaging of Polarization Phenomena in Ferroelectric Thin Films
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Contributors:
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Published in:MRS bulletin ; 23, 1 ; 33-42
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Publisher:
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Place of publication:Pittsburgh, Pa.
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Publication date:1998
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Table of contents – Volume 23, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 4
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Letter from the President| 1998
- 6
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Research-Researchers| 1998
- 12
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Washington News| 1998
- 13
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Materials Science and Nonproliferation: Scientists Influence National PolicyFreedhoff, Michal et al. | 1998
- 13
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Public Affairs Forum| 1998
- 14
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Resources| 1998
- 15
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Electron Crystals and Phonon Glasses: A New Path to Improved Thermoelectric MaterialsSales, Brian C. et al. | 1998
- 21
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Advertisers in This Issue| 1998
- 22
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Computational Alchemy: The Search for New Superhard MaterialsTeter, David M. et al. | 1998
- 28
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Lateral Manipulation of Single Adsorbates and Substrate Atoms With the Scanning Tunneling MicroscopeMeyer, G. et al. | 1998
- 33
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Nanoscale Scanning Force Imaging of Polarization Phenomena in Ferroelectric Thin FilmsAuciello, O. et al. | 1998
- 43
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Nemanich Leads Executive Committee in 1998Nemanich, Robert J. / Gibala, Ronald / Tsai, Chuang Chuang / Hurd, Alan J. / Hull, Robert / Atwater, Harry A. / Green, Martin L. et al. | 1998
- 45
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Briant, Chason, Katz, and Shiohara to Chair 1998 MRS Fall Meeting| 1998
- 46
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MRS Bulletin Volume Organizers Guide Technical Theme Topics for 1998| 1998
- 50
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Abstracts for March 1998 Journal of Materials Research| 1998
- 56
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Calendar| 1998
- 59
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Classified| 1998
- 64
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Posterminaries| 1998