Heavy metal pathways and archives in biological tissue (English)
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In:
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
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190
; 439-444
;
2002
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ISSN:
- Article (Journal) / Print
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Title:Heavy metal pathways and archives in biological tissue
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Contributors:Orlic, I. ( author ) / Siegele, R. / Menon, D.D. / Markich, S.J. / Cohen, D.D. / Jeffree, R.A. / Mcphail, D.C. / Sarbutt, A. / Stelcer, E.
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- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2002
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 535/3450
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Source:
Table of contents – Volume 190
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Ionoluminescence decay measured with single ionsMcdaniel, F.D. et al. | 2002
- 11
-
Insight in the outside: New applications of low-energy ion scatteringBrongersma, Hidde H. et al. | 2002
- 19
-
Axial ion-electron emission microscopy of IC radiation hardnessDoyle, B.L. et al. | 2002
- 26
-
Development of enhanced depth-resolution technique for shallow dopant profilesFujita, M. et al. | 2002
- 34
-
The point defect engineering approaches for ultra-shallow boron junction formation in siliconChu, W.-K. et al. | 2002
- 40
-
Ion implantation of rare earth ions for light emittersBuchal, Ch et al. | 2002
- 47
-
RBS analysis of trace gas uptake on iceHuthwelker, T. et al. | 2002
- 54
-
The new Melbourne nuclear microprobe systemJamieson, D.N. et al. | 2002
- 60
-
Simultaneous wide-range stopping power determination for several ionsAlanko, T. et al. | 2002
- 64
-
Stopping power of swift neon ions in dependence on the charge state in the non-equilibrium regimeBlazevic, A. et al. | 2002
- 69
-
Electronic stopping power of swift heavy ions in carbonZhang, Yanwen et al. | 2002
- 74
-
Energy loss measurements of H2 and H3 molecular beams along random and 110 directions of SiBehar, M. / Cohen, C. / dos Santos, J. H. / Grande, P. L. et al. | 2002
- 74
-
Energy loss measurements of H2 and H3 molecular beams along random and <110> directions of SiBehar, M. et al. | 2002
- 79
-
Random stopping power and energy straggling of 16O ions into amorphous Si targetAraujo, L.L. et al. | 2002
- 84
-
Measurements of Si ion stopping in amorphous siliconWhitlow, Harry J. et al. | 2002
- 89
-
Electronic energy loss of swift protons in the oxides Al2O3, SiO2 and ZrO2Abril, Isabel et al. | 2002
- 95
-
Measurement of (p,p) elastic differential cross-sections for carbon, nitrogen, oxygen, aluminium and silicon in the 500-2500 keV range at 140(degree) and 178(degree) laboratory scattering anglesRamos, A.R. et al. | 2002
- 100
-
Helium elastic scattering from carbon for 30(degree) to 150(degree) in the energy region from 2 to 4.8 MeVBogdanovic Radovic, I. et al. | 2002
- 107
-
Cross-sections of 11B(p,a)8Be reaction for boron analysisLiu, Jiarui et al. | 2002
- 112
-
An empirical formula for L line X-ray production cross-section of elements from Ag to U for protons below 3.5 MeVStrivay, D. et al. | 2002
- 117
-
Proton-induced g-ray analysis of lithium in thick samplesMateus, R. et al. | 2002
- 122
-
Charge state distributions of heavy ions after scattering at surface atomsKlein, C. et al. | 2002
- 127
-
Neutralization of He ions scattered from Ca surfaceSasaki, M. et al. | 2002
- 131
-
Spatial and energy distributions of the fragments resulting from the dissociation of swift molecular ions in solidsHeredia-Avalos, Santiago et al. | 2002
- 136
-
Ion beam induced luminescence of materialsBrooks, R.J. et al. | 2002
- 141
-
Light emission from oxygen covered Al and Cu surfacesLee, C.S. et al. | 2002
- 146
-
Real-time evolution of ion-surface interactions of MgAl2O3 and LiNbO3 detected by ion-induced photon spectroscopyBandourko, V. et al. | 2002
- 151
-
High ion-beam induced electron yields from polycrystalline diamondHoxley, D.I. et al. | 2002
- 154
-
Proton beam micromachining: electron emission from SU-8 resist during ion beam irradiationBettiol, A.A. et al. | 2002
- 160
-
Carbon KVV Auger electron emission from highly oriented pyrolytic graphite bombarded by fast protonsKudo, Hiroshi et al. | 2002
- 164
-
Structure dependent electronic sputtering of a-C:H films by swift heavy ionsGhosh, S. et al. | 2002
- 169
-
Studies of electronic sputtering of fullerene under swift heavy ion impactGhosh, S. et al. | 2002
- 173
-
Atomic mixing in thin film systems by swift heavy ionsBolse, Wolfgang et al. | 2002
- 177
-
The novel HVEE 5 MV TandetrontradeGottdang, A. et al. | 2002
- 177
-
The novel HVEE 5 MV TandetronGottdang, A. / Mous, D. J. / Haitsma, R. G. et al. | 2002
- 183
-
Detection system for depth profiling of radiotracersLaitinen, Pauli et al. | 2002
- 186
-
External PIGE-PIXE measurements at the S~ao Paulo 8UD tandem acceleratorRizzutto, M.A. et al. | 2002
- 190
-
The development of a time of flight spectrometer for LARNMathot, G. et al. | 2002
- 195
-
Real-time measurement of implanted deuterons by using the nuclear reaction 2H(d,p)3HKawachi, N. et al. | 2002
- 199
-
In situ ERD analysis of sol-gel films during thermal processingDytlewski, N. et al. | 2002
- 203
-
Single photon ionisation of self assembled monolayersKing, B.V. et al. | 2002
- 207
-
Ion-induced photon spectroscopy of insulators and application to in-situ diagnostics of nanoparticle formation processesKishimoto, N. et al. | 2002
- 212
-
Ion-beam-induced-charge characterisation of particle detectorsYang, C. et al. | 2002
- 217
-
Accumulation of decelerated gold ionsRatschko, D. et al. | 2002
- 222
-
Surface properties of electrolyte solutions studied with ion beam analysisAndersson, G. et al. | 2002
- 226
-
Study of the permeability of thin films of a-Si:H using MeV ion beamsBrockhoff, A.M. et al. | 2002
- 231
-
RBS without humansBarradas, N.P. et al. | 2002
- 237
-
Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structureGurbich, A.F. et al. | 2002
- 241
-
Analysis of sapphire implanted with different elements using artificial neural networksVieira, A. et al. | 2002
- 247
-
Fitting of RBS data including roughness: Application to Co-Re multilayersBarradas, N.P. et al. | 2002
- 252
-
Efficiency enhancements to Monte Carlo simulation of heavy ion elastic recoil detection analysis spectraFranich, R.D. et al. | 2002
- 256
-
Dynamic Monte Carlo simulation of surface composition change during sputter depth profilingMiyagawa, Yoshiko et al. | 2002
- 261
-
Ion-solid interactions and defects in silicon carbideWeber, W.J. et al. | 2002
- 266
-
Scanning transmission ion microscopy tomography at the Leipzig nanoprobe LIPSIONReinert, T. et al. | 2002
- 271
-
JAERI Takasaki in-air micro-PIXE system for various applicationsSakai, Takuro et al. | 2002
- 276
-
The external beam microprobe facility in Florence: Set-up and performanceMassi, M. et al. | 2002
- 283
-
The performance of the Ljubljana ion microprobeSimicic, J. et al. | 2002
- 287
-
Hydrogen analysis of mineral samples at University of TsukubaSasa, K. et al. | 2002
- 291
-
Deuteron induced gamma-ray emission method applied at a nuclear microprobe for carbon and oxygen content measurementsElekes, Z. et al. | 2002
- 296
-
Medium energy ion-nanoprobe with TOF-RBS for semiconductor process analysisIwasaki, K. et al. | 2002
- 301
-
Elastic recoil detection analysis on the ANSTO heavy ion microprobeSiegele, R. et al. | 2002
- 306
-
Proton beam micromachined resolution standards for nuclear microprobesWatt, F. et al. | 2002
- 312
-
Suitable test structures for submicron ion beam analysisSpemann, D. et al. | 2002
- 318
-
MeV microprobe analysis of polymer films: radiation damage aspectsDelto, R. et al. | 2002
- 324
-
Micro-ERDA studies of hydrogen in polycrystalline CVD diamond windowsSamlenski, R. et al. | 2002
- 329
-
Investigation of the radiation hardness on semiconductor devices using the ion micro-beamNishijima, T. et al. | 2002
- 335
-
Ion beam induced charge characterisation of a silicon microdosimeter using a heavy ion microprobeCornelius, Iwan et al. | 2002
- 339
-
Sub-micron channeling contrast microscopy on reactive ion etched deep Si microstructuresTeo, E.J. et al. | 2002
- 345
-
High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structuresOsipowicz, T. et al. | 2002
- 351
-
Micro-RBS characterisation of the chemical composition and particulate deposition on pulsed laser deposited Si1-xGex thin filmsSimon, A. et al. | 2002
- 357
-
Nuclear microprobe analysis of U-doped (Bi,Pb)2Sr2Ca2Cu3Oy-Ag superconducting tapesRout, B. et al. | 2002
- 365
-
Filiform corrosion imaged beneath protection layers on Al alloysSzymanski, R. et al. | 2002
- 370
-
Analysis of metallic pigments by ion microbeamPelicon, P. et al. | 2002
- 375
-
Fundamental effects and non-linear Si detector responseWhitlow, Harry J. et al. | 2002
- 379
-
Assessment of pulse height defect in passivated implanted planar Si detectors used for channeling measurements with slow, highly charged heavy projectilesMeyer, J.D. et al. | 2002
- 383
-
Response of Si p-i-n diode and Au-n-Si surface barrier detector to heavy ionsZhang, Yanwen et al. | 2002
- 387
-
Silicon detector response to heavy ions at energies of 1-2 MeV-amuWeijers, T.D.M. et al. | 2002
- 393
-
Unique capabilities of heavy ion elastic recoil detection with gas ionization detectorsTimmers, H. et al. | 2002
- 397
-
Accurate depth profiling through energy-dependent pulse height deficit compensation in gas ionization detectorsWeijers, T.D.M. et al. | 2002
- 402
-
Simple concepts for ion source improvementHausladen, P.A. et al. | 2002
- 405
-
Rutherford backscattering spectroscopy and elastic recoil detection analysis with lithium ions - The better alternative to helium?Mayer, M. et al. | 2002
- 410
-
Use of reference samples for more accurate RBS analysesLanford, W.A. et al. | 2002
- 414
-
Optimal geometry for GeSi-Si super-lattice structure RBS investigationWielunski, L.S. et al. | 2002
- 419
-
Accurate hydrogen depth profiling by reflection elastic recoil detection analysisVerda, R.D. et al. | 2002
- 423
-
Release of nitrogen from SiOxNy films during RBS measurementKimura, K. et al. | 2002
- 428
-
Threshold stoichiometry for beam induced nitrogen depletion of SiNTimmers, H. et al. | 2002
- 433
-
Ion beam induced desorption from thin films: SiO2 single layers and SiO2-Si multilayersArnoldbik, W.M. et al. | 2002
- 439
-
Heavy metal pathways and archives in biological tissueOrlic, I. et al. | 2002
- 445
-
Study by PIXE method of trace elements transferred from prostheses to soft tissues and organsOudadesse, H. et al. | 2002
- 449
-
Trace element analysis of blood samples from mentally challenged children by PIXEAshok Kumar, R. et al. | 2002
- 453
-
Strontium in 19th century Australian children's teethWilliams, A.-M.M. et al. | 2002
- 458
-
Combined PIXE and SEM study of the behaviour of trace elements in gel formed around implant coated with bioactive glassOudadesse, H. et al. | 2002
- 466
-
Ion beam methods to determine trace heavy metals concentrations and sources in urban airshedsCohen, David D. et al. | 2002
- 471
-
Aerosol characterisation in Italian towns by IBA techniquesAriola, V. et al. | 2002
- 477
-
Application of the micro-PIXE technique for analyzing arsenic in biomat and lower plants of lichen and mosses around an arsenic mine site, at Gunma, JapanOhnuki, T. et al. | 2002
- 482
-
Detection limit improvement for Mg in marine foraminiferal calcite by using helium induced X-ray emissionBeck, L. et al. | 2002
- 488
-
Non-destructive analysis and appraisal of ancient Chinese porcelain by PIXECheng, H.S. et al. | 2002
- 492
-
PIXE cluster analysis of ancient ceramics from North SyriaKieft, I.E. et al. | 2002
- 497
-
Trace elements measurement by PIXE in the appraisal of the ancient potteriesZhang, Z.Q. et al. | 2002
- 501
-
Proton induced X-ray emission and proton induced gamma ray emission analysis in geochemical exploration for gold and base metal depositsPwa, Aung et al. | 2002
- 505
-
Advanced characterization of high-k materials: A nuclear approachBrijs, B. et al. | 2002
- 510
-
Ion beam studies of high-k ultrathin films deposited on SiPezzi, R.P. et al. | 2002
- 514
-
Quantitative analysis of the oxygen content in TiO2 films deposited by electron-beam evaporation using 16O(a,a)16O resonant elastic scatteringJiang, J.C. et al. | 2002
- 518
-
Role of oxides in high velocity thermal spray coatingsTrompetter, W.J. et al. | 2002
- 524
-
Incorporation of tungsten in lithium niobate by diffusionKling, A. et al. | 2002
- 528
-
RBS-channeling measurements of sapphire (001) substrate implanted with high-energy O and Cu ionsNakao, S. et al. | 2002
- 533
-
Investigation of the environment of Cr ions implanted into sapphireNorman, M.J. et al. | 2002
- 538
-
Narrow nuclear resonance profiling of Al with subnanometric depth resolutionda Rosa, E.B.O. et al. | 2002
- 543
-
Lattice location of implanted Ag in SiWahl, U. et al. | 2002
- 547
-
Activation and dopant sites of ultra-shallow implanted boron and arsenic in siliconKobayashi, H. et al. | 2002
- 552
-
Application of NRA to evaluation of boron implants in Si for shallow junctionsSuzuki, M. et al. | 2002
- 556
-
Determination of the erbium lattice site in bismuth tellurite using PIXE-channelingKling, A. et al. | 2002
- 560
-
Strain relaxation and compositional analysis of InGaN-GaN layers by Rutherford backscatteringAlves, E. et al. | 2002
- 565
-
Strain and compositional profile determination in ion bombarded heterostructures by the complementary use of RBS-channeling and high resolution X-ray diffractionTuros, A. et al. | 2002
- 570
-
Planar MeV ion channeling on strained buried nanofilmsSelen, L.J.M. et al. | 2002
- 574
-
Oxygen isotopic exchange occurring during dry thermal oxidation of 6H SiCVickridge, I.C. et al. | 2002
- 579
-
Characterization of SiC thermal oxidationRadtke, C. et al. | 2002
- 583
-
Ion beam analysis of the segregation and solubility of iridium during silicon crystallizationAlmendra, A. et al. | 2002
- 587
-
Surface segregation of Ge during Si growth on Ge-Si(001) at low temperature observed by high-resolution RBSNakajima, K. et al. | 2002
- 592
-
The use of ion channeling and elastic recoil detection in determining the mechanism of cleavage in the ion-cut processHöchbauer, T. et al. | 2002
- 598
-
In-depth concentration distribution of Ar in Si surface after low-energy Ar+ ion sputteringOh, D.W. et al. | 2002
- 602
-
Collapse of nanocavities studied by ion-channeling and Raman spectroscopyJohnson, B.C. et al. | 2002
- 606
-
Platinum atom location on the internal walls of nanocavities investigated by ion channeling analysisKinomura, A. et al. | 2002
- 611
-
Characterisation of amorphous silicon solar cells by IBA methodsMedunic, Z. et al. | 2002
- 615
-
PIXE and RBS investigation of growth phases of ultra-thin chemical bath deposited CdS filmsDuncan, P.C. et al. | 2002
- 620
-
Ion beam analysis of ion-assisted deposited amorphous GaNKennedy, V.J. et al. | 2002
- 625
-
Study of calcium implanted GaNAlves, E. et al. | 2002
- 630
-
Ion beam analysis of aluminium in thin layersHealy, M.J.F. et al. | 2002
- 636
-
Deuterium channeling study of disorder in Al22+-implanted 6H-SiCJiang, W. et al. | 2002
- 641
-
Clustering in Pb thin films on Si(111) and Pb-induced Si surface orderingRout, B. et al. | 2002
- 646
-
Initial oxidation of AlPdMn quasicrystals - A study by high-resolution RBS and ERDAPlachke, D. et al. | 2002
- 652
-
Ion beam analysis of helium and its irradiation effect on hydrogen trapping in W single crystalsNagata, S. et al. | 2002
- 657
-
RBS-channeling analysis of epitaxial films with Nb buffer layer on sapphire substrateYamamoto, S. et al. | 2002
- 661
-
Use of nuclear microanalysis to study the oxygenation mechanism of Y1Ba2Cu3O7-x thin films: estimation of the oxygen diffusion coefficientsGarcia Lopez, J. et al. | 2002
- 667
-
Ion beam analysis of Zn2-2xCuxInxS2 filmsSpemann, D. et al. | 2002
- 673
-
Surface quality studies of high-Tc superconductors of the Hg-, Tl- and HgxTl1-x-families: RBS and resonant C and O backscattering studiesVantomme, A. et al. | 2002
- 679
-
Inclusion of Mg impurities in YBCO films on MgO substrate during sputter depositionMatsunami, N. et al. | 2002
- 684
-
Composition analysis of the insulating barrier in magnetic tunnel junctions by grazing angle of incidence RBSWei, P. et al. | 2002
- 689
-
Hydrogen analysis of CVD homoepitaxial diamond films by high-resolution elastic recoil detectionKimura, K. et al. | 2002
- 693
-
Hydrogen depth resolution in multilayer metal structures, comparison of elastic recoil detection and resonant nuclear reaction methodWielunski, L.S. et al. | 2002
- 699
-
Hydrogen analyses of titanium hydride by ERD and NRG methodsTsuchiya, B. et al. | 2002
- 704
-
Rapid chemical state analysis by a highly sensitive high-resolution PIXE systemMaeda, K. et al. | 2002
- 709
-
Ion beam induced luminescence of thin filmsBrooks, R.J. et al. | 2002
- 714
-
On the determination of nitrogen in carbon matrix by deuteron induced gamma-ray emission techniqueSziki, G.Á et al. | 2002
- 718
-
Ion beam analysis of light elements in nanoporous surfaces produced by single- and multiple-energy helium ion implantationMarkwitz, A. et al. | 2002
- 723
-
Characterisation of titanium nitride thin films prepared using PVD and a plasma immersion ion implantation systemLim, S.H.N. et al. | 2002
- 728
-
In situ diffusion measurements during RBS analysis of polymers coated with aluminiumMändl, S. et al. | 2002
- 732
-
Discovery of the rate limiting step in solid oxide fuel cells by LEISde Ridder, M. et al. | 2002
- 736
-
Ion beam analysis of aluminium ion implanted titanium diboride thin filmsMollica, S. et al. | 2002
- 742
-
RBS study of the reactions in the Si-Co-Ta-Co system after isothermal annealings between 360 and 650 (degree)CFranklyn, C. et al. | 2002
- 747
-
Application of atomic and nuclear techniques to the study of inhomogeneities in electrodeposited a-particle sourcesMartin Sánchez, A. et al. | 2002
- 751
-
The effect of crystal orientation on thermal shock-induced fracture and properties of ion implanted sapphireGurarie, V.N. et al. | 2002
- 756
-
Implantation temperature dependence of He bubble formation in Sida Silva, D.L. et al. | 2002
- 761
-
Cold ion-cutting of hydrogen implanted SiHenttinen, K. et al. | 2002
- 767
-
Depth profiles of cluster-ion-implanted BSi in siliconLiang, Jenq-Horng et al. | 2002
- 772
-
In situ measurements of the channeling dependence of ion-beam-induced recrystallization in siliconAzevedo, G.de M. et al. | 2002
- 777
-
The effect of potassium on the rate of solid phase epitaxy in siliconLiu, A.C.Y. et al. | 2002
- 782
-
Effect of ion species on implantation-produced disorder in GaN at liquid nitrogen temperatureKucheyev, S.O. et al. | 2002
- 787
-
Non-linear effect on radiation damage of silicon by cluster ion bombardmentLiu, Jiarui et al. | 2002
- 792
-
Isolated cluster ion impact on solid surfaces HOPG, Si and Cu(TiO2)-Si surfacesSong, Jae-Hoon et al. | 2002
- 797
-
Optical properties of nanoparticle composites in insulators by high-flux 60 keV Cu- implantationTakeda, Y. et al. | 2002
- 802
-
Annealing reactions in lead implanted copperJohansen, A. et al. | 2002
- 807
-
Change of preferred orientation in TiN thin films grown by ultrahigh vacuum reactive ion beam assisted depositionShin, H.J. et al. | 2002
- 813
-
Surface modification of a fuel cell material by ion implantationVervoort, A.G.J. et al. | 2002
- 817
-
X-ray reflectivity of ion-beam-deposited Ag-Al multilayersQadri, Syed B. et al. | 2002
- 821
-
Intercomparison of electron probe micro-analyses and particle induced X-ray emission analyses of Pt-Pd-Ni-S matricesMerkle, R.K.W. et al. | 2002
- 826
-
Impurity measurements in semiconductor materials using trace element accelerator mass spectrometryMcdaniel, F.D. et al. | 2002
- 831
-
Simplified methodology of the ultra-thin layer activation techniqueVincent, L. et al. | 2002
- 835
-
Implantation sites of Ce and Gd in diamondBharuth-Ram, K. et al. | 2002