Research Papers - Single-quantum well InGaN green light emitting diode degradation under high electrical stress (English)
- New search for: Barton, D.L.
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In:
Microelectronics reliability
;
39
, 8
; 1219-1228
;
1999
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ISSN:
- Article (Journal) / Print
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Title:Research Papers - Single-quantum well InGaN green light emitting diode degradation under high electrical stress
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Contributors:
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Published in:Microelectronics reliability ; 39, 8 ; 1219-1228
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:1999
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 275/5670
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Keywords:
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Classification:
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Source:
Table of contents – Volume 39, Issue 8
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1171
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In memoriam| 1999
- 1173
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On the extraction of the source and drain series resistances of MOSFETsGarca Sanchez, F.J. / Ortiz-Conde, A. / Liou, J.J. et al. | 1999
- 1173
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Introductory Invited Papers - On the extraction of the source and drain series resistances of MOSFETsSánchez, F.J.Garcia et al. | 1999
- 1185
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Thin RF sputtered and thermal Ta"2O"5 on Si for high density DRAM applicationAtanassova, E. et al. | 1999
- 1185
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Introductory Invited Papers - Thin RF sputtered and thermal Ta2O5 on Si for high density DRAM applicationAtanassova, E. et al. | 1999
- 1219
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Single-quantum well InGaN green light emitting diode degradation under high electrical stressBarton, D.L. / Osinski, M. / Perlin, P. / G. Eliseev, P. / Lee, J. et al. | 1999
- 1219
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Research Papers - Single-quantum well InGaN green light emitting diode degradation under high electrical stressBarton, D.L. et al. | 1999
- 1229
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Research Papers - Failure modes in surface micromachined microelectromechanical actuation systemsMiller, S.L. et al. | 1999
- 1229
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Failure modes in surface micromachined microelectromechanical actuation systemsMiller, S.L. / Rodgers, M.S. / La Vigne, G. / Sniegowski, J.J. / Clews, P. / Tanner, D.M. / Peterson, K.A. et al. | 1999
- 1239
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Electrical characteristics of advanced lateral insulated-gate bipolar transistor structures at 77 KVellvehi, M. / Jorda, X. / Flores, D. / Godignon, P. / Rebollo, J. / Millan, J. et al. | 1999
- 1239
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Research Papers - Electrical characteristics of advanced lateral insulated-gate bipolar transistor structures at 77 KVeilvehi, M. et al. | 1999
- 1247
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Modeling of ionizing irradiation influence on Schottky-gate field-effect transistorDemarina, N.V. / Obolensky, S.V. et al. | 1999
- 1247
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Research Papers - Modeling of ionizing irradiation influence on Schottky-gate field-effect transistorDemarina, N.V. et al. | 1999
- 1265
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Research Papers - Reliability of radio frequency-microwave power packages: The effects of component materials and assembly processesFabis, P.M. et al. | 1999
- 1265
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Reliability of radio frequency/microwave power packages: the effects of component materials and assembly processesFabis, P.M. et al. | 1999
- 1275
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Research Papers - Material property, compatibility, and reliability issues in diamond-enhanced, GaAs-based plastic packagesFabis, P.M. et al. | 1999
- 1275
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Material property, compatibility, and reliability issues in diamond-enhanced, GaAs-based plastic packagesFabis, P.M. et al. | 1999
- 1293
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Analog circuit fault diagnosis based on noise measurementDai, Y. / Xu, J. et al. | 1999
- 1293
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Research Notes - Analog circuit fault diagnosis based on noise measurementDai, Y. et al. | 1999
- 1299
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Incomplete ionization in a semiconductor and its implications to device modelingXiao, G. / Lee, J. / Liou, J.J. / Ortiz-Conde, A. et al. | 1999
- 1299
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Research Notes - Incomplete ionization in a semiconductor and its implications to device modelingXiao, G. et al. | 1999
- 1305
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Calendar of forthcoming events| 1999