Thin Films and Magnetic Materials - Inter-diffusion Studies of SrBi2Ta2O9 Film Prepared on Plantinized Wafer by Pulsed Laser Ablation (English)
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In:
Surface and interface analysis
;
28
, 1
; 217-220
;
1999
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ISSN:
- Article (Journal) / Print
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Title:Thin Films and Magnetic Materials - Inter-diffusion Studies of SrBi2Ta2O9 Film Prepared on Plantinized Wafer by Pulsed Laser Ablation
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Contributors:
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Published in:Surface and interface analysis ; 28, 1 ; 217-220
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- New search for: Wiley
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Place of publication:Chichester [u.a.]
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Publication date:1999
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Table of contents – Volume 28, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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PrefaceTan, K.L. et al. | 1999
- 3
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Biomaterials and Composite Materials - Surface Analysis and Bioreactions of Ti- and V-containing a-C:HFrancz, G. et al. | 1999
- 3
-
Surface Analysis and Bioreactions of Ti- and V-containing a-C:HFrancz, G. / Schroeder, A. / Hauert, R. et al. | 1999
- 8
-
Biomaterials and Composite Materials - Carbon Nanotubes as AFM Tips: Measuring DNA Molecules at the Liquid-Solid InterfaceLi, J. et al. | 1999
- 8
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Carbon Nanotubes as AFM Tips: Measuring DNA Molecules at the Liquid/Solid InterfaceLi, J. / Cassell, A. M. / Dai, H. et al. | 1999
- 12
-
Adhesion - Influence of Surface Electrokinetics on Organosilane AdsorptionQuinton, J.S. et al. | 1999
- 12
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Influence of Surface Electrokinetics on Organosilane AdsorptionQuinton, J. S. / Dastoor, P. C. et al. | 1999
- 16
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Investigation of the Surface Structures and Dynamics of Polyethylene Terephthalate (PET) Modified by Fluorocarbon PlasmasZhang, L. / Chin, W. S. / Huang, W. / Wang, J. Q. et al. | 1999
- 16
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Polymers - Investigation of the Surface Structures and Dynamics of Polyethylene Terephthalate (PET) Modified by Fluorocarbon PlasmasZhang, L. et al. | 1999
- 20
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Electrical Conductivity Study of Surface-modified PolymersLiesegang, J. / Senn, B. C. / Pigram, P. J. / Kang, E. T. / Tan, K. L. / Neoh, K. G. et al. | 1999
- 20
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Polymers - Electrical Conductivity Study of Surface-modified PolymersLiesegang, J. et al. | 1999
- 28
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Surface Morphology of Latex Film Formed from Poly(butyl methacrylate) Latex in the Presence of Alkali-soluble ResinLee, D.-Y. / Shin, J.-S. / Park, Y.-J. / Kim, J.-H. / Khew, M.-C. / Ho, C.-C. et al. | 1999
- 28
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Polymers - Surface Morphology of Latex Film Formed from Poly(butyl methacrylate) Latex in the Presence of Alkali-soluble ResinLee, D.-Y. et al. | 1999
- 36
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Atomic-scale Surface Structure Determination: Comparison of TechniquesVan Hove, M. A. et al. | 1999
- 36
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Technique Development and Data Interpretation - Atomic-scale Surface Structure Determination: Comparison of TechniquesHove, M.A.Van et al. | 1999
- 44
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AFM as a Surface Probe - Beyond Structural InformationBai, C. / Li, J. / Lin, Z. / Tang, J. / Wang, C. et al. | 1999
- 44
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Technique Development and Data Interpretation - AFM as a Surface Probe -- Beyond Structural InformationBai, C. et al. | 1999
- 49
-
Technique Development and Data Interpretation - SIMS with Sample Rotation: An Experimental Novelty or a Practical Necessity?Sykes, D.E. et al. | 1999
- 49
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SIMS with Sample Rotation: an Experimental Novelty or a Practical Necessity?Sykes, D. E. et al. | 1999
- 56
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Discrete Shape Analysis of the Energy Distribution to Discriminate Non-atomic Signal Contributions in Depth Profiling with SNMSGoschnick, J. / Natzeck, C. / Sommer, M. et al. | 1999
- 56
-
Technique Development and Data Interpretation - Discrete Shape Analysis of the Energy Distribution to Discriminate Non-atomic Signal Contributions in Depth Profiling with SNMSGoschnick, J. et al. | 1999
- 61
-
Metals, Ceramics, Glasses and Superconductors - High-temperature Nitridation of the Intermetallic Compound TiAl at 1000-1200 KThongtem, S. et al. | 1999
- 61
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High-temperature Nitridation of the Intermetallic Compound TiAl at 1000-1200 KThongtem, S. / Thongtem, T. / McNallan, M. J. et al. | 1999
- 65
-
Metals, Ceramics, Glasses and Superconductors - Simulated Growth Morphology of Cobalt on Copper(111)Dastoor, P.C. et al. | 1999
- 65
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Simulated Growth Morphology of Cobalt on Copper(111)Dastoor, P. C. / Allison, W. et al. | 1999
- 70
-
Metals, Ceramics, Glasses and Superconductors - Orientation Dependence of the Surface Segregation Kinetics in Single CrystalsTerblans, J.J. et al. | 1999
- 70
-
Orientation Dependence of the Surface Segregation Kinetics in Single CrystalsTerblans, J. J. / Erasmus, W. J. / Viljoen, E. C. / Du Plessis, J. et al. | 1999
- 73
-
Equilibrium Surface Segregation of Silver to the Low-index Surfaces of a Copper Single CrystalWang, J. Y. / Du Plassis, J. / Terblans, J. J. / Van Wyk, G. N. et al. | 1999
- 73
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Metals, Ceramics, Glasses and Superconductors - Equilibrium Surface Segregation of Silver to the Low-index Surfaces of a Copper Single CrystalWang, J.Y. et al. | 1999
- 77
-
Metals, Ceramics, Glasses and Superconductors - Study on the Bulk Diffusion of Hydrogen in Stainless SteelsChen, C.-A. et al. | 1999
- 77
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Study on the Bulk Diffusion of Hydrogen in Stainless SteelsChen, C.-A. / Wu, S. / Ni, R.-F. / Bai, C.-M. et al. | 1999
- 81
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Metals, Ceramics, Glasses and Superconductors - Electronic Properties of CsSnBr3: Studies by Experiment and TheoryZheng, J.-C. et al. | 1999
- 81
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Electronic Properties of CsSnBr~3: Studies by Experiment and TheoryZheng, J.-C. / Huan, C. H. A. / Wee, A. T. S. / Kuok, M. H. et al. | 1999
- 84
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Tensor LEED Analysis for the Ni(111)-(7 x 7)R19.1-P Surface Structure: Comparison with Other 7 SystemsSaidy, M. / Zhuo, M. Y. / Mitchell, K. A. R. et al. | 1999
- 84
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Metals, Ceramics, Glasses and Superconductors - Tensor LEED Analysis for the Ni(111)-((bent radical)7 x (bent radical)7)R19.1(degree)-P Surface Structure: Comparison with Other (bent radical)7 SystemsSaidy, M. et al. | 1999
- 92
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Metals, Ceramics, Glasses and Superconductors - The Structure of Dimers at the C(100), Si(100) and Ge(100) SurfacesKang, H.C. et al. | 1999
- 92
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The Structure of Dimers at the C(100), Si(100) and Ge(100) SurfacesKang, H. C. et al. | 1999
- 97
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Characterization of a Low-K Organic Spin-on-glass as Intermetal DielectricWang, C. Y. / Zheng, J. Z. / Shen, Z. X. / Xu, Y. / Lim, S. L. / Liu, R. / Huan, A. C. H. et al. | 1999
- 97
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Metals, Ceramics, Glasses and Superconductors - Characterization of a Low-K Organic Spin-on-glass as Intermetal DielectricWang, C.Y. et al. | 1999
- 101
-
XPS of Sulfide Mineral Surfaces: Metal-deficient, Polysulfides, Defects and Elemental SulphurSmart, R. S. C. / Skinner, W. M. / Gerson, A. R. et al. | 1999
- 101
-
Catalysis, Corrosion and Environmental Studies - XPS of Sulfide Mineral Surfaces: Metal-deficient, Polysulfides, Defects and Elemental SulphurSmart, R.St C. et al. | 1999
- 106
-
Catalysis, Corrosion and Environmental Studies - XPS, SEM and TEM Characterisation of Stainless-steel 316L Surfaces after Electrochemical Etching and OxidizingStefanov, P. et al. | 1999
- 106
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XPS, SEM and TEM Characterisation of Stainless-steel 316L Surfaces after Electrochemical Etching and OxidizingStefanov, P. / Stoychev, D. / Stoycheva, M. / Gonzalez-Elipe, A. R. / Marinova, T. et al. | 1999
- 111
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Raman Spectroscopic and Quantum Chemical Study of Hydrogen Adsorption at Platinum ElectrodesXu, X. / Ren, B. / Wu, D. Y. / Xian, H. / Lu, X. / Shi, P. / Tian, Z. Q. et al. | 1999
- 111
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Catalysis, Corrosion and Environmental Studies - Raman Spectroscopic and Quantum Chemical Study of Hydrogen Adsorption at Platinum ElectrodesXu, X. et al. | 1999
- 115
-
FTIR, XPS and TPR Studies of N~2O Decomposition Over Cu-ZSM-5Chen, L. / Chen, H. Y. / Lin, J. / Tan, K. L. et al. | 1999
- 115
-
Catalysis, Corrosion and Environmental Studies - FTIR, XPS and TPR Studies of N2O Decomposition Over Cu-ZSM-5Chen, L. et al. | 1999
- 119
-
EIS and XPS Study of the Corrosion of Carbon Steel in Inhibited Natural SeawaterQiu, J. H. / Chua, P. H. et al. | 1999
- 119
-
Catalysis, Corrosion and Environmental Studies - EIS and XPS Study of the Corrosion of Carbon Steel in Inhibited Natural SeawaterQiu, J.H. et al. | 1999
- 123
-
Acidities of CeO~2 and Ce~0~.~5Zr~0~.~5O~2 Solid Solution Studied by NH~3-TPDMiao, J.-Y. / Yang, L.-F. / Cai, J.-X. et al. | 1999
- 123
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Catalysis, Corrosion and Environmental Studies - Acidities of CeO2 and Ce0.5Zr0.5O2 Solid Solution Studied by NH3-TPDMiao, J.-Y. et al. | 1999
- 126
-
Catalysis, Corrosion and Environmental Studies - XPS Determination of the Forms of Nitrogen in Coal Pyrolysis CharsGong, B. et al. | 1999
- 126
-
XPS Determination of the Forms of Nitrogen in Coal Pyrolysis CharsGong, B. / Buckley, A. N. / Lamb, R. N. / Nelson, P. F. et al. | 1999
- 131
-
Catalysis, Corrosion and Environmental Studies - Acidity of High-surface-area Zirconia Prepared from Different PrecipitantsChuah, G.K. et al. | 1999
- 131
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Acidity of High-surface-area Zirconia Prepared from Different PrecipitantsChuah, G. K. / Jaenicke, S. / Xu, T. H. et al. | 1999
- 135
-
Structure and Dynamic Behavior of Atoms and Molecules at Catalyst Model SurfacesSuzuki, S. / Fukui, K. / Onishi, H. / Iwasawa, Y. et al. | 1999
- 135
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Catalysis, Corrosion and Environmental Studies - Structure and Dynamic Behavior of Atoms and Molecules at Catalyst Model SurfacesSuzuki, S. et al. | 1999
- 142
-
Micro- and Optoelectronics - Method of Metal-Insulator-Semiconductor Structure Interface AnalysisBondarenko, G.G. et al. | 1999
- 142
-
Method of Metal-Insulator-Semiconductor Structure Interface AnalysisBondarenko, G. G. / Andreev, V. V. / Loskutov, S. A. / Stolyarov, A. A. et al. | 1999
- 146
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Micro- and Optoelectronics - Characterizing the Interfacial Fracture Toughness for Microelectronic PackagingChen, Z. et al. | 1999
- 146
-
Characterizing the Interfacial Fracture Toughness for Microelectronic PackagingChen, Z. / Cotterell, B. / Chen, W. T. et al. | 1999
- 150
-
Material Properties of GaN Grown by MOCVDLin, W. / Li, M.-F. / Feng, Z.-C. / Chua, S.-J. / Akutsu, N. / Matsumoto, K. et al. | 1999
- 150
-
Micro- and Optoelectronics - Material Properties of GaN Grown by MOCVDLin, W. et al. | 1999
- 155
-
Characterization and Reactivity of -Al~2O~3-Supported Pt-Co Bimetallic CatalystsTang, S. / Lin, J. / Tan, K. L. et al. | 1999
- 155
-
Micro- and Optoelectronics - Characterization and Reactivity of a-Al2O3-Supported Pt-Co Bimetallic CatalystsTang, S. et al. | 1999
- 159
-
SIMS Depth Profiling of TiO~xN~y FilmsMetson, J. B. / Prince, K. E. et al. | 1999
- 159
-
Micro- and Optoelectronics - SIMS Depth Profiling of TiOxNy FilmsMetson, J.B. et al. | 1999
- 163
-
Micro- and Optoelectronics - Characterization of MBE Grown Ga1-xAlxAs Alloy Films by Raman ScatteringHou, Y.T. et al. | 1999
- 163
-
Characterization of MBE Grown Ga~1~-~xAl~xA~s Alloy Films by Raman ScatteringHou, Y. T. / Feng, Z. C. / Li, M. F. / Chua, S. J. et al. | 1999
- 166
-
Micro- and Optoelectronics - Infrared Reflectance Studies of GaN Epitaxial Films on Sapphire SubstrateFeng, Z.C. et al. | 1999
- 166
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Infrared Reflectance Studies of GaN Epitaxial Films on Sapphire SubstrateFeng, Z. C. / Hou, Y. T. / Chua, S. J. / Li, M. F. et al. | 1999
- 170
-
Studies on Interfacial Chemistry of Polypropylene/Aluminum Hydroxide CompositesRen, D. / Wang, J. et al. | 1999
- 170
-
Micro- and Optoelectronics - Studies on Interfacial Chemistry of Polypropylene-Aluminum Hydroxide CompositesRen, D. et al. | 1999
- 173
-
Micro- and Optoelectronics - Raman Scattering and Transverse Effective Charge of MOCVD-grown GaN Films Between 77 and 870 KLi, W.S. et al. | 1999
- 173
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Raman Scattering and Transverse Effective Charge of MOCVD-grown GaN Films Between 77 and 870 KLi, W. S. / Shen, Z. X. / Feng, Z. C. / Chua, S. J. et al. | 1999
- 177
-
Micro- and Optoelectronics - Valence-based Offsets of III-V Alloy HeterojunctionsWang, H.-Q. et al. | 1999
- 177
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Valence-based Offsets of III-V Alloy HeterojunctionsWang, H.-Q. / Zheng, J.-C. / Wang, R.-Z. / Zheng, Y.-M. / Cai, S.-H. et al. | 1999
- 181
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Compositional and Morphological Analysis of In~xGa~1~-~xN/GaN EpilayersLi, K. / Wee, A. T. S. / Lin, J. / Feng, Z. C. / Lau, E. W. P. et al. | 1999
- 181
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Micro- and Optoelectronics - Compositional and Morphological Analysis of InxGa1-xN-GaN EpilayersLi, K. et al. | 1999
- 186
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Micro- and Optoelectronics - Buried Interfaces: Interfacial Interactions in Materials for Polymer-LED ApplicationsAndersson, A. et al. | 1999
- 186
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Buried Interfaces: Interfacial Interactions in Materials for Polymer-LED ApplicationsAndersson, A. / Kugler, T. / Loegdlund, M. / Holmes, A. B. / Li, X. / Salaneck, W. R. et al. | 1999
- 191
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Thermoelectric Measurements for Bondability Analysis of Bond Pads: a New Concept for a Bondability AnalyserGroening, P. / Schwaller, P. / Schneuwly, A. / Schlapbach, L. et al. | 1999
- 191
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Micro- and Optoelectronics - Thermoelectric Measurements for Bondability Analysis of Bond Pads: A New Concept for a Bondability AnalyserGröning, P. et al. | 1999
- 195
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Synthesis and Characterization of Ge Nanocrystals Immersed in Amorphous SiO~x MatrixJie, Y. X. / Wu, X. / Huan, C. H. A. / Wee, A. T. S. / Guo, Y. / Zhang, T. J. / Pan, J. S. / Chai, J. / Chua, S. J. et al. | 1999
- 195
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Micro- and Optoelectronics - Synthesis and Characterization of Ge Nanocrystals Immersed in Amorphous SiOx MatrixJie, Y.X. et al. | 1999
- 200
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Laser-induced Formation of Titanium SilicidesChen, S. Y. / Shen, Z. X. / Chen, Z. D. / See, A. K. / Chan, L. H. / Zhang, T. J. / Tee, K. C. et al. | 1999
- 200
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Micro- and Optoelectronics - Laser-induced Formation of Titanium SilicidesChen, S.Y. et al. | 1999
- 204
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Raman Scattering and Room-temperature Visible Photoluminescence from Si Nanocrystals Embedded in SiO~2 Thin FilmsWang, Y. / Gong, H. / Yang, Y. / Guo, Y. / Gan, R. et al. | 1999
- 204
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Micro- and Optoelectronics - Raman Scattering and Room-temperature Visible Photoluminescence from Si Nanocrystals Embedded in SiO2 Thin FilmsWang, Y. et al. | 1999
- 208
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Thin Films and Magnetic Materials - TEM, XPS and FTIR Characterisation of Sputtered Carbon Nitride FilmsWei, J. et al. | 1999
- 208
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TEM, XPS and FTIR Characterisation of Sputtered Carbon Nitride FilmsWei, J. / Hing, P. / Mo, Z. Q. et al. | 1999
- 212
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Crystalline Carbon Nitride Deposition by r.f.-PECVD using a C~2H~4-NH~3-H~2 Source Gas MixtureLim, S. F. / Wee, A. T. S. / Lin, J. / Chua, D. H. C. et al. | 1999
- 212
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Thin Films and Magnetic Materials - Crystalline Carbon Nitride Deposition by rf-PECVD using a C2H4-NH3-H2 Source Gas MixtureLim, S.F. et al. | 1999
- 217
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Thin Films and Magnetic Materials - Inter-diffusion Studies of SrBi2Ta2O9 Film Prepared on Plantinized Wafer by Pulsed Laser AblationJiang, X.H. et al. | 1999
- 217
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Inter-diffusion Studies of SrBi~2Ta~2O~9 Film Prepared on Plantinized Wafer by Pulsed Laser AblationJiang, X. H. / Tay, S. T. / Wee, A. T. S. / Huan, C. H. A. / Liu, J. M. et al. | 1999
- 221
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Reactive Atom Synthesis and Characterization of C~3N~4 Crystalline FilmsLi, Y. G. / Wee, A. T. S. / Huan, C. H. A. / Li, W. S. / Pan, J. S. et al. | 1999
- 221
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Thin Films and Magnetic Materials - Reactive Atom Synthesis and Characterization of C3N4 Crystalline FilmsLi, Y.G. et al. | 1999
- 226
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Tribological and Optical Properties of Hydrogen-free Amorphous Carbon Films with Varying sp^3/sp^2 CompositionTay, B. K. / Shi, X. / Liu, E. / Tan, H. S. / Cheah, L. K. / Shi, J. / Lim, E. C. / Lee, H. Y. et al. | 1999
- 226
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Thin Films and Magnetic Materials - Tribological and Optical Properties of Hydrogen-free Amorphous Carbon Films with Varying sp3-Sp2 CompositionTay, B.K. et al. | 1999
- 231
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Thin Films and Magnetic Materials - Investigation of Tetrahedral Amorphous Carbon Films Using X-ray Photoelectron and Raman SpectroscopyTay, B.K. et al. | 1999
- 231
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Investigation of Tetrahedral Amorphous Carbon Films Using X-ray Photoelectron and Raman SpectroscopyTay, B. K. / Shi, X. / Tan, H. S. / Chua, D. H. C. et al. | 1999
- 235
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Thin Films and Magnetic Materials - Adhesion Improvement of Polytetrafluoroethylene-Metal Interface by Graft CopolymerizationZhang, J. et al. | 1999
- 235
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Adhesion Improvement of Polytetrafluoroethylene/Metal Interface by Graft CopolymerizationZhang, J. / Cui, C. Q. / Lim, T. B. / Kang, E.-T. / Neoh, K. G. et al. | 1999
- 240
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Thin Films and Magnetic Materials - Complete Optical Characterization of the SiO2-Si System by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force MicroscopyOhlidal, I. et al. | 1999
- 240
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Complete Optical Characterization of the SiO~2/Si System by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force MicroscopyOhlidal, I. / Franta, D. / Pincik, E. / Ohlidal, M. et al. | 1999
- 245
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Post-annealing Effect in Reactive r.f.-Magnetron-sputtered Carbon Nitride Thin FilmsChen, G. L. / Li, Y. / Lin, J. / Huan, C. H. A. / Guo, Y. P. et al. | 1999
- 245
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Thin Films and Magnetic Materials - Post-annealing Effect in Reactive rf-Magnetron-sputtered Carbon Nitride Thin FilmsChen, G.L. et al. | 1999
- 250
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Characterization of Co-Al-O Magnetic Thin Films by Combined use of XPS, XRD and EPMAAsami, K. / Mitani, S. / Fujimori, H. / Ohnuma, S. / Masumoto, T. et al. | 1999
- 250
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Thin Films and Magnetic Materials - Characterization of Co-Al-O Magnetic Thin Films by Combined use of XPS, XRD and EPMAAsami, K. et al. | 1999
- 254
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Thin Films and Magnetic Materials - The Application of AES Line Shape Analysis on the Identification of Interface Species During the Metallization of Diamond ParticlesZhu, Y. et al. | 1999
- 254
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The Application of AES Line Shape Analysis on the Identification of Interface Species During the Metallization of Diamond ParticlesZhu, Y. / Yao, W. / Zheng, B. / Cao, L. et al. | 1999
- 258
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Thin Films and Magnetic Materials - Study on the Electromigration Behaviors of Au-Ag Thin Films Deposited on SiO2 Substrate Using AES, XPS and AFM TechniquesCao, L. et al. | 1999
- 258
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Study on the Electromigration Behaviors of Au-Ag Thin Films Deposited on SiO~2 Substrate Using AES, XPS and AFM TechniquesCao, L. / Shi, F. / Song, W. / Zhu, Y. et al. | 1999
- 264
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Thin Films and Magnetic Materials - RHEED Studies of MnF2 Epitaxial Growth on Si(111) SubstratesYakovlev, N.L. et al. | 1999
- 264
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RHEED Studies of MnF~2 Epitaxial Growth on Si(111) SubstratesYakovlev, N. L. / Banshchikov, A. G. / Moisseeva, M. M. / Sokolov, N. S. / Beeby, J. L. / Maksym, P. A. et al. | 1999
- 267
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XRR and XPS Studies of SiO~2 Thin Films Formed by r.f. Magnetron SputteringKojima, I. / Li, B. / Fujimoto, T. et al. | 1999
- 267
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Thin Films and Magnetic Materials - XRR and XPS Studies of SiO2 Thin Films Formed by rf Magnetron SputteringKojima, I. et al. | 1999
- 271
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Thin Films and Magnetic Materials - Indium-doped Zinc Oxide Films Prepared by Simultaneous RF and DC Magnetron SputteringZhang, K. et al. | 1999
- 271
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Indium-doped Zinc Oxide Films Prepared by Simultaneous RF and DC Magnetron SputteringZhang, K. / Zhu, F. / Huan, C. H. A. / Wee, A. T. S. / Osipowicz, T. et al. | 1999