Quantitative measurement of essential and not essential metals in muscular, hepatic and renal tissue of horses by means of PIXE technique (English)
- New search for: Balzan, S.
- New search for: Balzan, S.
- New search for: Buoso, M.C.
- New search for: Ceccato, D.
- New search for: De Poli, M.
- New search for: Giaccone, V.
- New search for: Moschini, G.
- New search for: Novelli, E.
- New search for: Olabanji, S.O.
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In:
Nuclear instruments & methods in physics research / B
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219
; 72-76
;
2004
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ISSN:
- Article (Journal) / Print
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Title:Quantitative measurement of essential and not essential metals in muscular, hepatic and renal tissue of horses by means of PIXE technique
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Contributors:Balzan, S. ( author ) / Buoso, M.C. / Ceccato, D. / De Poli, M. / Giaccone, V. / Moschini, G. / Novelli, E. / Olabanji, S.O. / Passi, P.
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Published in:Nuclear instruments & methods in physics research / B ; 219 ; 72-76
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- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2004
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 535/3450
- New search for: 33.00
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Source:
Table of contents – Volume 219
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Ion beam analysis in art and archaeology: attacking the power precisions paradigmAbraham, Meg et al. | 2004
- 1
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Author index of Volumes 211-220| 2004
- 7
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Ion beam analysis of art works: 14 years of use in the LouvreDran, Jean-Claude / Salomon, Joseph / Calligaro, Thomas / Walter, Philippe et al. | 2004
- 16
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The non-destructive identification of early Chinese porcelain by PIXECheng, H.S. / Zhang, Z.Q. / Zhang, B. / Yang, F.J. et al. | 2004
- 20
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Characterisation of early medieval frescoes by m-PIXE, SEM and Raman spectroscopyZucchiatti, A. / Prati, P. / Bouquillon, A. / Giuntini, L. / Massi, M. / Migliori, A. / Cagnana, A. / Roascio, S. et al. | 2004
- 20
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Characterisation of early medieval frescoes by μ-PIXE, SEM and Raman spectroscopyZucchiatti, A. / Prati, P. / Bouquillon, A. / Giuntini, L. / Massi, M. / Migliori, A. / Cagnana, A. / Roascio, S. et al. | 2004
- 20
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Characterisation of early medieval frescoes by (micro)-PIXE, SEM and Raman spectroscopyZucchiatti, A. et al. | 2004
- 26
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PIXE study on ancient pottery from Chinese Sanxia areaZhang, B. / Pan, B.H. / Zhang, Z.Q. / Cheng, H.S. / Gao, M.H. / Yang, F.J. / Peng, X.B. et al. | 2004
- 30
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Non-destructive analysis and identification of jade by PIXECheng, H.S. / Zhang, Z.Q. / Zhang, B. / Yang, F.J. et al. | 2004
- 35
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Confocal (micro)-XRF depth analysis of paint layersSmit, Z. et al. | 2004
- 35
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Confocal m-XRF depth analysis of paint layersSmit, Z. / Janssens, K. / Proost, K. / Langus, I. et al. | 2004
- 35
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Confocal μ-XRF depth analysis of paint layersŠmit, Ž. / Janssens, K. / Proost, K. / Langus, I. et al. | 2004
- 41
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In-air PIXE set-up for automatic analysis of historical document inksBudnar, Miloš / Simčič, Jure / Rupnik, Zdravko / Uršič, Mitja / Pelicon, Primož / Kolar, Jana / Strlič, Matija et al. | 2004
- 48
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Identification of lapis-lazuli pigments in paint layers by PIGE measurementsGrassi, N. / Migliori, A. / Mandò, P.A. / Calvo del Castillo, H. et al. | 2004
- 53
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Damage induced by proton irradiation in carbonate based natural painting pigmentsEnguita, Olga / Calderón, T. / Fernández-Jiménez, M.T. / Beneitez, P. / Millan, A. / Garcı́a, G. et al. | 2004
- 57
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Elemental microanalysis in ecophysiology using ion microbeamPrzybyłowicz, W.J / Mesjasz-Przybyłowicz, J / Migula, P / Turnau, K / Nakonieczny, M / Augustyniak, M / Głowacka, E et al. | 2004
- 67
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Nuclear microprobe analysis of the selective boron uptake obtained with BPA in brain tumour tissueWegdén, M. / Kristiansson, P. / Ceberg, C. / Munck af Rosenschöld, P. / Auzelyte, V. / Elfman, M. / Malmqvist, K.G. / Nilsson, C. / Pallon, J. / Shariff, A. et al. | 2004
- 72
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Quantitative measurement of essential and not essential metals in muscular, hepatic and renal tissue of horses by means of PIXE techniqueBalzan, S. / Buoso, M.C. / Ceccato, D. / De Poli, M. / Giaccone, V. / Moschini, G. / Novelli, E. / Olabanji, S.O. / Passi, P. / Tepedino, V. et al. | 2004
- 77
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Single ion bombardment of living cells at LIPSIONReinert, T. / Fiedler, A. / Škopek, J. / Tanner, J. / Vogt, J. / Butz, T. et al. | 2004
- 82
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Investigations of percutaneous uptake of ultrafine TiO2 particles at the high energy ion nanoprobe LIPSIONMenzel, F. / Reinert, T. / Vogt, J. / Butz, T. et al. | 2004
- 87
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Efficient Monte Carlo simulation of heavy ion elastic recoil detection analysis spectraFranich, R.D / Johnston, P.N / Bubb, I.F et al. | 2004
- 92
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Subject index of Volumes 211-220| 2004
- 95
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Fast Monte Carlo simulation for elastic ion backscatteringPusa, P. / Ahlgren, T. / Rauhala, E. et al. | 2004
- 99
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On the use of the 16O(4He,4He)16O resonance for the evaluation of radiation damage in oxidesThomé, L. / Gentils, A. / Jagielski, J. / Enescu, S.E. / Garrido, F. et al. | 2004
- 105
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A general artificial neural network for analysis of RBS data of any element with Z between 18 and 83 implanted into any lighter one- or two-element targetBarradas, N.P. / Patrı́cio, R.N. / Pinho, H.F.R. / Vieira, A. et al. | 2004
- 110
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Evaluation of low-energy tailing parameters of a HPGe X-ray detector to be used in GUPIX software library for PIXE analysisShariff, Asad / Martinsson, Bengt G. / Auzelyte, Vaida / Elfman, Mikael / Kristiansson, Per / Malmqvist, Klas G. / Nilsson, Christer / Pallon, Jan / Wegdén, Marie et al. | 2004
- 115
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Hydrogen standards in elastic recoil detection analysisWang, Y.Q. et al. | 2004
- 125
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Allegria: a new interface to the ERD programSchiettekatte, F. / Chicoine, M. / Gujrathi, S. / Wei, P. / Oxorn, K. et al. | 2004
- 130
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High-energy PIXE: quantitative analysisDenker, A. / Opitz-Coutureau, J. / Campbell, J.L. / Maxwell, J.A. / Hopman, T. et al. | 2004
- 136
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An Excel utility for the rapid characterization of “funny filters” in PIXE analysisNejedly, Zdenek / Campbell, John L. / Gama, Sophie et al. | 2004
- 140
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Differential cross-sections for nuclear reactions 14N(d,p5)15N, 14N(d,p0)15N, 14N(d,a0)12C and 14N(d,a1)12CPellegrino, S. et al. | 2004
- 140
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Differential cross-sections for nuclear reactions 14N(d,p5)15N, 14N(d,p0)15N, 14N(d,α0)12C and 14N(d,α1)12CPellegrino, S. / Beck, L. / Trouslard, Ph. et al. | 2004
- 145
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IBA methods for characterisation of fine particulate atmospheric pollution: a local, regional and global research problemCohen, David D. / Stelcer, Ed / Hawas, Olga / Garton, David et al. | 2004
- 153
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Anthropogenic sources of PM2.5’s arsenic, lead, mercury and nickel in northern metropolitan Lisbon, Portugaldo Carmo Freitas, Maria / Pacheco, Adriano M.G. / Ventura, Márcia G. et al. | 2004
- 157
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PIXE analysis of atmospheric aerosols from three sites in Mexico CityMiranda, J. / Barrera, V.A. / Espinosa, A.A. / Galindo, O.S. / Núñez-Orosco, A. / Montesinos, R.C. / Leal-Castro, A. / Meinguer, J. et al. | 2004
- 161
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PIXE analysis of hair samples from artisanal mining communities in the Acupan region, Benguet, PhilippinesClemente, Eligia / Sera, K. / Futatsugawa, S. / Murao, S. et al. | 2004
- 166
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Atmospheric aerosol characterisation by Ion Beam Analysis techniques: recent improvements at the Van de Graaff laboratory in FlorenceChiari, Massimo / Del Carmine, Piero / Lucarelli, Franco / Marcazzan, Graziella / Nava, Silvia / Paperetti, Leonardo / Prati, Paolo / Valli, Gianluigi / Vecchi, Roberta / Zucchiatti, Alessandro et al. | 2004
- 171
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Micro-PIXE study of tropospheric aerosols in an Antarctic coastal environmentChiminello, F / Ceccato, D / Mittner, P et al. | 2004
- 176
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In-situ Ir concentration measurements in KT-boundary sediments by accelerator secondary ion mass spectrometryMaden, C. / Döbeli, M. / Hofmann, B. / Suter, M. et al. | 2004
- 181
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Ni, Cu, Zn and Pb background values determination in representative Lebanese soil using the thick target PIXE techniqueNsouli, B. / Darwish, T. / Thomas, J.-P. / Zahraman, K. / Roumié, M. et al. | 2004
- 187
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Heavy metal accumulation in plants and soil irrigated with wastewater from Mexico cityMireles, A. / Solı́s, C. / Andrade, E. / Lagunas-Solar, M. / Piña, C. / Flocchini, R.G. et al. | 2004
- 191
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PIXE pollution studies across EuropeInnegraeve, O. / Blanchet, X. / Muntele, C.I. / Muntele, I.C. / Zimmerman, R.L. / Popa-Simil, L. / Voiculescu, D. / Racolta, P.M. / Ila, D. et al. | 2004
- 196
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Lattice location of helium in uranium dioxide single crystalsGarrido, F. / Nowicki, L. / Sattonnay, G. / Sauvage, T. / Thomé, L. et al. | 2004
- 200
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Open questions in electronic sputtering of solids by slow highly charged ions with respect to applications in single ion implantationSchenkel, T. / Rangelow, I.W. / Keller, R. / Park, S.J. / Nilsson, J. / Persaud, A. / Radmilovic, V.R. / Grabiec, P. / Schneider, D.H. / Liddle, J.A. et al. | 2004
- 206
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Existence of transient temperature spike induced by SHI: evidence by ion beam analysisAvasthi, D.K / Ghosh, S / Srivastava, S.K / Assmann, W et al. | 2004
- 215
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Sputtering with polyatomic ions: revisiting kinetic energy distributions of secondary ionsVeryovkin, I.V. / Belykh, S.F. / Adriaens, A. / Adams, F. et al. | 2004
- 221
-
Angular distribution of sputtered particles induced by ion bombardmentLee, Chin Shuang / Liu, Ya Chun / Chen, Yung Hung / Lee, Shyong et al. | 2004
- 226
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A study of the dechanneling of protons in SiC polytype crystals in the energy range Ep=400–650 keVKokkoris, M. / Perdikakis, G. / Kossionides, S. / Petrović, S. / Vlastou, R. / Grötzschel, R. et al. | 2004
- 232
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Analysis of ion implanted silicon by RBS-channeling: influence of the damage modelBianconi, M. / Albertazzi, E. / Balboni, S. / Lulli, G. et al. | 2004
- 236
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Damage evaluation after ion beam irradiation on polyimide films using ERD and RBS techniques simultaneouslyKaneko, T. / Watamori, M. / Makita, H. / Araujo, C. / Kano, G. et al. | 2004
- 241
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Experimental energy straggling of protons in inhomogeneous materialsTosaki, Mitsuo / Ohsawa, Daisuke / Isozumi, Yasuhito et al. | 2004
- 246
-
Random energy loss and straggling study of 9Be ions in siliconAraujo, L.L. / Behar, M. / Grande, P.L. / Dias, J.F. et al. | 2004
- 251
-
Energy loss of He, Li and B isotopes with MeV energies in AuHsu, J.Y. / Yu, Y.C. / Liang, J.H. / Chen, K.M. / Niu, H. et al. | 2004
- 256
-
Studies of electronic stopping powers using time of flight spectrometryZhang, Yanwen / Weber, William J. et al. | 2004
- 263
-
Energy loss measurements for mass-14 ions using a patterned stopping medium on a PIN diodeTimmers, Heiko / Stenström, Kristina / Graczyk, Mariusz / Whitlow, Harry J. et al. | 2004
- 268
-
Continuous stopping power curves of Al2O3 for 0.2–2.5 MeV He ionsPascual-Izarra, C. / Bianconi, M. / Barradas, N.P. / Climent-Font, A. / Garcı́a, G. / Gonzalo, J. / Afonso, C.N. et al. | 2004
- 273
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Stopping power of thin GaAs films for Si and P ionsNigam, M. / Duggan, J.L. / El Bouanani, M. / Yang, C. / Ravi Prasad, G.V. / Sosa, E.D. / Matteson, S. / McDaniel, F.D. et al. | 2004
- 278
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Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectilesBelykh, S.F / Palitsin, V.V / Adriaens, A / Adams, F et al. | 2004
- 284
-
M X-ray production in Nd, Gd, Ho and Lu by 1–6 MeV lithium ionsYu, Y.C. / Chen, K.M. et al. | 2004
- 289
-
L-Shell X-ray production cross-sections by impact of 5.0 to 7.5 MeV 10B2+ ions on selected rare earth elementsLugo-Licona, M. / Miranda, J. et al. | 2004
- 294
-
Optical transmission of silica glass during swift-heavy-ion implantationPlaksin, Oleg / Okubo, Nariaki / Takeda, Yoshihiko / Amekura, Hiroshi / Kono, Kenichiro / Kishimoto, Naoki et al. | 2004
- 299
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Emission of electrons from diamond surfaces induced by MeV ionsRebuli, D.B. / Sideras-Haddad, E. / Connell, S.H. et al. | 2004
- 303
-
Response function during oxygen sputter profiling for deconvolution of boron spatial distributionShao, Lin / Liu, Jiarui / Wang, Chong / Ma, Ki B. / Zhang, Jianming / Chen, John / Tang, Daniel / Patel, Sanjay / Chu, Wei-Kan et al. | 2004
- 307
-
Measurement of the inelastic scattering of protons by 23Na in the energy range 1.25–2.40 MeVMateus, R. / Jesus, A.P. / Cruz, J. / Ribeiro, J.P. et al. | 2004
- 312
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Desorption of O2 from SiO2 films during irradiation of SiO2 with MeV/a.m.u. heavy ionsArnoldbik, W.M. / Tomozeiu, N. / Habraken, F.H.P.M. et al. | 2004
- 317
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Cross-sections for the elastic recoil of hydrogen isotopes for high energy helium ionsBrowning, J.F. / Banks, J.C. / Wampler, W.R. / Doyle, B.L. et al. | 2004
- 323
-
Mass analysis of sputtered particles induced by Ar bombardment of two iced targets, H2O and CO2Lee, Chin Shuang / Liu, Ya Chung / Chen, Yung Hung / Wu, Robert / Ip, W.-H. / Yih, T.S. / Lee, Shyong et al. | 2004
- 327
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Ion beam induced luminescence of doped yttrium compoundsRossi, P. / Brice, D.K. / Seager, C.H. / McDaniel, F.D. / Vizkelethy, G. / Doyle, B.L. et al. | 2004
- 333
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High resolution elastic recoil detectionDollinger, G. / Bergmaier, A. / Goergens, L. / Neumaier, P. / Vandervorst, W. / Jakschik, S. et al. | 2004
- 344
-
RBS with high depth resolution using small magnetic spectrometersGrötzschel, Rainer / Klein, Christoph / Mäder, Michael et al. | 2004
- 351
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High-resolution RBS: a powerful tool for atomic level characterizationKimura, K. / Joumori, S. / Oota, Y. / Nakajima, K. / Suzuki, M. et al. | 2004
- 358
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Heavy ion backscattering spectrometry at the University of Central FloridaBraunstein, G. / Duffy, M. / Maina, S. / Tonner, B. / Banks, J.C. et al. | 2004
- 364
-
Counting individual atom layers in graphite – high-resolution RBS experiments on highly oriented pyrolytic graphiteSrivastava, S.K. / Plachke, D. / Szőkefalvi-Nagy, Á. / Major, J. / Carstanjen, H.D. et al. | 2004
- 369
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Use of grazing angle sputtering for improving depth resolution in high resolution RBSSakai, W. / Nakajima, K. / Suzuki, M. / Kimura, K. et al. | 2004
- 373
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Ion-beam characterization of He implanted into nuclear matricesPantelica, D. / Thomé, L. / Enescu, S.E. / Negoita, F. / Ionescu, P. / Stefan, I. / Gentils, A. et al. | 2004
- 379
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Extending RBS analysis to very fragile, nanometer-thick foilsMusket, R.G. / Felter, T.E. et al. | 2004
- 384
-
The new external microbeam facility at the 5 MV Tandetron accelerator laboratory in Madrid: beam characterisation and first resultsEnguita, Olga / Fernández-Jiménez, M.T. / Garcı́a, G. / Climent-Font, A. / Calderón, T. / Grime, G.W. et al. | 2004
- 389
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First accelerator based ion beam analysis facility in Lebanon: development and applicationsRoumié, M. / Nsouli, B. / Zahraman, K. / Reslan, A. et al. | 2004
- 394
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25 years of IBA teaching experience at the National Institute for Nuclear Science and Technology, FranceBeck, Lucile / de Château-Thierry, A. / Frontier, J.-P. / Pellegrino, S. / Trouslard, Ph. et al. | 2004
- 400
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First measurements with the Madrid 5 MV tandem acceleratorCliment-Font, A. / Pászti, F. / Garcı́a, G. / Fernández-Jiménez, M.T. / Agulló, F. et al. | 2004
- 405
-
The new Surrey ion beam analysis facilitySimon, A. / Jeynes, C. / Webb, R.P. / Finnis, R. / Tabatabaian, Z. / Sellin, P.J. / Breese, M.B.H. / Fellows, D.F. / van den Broek, R. / Gwilliam, R.M. et al. | 2004
- 410
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Hydrogen detection with a gas ionization elastic recoil detectorElliman, R.G. / Timmers, H. / Weijers, T.D.M. et al. | 2004
- 415
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Gas ionization chambers with silicon nitride windows for the detection and identification of low energy ionsDöbeli, M. / Kottler, C. / Stocker, M. / Weinmann, S. / Synal, H.-A. / Grajcar, M. / Suter, M. et al. | 2004
- 420
-
A PIN detector array for the determination of boron using nuclear reaction analysis at a nuclear microprobeSziki, Gusztáv / Dobos, Erik / Kertész, Zsófia / Szikszai, Zita / Uzonyi, Imre / Kiss, Árpád Zoltán et al. | 2004
- 425
-
Ion beam analysis of carbon using 12C(p,p'g) reactionYasuda, K. et al. | 2004
- 425
-
Ion beam analysis of carbon using 12C(p,pprimeg) reactionYasuda, K. / Hatori, S. / Inomata, T. / Ishigami, R. / Ito, Y. / Sasase, M. et al. | 2004
- 425
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Ion beam analysis of carbon using 12C(p,p′γ) reactionYasuda, K. / Hatori, S. / Inomata, T. / Ishigami, R. / Ito, Y. / Sasase, M. et al. | 2004
- 430
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ERD, 15N external beam for NRRA in air, HIRBS: ion beam analysis developments on the HVEC EN-1 TandemSchiettekatte, F. / Chicoine, M. / Forster, J.S. / Geiger, J.S. / Gujrathi, S. / Kolarova, R. / Paradis, A. / Roorda, S. / Wei, P. et al. | 2004
- 435
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Measurement of very low bulk concentrations (below 1 ppm) of hydrogen using ERDATripathi, A. / Kruse, O. / Carstanjen, H.D. et al. | 2004
- 440
-
Elastic recoil detection analysis of 3HeKnapp, J.A. / Arstila, K. / Wampler, W.R. / Banks, J.C. / Doyle, B.L. et al. | 2004
- 444
-
Round robin analyses of hydrogen isotope thin films standardsBanks, J.C. / Browning, J.F. / Wampler, W.R. / Doyle, B.L. / LaDuca, C.A. / Tesmer, J.R. / Wetteland, C.J. / Wang, Y.Q. et al. | 2004
- 450
-
Measurement of deuterium in the presence of protium by elastic recoil spectroscopyIngram, David C. et al. | 2004
- 455
-
Depth profiles of H, C, O, Al and Si implants in a GaN substrate using trace element accelerator mass spectrometryMitchell, Lee J. / Ravi Prasad, G.V. / Pelicon, Primoz / Smith, Eric B. / McDaniel, Floyd D. et al. | 2004
- 459
-
AMS depth profiling of humidity in silicaPilz, W. / Friedrich, M. / Heinig, K.-H. / Schmidt, B. / von Borany, J. et al. | 2004
- 463
-
A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion sourceMatsuo, Jiro / Okubo, Chihiro / Seki, Toshio / Aoki, Takaaki / Toyoda, Noriaki / Yamada, Isao et al. | 2004
- 468
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A time-of-flight mass spectrometer to resolve isobarsIshida, Y. / Wada, M. / Matsuo, Y. / Tanihata, I. / Casares, A. / Wollnik, H. et al. | 2004
- 473
-
A new time-of-flight instrument for quantitative surface analysisVeryovkin, Igor V. / Calaway, Wallis F. / Moore, Jerry F. / Pellin, Michael J. / Burnett, Donald S. et al. | 2004
- 480
-
A new range of high-current TandetronTM accelerator systems with terminal voltages of 1–6 MVMous, D.J.W. / Visser, J. / Gottdang, A. / Haitsma, R.G. et al. | 2004
- 485
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The beam blanking system for microlithography at Lund Nuclear MicroprobeAuzelyte, Vaida / Elfman, Mikael / Kristiansson, Per / Malmqvist, Klas / Wallman, Lars / Nilsson, Christer / Pallon, Jan / Shariff, Asad / Wegdén, Marie et al. | 2004
- 490
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A nanosecond pulsing system for MeV light ions using a 2 MV TandetronTMMous, D.J.W. / Visser, J. / Haitsma, R.G. et al. | 2004
- 494
-
Characterization of a new large area HPGe X-ray detector for low beam current applicationShariff, Asad / Kristiansson, Per / Auzelyte, Vaida / Elfman, Mikael / Malmqvist, Klas G. / Nilsson, Christer / Pallon, Jan / Wegdén, Marie et al. | 2004
- 499
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Intensity calibration of an FT-IR spectrometer by heavy-ion ERDAStrub, E. / Bär, M. / Bohne, W. / Fischer, Ch.-H. / Leupolt, B. / Lindner, S. / Röhrich, J. / Schöneich, B. et al. | 2004
- 503
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On the role of the signal processing electronics in X-ray analytical measurementsPapp, T. / Maxwell, J.A. / Papp, A. / Nejedly, Z. / Campbell, J.L. et al. | 2004
- 508
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A new micro-DIGE set-up for the analysis of light elementsSzı́ki, Gusztáv Á. / Uzonyi, Imre / Dobos, Erik / Rajta, István / Biró, Katalin T. / Nagy, Sándor / Kiss, Árpád et al. | 2004
- 514
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Charge-state distribution of 400 keV He ions scattered from solid surfacesNakajima, Kaoru / Okura, Yasutaka / Suzuki, Motofumi / Kimura, Kenji et al. | 2004
- 519
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Quantitative analysis of light elements in thick samples by PIGEMateus, R. / Jesus, A.P. / Ribeiro, J.P. et al. | 2004
- 524
-
Differential PIXE measurements of thin metal layersŠmit, Ž. / Holc, M. et al. | 2004
- 530
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Versatile use of ion beams for diffusion studies by the modified radiotracer techniqueLaitinen, Pauli / Riihimäki, Iiro / Huikari, Jussi / Räisänen, Jyrki et al. | 2004
- 534
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Ion beam microanalysis in geoscience researchRyan, C.G et al. | 2004
- 550
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Hydrogen analysis by p–p scattering in geological materialWegdén, M. / Kristiansson, P. / Pastuovic, Z. / Skogby, H. / Auzelyte, V. / Elfman, M. / Malmqvist, K.G. / Nilsson, C. / Pallon, J. / Shariff, A. et al. | 2004
- 555
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Characterization of impact materials around Barringer Meteor Crater by micro-PIXE and micro-SRXRF techniquesUzonyi, I. / Szöőr, Gy. / Rózsa, P. / Vekemans, B. / Vincze, L. / Adams, F. / Drakopoulos, M. / Somogyi, A. / Kiss, Á.Z. et al. | 2004
- 561
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Development of a system for determination of the 13C/12C isotopic ratio with high spatial resolutionKristiansson, Per / Hode, Tomas / Auzelyte, Vaida / Elfman, Mikael / Malmqvist, Klas / Nilsson, Christer / Pallon, Jan / Shariff, Asad / Wegdén, Marie et al. | 2004
- 567
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Triangulation of a Cu(001) surface and an ultra-thin Mn film via grazing ion surface scatteringBernhard, T. / Pfandzelter, R. / Winter, H. et al. | 2004
- 573
-
Development of three-dimensional medium-energy ion scattering spectroscopyShimoda, S. / Kobayashi, T. et al. | 2004
- 578
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Depth characterization of nm-layers by low energy ion scatteringDraxler, M. / Markin, S.N. / Beikler, R. / Taglauer, E. / Kastner, F. / Bergsmann, M. / Bauer, P. et al. | 2004
- 584
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Characterization of dopant profiles produced by ultra-shallow As implantation and spike annealing using medium energy ion scatteringIchihara, S. / Nakagawa, T. / Nitta, M. / Abo, S. / Lohner, T. / Angelov, C. / Ohta, K. / Takai, M. et al. | 2004
- 589
-
TOF-RBS with medium energy heavy ion probe for semiconductor process analysisHayashi, Kei / Takayama, Hirosuke / Ishikawa, Masao / Abo, Satoshi / Lohner, Tivadar / Takai, Mikio et al. | 2004
- 593
-
A combined LEIS/STM study of two types of surface reconstruction of magnetic Fe4N layersGrachev, S.Y. / Gallego, J.M. / Écija, D. / Boerma, D.O. / Gonzalez-Arrabal, R. / Miranda, R. et al. | 2004
- 599
-
Inelastic energy loss and spectrum shape for medium energy He ions undergoing a large-angle single collision with Si(111)-x-SbKido, Y. et al. | 2004
- 599
-
Inelastic energy loss and spectrum shape for medium energy He ions undergoing a large-angle single collision with Si(111)-3x3-SbKido, Y. / Semba, S. / Hoshino, Y. et al. | 2004
- 599
-
Inelastic energy loss and spectrum shape for medium energy He ions undergoing a large-angle single collision with Si(111)-–SbKido, Y. / Semba, S. / Hoshino, Y. et al. | 2004
- 604
-
Using ion beam analysis in determining the mechanisms of cleavage in hydrogen ion implanted SiNastasi, Michael / Höchbauer, Tobias / Verda, Raymond D. / Misra, Amit / Lee, Jung-Kun / Mayer, James W. / Lau, S.S. et al. | 2004
- 611
-
Assessment of subsurface damage in polished II–VI semiconductors by ion channelingLucca, D.A. / Wetteland, C.J. / Misra, A. / Klopfstein, M.J. / Nastasi, M. / Maggiore, C.J. / Tesmer, J.R. et al. | 2004
- 618
-
Virtues and pitfalls in structural analysis of compound semiconductors by the complementary use of RBS/channeling and high resolution X-ray diffractionTuros, A. / Gaca, J. / Wojcik, M. / Nowicki, L. / Ratajczak, R. / Groetzschel, R. / Eichhorn, F. / Schell, N. et al. | 2004
- 626
-
Channeling study of the damage induced in zirconia irradiated with high-energy heavy ionsJagielski, J. / Gentils, A. / Thomé, L. / Nowicki, L. / Garrido, F. / Klaumünzer, S. et al. | 2004
- 631
-
NRA and ERDA investigation of helium retention in SiC as a function of irradiation and annealingSmith, R.J. / Zhang, Y. / Shutthanandan, V. / Bissell, L.J. / Thevuthasan, S. / Jiang, W. / Weber, W.J. et al. | 2004
- 636
-
Lattice location of Mn and fundamental Curie temperature limit in ferromagnetic Ga1−xMnxAsYu, K.M. / Walukiewicz, W. / Wojtowicz, T. / Lim, W.L. / Liu, X. / Dobrowolska, M. / Furdyna, J.K. et al. | 2004
- 642
-
Thermal and dynamic responses of Ag implants in silicon carbideJiang, W. / Weber, W.J. / Shutthanandan, V. / Li, L. / Thevuthasan, S. et al. | 2004
- 647
-
Annealing behavior of Al-implantation-induced disorder in 4H–SiCZhang, Y. / Weber, W.J. / Jiang, W. / Shutthanandan, V. / Thevuthasan, S. / Janson, M. / Hallén, A. et al. | 2004
- 652
-
Effect of ion current density on damage in Al ion implanted SiCBattistig, G. / Garcı́a López, J. / Morilla, Y. / Khánh, N.Q. / Lohner, T. / Petrik, P. / Ramos, A.R. et al. | 2004
- 656
-
Microbeam channeling studies of epitaxial titanate filmsPadmanabhan, Karur R. et al. | 2004
- 662
-
Relationship between damage evolution and Si–H complexes formation in hydrogen implanted SiLee, J.K. / Höchbauer, T. / Averitt, R.D. / Nastasi, M. et al. | 2004
- 666
-
Structural characterization of half-metallic Heusler compound NiMnSbNowicki, L. / Abdul-Kader, A.M. / Bach, P. / Schmidt, G. / Molenkamp, L.W. / Turos, A. / Karczewski, G. et al. | 2004
- 671
-
Ion beam characterization of GaAs1−x−yNxBiy epitaxial layersWei, P. / Tixier, S. / Chicoine, M. / Francoeur, S. / Mascarenhas, A. / Tiedje, T. / Schiettekatte, F. et al. | 2004
- 676
-
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperaturesNakabayashi, M. / Ohyama, H. / Hanano, N. / Kamiya, T. / Hirao, T. / Takakura, K. / Simoen, E. / Claeys, C. et al. | 2004
- 680
-
Heavy ion elastic recoil detection analysis of silicon-rich silica filmsWeijers, T.D.M. / Elliman, R.G. / Timmers, H. et al. | 2004
- 686
-
Reliable ERD analysis of group-III nitrides despite severe nitrogen depletionShrestha, Santosh K. / Butcher, K.Scott A. / Wintrebert-Fouquet, Marie / Timmers, Heiko et al. | 2004
- 693
-
Ion beam analysis of functional layers for CuInSe2 solar cells deposited on polymer foilsSpemann, D / Deltschew, R / Lorenz, M / Butz, T et al. | 2004
- 699
-
RBS ion channeling study of low concentrations of ion implanted samarium in GaNIngram, David C. / Lozykowski, Henryk / Jadwisienczak, Wojciech M. et al. | 2004
- 703
-
Microstructure evolution effects of helium redistribution in as-implanted silicon and Si0.8Ge0.2/Si heterostructuesMörschbächer, M.J. / da Silva, D.L. / Fichtner, P.F.P. / Oliviero, E. / Behar, M. / Zawislak, F.C. / Holländer, B. / Luysberg, M. / Mantl, S. / Loo, R. et al. | 2004
- 708
-
Ion beam analysis of thin doped ZnO layersWielunski, Leszek S. / Hill, D.H. / Quinn, J. / Bartynski, R.A. / Wu, P. / Lu, Y. et al. | 2004
- 713
-
Formation of bubbles and extended defects in He implanted (100) Si at elevated temperaturesda Silva, Douglas L. / Mörschbächer, Marcio J. / Fichtner, Paulo F.P. / Oliviero, Erwan / Behar, Moni et al. | 2004
- 718
-
Radiation damages of InGaAs photodiodes by high-temperature electron irradiationOhyama, H. / Takakura, K. / Nakabayashi, M. / Hirao, T. / Onoda, S. / Kamiya, T. / Simoen, E. / Claeys, C. / Kuboyama, S. / Oka, K. et al. | 2004
- 722
-
Use of micro-PIXE analysis for the identification of contaminants in the metal deposition on a CMS pitch adapterMassi, M. / Giuntini, L. / Fedi, M.E. / Arilli, C. / Grassi, N. / Mandò, P.A. / Migliori, A. / Focardi, E. et al. | 2004
- 727
-
Electrical activation and lattice location of B and Ga impurities implanted in SiRomano, Lucia / Piro, Alberto M. / Napolitani, Enrico / Bisognin, Gabriele / Spada, Aldo / Grimaldi, Maria G. / Rimini, Emanuele et al. | 2004
- 732
-
Structural characterization and oxygen concentration profiling of a Co/Si multilayer structurePiro, A.M. / Romano, L. / Spada, A. / La Via, F. / Grimaldi, M.G. / Rimini, E. et al. | 2004
- 737
-
Optical properties of dense Cu nanoparticle composites fabricated by negative ion implantationTakeda, Y. / Lu, J. / Plaksin, O.A. / Amekura, H. / Kono, K. / Kishimoto, N. et al. | 2004
- 742
-
He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70 Å/CoFe 35 Å/HfAlOx/CoFe 35 Å/Ta 30 Å systemsBarradas, N.P. / Matias, V. / Sequeira, A.D. / Soares, J.C. / Kreissig, U. / Wang, J.U. / Freitas, P.P. et al. | 2004
- 742
-
He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70 A/CoFe 35 A/HfAlOx/CoFe 35 A/Ta 30 A systemsBarradas, N. P. / Matias, V. / Sequeira, A. D. / Soares, J. C. / Kreissig, U. / Wang, J. U. / Freitas, P. P. et al. | 2004
- 747
-
Ion beam studies of hydrogen implanted Si wafersNurmela, A. / Henttinen, K. / Suni, T. / Tolkki, A. / Suni, I. et al. | 2004
- 751
-
Real-time ERD analysis of hydrogen retention in silicon during ramped thermal annealMeyer, K.A. / Comrie, C.M. / Theron, C. et al. | 2004
- 755
-
Application of nondestructive ion beam analysis to measure variations in the elemental composition of armor materialsPallone, Arthur / Demaree, John / Adams, Jane et al. | 2004
- 759
-
Nitrogen beam RBS for concentration uniformity measurements of SiO2:Au thin layer co-depositionsMuntele, Claudiu I. / Muntele, Iulia C. / Zimmerman, Robert L. / Ila, Daryush et al. | 2004
- 763
-
Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputteringAndrade, E. / Flores, M. / Muhl, S. / Barradas, N.P. / Murillo, G. / Zavala, E.P. / Rocha, M.F. et al. | 2004
- 768
-
Elemental depth profiles of MgB2/Si precursor and superconducting filmsAndrade, E. / Chromik, Š. / Jergel, Mi. / Jergel, Ma. / Falcony, C. / Štrbı́k, V. / Rocha, M.F. et al. | 2004
- 773
-
Thin film nanolaminate analysis by simultaneous heavy ion recoil and X-ray spectrometryHarjunmaa, A. / Sajavaara, T. / Arstila, K. / Kukli, K. / Keinonen, J. et al. | 2004
- 778
-
Formation of shallow junctions through BGe molecular ion implantation and rapid thermal annealingLiang, J.H. / Sang, Y.J. et al. | 2004
- 783
-
Range parameters of Bn cluster ion implantation in siliconLiang, J.H. / Han, H.M. et al. | 2004
- 788
-
The unique role of ion beam analysis in modeling the thermal evolution of hydrogen in Si implanted at doses required for ion cuttingHolland, O.W. et al. | 2004
- 792
-
Carbon doping by ion implantation and C2H6 gas in GaN: Rutherford backscattering/channeling, Raman scattering and photoluminescence studiesHirota, R. / Kushida, K. / Takahashi, Jun / Kuriyama, Kazuo et al. | 2004
- 798
-
Ion beam modification and analysis of metal/polymer bi-layer thin filmsWang, Y.Q. / Curry, M. / Tavenner, E. / Dobson, N. / Giedd, R.E. et al. | 2004
- 804
-
Fluence loss due to Rutherford backscattering for very low energy ion implantation in siliconZhao, Zhiyong / Ng, Che-Hoo / Neil, Ted / Liu, Jinning / Jin, Jianyue et al. | 2004
- 810
-
Atomic transport in insulators under high-flux heavy-ion implantationKishimoto, N. / Plaksin, O.A. / Umeda, N. / Takeda, Y. et al. | 2004
- 815
-
Swift heavy ion induced modification of Si/C60 multilayersSrivastava, S.K. / Kabiraj, D. / Schattat, B. / Carstanjen, H.D. / Avasthi, D.K. et al. | 2004
- 820
-
Temporal evolution of ion implanted CdSe distribution in SiO2 on silicon during annealingGrosshans, I. / Karl, H. / Stritzker, B. et al. | 2004
- 825
-
Non-magnetic to magnetic and non-metal to metal transitions in nickel nanoparticles in SiO2 under heat treatmentAmekura, H. / Kitazawa, H. / Kishimoto, N. et al. | 2004
- 830
-
Dynamics of co-irradiation effects of high-energy ions and photons on nanoparticle precipitation in silica glassOkubo, N. / Kishimoto, N. / Takeda, Y. et al. | 2004
- 836
-
Ion beam analysis for fusion energy researchWampler, W.R. et al. | 2004
- 846
-
Loss of hydrogen from ion irradiated photoresist and a-C:H filmsBaptista, D.L. / Garcia, Irene T.S. / Zawislak, F.C. et al. | 2004
- 851
-
Characterization of Si(100)/HfSiON interfaceSuzuki, M. / Takashima, A. / Koyama, M. / Iijima, R. / Ino, T. / Takenaka, M. et al. | 2004
- 856
-
Study of thin hafnium oxides deposited by atomic layer depositionGanem, J.-J. / Trimaille, I. / Vickridge, I.C. / Blin, D. / Martin, F. et al. | 2004
- 862
-
Study of the nickel-fullerene nano-structured thin filmsVacik, J. / Naramoto, H. / Narumi, K. / Yamamoto, S. / Abe, H. et al. | 2004
- 867
-
Epitaxial re-crystallization of the Ni/MgO(001) interfacesVacik, J. / Naramoto, H. / Yamamoto, S. / Narumi, K. et al. | 2004
- 871
-
Characterization of electroless Au, Pt and Pd contacts on CdTe and ZnTe by RBS and SIMS techniquesRoumié, M. / Hageali, M. / Zahraman, K. / Nsouli, B. / Younes, G. et al. | 2004
- 875
-
Rutherford backscattering spectroscopy of amorphous films of Ag–As–S system prepared by spin-coating techniqueWágner, T. / Kohoutek, T. / Perina, V. / Mackova, A. / Hnatowitz, V. / Wagner, Th. / Kasap, S.O. / Krbal, M. / Frumar, M. / Vlček, Mil. et al. | 2004
- 880
-
Secondary-ion mass spectrometry (SIMS) analysis of catalyst coatings used in microreactorsGnaser, Hubert / Bock, Wolfgang / Rowlett, Elisabeth / Men, Yong / Ziegler, Christiane / Zapf, Ralf / Hessel, Volker et al. | 2004
- 886
-
Ferromagnetic microstructures in highly oriented pyrolytic graphite created by high energy proton irradiationSpemann, D. / Han, K.-H. / Esquinazi, P. / Höhne, R. / Butz, T. et al. | 2004
- 891
-
Ion beam analysis of epitaxial (Mg, Cd)xZn1−xO and ZnO:(Li, Al, Ga, Sb) thin films grown on c-plane sapphireSpemann, D / Kaidashev, E.M / Lorenz, M / Vogt, J / Butz, T et al. | 2004