Glass-forming ability and soft magnetic properties of FeCoSiAlGaPCB amorphous alloys (English)
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In:
Journal of applied physics
;
92
, 4
; 2073-2078
;
2002
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ISSN:
- Article (Journal) / Print
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Title:Glass-forming ability and soft magnetic properties of FeCoSiAlGaPCB amorphous alloys
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Contributors:
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Published in:Journal of applied physics ; 92, 4 ; 2073-2078
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Publisher:
- New search for: AIP
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Place of publication:Melville, NY
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Publication date:2002
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 33.00 / 50.30
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Source:
Table of contents – Volume 92, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1727
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Space-charge dynamics in photorefractive polymersOstroverkhova, Oksana / Singer, Kenneth D. et al. | 2002
- 1744
-
Fully leaky guided wave determination of the original alignment direction for the directors at the walls in a twisted nematic liquid crystal cellYang, F. Z. / Gao, H. J. / Sambles, J. R. et al. | 2002
- 1752
-
Pretilted and grating alignment of liquid crystals by oblique ultraviolet irradiation of polyimideNewsome, C. J. / O'Neill, M. et al. | 2002
- 1757
-
Thomson-scattering observation of non-Maxwellian electron energy distribution in inductively coupled C4F8/Ar and CF4/Ar plasmas and the effect of vibrational excitation and nonlocal electron kineticsKono, A. / Funahashi, H. et al. | 2002
- 1764
-
Far field modeling of the plasma plume of a Hall thrusterBoyd, Iain D. / Dressler, Rainer A. et al. | 2002
- 1775
-
High resolution laser-driven proton radiographyCobble, J. A. / Johnson, R. P. / Cowan, T. E. / Renard-Le Galloudec, N. / Allen, M. et al. | 2002
- 1780
-
Model and probe measurements of inductively coupled CF4 dischargesKimura, T. / Ohe, K. et al. | 2002
- 1788
-
Arc erosion characteristics of pseudospark discharge in multiaperture geometryNaweed, Ahmer / Kiefer, Jochen / Gavrilescu, Constantin / Neff, Willi et al. | 2002
- 1793
-
Photoreflectance spectroscopy of wurtzite CdSImada, Akinori / Ozaki, Shunji / Adachi, Sadao et al. | 2002
- 1799
-
Formation of cellular defect structure on GaSb ion-implanted at low temperatureNitta, Noriko / Taniwaki, Masafumi / Hayashi, Yoshihiko / Yoshiie, Toshimasa et al. | 2002
- 1803
-
In situ study of void growth kinetics in electroplated Cu linesLiniger, E. / Gignac, L. / Hu, C.-K. / Kaldor, S. et al. | 2002
- 1811
-
Crystal growth and characterization of the cubic semiconductor Cu2SnSe4Marcano, G. / Rinco´n, C. / Marı´n, G. / Tovar, R. / Delgado, G. et al. | 2002
- 1816
-
Optical response of one-dimensional (Si/SiO2)m photonic crystalsPatrini, M. / Galli, M. / Belotti, M. / Andreani, L. C. / Guizzetti, G. / Pucker, G. / Lui, A. / Bellutti, P. / Pavesi, L. et al. | 2002
- 1821
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Ion-beam doping of silver in amorphous As2S3 thin filmsSuzuki, Takenobu / Hosono, Hideo et al. | 2002
- 1825
-
Characterization of photorefractive GaAlAs multiple quantum well structures by ac photoelectromotive force and modulated photocarrier grating techniquesStepanov, S. / Seres, I. / Mansurova, S. / Nolte, D. et al. | 2002
- 1833
-
Influence of growth temperature on properties of zirconium dioxide films grown by atomic layer depositionKukli, Kaupo / Ritala, Mikko / Aarik, Jaan / Uustare, Teet / Leskela¨, Markku et al. | 2002
- 1841
-
Competitive effects of grooves and photoalignment on nematic liquid-crystal alignment using azobenzene polymerChung, Doo-Han / Fukuda, Takashi / Takanishi, Yoichi / Ishikawa, Ken / Matsuda, Hiro / Takezoe, Hideo / Osipov, Mikhail A. et al. | 2002
- 1845
-
Substrate bias dependence of Raman spectra for TiN films deposited by filtered cathodic vacuum arcCheng, Y. H. / Tay, B. K. / Lau, S. P. / Kupfer, H. / Richter, F. et al. | 2002
- 1850
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Electrical damage of an ultrathin Si oxynitride layer induced by scanning tunneling spectroscopyMiyata, Noriyuki / Ichikawa, Masakazu et al. | 2002
- 1858
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Silicon–on–insulator waveguide photodetector with Ge/Si self-assembled islandsEl kurdi, M. / Boucaud, P. / Sauvage, S. / Fishman, G. / Kermarrec, O. / Campidelli, Y. / Bensahel, D. / Saint-Girons, G. / Sagnes, I. / Patriarche, G. et al. | 2002
- 1862
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Structural characterization of Ni–Al (111) interface by surface x-ray absorption spectroscopyDamoc, L. / Fonda, E. / Le Fevre, P. / Traverse, A. et al. | 2002
- 1868
-
Dependence of luminescence efficiency on dopant concentration and sintering temperature in the erbium-doped Ba0.7Sr0.3TiO3 thin filmsKuo, Shou-Yi / Chen, Chin-Sheng / Tseng, Tseung-Yuen / Chang, S.-C. / Hsieh, Wen-Feng et al. | 2002
- 1873
-
Influence of overlayers on determination of the optical constants of ZnSe thin filmsFranta, Daniel / Ohli´dal, Ivan / Klapetek, Petr / Montaigne-Ramil, Alberto / Bonanni, Alberta / Stifter, David / Sitter, Helmut et al. | 2002
- 1881
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Electrical and optical properties of beryllium-implanted Mg-doped GaNYu, Chang-Chin / Chu, C. F. / Tsai, J. Y. / Lin, C. F. / Wang, S. C. et al. | 2002
- 1888
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Thermal equilibrium governing the formation of negatively charged excitons in resonant tunneling diodesVercik, A. / Gobato, Y. Galva˜o / Brasil, M. J. S. P. et al. | 2002
- 1893
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Microstructure study of amorphous vanadium oxide thin films using raman spectroscopyLee, Se-Hee / Cheong, Hyeonsik M. / Je Seong, Maeng / Liu, Ping / Tracy, C. Edwin / Mascarenhas, Angelo / Pitts, J. Roland / Deb, Satyen K. et al. | 2002
- 1898
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Characterization of Mg doped GaN by positron annihilation spectroscopyMoxom, Jeremy / Xu, Jun / Suzuki, R. / Ohdaira, T. / Brandes, George / Flynn, Jeffrey S. et al. | 2002
- 1902
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Morphological study of aluminum tris(8-hydroxyquinoline) thin films using infrared and Raman spectroscopyCurry, R. J. / Gillin, W. P. / Clarkson, J. / Batchelder, D. N. et al. | 2002
- 1906
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Thermally induced modifications on bonding configuration and density of defects of plasma deposited SiOx:H filmsSan Andre´s, E. / del Prado, A. / Ma´rtil, I. / Gonza´lez-Dı´az, G. / Bravo, D. / Lo´pez, F. J. et al. | 2002
- 1914
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Investigation of the effect of high-temperature annealing on stability of ultrathin Al2O3 films on Si(001)Kundu, Manisha / Miyata, Noriyuki / Ichikawa, Masakazu et al. | 2002
- 1922
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SiO2–TiO2 interfaces studied by ellipsometry and x-ray photoemission spectroscopyGallas, B. / Brunet-Bruneau, A. / Fisson, S. / Vuye, G. / Rivory, J. et al. | 2002
- 1929
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Analysis of interfacial silicates and silicides formed by annealing ultrathin Hf on SiO2: Effect of Hf/SiO2 thickness ratioLee, Jung-Ho / Ichikawa, Masakazu et al. | 2002
- 1936
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Visible thermal emission from sub-band-gap laser excited cerium dioxide particlesRobinson, Richard D. / Spanier, Jonathan E. / Zhang, Feng / Chan, Siu-Wai / Herman, Irving P. et al. | 2002
- 1942
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Structural stability and electrical properties of Sr2FeMoO6 under high pressureZhao, P. / Yu, R. C. / Li, F. Y. / Liu, Z. X. / Jin, M. Z. / Jin, C. Q. et al. | 2002
- 1945
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Directional diffusion and void formation at a Si (001) bonded wafer interfaceEsser, R. H. / Hobart, K. D. / Kub, F. J. et al. | 2002
- 1950
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Temperature and pressure dependences of the Mn2+ and donor–acceptor emissions in ZnS:Mn2+ nanoparticlesChen, Wei / Su, Fuhai / Li, Guohua / Joly, Alan G. / Malm, Jan-Olle / Bovin, Jan-Olov et al. | 2002
- 1956
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Reflective liquid-crystal display using an in-plane-switching super-twisted nematic cellSun, Yubao / Ma, Hongmei / Zhang, Zhidong / Wu, Shin-Tson et al. | 2002
- 1960
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Effects of slight misorientation of GaN templates on molecular-beam-epitaxy growth of ZnOKato, Hiroyuki / Sano, Michihiro / Miyamoto, Kazuhiro / Yao, Takafumi et al. | 2002
- 1964
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Thermopower enhancement in misfit cobaltitesMaignan, A. / He´bert, S. / Pelloquin, D. / Michel, C. / Hejtmanek, J. et al. | 2002
- 1968
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Deep levels in semi-insulating InP obtained by annealing under iron phosphide ambianceDong, H. W. / Zhao, Y. W. / Zhang, Y. H. / Jiao, J. H. / Zhao, J. Q. / Lin, L. Y. et al. | 2002
- 1971
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Superfast fronts of impact ionization in initially unbiased layered semiconductor structuresRodin, P. / Ebert, U. / Hundsdorfer, W. / Grekhov, I. V. et al. | 2002
- 1981
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Anisotropic random resistor networks: A model for piezoresistive response of thick-film resistorsGrimaldi, C. / Ryser, P. / Stra¨ssler, S. et al. | 2002
- 1987
-
Transient simulations of a resonant tunneling diodePinaud, Olivier et al. | 2002
- 1995
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Electrical conductivity of Wesgo AL995 alumina under fast electron irradiation in a high voltage electron microscopeHowlader, M. M. R. / Kinoshita, C. / Shiiyama, K. / Kutsuwada, M. et al. | 2002
- 2000
-
Carrier recombination at single dislocations in GaN measured by cathodoluminescence in a transmission electron microscopeAlbrecht, M. / Strunk, H. P. / Weyher, J. L. / Grzegory, I. / Porowski, S. / Wosinski, T. et al. | 2002
- 2006
-
Response function of a Hall magnetosensor in the diffusive regimeCornelissens, Y. G. / Peeters, F. M. et al. | 2002
- 2013
-
Double-junction effect in proton-irradiated silicon diodesCastaldini, A. / Cavallini, A. / Polenta, L. / Canali, C. / Nava, F. et al. | 2002
- 2017
-
Carrier generation in highly oriented WO3 films by proton or helium implantationMiyakawa, M. / Ueda, K. / Hosono, H. et al. | 2002
- 2023
-
Electronic states in the conduction band of V-groove quantum wiresGvozdic´, Dejan M. / Schlachetzki, Andreas et al. | 2002
- 2035
-
Charge injection and transport in electrochemical films of poly(3-hexylthiophene)Valaski, R. / Moreira, L. M. / Micaroni, L. / Hu¨mmelgen, I. A. et al. | 2002
- 2041
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Study of carrier dynamics in indirect transition-type (Al0.7Ga0.3)0.5In0.5P/AlxIn1−xP superlattices by transient photoluminescence and photocurrent measurementsIshitani, Yoshihiro / Matsuya, Kouhei / Fujita, Toshiaki / Nakasa, Keijiro / Harima, Yutaka et al. | 2002
- 2047
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Magnetic and structural characterization of Mn-implanted, single-crystal ZnGeSiN2Pearton, S. J. / Overberg, M. E. / Abernathy, C. R. / Theodoropoulou, N. A. / Hebard, A. F. / Chu, S. N. G. / Osinsky, A. / Fuflyigin, V. / Zhu, L. D. / Polyakov, A. Y. et al. | 2002
- 2052
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Relation between microstructures and magnetic properties upon annealing in Fe50Mn50/Ni80Fe20 filmsXu, Ming / Lu, Zhengqi / Yang, Tao / Liu, Cuixiu / Cui, Shufan / Mai, Zhenhong / Lai, Wuyan / Jia, Quanjie / Zheng, Wenli et al. | 2002
- 2058
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Microwave magnetoabsorption in glass-coated amorphous microwires with radii close to skin depthLofland, S. E. / Garcia-Miquel, H. / Vazquez, M. / Bhagat, S. M. et al. | 2002
- 2064
-
Thermal-dynamic reversal of fine magnetic grains with arbitrary anisotropy axes orientationWang, Xiaobin / Bertram, H. Neal / Safonov, Vladimir L. et al. | 2002
- 2073
-
Glass-forming ability and soft magnetic properties of FeCoSiAlGaPCB amorphous alloysBorrego, J. M. / Conde, A. / Roth, S. / Eckert, J. et al. | 2002
- 2079
-
Structural and magnetic transformation of monodispersed iron oxide particles in a reducing atmosphereVaranda, L. C. / Jafelicci, M. / Tartaj, P. / O’ Grady, K. / Gonza´lez-Carren˜o, T. / Morales, M. P. / Mun˜oz, T. / Serna, C. J. et al. | 2002
- 2086
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Investigation of two-phase nucleation in paraelectric phase of ferroelectrics with ferroelectric–antiferroelectric–paraelectric triple pointIshchuk, V. M. / Sobolev, V. L. et al. | 2002
- 2094
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Effects of rare earth metal substituents on the piezoelectric and polarization properties of Pb(Zr,Ti)O3–Pb(Sb,Mn)O3 ceramicsGao, Yongkang / Uchino, Kenji / Viehland, Dwight et al. | 2002
- 2100
-
Structural and dielectric characterization of the (Ba1−xSrx)(Ti0.9Sn0.1)O3 thin films deposited on Pt/Ti/SiO2/Si substrate by radio frequency magnetron sputteringWang, Moo-Chin / Tsai, Cheng-Chi / Wu, Nan-Chung / Hung, Kun-Ming et al. | 2002
- 2108
-
Effect of textured Pb(Zr1−xTix)O3 seed layer on fatigue properties of ferroelectric Pb0.99[(Zr0.6Sn0.4)0.85Ti0.15]0.98Nb0.02O3 thin filmsYoon, Ki Hyun / Shin, Hyun Cheol / Park, Jihoon / Kang, Dong Heon et al. | 2002
- 2112
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Domain reorientation anisotropy in ferroelectric polycrystalsLente, M. H. / Eiras, J. A. et al. | 2002
- 2118
-
Electroluminescence from heterojunctions of nanocrystalline CdS and ZnS with porous siliconGokarna, Anisha / Pavaskar, N. R. / Sathaye, S. D. / Ganesan, V. / Bhoraskar, S. V. et al. | 2002
- 2125
-
Dynamic magnetic behavior of Fe3O4 colloidal nanoparticlesHrianca, I. / Caizer, C. / Schlett, Z. et al. | 2002
- 2133
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Substrate bias effect on the formation of nanocrystalline diamond films by microwave plasma-enhanced chemical vapor depositionYang, Tien-Syh / Lai, Jir-Yon / Wong, Ming-Show / Cheng, Chia-Liang et al. | 2002
- 2139
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Polarity dependence in pulsed scanning tunneling microscopy fabrication and modification of metal nanodots on siliconPark, Jeong Young / Phaneuf, R. J. et al. | 2002
- 2144
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Scanning capacitance microscopy with ZrO2 as dielectric materialBrezna, W. / Harasek, S. / Bertagnolli, E. / Gornik, E. / Smoliner, J. / Enichlmair, H. et al. | 2002
- 2149
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The convergence condition of the successive approximation process in Compton scattering tomographyWang, Jiajun / Huang, Xianwu / Zhong, Xingrong et al. | 2002
- 2153
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Subpicosecond laser ablation of dental enamelRode, A. V. / Gamaly, E. G. / Luther-Davies, B. / Taylor, B. T. / Dawes, J. / Chan, A. / Lowe, R. M. / Hannaford, P. et al. | 2002
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A gas-spring system for optimizing loudspeakers in thermoacoustic refrigeratorsTijani, M. E. H. / Zeegers, J. C. H. / de Waele, A. T. A. M. et al. | 2002
- 2166
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Conduction-induced oxidation of silicon on silver metaphosphate glassDoi, Akira et al. | 2002
- 2172
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H2S gas sensing mechanism of SnO2 films with ultrathin CuO dotted islandsChowdhuri, Arijit / Sharma, Parmanand / Gupta, Vinay / Sreenivas, K. / Rao, K. V. et al. | 2002
- 2181
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Combined molecular dynamics–direct simulation Monte Carlo computational study of laser ablation plume evolutionZeifman, Michael I. / Garrison, Barbara J. / Zhigilei, Leonid V. et al. | 2002
- 2194
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Electron emission from N-doped homoepitaxially grown diamondOkano, Ken / Kamio, Takaaki / Yamada, Takatoshi / Sawabe, Atsuhito / Koizumi, Satoshi et al. | 2002
- 2198
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Effects of stress annealing in nitrogen on the effective contact-potential difference, charges, and traps at the Si/SiO2 interface of metal–oxide–semiconductor devicesPrzewlocki, Henryk M. / Massoud, Hisham Z. et al. | 2002
- 2202
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Effects of stress annealing in nitrogen on the index of refraction of silicon dioxide layers in metal–oxide–semiconductor devicesMassoud, Hisham Z. / Przewlocki, Henryk M. et al. | 2002
- 2207
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Resonant optical microcavity based on crystalline silicon active layerSotta, D. / Hadji, E. / Magnea, N. / Delamadeleine, E. / Besson, P. / Renard, P. / Moriceau, H. et al. | 2002
- 2210
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Indium–tin–oxide-coated glass as dichroic mirror for far-infrared electromagnetic radiationBauer, T. / Kolb, J. S. / Lo¨ffler, T. / Mohler, E. / Roskos, H. G. / Pernisz, U. C. et al. | 2002
- 2213
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Ferroelectric properties of vanadium-doped Bi4Ti3O12 thin films deposited by a sol–gel methodKim, S. S. / Song, T. K. / Kim, J. K. / Kim, Jinheung et al. | 2002
- 2216
-
Reduced chemical sputtering of carbon by silicon dopingSalonen, E. / Nordlund, K. / Keinonen, J. / Runeberg, N. / Wu, C. H. et al. | 2002
- 2219
-
Erratum: “Spatially resolved photoconductive properties of profiled polycrystalline silicon thin films” [J. Appl. Phys. 91, 5671 (2002)]Savenije, Tom J. / van Veenendaal, Patrick A. T. T. / de Haas, Matthijs P. / Warman, John M. / Rath, Jatindra K. / Schropp, Ruud E. I. et al. | 2002