EIC Message (English)
In:
IEEE design & test of computers
;
18
, 3
; 1-2
;
2001
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ISSN:
- Article (Journal) / Print
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Title:EIC Message
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Published in:IEEE design & test of computers ; 18, 3 ; 1-2
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Publisher:
- New search for: Soc.
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Place of publication:Los Alamitos, Calif.
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Publication date:2001
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 54.33 / 54.00
- Further information on Basic classification
- New search for: 770/3155
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Keywords:
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Classification:
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Source:
Table of contents – Volume 18, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Departments - EIC Message| 2001
- 1
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EIC Message| 2001
- 3
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Guest editors' introduction: the new world of large embedded memoriesRajsuman, R. / Catthoor, F. et al. | 2001
- 3
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Features - Guest Editors' Introduction: The New World of Large Embedded MemoriesRajsuman, Rochit et al. | 2001
- 5
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Perspectives: Moving the market to embedded memoryShubat, A. et al. | 2001
- 5
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Departments - Perspectives| 2001
- 5
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Perspectives| 2001
- 7
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Embedded DRAM development: Technology, physical design, and application issuesKeitel-Schulz, D. / Wehn, N. et al. | 2001
- 7
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Features - Embedded DRAM Development: Technology, Physical Design, and Application IssuesKeitel-Schulz, Doris et al. | 2001
- 16
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Design and test of large embedded memories: An overviewRajsuman, R. et al. | 2001
- 16
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Features - Design and Test of Large Embedded Memories: An OverviewRajsuman, Rochit et al. | 2001
- 28
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Using electrical bitmap results from embedded memory to enhance yieldSegal, J. / Jee, A. / Lepejian, D. / Chu, B. et al. | 2001
- 28
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Features - Using Electrical Bitmap Results from Embedded Memory to Enhance YieldSegal, Julie et al. | 2001
- 40
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Features - Random-Access Data Storage Components in Customized ArchitecturesNachtergaele, Lode et al. | 2001
- 40
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Random-access data storage components in customized architecturesNachtergaele, L. / Catthoor, F. / Kulkarni, C. et al. | 2001
- 56
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Data memory organization and optimizations in application-specific systemsRanjan Panda, P. / Dutt, N.D. / Nicolau, A. / Catthoor, F. / Vandecappelle, A. / Brockmeyer, E. / Kulkarni, C. / De Greef, E. et al. | 2001
- 56
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Features - Data Memory Organization and Optimizations in Application-Specific SystemsPanda, Preeti Ranjan et al. | 2001
- 70
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Code transformations for data transfer and storage exploration preprocessing in multimedia processorsCatthoor, F. / Danckaert, K. / Wuytack, S. / Dutt, N.D. et al. | 2001
- 70
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Features - Code Transformations for Data Transfer and Storage Exploration Preprocessing in Multimedia ProcessorsCatthoor, Francky et al. | 2001
- 83
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Special Features - System-on-Chip Testability Using LSSD Scan StructuresZarrineh, Kamran et al. | 2001
- 83
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System-on-chip testability using LSSD scan structuresZarrineh, K. / Upadhyaya, S.J. / Chickermane, V. et al. | 2001
- 98
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A survey of digital design reuseJacome, M.F. / Peixoto, H.P. et al. | 2001
- 98
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Special Features - A Survey of Digital Design ReuseJacome, Margarida F. et al. | 2001
- 108
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Special Features - Automatic Generation of Parallel CRC CircuitsSprachmann, Michael et al. | 2001
- 108
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Automatic generation of parallel CRC circuitsSprachmann, M. et al. | 2001
- 115
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System-on-chip specification and modeling using C++: challenges and opportunities| 2001
- 115
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Departments - Roundtable| 2001
- 115
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Roundtable| 2001
- 124
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Conference Reports| 2001
- 124
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Departments - Conference Reports| 2001
- 127
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DATC Newsletter| 2001
- 127
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Departments - DATC Newsletter| 2001
- 128
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The Last Byte| 2001
- 128
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The last byte - two enduring questions for computer designJerraya, A. et al. | 2001