Determination of the elemental status of ancient human bones from Bockenheim-Rheinland-Pfalz by PIGE and PIXE (English)
- New search for: Jankuhn, S.
- New search for: Jankuhn, S.
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In:
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
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161
; 894-897
;
2000
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ISSN:
- Article (Journal) / Print
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Title:Determination of the elemental status of ancient human bones from Bockenheim-Rheinland-Pfalz by PIGE and PIXE
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Contributors:
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Published in:
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2000
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 535/3450
- New search for: 33.00
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Keywords:
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Source:
Table of contents – Volume 161
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Energy-loss spectra of swift ionsGlazov, L. et al. | 2000
- 9
-
Plasma physics with intense laser and ion beamsHoffmann, D.H.H. et al. | 2000
- 19
-
Simplifying position-sensitive gas-ionization detectors for heavy ion elastic recoil detectionTimmers, H. et al. | 2000
- 29
-
New concepts for radiocarbon detection systemsSynal, H.-A. et al. | 2000
- 37
-
Energy spread in ion beam analysisSzilágyi, E. et al. | 2000
- 48
-
Real-time RBS of solid-state reaction in thin filmsTheron, C.C. et al. | 2000
- 56
-
In situ surface analysis by low energy ion scatteringDenier van der Gon, A.W. et al. | 2000
- 65
-
Electronic sputtering of solids by slow, highly charged ions: Fundamentals and applicationsSchenkel, T. et al. | 2000
- 76
-
Heavy ion tumour therapyScholz, M. et al. | 2000
- 83
-
The use of proton microbeams for the production of microcomponentsOsipowicz, T. et al. | 2000
- 90
-
Yields of bulk plasmons excited by slow Neq+ ions interacting with an Al surfaceNiemann, D. et al. | 2000
- 96
-
Charge equilibration of He ions in the Si 100 channelAzevedo, G. d. / Kaschny, J. R. / Behar, M. / Grande, P. L. / Klatt, C. / Kalbitzer, S. et al. | 2000
- 96
-
Charge equilibration of He ions in the Si <100> channelAzevedo, G.d.M. et al. | 2000
- 101
-
Stopping cross-section measurements of 4He in TiN1.1O0.27Climent-Font, A. et al. | 2000
- 106
-
A TOF system to measure the energy loss of low energy ions in a hot dense plasmaShibata, K. et al. | 2000
- 111
-
Investigation of charge-state modifications under channeling conditions by highly charged heavy projectilesDitroi, F. et al. | 2000
- 115
-
Ultra thin layer activation by implantation of recoil radioactive nuclei: Experiments and simulationsVincent, L. et al. | 2000
- 120
-
Anomalous X-ray yields from insulating samples bombarded by ion beamsJesus, A.P. et al. | 2000
- 125
-
Evaluation of the cross-section for elastic scattering of 4He from carbonGurbich, A.F. et al. | 2000
- 130
-
RBS and ERD cross-sections and optical model parameters for the analysis of lithium, boron and nickelNurmela, A. et al. | 2000
- 136
-
New data on the proton elastic scattering cross-section for siliconHealy, M.J.F. et al. | 2000
- 141
-
Experimental measurements of X-ray production cross-sections by protons of energies between 1 and 2.3 MeV and comparison with theoretical predictions of PWBA and ECPSSR modelsOuziane, S. et al. | 2000
- 145
-
Angular dependence of the electronic stopping power of Li ions channeled around the Si <100> directionAzevedo, G.de M. et al. | 2000
- 145
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Angular dependence of the electronic stopping power of Li ions channeled around the Si 100 directionde M. Azevedo, G. / Dias, J. F. / dos Santos, J. H. / Grande, P. L. / Behar, M. / Klatt, C. / Kalbitzer, S. et al. | 2000
- 150
-
Range parameters of aluminium implants in medium and heavy mass metalsHayes, M. et al. | 2000
- 155
-
Heavy ion stripping by a highly-ionized laser plasmaOguri, Y. et al. | 2000
- 159
-
A new experimental method for precise energy loss measurementsLiguori Neto, R. et al. | 2000
- 164
-
Stopping powers of havar for 1.6, 2.3 and 3.2 MeV-u heavy ionsAlanko, T. et al. | 2000
- 168
-
Molecular H2 and H3 energy loss measurements along the Si <111> directionBehar, M. et al. | 2000
- 168
-
Molecular H2 and H3 energy loss measurements along the Si 111 directionBehar, M. / Grande, P. L. / Azevedo, G. d. / Alves, E. / Silva, M. F. / Soares, J. C. et al. | 2000
- 172
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Investigation of deuteron induced nuclear reactions on niobiumDitroi, F. et al. | 2000
- 178
-
Experimental study of excitation functions for some reactions induced by deuterons (10-50 Mev) on natural Fe and TiHermanne, A. et al. | 2000
- 186
-
Excitation function and cross-sections of the reaction 19F(p,p'g)19FJesus, A.P. et al. | 2000
- 186
-
Excitation function and cross-sections of the reaction 19F(p,pprimeg)19FJesus, A. P. / Braizinha, B. / Ribeiro, J. P. et al. | 2000
- 191
-
M-X-ray production cross-sections for 0.2-2 MeV deuteronsJaskola, M. et al. | 2000
- 196
-
L-subshell ionisation studies of Ta, W and Pt with protonsJohn Kennedy, V. et al. | 2000
- 202
-
Characteristics of Albany's compact high resolution magnetic spectrometerLanford, W.A. et al. | 2000
- 207
-
High energy ion beam analysis on polymers at cryogenic temperaturesde Jong, M.P. et al. | 2000
- 211
-
High accuracy, high energy He-ERD analysis of H, D and TBrowning, J.F. et al. | 2000
- 216
-
Tritium depth profiling in carbon by accelerator mass spectrometryFriedrich, M. et al. | 2000
- 221
-
Depth profiling: RBS versus energy-dispersive X-ray imaging using scanning transmission electron microscopyMarkwitz, A. et al. | 2000
- 227
-
New high-precision 5-axes RBS-channeling goniometer for ion beam analysis of 150 mm emptyv wafersHolländer, B. et al. | 2000
- 227
-
New high-precision 5-axes RBS/channeling goniometer for ion beam analysis of 150 mm wafersHollander, B. / Heer, H. / Wagener, M. / Halling, H. / Mantl, S. et al. | 2000
- 231
-
Simultaneous hydrogen detection with an ERD gas ionization detectorElliman, R.G. et al. | 2000
- 235
-
Effects of surface roughness on results in elastic recoil detection measurementsSajavaara, T. et al. | 2000
- 240
-
129I measurements at the Uppsala tandem acceleratorBuraglio, N. et al. | 2000
- 245
-
Molecular information in static SIMS for the speciation of inorganic compoundsVan Ham, R. et al. | 2000
- 250
-
Developments towards a fully automated AMS systemSteier, P. et al. | 2000
- 255
-
Quantitative analysis with heavy ion E-TOF-ERDCliment Font, A. et al. | 2000
- 260
-
Investigation of beam effect on porous siliconKotai, E. et al. | 2000
- 264
-
Thick-target correction in PIXE for randomly inhomogeneous samplesSjöland, K.A. et al. | 2000
- 269
-
19F(p,p'g)19F and 18O(p,g)19F gamma-ray interferences studied on liquidsGrambole, D. et al. | 2000
- 269
-
19F(p,pprimeg)19F and 18O(p,g)19F gamma-ray interferences studied on liquidsGrambole, D. / Neelmeijer, C. / Noll, K. / Herrmann, F. et al. | 2000
- 275
-
Uncertainty budget for Ion Beam AnalysisSjöland, K.A. et al. | 2000
- 281
-
Application specific integrated circuit (ASIC) readout technologies for future ion beam analytical instrumentsWhitlow, H.J. et al. | 2000
- 287
-
Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry dataJeynes, C. et al. | 2000
- 293
-
The Si surface yield as a calibration standard for RBSBianconi, M. et al. | 2000
- 297
-
Influence of heavy ion irradiation damage on silicon charged particle detector calibrationZhang, Y. et al. | 2000
- 302
-
A new PC-controlled device for emittance and brightness measurementsScheloske, S. et al. | 2000
- 308
-
Simultaneous and consistent analysis of NRA, RBS and ERDA data with the IBA DataFurnaceBarradas, N.P. et al. | 2000
- 314
-
The effects of large angle plural scattering on heavy ion elastic recoil detection analysisJohnston, P.N. et al. | 2000
- 318
-
A computer code package for Monte Carlo photon-electron transport simulation - Comparisons with experimental benchmarksPopescu, L.M. et al. | 2000
- 318
-
A computer code package for Monte Carlo photon-electron transport simulationPopescu, L. M. et al. | 2000
- 323
-
The Leipzig high-energy ion nanoprobe: A report on first resultsButz, T. et al. | 2000
- 328
-
Development of an external beam nuclear microprobe on the Aglae facility of the Louvre museumCalligaro, T. et al. | 2000
- 334
-
Micron-scale analysis of SiC-SiCf composites using the new Lisbon nuclear microprobeAlves, L.C. et al. | 2000
- 339
-
Ion beam dose measurement in nuclear microprobe using a compact beam chopperBartha, L. et al. | 2000
- 344
-
Sub-milliprobe at the CTU in PragueVoltr, J. et al. | 2000
- 348
-
Using microprobe distribution maps to determine homogeneity and correlation between elementsMunnik, F. et al. | 2000
- 354
-
Mapping of light elements with the ANSTO high energy heavy ion microprobeSiegele, R. et al. | 2000
- 359
-
A novel micro-structured reference material for microbeam analysisWätjen, U. et al. | 2000
- 366
-
Sub 100 nm proton beam micromachining: theoretical calculations on resolution limitsvan Kan, J.A. et al. | 2000
- 371
-
Surface structures of SrTiO3(001) and Ni-SrTiO3(001) studied by medium-energy ion scattering and SR-photoelectron spectroscopyKido, Y. et al. | 2000
- 377
-
Investigation of the dynamics of changes of the Cu3 Au(100) surface in the course of ordering by low energy ion scatteringDzhurakhalov, A.A. et al. | 2000
- 381
-
Post-irradiation effects in MOS structuresIliescu, E. et al. | 2000
- 387
-
Results on electron irradiated Fricke solutions at low temperaturesHategan, A. et al. | 2000
- 390
-
Ion scattering studies of ordered alloy surfaces: CuAu(100) and NiAlBeikler, R. et al. | 2000
- 396
-
Study of TiO2(110)-p(1x1), p(1x2) and p(1x3) surface structures by impact collision ion scattering spectroscopy (ICISS)Asari, E. et al. | 2000
- 401
-
Effect of implanted silicon on hydrogen behavior in aluminum and nickelImanishi, N. et al. | 2000
- 406
-
The influence of the oxygen partial pressure on the ion nitriding of aluminium - An investigation by means of real time elastic recoil detection analysisParascandola, S. et al. | 2000
- 411
-
Combined ion and electron spectroscopy study of the surface reactions of beryllium with carbonGoldstrass, P. et al. | 2000
- 415
-
Argon implantation into GaAs and in situ RBS analysis at 21 and 77 KBreeger, B. et al. | 2000
- 419
-
In situ monitoring of hydrogen-surfactant effect during Ge growth on Si(001) using coaxial impact-collision ion scattering spectroscopy and time-of-flight elastic recoil detection analysisFujino, T. et al. | 2000
- 424
-
He ion beam density effect on damage induced in SiC during Rutherford backscattering measurementKhánh, N.Q. et al. | 2000
- 429
-
Characterization of ultra thin oxynitrides: A general approachBrijs, B. et al. | 2000
- 435
-
Topographical structure of MBE grown cubic InxGa1-xN films studied with a MeV ion microprobe and by AFMBrenn, R. et al. | 2000
- 441
-
Silicon isotopic tracing with the 29Si(p,g) narrow resonance near 415 keVVickridge, I.C. et al. | 2000
- 446
-
Theory of ion beam induced charge collection in detectors based on the extended Shockley-Ramo theoremVittone, E. et al. | 2000
- 452
-
Intermixing at Ge-Si(001) interfaces studied by high-resolution RBSNakajima, K. et al. | 2000
- 457
-
Ion beam induced charge collection (IBICC) studies of cadmium zinc telluride (CZT) radiation detectorsDoyle, B.L. et al. | 2000
- 462
-
Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiCVickridge, I.C. et al. | 2000
- 467
-
Comparative concentration analysis of Cr and Co in FeSi2 films performed by ERDA and RBSBohne, W. et al. | 2000
- 471
-
Study of interdiffusion in amorphous Si-Ge multilayers by Rutherford backscattering spectrometrySimon, A. et al. | 2000
- 476
-
Effectiveness of high energy ion beam techniques for the characterization of mesoporous low dielectric-constant materialsThevuthasan, S. et al. | 2000
- 482
-
Comparative study of RBS, SIMS and VASE for characterisation of high electron mobility transistorsPersson, L. et al. | 2000
- 487
-
Defects and strain studies in semiconductor multilayersPathak, A.P. et al. | 2000
- 492
-
Strain measurements in ultra-thin buried films (<50 °A) with RBS ion channelingSelen, L.J.M. et al. | 2000
- 496
-
Analysis of defects in multicomponent crystals by ion channelingStonert, A. et al. | 2000
- 501
-
Deuterium channeling analysis for He+-implanted 6H-SiCJiang, W. et al. | 2000
- 505
-
Ion beam induced epitaxy experiments in silicon under channeling and random alignmentsWilliams, J.S. et al. | 2000
- 510
-
Ion beam analysis of interface reactions in magnetite and maghemite thin filmsThevuthasan, S. et al. | 2000
- 515
-
Determination of lattice displacements in Se implanted InP by RBS and PIXE channeling experimentsSchrempel, F. et al. | 2000
- 520
-
Lattice sites of diffused gold and platinum in epitaxial ZnSe layersSeppälä, A. et al. | 2000
- 524
-
Simulations and comparisons of channeling spectra in the p+28Si system in the backscattering geometryAslanoglou, X.A. et al. | 2000
- 528
-
Implantation of group IVA elements in TiO2: lattice site location and diffusionFromknecht, R. et al. | 2000
- 534
-
RBS-NRA-channeling analysis of implanted immiscible speciesNaramoto, H. et al. | 2000
- 539
-
Characterization of InGaN-GaN heterostructures by means of RBS-channelingNowicki, L. et al. | 2000
- 544
-
Investigation of thermal recovery behavior in hydrogen-implanted SrTiO3 using high energy ion beam techniquesThevuthasan, S. et al. | 2000
- 549
-
Investigation of an 18 °A Al2O3 layer in a magnetic multilayer system by Rutherford and resonant scatteringKling, A. et al. | 2000
- 553
-
Application of the particle backscattering methods for the study of new oxide protective coatings at the surface of Al and Mg alloysApelfeld, A.V. et al. | 2000
- 558
-
Analysis of ferromagnetic removable hard disc media ageing by time of flight-energy elastic recoil detection analysisWinzell, T. et al. | 2000
- 563
-
Thickness uniformity of beryllium foils derived from energy loss broadening of transmitted MeV protonsHietel, B. et al. | 2000
- 568
-
ERDA study of H incorporated into lithium niobate optical layersBudnar, M. et al. | 2000
- 573
-
A comparative study of different IBA techniques for determining the thickness of thin SiO2 filmsDytlewski, N. et al. | 2000
- 578
-
Narrow resonance profiling study of the oxidation of reactively sputtered Ti1-xAlxN thin filmsHugon, M.C. et al. | 2000
- 584
-
Studies of electrochemical oxidation of Zircaloy nuclear reactor fuel cladding using time-of-flight-energy elastic recoil detection analysisWhitlow, H.J. et al. | 2000
- 590
-
Characterization of optical UV filters using Rutherford backscattering spectroscopyVlastou, R. et al. | 2000
- 595
-
Ion beam analysis of composition and impurities in YBa2Cu3O7-d and Bi2Sr2Ca2Cu3O10-d superconductor thin filmsMatsunami, N. et al. | 2000
- 600
-
Nucleation study of titanium nitride onto steel using 15N(p,ag)12C resonant nuclear reactionRoquiny, P. et al. | 2000
- 605
-
Hydrogen distribution characterization in Cu(111)-Nb(110) multilayer using ion beam analysisYamamoto, S. et al. | 2000
- 609
-
Investigation of laser nitriding of iron using ion beam analysisLandry, F. et al. | 2000
- 614
-
External microbeam PIGE study of Li and F distribution in PVdF-HFP electrolyte gel polymer for lithium battery applicationTadic, T. et al. | 2000
- 619
-
Concentration profiles and structural changes of silver intercalated titanium disulfideHeitmann, J. et al. | 2000
- 624
-
Heavy-ion elastic-recoil detection analysis of doped-silica films for integrated photonicsWeijers, T.D.M. et al. | 2000
- 629
-
Simultaneous nuclear reaction analyses of boron and phosphorus in thin borophosphosilicate glass films using (a,p) reactionsWalsh, D.S. et al. | 2000
- 635
-
Ion beam analysis of copper selenide thin films prepared by chemical bath depositionAndrade, E. et al. | 2000
- 641
-
Diffusion of hydrogen implanted in a-quartz during air annealingBolse, W. et al. | 2000
- 646
-
Thermal diffusion of molybdenum in apatiteGaillard, C. et al. | 2000
- 651
-
PIXE monitoring of diffusion during photo-polymerizationLeewis, C.M. et al. | 2000
- 656
-
Study of the diffusion behaviour of aluminium in silicon up to 900(degree)C by nuclear reaction analysisHauser, T. et al. | 2000
- 663
-
RBS characterization of the iridium diffusion in siliconRodriguez, A. et al. | 2000
- 668
-
Use of RBS to validate europium surface implantation as a marker for the corrosion study of zirconiaPoulard, K. et al. | 2000
- 673
-
Annealing behaviour of aluminium-implanted InPKyllönen, V. et al. | 2000
- 677
-
Diffusion study of plasma ion implanted H in siliconSom, T. et al. | 2000
- 682
-
Nuclear reaction analysis of hydrogen migration in silicon dioxide films on silicon under 15N ion irradiationEcker, K.H. et al. | 2000
- 686
-
RBS study of fission product migration in advanced nuclear fuel materialsJagielski, J. et al. | 2000
- 690
-
Ion nitriding of aluminium - experimental investigation of the thermal transportTelbizova, T. et al. | 2000
- 694
-
Bottger stoneware from North America and Europe; are they authenticSwann, C. P. / Nelson, C. H. et al. | 2000
- 694
-
Böttger stoneware from North America and Europe; are they authenticSwann, C.P. et al. | 2000
- 699
-
Study of Italian Renaissance sculptures using an external beam nuclear microprobeZucchiatti, A. et al. | 2000
- 704
-
Investigation of objects d'art by PIXE with 68 MeV protonsDenker, A. et al. | 2000
- 709
-
Distinguishing between native and smelted coppers using PIXE spectrometry: a case history from early colonial AmericaFleming, S.J. et al. | 2000
- 714
-
Analysis of Minoan white pigments used on pottery from PalaikastroSwann, C.P. et al. | 2000
- 718
-
Analysis of medieval glass by X-ray spectrometric methodsSmit, Z. et al. | 2000
- 724
-
Is the external beam PIXE method suitable for determining ancient silver artifact fineness?Weber, G. et al. | 2000
- 730
-
RBS and NRA with external beams for archaeometric applicationsIoannidou, E. et al. | 2000
- 737
-
Comparative analysis of odontolite, heated fossil ivory and blue fluorapatite by PIXE-PIGE and TEMReiche, I. et al. | 2000
- 743
-
Combined PIXE and XPS analysis on republican and imperial Roman coinsDaccà, A. et al. | 2000
- 748
-
Characterization of Dyrrhachium silver coins by micro-PIXE methodUzonyi, I. et al. | 2000
- 753
-
Analyses of gold artifacts from SloveniaSmit, Z. et al. | 2000
- 758
-
Yellow, red and blue pigments from ancient Egyptian palace painted wallsUda, M. et al. | 2000
- 762
-
Ion beam analysis of pottery from Teotihuacan, MexicoOntalba Salamanca, M.A. et al. | 2000
- 769
-
PIXE-PIGE characterisation of emeralds using an external micro-beamCalligaro, T. et al. | 2000
- 775
-
Multi-elemental methods for fine particle source apportionment at the global baseline station at Cape Grim, TasmaniaCohen, D.D. et al. | 2000
- 780
-
A detailed 2-year record of atmospheric 14CO in the temperate northern hemisphereRom, W. et al. | 2000
- 786
-
Study of the aerosol composition in the town of La Spezia with continuous sampling and PIXE analysisBongiovanni, S.F. et al. | 2000
- 792
-
PIXE, a new technique for the trace element analysis of high explosivesLane, D.W. et al. | 2000
- 797
-
Nuclear reaction and SIMS studies of carbon diffusion in olivinesShilobreeva, S.N. et al. | 2000
- 801
-
Study of metal bioaccumulation by nuclear microprobe analysis of algae fossils and living algae cellsGuo, P. et al. | 2000
- 808
-
Analysis of single aerosol particles collected in urban and cave environment by proton microprobeKertész, Z. et al. | 2000
- 814
-
Optimisation of peak-to-background ratios in proton-induced X-ray analysis of material deposited on thin and thick backingsWittmaack, K. et al. | 2000
- 819
-
Elemental composition of urban aerosol collected in Florence, ItalyLucarelli, F. et al. | 2000
- 825
-
TTPIXE analysis of Guadiamar river sediments collected before the environmental disaster of 1998Martin, J.E. et al. | 2000
- 830
-
Identification of air pollution sources by single aerosol particle fingerprints - micro-PIXE spectraWang, J. et al. | 2000
- 836
-
Contribution of PIGE technique to the study of obsidian glassesElekes, Z. et al. | 2000
- 842
-
Cathodoluminescence spectroscopy and micro-PIXE: combined high resolution Mn-analyses in dolomites - First resultsGillhaus, A. et al. | 2000
- 846
-
High resolution rare-earth elements analyses of natural apatite and its application in geo-sciences: Combined micro-PIXE, quantitative CL spectroscopy and electron spin resonance analysesHabermann, D. et al. | 2000
- 852
-
The biological research programme of the nuclear microprobe at the National Accelerator Centre, FaureProzesky, V.M. et al. | 2000
- 860
-
Nuclear microprobe analysis of muscle biopsies: Applications in pathology and clinicMoretto, P. et al. | 2000
- 867
-
Ionoluminescence investigations of ancient human bone with an external ion beamSpemann, D. et al. | 2000
- 872
-
Biological experiments in low-flux light-particle fields produced by acceleratorsDörschel, B. et al. | 2000
- 877
-
Complex life histories of fishes revealed through natural information storage devices: case studies of diadromous events as recorded by otolithsElfman, M. et al. | 2000
- 882
-
Calibration procedure for pinhole filters for PIXE analysisQuaedackers, J.A. et al. | 2000
- 887
-
Microprobe studies of inorganic deposits in the aortic wallRokita, E. et al. | 2000
- 894
-
Determination of the elemental status of ancient human bones from Bockenheim-Rheinland-Pfalz by PIGE and PIXEJankuhn, S. et al. | 2000