Giant LO oscillation in the Zn1-xBex(Se,Te) multi-phonons percolative alloys (English)
- New search for: Tite, T.
- New search for: Tite, T.
- New search for: Pagès, O.
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- New search for: Laurenti, J.P.
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In:
Thin solid films
;
450
, 1
; 195-198
;
2004
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ISSN:
- Article (Journal) / Print
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Title:Giant LO oscillation in the Zn1-xBex(Se,Te) multi-phonons percolative alloys
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Contributors:Tite, T. ( author ) / Pagès, O. / Ajjoun, M. / Laurenti, J.P. / Gorochov, O. / Tournié, E. / Maksimov, O. / Tamargo, M.C.
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Published in:Thin solid films ; 450, 1 ; 195-198
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Place of publication:Amsterdam [u.a.] Elsevier
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Publication date:2004
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 33.68
- Further information on Basic classification
- New search for: 535/3485
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Keywords:
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Classification:
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Source:
Table of contents – Volume 450, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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EditorialModreanu, Mircea / Murtagh, Martin / Ricote, Jesús / Chateigner, Daniel / Schreiber, Jürgen et al. | 2003
- 3
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Advances in the application of modulation spectroscopy to vertical cavity structuresHosea, T.J.C. et al. | 2003
- 14
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Photomodulated reflectance and transmittance: optical characterisation of novel semiconductor materials and device structuresMisiewicz, J. / Sęk, G. / Kudrawiec, R. / Sitarek, P. et al. | 2003
- 23
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Recent advances in characterization of ultra-thin films using specular X-ray reflectivity techniqueBanerjee, S. / Ferrari, S. / Chateigner, D. / Gibaud, A. et al. | 2003
- 29
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Elastic-strain tensor and inhomogeneous strain in thin films by X-ray diffractionBalzar, D. / Popa, N.C. et al. | 2003
- 34
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Texture, residual stress and structural analysis of thin films using a combined X-ray analysisLutterotti, L. / Chateigner, D. / Ferrari, S. / Ricote, J. et al. | 2003
- 42
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Generalized ellipsometry for materials characterizationJellison, G.E. Jr. et al. | 2003
- 51
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Characterization of multilayered materials for optoelectronic components by high-resolution X-ray diffractometry and reflectometry: contribution of numerical treatmentsDurand, O. et al. | 2003
- 60
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Application of photoreflectance spectroscopy to optoelectronic materials and devicesLong, L. / Schreiber, J. et al. | 2003
- 66
-
Strain profiles in yttria stabilized zirconia epitaxial thin films determined by high-resolution X-ray diffractionBoulle, A. / Masson, O. / Guinebretière, R. / Dauger, A. et al. | 2003
- 71
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Three beam photoreflectance as a powerful method to investigate semiconductor heterostructuresKudrawiec, R. / Sek, G. / Sitarek, P. / Ryczko, K. / Misiewicz, J. / Wang, T. / Forchel, A. et al. | 2003
- 75
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UV photoreflectance for wide band gap nitride characterizationBru-Chevallier, C. / Fanget, S. / Guillot, G. / Ruffenach, S. / Briot, O. et al. | 2003
- 79
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The metrology of a miniature FT spectrometer MOEMS device using white light scanning interference microscopyMontgomery, P.C. / Montaner, D. / Manzardo, O. / Flury, M. / Herzig, H.P. et al. | 2003
- 84
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In-line monitoring of advanced microelectronic processes using combined X-ray techniquesWyon, C. / Delille, D. / Gonchond, J.P. / Heider, F. / Kwakman, L. / Marthon, S. / Mazor, I. / Michallet, A. / Muyard, D. / Perino-Gallice, L. et al. | 2003
- 90
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New developments in X-ray fluorescence metrologyvan der Haar, L.M. / Sommer, C. / Stoop, M.G.M. et al. | 2003
- 97
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Structural and optical properties of both pure poly(3-octylthiophene) (P3OT) and P3OT/fullerene filmsErb, Tobias / Raleva, Sofiya / Zhokhavets, Uladzimir / Gobsch, Gerhard / Stühn, Bernd / Spode, Matthias / Ambacher, Oliver et al. | 2003
- 101
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Optical characterization of indium-tin-oxynitride fabricated by RF-sputteringAperathitis, E. / Modreanu, M. / Bender, M. / Cimalla, V. / Ecke, G. / Androulidaki, M. / Pelekanos, N. et al. | 2003
- 105
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Optical properties of silicon thin films related to LPCVD growth conditionModreanu, M. / Gartner, M. / Cobianu, C. / O'Looney, B. / Murphy, F. et al. | 2003
- 111
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Kinetics of interfacial layer formation during deposition of HfO2 on siliconEssary, C / Howard, J.M / Craciun, V / Craciun, D / Singh, R.K et al. | 2003
- 114
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Automated metrology system including VUV spectroscopic ellipsometry and X-ray reflectometry for 300 mm silicon microelectronicsBoher, P / Evrard, P / Condat, O / Dos Reis, C / Defranoux, C / Bellandi, E et al. | 2003
- 120
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Metrology issues in thin ONO stacks measurements by spectroscopic ellipsometry and X-ray reflectivityBellandi, E. / Elbaz, A. / Spadoni, S. / Piagge, R. / Coccorese, C. / Pavia, G. / Ferrari, S. / Banerjee, S. / Alessandri, M. et al. | 2003
- 124
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X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-k materialsFerrari, S. et al. | 2004
- 124
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X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-κ materialsFerrari, S. / Modreanu, M. / Scarel, G. / Fanciulli, M. et al. | 2003
- 128
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Application of the X-ray combined analysis to the study of lead titanate based ferroelectric thin filmsRicote, J. / Chateigner, D. / Morales, M. / Calzada, M.L. / Wiemer, C. et al. | 2003
- 134
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Combining grazing incidence X-ray diffraction and X-ray reflectivity for the evaluation of the structural evolution of HfO2 thin films with annealingWiemer, C. / Ferrari, S. / Fanciulli, M. / Pavia, G. / Lutterotti, L. et al. | 2003
- 138
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Application of X-ray scattering methods to the analysis of Si-based heterostructuresWoitok, J.F. et al. | 2003
- 143
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Residual stress analysis of thin films and coatings through XRD2 experimentsGelfi, M. / Bontempi, E. / Roberti, R. / Armelao, L. / Depero, L.E. et al. | 2003
- 148
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Photoreflectance spectroscopy study of vertical cavity surface emitting laser structuresMurtagh, M.E. / Guenebaut, V. / Ward, S. / Nee, D. / Kelly, P.V. / O'Looney, B. / Murphy, F. / Modreanu, M. / Westwater, S. / Blunt, R. et al. | 2003
- 151
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Photoreflectance spectroscopy for the study of GaAsSb/InP heterojunction bipolar transistorsBru-Chevallier, C. / Chouaib, H. / Arcamone, J. / Benyattou, T. / Lahreche, H. / Bove, P. et al. | 2003
- 155
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Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructuresBuchheim, C. / Winzer, A.T. / Goldhahn, R. / Gobsch, G. / Ambacher, O. / Link, A / Eickhoff, M. / Stutzmann, M. et al. | 2003
- 159
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Characterization of InP and GaAs films by contactless transient photoconductivity measurementsKunst, M. / Neitzert, H.-C. / Sanders, A. et al. | 2003
- 163
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Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectanceShokhovets, S. / Fuhrmann, D. / Goldhahn, R. / Gobsch, G. / Ambacher, O. / Hermann, M. / Eickhoff, M. et al. | 2003
- 167
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Theoretical concept of strain effect on reflectance anisotropy and photoreflectance spectra of semiconductor multilayer systemLong, L. / Schreiber, J. et al. | 2003
- 173
-
Infrared spectroscopic ellipsometry applied to the characterization of nano-structures of silicon IC manufacturingBoher, P / Bucchia, M / Guillotin, C / Defranoux, C et al. | 2003
- 178
-
Controllable Fabry-Perot interferometer based on dynamic volume hologramsPetrov, V.M. / Lichtenberg, S. / Chamrai, A.V. / Petter, J. / Tschudi, T. et al. | 2003
- 183
-
A XRD study of Co/Au multilayers using a laboratory microdiffractometerBontempi, E. / Depero, L.E. et al. | 2003
- 187
-
Buried interface characterization by interference microscopyBenatmane, A. / Montgomery, P.C. et al. | 2003
- 191
-
Advanced cure monitoring by optoelectronic multifunction sensing systemGiordano, M. / Laudati, A. / Russo, M. / Nasser, J. / Persiano, G.V. / Cusano, A. et al. | 2003
- 195
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Giant LO oscillation in the Zn1−xBex(Se,Te) multi-phonons percolative alloysTite, T. / Pagès, O. / Ajjoun, M. / Laurenti, J.P. / Gorochov, O. / Tournié, E. / Maksimov, O. / Tamargo, M.C. et al. | 2003
- 199
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The dielectric function of a GaAs/AlGaAs single quantum well: calculation and comparison with experimentHerasimovich, A. / Shokhovets, S. / Goldhahn, R. / Gobsch, G. et al. | 2003
- 203
-
Photoelectrical measurements of the local value of the contact potential difference in the metal–insulator semiconductor (MIS) structuresKudla, A. / Przewlocki, H.M. / Borowicz, L. / Brzezinska, D. / Rzodkiewicz, W. et al. | 2003
- 207
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A methodology to reduce error sources in the determination of thin film chemical composition by EDAXAres, J.R. / Pascual, A. / Ferrer, I.J. / Sánchez, C. et al. | 2003
- 211
-
X-ray characterisation of chemical solution deposited PbTiO3 films with high Ca dopingCalzada, M.L. / Bretos, I. / Jiménez, R. / Ricote, J. / Mendiola, J. et al. | 2003
- 216
-
Anisotropic crystallite size analysis of textured nanocrystalline silicon thin films probed by X-ray diffractionMorales, M. / Leconte, Y. / Rizk, R. / Chateigner, D. et al. | 2003
- 222
-
Application of modulation spectroscopy for determination of recombination center parametersMakhniy, V.P. / Slyotov, M.M. / Stets, E.V. / Tkachenko, I.V. / Gorley, V.V. / Horley, P.P. et al. | 2003
- 226
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Author Index| 2004
- 227
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Subject Index| 2004
- iii
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Ed. Board| 2004