Digital Electron Microscopy on Advanced Materials (English)
- New search for: Shindo, D.
- New search for: Shindo, D.
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In:
Materials characterization
;
44
, 4
; 375-384
;
2000
-
ISSN:
- Article (Journal) / Print
-
Title:Digital Electron Microscopy on Advanced Materials
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Contributors:
-
Published in:Materials characterization ; 44, 4 ; 375-384
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Publisher:
- New search for: Elsevier
-
Place of publication:New York, NY
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Publication date:2000
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ISSN:
-
ZDBID:
-
Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 51.30
- Further information on Basic classification
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Keywords:
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Classification:
BKL: 51.30 Werkstoffprüfung, Werkstoffuntersuchung -
Source:
Table of contents – Volume 44, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 347
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The Scraping Test and Adhesion Measurements of Diamond and Nickel Electroless CoatingsXie, Zhongwei et al. | 2000
- 353
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High-Resolution and Low-Voltage FE-SEM Imaging and Microanalysis in Materials CharacterizationLiu, Jingyue et al. | 2000
- 365
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Effect of Small g Precipitates on the Two-way Shape Memory Effect in a Cu-Zn-Al AlloyZhang, X.M. et al. | 2000
- 371
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Thin-Shell Structure of Nanometal ParticlesZhang, Zhikun et al. | 2000
- 375
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Digital Electron Microscopy on Advanced MaterialsShindo, D. et al. | 2000
- 385
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A Study on Crystal Defects in Epitaxial GaN Film by High-Order Weak-Beam Electron MicroscopyWang, S.Q. et al. | 2000
- 391
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Microstructures in Advanced Materials Characterized by HREM and Nanoscale AnalysisLi, D.X. et al. | 2000
- 403
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HREM Observations of Kinking in SiC Induced by Ball MillingYang, X.Y. et al. | 2000
- 407
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Helical Diffraction from Tubular StructuresQin, Lu-Chang et al. | 2000
- 413
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Relationships Between Microstructure and Properties of Stainless Steels- A Few Working ExamplesLiu, Ping et al. | 2000
- 425
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Investigation of Brazing Structure of Bulk Graphite to a W-Re SubstrateYingquan, Li et al. | 2000
- 431
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Crystal Orientation Measured by XRD and Annotation of the Butterfly DiagramGuo, Zhenqi et al. | 2000
- 435
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Verification for Particle Size Distribution of Ultrafine Powders by the SAXS MethodXiang, Yingwei et al. | 2000
- 441
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TEM Investigation on Stress Contrast and Interfaces of Contacting ParticlesYao, Yimin et al. | 2000
- 453
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Investigation of the Effect of the Annealing Process on the Domain Structure of 0.65Pb(Mg1-3Nb2-3)O3-0.35 PbTiO3 Single Crystal Using Scanning Electron Acoustic MicroscopyLiao, J. et al. | 2000