Laser-SNMS analysis of apatite formation in vitro (English)
- New search for: Dambach, S.
- New search for: Dambach, S.
- New search for: Fartmann, M.
- New search for: Kriegeskotte, C.
- New search for: Brüning, C.
- New search for: Wiesmann, H.P.
- New search for: Lipinsky, D.
- New search for: Arlinghaus, H.F.
In:
Applied surface science
;
231
; 506-509
;
2004
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ISSN:
- Article (Journal) / Print
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Title:Laser-SNMS analysis of apatite formation in vitro
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Contributors:Dambach, S. ( author ) / Fartmann, M. / Kriegeskotte, C. / Brüning, C. / Wiesmann, H.P. / Lipinsky, D. / Arlinghaus, H.F.
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Published in:Applied surface science ; 231 ; 506-509
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2004
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 52.78 / 35.18 / 33.68
- Further information on Basic classification
- New search for: 535/3485
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Keywords:
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Classification:
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Source:
Table of contents – Volume 231
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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PrefaceHunter, Jerry / Schueler, Bruno W. / Stevie, Fred A. et al. | 2004
- 3
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Challenges in localized high precision isotope analysis by SIMSSlodzian, G. et al. | 2004
- 13
-
Collisions of organic ions at surfacesCooks, R.Graham / Jo, Sung-Chan / Green, Jason et al. | 2004
- 22
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Sputtering simulations of organic overlayers on metal substrates by monoatomic and clusters projectilesPostawa, Z. et al. | 2004
- 29
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Molecular dynamics simulation of silicon sputtering: sensitivity to the choice of potentialThijsse, B.J. / Klaver, T.P.C. / Haddeman, E.F.C. et al. | 2004
- 39
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A comparison of molecular dynamic simulations and experimental observations: the sputtering of gold {100} by 20keV argonMcQuaw, C.M. / Smiley, E.J. / Garrison, B.J. / Winograd, N. et al. | 2004
- 44
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Molecular dynamics simulations to explore the role of mass matching in the keV bombardment of organic films with polyatomic projectilesHarper, Sandra / Krantzman, Kristin D. et al. | 2004
- 48
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Sputtering of a polycyclic hydrocarbon molecule: TOF–SIMS experiments and molecular dynamic simulationsSolomko, V. / Delcorte, A. / Garrison, B.J. / Bertrand, P. et al. | 2004
- 54
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Cluster secondary ion mass spectrometry: an insight into “super-efficient” collision cascadesRickman, Richard D. / Verkhoturov, Stanislav V. / Schweikert, Emile A. et al. | 2004
- 59
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Energetic cluster induced desorption from a graphite surfaceWebb, R. et al. | 2004
- 64
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Sputtering of Ag under C60+ and Ga+ projectile bombardmentSun, S. / Szakal, C. / Smiley, E.J. / Postawa, Z. / Wucher, A. / Garrison, B.J. / Winograd, N. et al. | 2004
- 68
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Molecular depth profiling in ice matrices using C60 projectilesWucher, A. / Sun, S. / Szakal, C. / Winograd, N. et al. | 2004
- 72
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Emission of ionic water clusters from water ice films bombarded by energetic projectilesWojciechowski, Igor A. / Kutliev, Uchkun / Sun, Shixin / Szakal, Christopher / Winograd, Nicholas / Garrison, Barbara J. et al. | 2004
- 78
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Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardmentMorozov, S.N. / Rasulev, U.Kh. et al. | 2004
- 82
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Detection of the diatomic dications SiH2+ and AlH2+Franzreb, Klaus / Sobers, Richard C. Jr. / Lörincı́k, Jan / Williams, Peter et al. | 2004
- 86
-
Secondary ion emission from polycrystalline Al under Cs+ irradiationvan der Heide, P.A.W. et al. | 2004
- 90
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Factors affecting the retention of Cs+ primary ions in Sivan der Heide, P.A.W. / Lupu, C. / Kutana, A. / Rabalais, J.W. et al. | 2004
- 94
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Positive ionization probabilities of sputtered Ag and Ta clustersFerleger, V.Kh. et al. | 2004
- 97
-
Secondary ion emission and work function measurements over the transient region from n and p type Si under Cs+ irradiationvan der Heide, P.A.W. et al. | 2004
- 101
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On the trends in kinetic energies of secondary ions produced by polyatomic ion bombardmentVeryovkin, Igor V. / Belykh, Sergey F. / Adriaens, Annemie / Zinovev, Alexander V. / Adams, Freddy et al. | 2004
- 106
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Characterization of surface structure by cluster coincidental ion mass spectrometryRickman, R.D. / Verkhoturov, S.V. / Balderas, S. / Bestaoui, N. / Clearfield, A. / Schweikert, E.A. et al. | 2004
- 113
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Nanodomain analysis via coincidence ion mass spectrometryVerkhoturov, S.V. / Rickman, R.D. / Balderas, S. / Schweikert, E.A. et al. | 2004
- 117
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Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)Gnaser, Hubert / Golser, Robin / Kutschera, Walter / Priller, Alfred / Steier, Peter / Vockenhuber, Christof et al. | 2004
- 122
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Emission processes of molecule–metal cluster ions from self-assembled monolayers of octanethiols on gold and silverArezki, B / Delcorte, A / Bertrand, P et al. | 2004
- 127
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Positive secondary ion yield enhancement of metal elements using trichlorotrifluoroethane and tetrachloroethene backfillingChi, P.H. / Gillen, G. et al. | 2004
- 131
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Desorption/ionization of molecular nanoclusters: SIMS versus MALDIDelcorte, A. / Hermans, S. / Devillers, M. / Lourette, N. / Aubriet, F. / Muller, J.-F. / Bertrand, P. et al. | 2004
- 136
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Imaging by atomic force microscopy of the electrical properties difference of the facets of oxygen-ion-induced ripple topography in siliconGautier, Brice / Fares, Boubker / Prudon, Gilles / Dupuy, Jean-Claude et al. | 2004
- 141
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Laboratory teaching of SIMS to university undergraduatesChater, R.J. / McPhail, D.S. et al. | 2004
- 146
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C60 cluster ion bombardment of organic surfacesWeibel, D.E. / Lockyer, N. / Vickerman, J.C. et al. | 2004
- 153
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Cluster primary ion bombardment of organic materialsKollmer, F et al. | 2004
- 159
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ToF-SIMS imaging with cluster ion beamsXu, J. / Ostrowski, S. / Szakal, C. / Ewing, A.G. / Winograd, N. et al. | 2004
- 164
-
Investigation of secondary cluster ion emission from self-assembled monolayers of alkanethiols on gold with ToF-SIMSSchröder, M. / Sohn, S. / Arlinghaus, H.F. et al. | 2004
- 169
-
Impact energy dependence of SF5+ ion beam damage of poly(methyl methacrylate) studied by time-of-flight secondary ion mass spectrometryWagner, M.S. / Gillen, G. et al. | 2004
- 174
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Dynamic SIMS utilizing SF5+ polyatomic primary ion beams for drug delivery applicationsMahoney, Christine M. / Roberson, Sonya / Gillen, Greg et al. | 2004
- 179
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Depth profiling studies of multilayer films with a C60+ ion sourceSostarecz, A.G. / Sun, S. / Szakal, C. / Wucher, A. / Winograd, N. et al. | 2004
- 183
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C60 molecular depth profiling of a model polymerSzakal, C. / Sun, S. / Wucher, A. / Winograd, N. et al. | 2004
- 186
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Automated analysis of organic particles using cluster SIMSGillen, Greg / Zeissler, Cindy / Mahoney, Christine / Lindstrom, Abigail / Fletcher, Robert / Chi, Peter / Verkouteren, Jennifer / Bright, David / Lareau, Richard T. / Boldman, Mike et al. | 2004
- 191
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Sputtering of indium using polyatomic projectilesSamartsev, A.V. / Wucher, A. et al. | 2004
- 196
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Polyatomic primary ion bombardment of organic materials: experiences in routine analysisHagenhoff, B / Pfitzer, K / Tallarek, E / Kock, R / Kersting, R et al. | 2004
- 201
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Evaluation of a gold LMIG for detecting small molecules in a polymer matrix by ToF-SIMSBryan, S.R. / Belu, A.M. / Hoshi, T. / Oiwa, R. et al. | 2004
- 207
-
Re-discovering surface mass spectrometry: chemical mapping from micro to macroLloyd, K.G. / O’Keefe, D.P. et al. | 2004
- 217
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Enhancing and automating TOF-SIMS data interpretation using principal component analysisPachuta, Steven J. et al. | 2004
- 224
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Organic molecule characterization—G-SIMSGilmore, I.S. / Seah, M.P. et al. | 2004
- 230
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Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIAOhlhausen, J.A.Tony / Keenan, M.R. / Kotula, P.G. / Peebles, D.E. et al. | 2004
- 235
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Principal component analysis of TOF-SIMS spectra, images and depth profiles: an industrial perspectivePacholski, Michaeleen L. et al. | 2004
- 240
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Optimal scaling of TOF-SIMS spectrum-images prior to multivariate statistical analysisKeenan, Michael R. / Kotula, Paul G. et al. | 2004
- 245
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Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images—looking beyond the obviousSmentkowski, Vincent S. / Kotula, P.G. / Keenan, M.R. et al. | 2004
- 250
-
Interest of silver and gold metallization for molecular SIMS and SIMS imagingDelcorte, A. / Bertrand, P. et al. | 2004
- 256
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Organic SIMS: the influence of time on the ion yield enhancement by silver and gold depositionAdriaensen, L. / Vangaever, F. / Gijbels, R. et al. | 2004
- 261
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Influence of primary ion bombardment conditions on the emission of molecular secondary ionsKersting, R. / Hagenhoff, B. / Kollmer, F. / Möllers, R. / Niehuis, E. et al. | 2004
- 265
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Optimized conditions for selective gold flotation by ToF-SIMS and ToF-LIMSChryssoulis, S.L. / Dimov, S.S. et al. | 2004
- 269
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Additive quantification on polymer thin films by ToF-SIMS: aging sample effectsPoleunis, Claude / Médard, Nicolas / Bertrand, Patrick et al. | 2004
- 274
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Characterization of poly(p-phenylene vinylene)/methanofullerene blends of polymer solar cells by time-of-flight secondary ion mass spectrometryBulle-Lieuwma, C.W.T. / van Duren, J.K.J. / Yang, X. / Loos, J. / Sieval, A.B. / Hummelen, J.C. / Janssen, R.A.J. et al. | 2004
- 278
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TOF-SIMS study of modified polymer surfacesLee, Yeonhee / Han, Seunghee / Kwon, Moon-Hee et al. | 2004
- 283
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Determination of oligomeric chain length distributions at surfaces using ToF-SIMS: segregation effects and polymer propertiesGardella, Joseph A. Jr. / Mahoney, Christine M. et al. | 2004
- 289
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ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin filmsKailas, L. / Audinot, J.-N. / Migeon, H.-N. / Bertrand, P. et al. | 2004
- 296
-
Molecular weight evaluation of poly-dimethylsiloxane on solid surfaces using silver deposition/TOF-SIMSInoue, Masae / Murase, Atsushi et al. | 2004
- 302
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Effect of deep UV (172nm) irradiation on PET: ToF/SIMS analysisZhu, Zhengmao / Kelley, Michael J. et al. | 2004
- 309
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Additive behavior in ultrathin polymer films investigated by ToF-SIMSMédard, N. / Bertrand, P. et al. | 2004
- 314
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ToF-SIMS investigation of functional mixed aromatic thiol monolayers on goldAuditore, Alessandro / Tuccitto, Nunzio / Quici, Silvio / Marzanni, Giovanni / Puntoriero, Fausto / Campagna, Sebastiano / Licciardello, Antonino et al. | 2004
- 318
-
Static SIMS study of the behavior of K atoms on sbndCH3, sbndCO2H and sbndCO2CH3 terminated self-assembled monolayersZhu, Z. et al. | 2004
- 318
-
Static SIMS study of the behavior of K atoms on CH3, CO2H and CO2CH3 terminated self-assembled monolayersZhu, Z. / Haynie, B.C. / Winograd, N. et al. | 2004
- 323
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Aldehydes react with scribed silicon to form alkyl monolayers - Characterization by ToF-SIMS suggests an even-odd effectLua, Yit-Yian et al. | 2004
- 323
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Aldehydes react with scribed silicon to form alkyl monolayersLua, Yit-Yian / Fillmore, W.Jonathan J. / Linford, Matthew R. et al. | 2004
- 328
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Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometryLi, Z. / Rickman, R.D. / Verkhoturov, S.V. / Schweikert, E.A. et al. | 2004
- 332
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Investigation of fomblin Z-Dol end-groups on the magnetic recording disks by ToF-SIMSIshikawa, M. / Osawa, Y. / Ishiwata, O. et al. | 2004
- 336
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TOF-SIMS characterization of lubricants used in magnetic recording mediaZhang, Bin C. / Liu, Hui Kathy / Chang, Susan et al. | 2004
- 342
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ToF-SIMS analysis of anti-fretting films generated on the surface of ball bearings containing dithiocarbamate and dithiophosphate grease additivesDuque, Ricardo G. / Wang, Zhiyu / Duell, Dave / Fowler, David E. et al. | 2004
- 348
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A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniquesAdriaensen, L. / Vangaever, F. / Gijbels, R. et al. | 2004
- 353
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Depth profile analysis of chemically amplified resist by using TOF-SIMS with gradient shaving preparationsMan, N. / Okumura, H. / Oizumi, H. / Nagai, N. / Seki, H. / Nishiyama, I. et al. | 2004
- 357
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Ga+ TOF-SIMS lineshape analysis for resolution enhancement of MALDI MS spectra of a peptide mixtureMalyarenko, D.I. / Chen, H. / Wilkerson, A.L. / Tracy, E.R. / Cooke, W.E. / Manos, D.M. / Sasinowski, M. / Semmes, O.J. et al. | 2004
- 362
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A ToF-SIMS study of linseed oil bonded to mercapto silane treated aluminiumBexell, U. / Olsson, M. / Sundell, P.-E. / Johansson, M. / Carlsson, P. / Hellsing, M. et al. | 2004
- 366
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Analysis of adsorbed proteins by static time-of-flight secondary ion mass spectrometryWagner, Matthew S. / Castner, David G. et al. | 2004
- 377
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Progress in cellular analysis using ToF-SIMSLockyer, N.P. / Vickerman, J.C. et al. | 2004
- 385
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Quantitative TOF-SIMS imaging of DNA microarrays produced by bubble jet printing technique and the role of TOF-SIMS in life science industryHashimoto, Hiroyuki / Nakamura, Kumi / Takase, Hiromitsu / Okamoto, Tadashi / Yamamoto, Nobuko et al. | 2004
- 392
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Development of PNA microarrays for gene diagnostics with TOF-SIMSArlinghaus, H.F. / Schröder, M. / Feldner, J.C. / Brandt, O. / Hoheisel, J.D. / Lipinsky, D. et al. | 2004
- 397
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ToF-SIMS characterization of hybridization onto self-assembled single-stranded DNA monolayersSamuel, N.T. / Castner, D.G. et al. | 2004
- 402
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ToF-SIMS surface and interface characterization of the immobilized camel antibody (cAb) onto SAMs-COOH/Au substratesAzioune, A. / Pireaux, J.-J. / Houssiau, L. et al. | 2004
- 406
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Interpretation of static time-of-flight ion mass spectral images of adsorbed protein films on topographically complex surfacesRangarajan, Srinath / Tyler, B.J. et al. | 2004
- 411
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TOF-SIMS imaging of protein adsorption on dialysis membraneAoyagi, Satoka / Hayama, Msayo / Hasegawa, Urara / Sakai, Kiyotaka / Hoshi, Takahiro / Kudo, Masahiro et al. | 2004
- 416
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ToF-SIMS applied to probe bixin in Bixa orellana seedsHoussiau, L. / Felicissimo, M. / Bittencourt, C. / Pireaux, J.J. et al. | 2004
- 420
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ToF-SIMS studies as a tool to discriminate between spores and vegetative cells of bacteriaThompson, C.E. / Jungnickel, H. / Lockyer, N.P. / Stephens, G.M. / Vickerman, J.C. et al. | 2004
- 424
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Molecule-specific imaging analysis of carcinogens in breast cancer cells using time-of-flight secondary ion mass spectrometryQuong, J.N. / Knize, M.G. / Kulp, K.S. / Wu, K.J. et al. | 2004
- 428
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Quantitative imaging of atomic and molecular species in cancer cell cultures with TOF-SIMS and Laser-SNMSFartmann, M. / Kriegeskotte, C. / Dambach, S. / Wittig, A. / Sauerwein, W. / Arlinghaus, H.F. et al. | 2004
- 432
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Detection of protein immobilization on biosensor surfaces by TOF-SIMSAoyagi, Satoka / Oiw, Yuko / Kudo, Masahiro et al. | 2004
- 437
-
Application of TOF-SIMS to monitor coating processes on biological and organic surfacesChatterjee, Reema et al. | 2004
- 442
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Simultaneous determination of drug surface concentration and polymer degradation kinetics in biodegradable polymer/drug membranes: a model drug delivery systemLee, Joo-Woon / Gardella, Joseph A. Jr. et al. | 2004
- 447
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Rapid identification of phthalates in blood bags and food packaging using ToF-SIMSChen, Ching Yuan / Ghule, Anil Vithal / Chen, Wen Yin / Wang, Chiung Chi / Chiang, Yi Shin / Ling, Yong Chien et al. | 2004
- 452
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Imaging ToF-SIMS and synchrotron-based FT-IR microspectroscopic studies of prostate cancer cell linesGazi, E. / Lockyer, N.P. / Vickerman, J.C. / Gardner, P. / Dwyer, J. / Hart, C.A. / Brown, M.D. / Clarke, N.W. / Miyan, J. et al. | 2004
- 457
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Subcellular SIMS imaging of gadolinium isotopes in human glioblastoma cells treated with a gadolinium containing MRI agentSmith, Duane R. / Lorey, Daniel R. II / Chandra, Subhash et al. | 2004
- 462
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Subcellular SIMS imaging of isotopically labeled amino acids in cryogenically prepared cellsChandra, Subhash et al. | 2004
- 467
-
3D subcellular SIMS imaging in cryogenically prepared single cellsChandra, Subhash et al. | 2004
- 470
-
TOF-SIMS investigation of metallic material surface after culturing cellsAoyagi, Satoka / Hiromoto, Sachiko / Hanawa, Takao / Kudo, Masahiro et al. | 2004
- 475
-
Subcellular localization of aluminum and indium in the rat kidneyGalle, P. / Levi-Setti, R. / Lamperti, A. / Bourahla, K. / Escaig, F. et al. | 2004
- 479
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Ion microprobe imaging of -labeled mammalian chromosomesLevi-Setti, R. / Gavrilov, K.L. / Strissel, P.L. / Strick, R. et al. | 2004
- 485
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Specific Mg2+ binding at human and Indian muntjac chromosomal Giemsa bandsStrissel, P.L. / Strick, R. / Gavrilov, K.L. / Levi-Setti, R. et al. | 2004
- 490
-
Imaging of arsenic traces in human hair by nano-SIMS 50Audinot, J.-N. / Schneider, S. / Yegles, M. / Hallegot, P. / Wennig, R. / Migeon, H.-N. et al. | 2004
- 497
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Accumulation of chromium in root tissues of Eichhornia crassipes (Mart.) Solms. in Cachoeira river—BrazilMangabeira, P.A.O. / Labejof, L. / Lamperti, A. / de Almeida, A-A.F. / Oliveira, A.H. / Escaig, F. / Severo, M.I.G. / Silva, D.da C. / Saloes, M. / Mielke, M.S. et al. | 2004
- 502
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Influence of hydrocarbons on element detection in ion images by SIMS microscopyTakaya, Kenichi / Okabe, Motonori / Sawataishi, Masaru / Yoshida, Toshiko et al. | 2004
- 506
-
Laser-SNMS analysis of apatite formation in vitroDambach, S. / Fartmann, M. / Kriegeskotte, C. / Brüning, C. / Wiesmann, H.P. / Lipinsky, D. / Arlinghaus, H.F. et al. | 2004
- 510
-
Room temperature corrosion of museum glass: an investigation using low-energy SIMSFearn, Sarah / McPhail, David S. / Oakley, Victoria et al. | 2004
- 515
-
TOF-SIMS measurement for the complex particulate matter in urban air environmentTomiyasu, B. / Suzuki, K. / Gotoh, T. / Owari, M. / Nihei, Y. et al. | 2004
- 520
-
TOF-SIMS analysis of sea salt particles: imaging and depth profiling in the discovery of an unrecognized mechanism for pH bufferingGaspar, D.J. / Laskin, A. / Wang, W. / Hunt, S.W. / Finlayson-Pitts, B.J. et al. | 2004
- 524
-
ToF-SIMS analysis of atmospherically relevant sulphuric acid hydrate films and reactions thereofFletcher, J.S. / Vickerman, J.C. et al. | 2004
- 528
-
A comparative study on detection of organic surface modifiers on mineral grains by TOF-SIMS, VUV SALI TOF-SIMS and VUV SALI with laser desorptionDimov, S.S. / Chryssoulis, S.L. et al. | 2004
- 533
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ToF-SIMS as an alternative tool for the qualitative and quantitative analysis of polar herbicidesBotreau, Marc / Guignard, Cédric / Hoffmann, Lucien / Migeon, Henri-Noël et al. | 2004
- 538
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Application of a cryo-stage in the TOF-SIMS analysis of atmospheric aerosol surfacesNair, A.P. / Tyler, B.J. / Peterson, R.E. et al. | 2003
- 543
-
Challenges for the characterization and integration of high-k dielectricsWallace, Robert M. et al. | 2004
- 543
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Challenges for the characterization and integration of high-κ dielectricsWallace, Robert M. et al. | 2004
- 543
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Challenges for the characterization and integration of high-kappa dielectricsWallace, R. M. et al. | 2004
- 552
-
The influence of oxygen on the Hf signal intensity in the characterization of HfO2/Si stacksHuyghebaert, C. / Conard, T. / Vandervorst, W. et al. | 2004
- 556
-
Analysis of high-k HfO2 and HfSiO4 dielectric filmsNieveen, W. / Schueler, B.W. / Goodman, G. / Schnabel, P. / Moskito, J. / Mowat, I. / Chao, G. et al. | 2004
- 561
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Quantification of nitrogen profiles in HfSiON films for gate dielectricsYamamoto, T. / Miyamoto, T. / Karen, A. et al. | 2004
- 565
-
Sputter rate variations in silicon under high-k dielectric filmsBennett, J. / Beebe, M. / Sparks, C. / Gondran, C. / Vandervorst, W. et al. | 2004
- 569
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On the reliability of SIMS depth profiles through HfO2-stacksVandervorst, W. / Bennett, J. / Huyghebaert, C. / Conard, T. / Gondran, C. / De Witte, H. et al. | 2004
- 574
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ToF-SIMS profiling of HfO2/Si stacks: influence of sputtering condition of profile shapeConard, T. / Huyghebaert, C. / Vandervorst, W. et al. | 2004
- 581
-
Nitrogen analysis in high-k stack layers: a challengeConard, T. / Vandervorst, W. / De Witte, H. / Van Elshocht, S. et al. | 2004
- 585
-
ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxidesHoussiau, L. / Vitchev, R.G. / Conard, T. / Vandervorst, W. / Bender, H. et al. | 2004
- 590
-
SIMS study on N diffusion in hafnium oxynitrideGui, D. / Kang, Jinfeng / Yu, Hongyu / Lim, Hsiang Fang et al. | 2004
- 594
-
Backside-SIMS profiling of dopants in thin Hf silicate filmHongo, Chie / Takenaka, Miyuki / Kamimuta, Yuuichi / Suzuki, Masamichi / Koyama, Masato et al. | 2004
- 598
-
High resolution depth profiling of thin STO in high-k oxide materialEhrke, U. / Sears, A. / Alff, L. / Reisinger, D. et al. | 2004
- 603
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Depth profiling of ZrO2/SiO2/Si stacks—a TOF-SIMS and computer simulation studyIgnatova, V.A. / Conard, T. / Möller, W. / Vandervorst, W. / Gijbels, R. et al. | 2004
- 609
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Characterization of high-k dielectrics with ToF-SIMSFerrari, S. et al. | 2004
- 614
-
Depth profiles of boron and nitrogen in SiON films by backside SIMSSameshima, J. / Maeda, R. / Yamada, K. / Karen, A. / Yamada, S. et al. | 2004
- 618
-
Errors in near-surface and interfacial profiling of boron and arsenicVandervorst, W / Janssens, T / Brijs, B / Conard, T / Huyghebaert, C / Frühauf, J / Bergmaier, A / Dollinger, G / Buyuklimanli, T / VandenBerg, J.A et al. | 2004
- 632
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Arsenic shallow depth profiling: accurate quantification in SiO2/Si stackBarozzi, M. / Giubertoni, D. / Anderle, M. / Bersani, M. et al. | 2004
- 636
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Improved near surface characterization of shallow arsenic distribution by SIMS depth profilingBüyüklimanli, Temel H. / Marino, John W. / Novak, Steven W. et al. | 2004
- 640
-
Toward accurate in-depth profiling of As and P ultra-shallow implants by SIMSMerkulov, A. / de Chambost, E. / Schuhmacher, M. / Peres, P. et al. | 2004
- 645
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Ultra-shallow arsenic implant depth profiling using low-energy nitrogen beamsFearn, Sarah / Chater, Richard / McPhail, David et al. | 2004
- 649
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Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin testToujou, F. / Yoshikawa, S. / Homma, Y. / Takano, A. / Takenaka, H. / Tomita, M. / Li, Z. / Hasegawa, T. / Sasakawa, K. / Schuhmacher, M. et al. | 2004
- 653
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Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen floodingLiu, R. / Wee, A.T.S. et al. | 2004
- 658
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a-Si Capping SIMS for shallow dopant profilesMiwa, Shiro et al. | 2004
- 663
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Site-specific SIMS backside analysisGu, C. / Garcia, R. / Pivovarov, A. / Stevie, F. / Griffis, D. et al. | 2004
- 668
-
Backside and frontside depth profiling of B delta doping, at low energy, using new and previous magnetic SIMS instrumentsLaugier, F. / Hartmann, J.M. / Moriceau, H. / Holliger, P. / Truche, R. / Dupuy, J.C. et al. | 2004
- 673
-
Accurate depth profiling for ultra-shallow implants using backside-SIMSHongo, Chie / Tomita, Mitsuhiro / Takenaka, Miyuki et al. | 2004
- 678
-
Influence of surface orientation on the formation of sputtering-induced ripple topography in siliconFares, B. / Gautier, B. / Baboux, N. / Prudon, G. / Holliger, P. / Dupuy, J.C. et al. | 2004
- 684
-
O2+ versus Cs+ for high depth resolution depth profiling of III–V nitride-based semiconductor devicesKachan, M. / Hunter, J. / Kouzminov, D. / Pivovarov, A. / Gu, J. / Stevie, F. / Griffis, D. et al. | 2004
- 688
-
Effects of crystalline regrowth on dopant profiles in preamorphized siliconHopstaken, M.J.P. / Tamminga, Y. / Verheijen, M.A. / Duffy, R. / Venezia, V.C. / Heringa, A. et al. | 2004
- 693
-
Energy and angular dependence of the sputter yield and ionization yield of Ge bombarded by O2+Huyghebaert, C. / Conard, T. / Vandervorst, W. et al. | 2004
- 698
-
SIMS depth profiling of SiGe:C structures in test pattern areas using low energy cesium with a Cameca IMS WfJuhel, M. / Laugier, F. et al. | 2004
- 704
-
Matrix effects in SIMS depth profiles of SiGe relaxed buffer layersSánchez-Almazán, F. / Napolitani, E. / Carnera, A. / Drigo, A.V. / Isella, G. / von Känel, H. / Berti, M. et al. | 2004
- 708
-
Impact of the Ge concentration on the Ge-ionisation probability and the matrix sputter yield for a SiGe matrix under oxygen irradiationHuyghebaert, C. / Conard, T. / Brijs, B. / Vandervorst, W. et al. | 2004
- 713
-
Use of SIMS in SiGe process controlMaul, J.L. / Chou, Pei-Fen / Lu, Y.H. et al. | 2004
- 716
-
Quantifying residual and surface carbon using polyencapsulation SIMSBeebe, Meredith / Bennett, Joe / Barnett, Joel / Berlin, Alex / Yoshinaka, Tommy et al. | 2004
- 720
-
Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRFRostam-Khani, P. / Hopstaken, M.J.P. / Vullings, P. / Noij, G. / O’Halloran, O. / Claassen, W. et al. | 2004
- 725
-
Study on change in SIMS intensities near the interface between silicon-nitride film and silicon substrateHasegawa, Takahiro / Date, Tomotsugu / Karen, Akiya / Masuda, Atsushi et al. | 2004
- 729
-
Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using implant standardsSobers, Richard C. Jr. / Franzreb, Klaus / Williams, Peter et al. | 2004
- 734
-
Application of TXRF for ion implanter dose matching experimentsFrost, M.R. / French, M. / Harris, W. et al. | 2004
- 738
-
Secondary ion mass spectrometry characterization of indium-implanted silicon wafersBlackmer-Krasinski, C. / Morinville, W.R. et al. | 2004
- 743
-
Optimization of SIMS analyses performed in the MCsx+ mode by using an in situ deposition of CsWirtz, T. / Migeon, H.-N. et al. | 2004
- 749
-
Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and M2Cs2+ yieldsBrison, J. / Conard, T. / Vandervorst, W. / Houssiau, L. et al. | 2004
- 754
-
Cation Mass Spectrometer (CMS): recent developments for quantitative analyses of positive and negative secondary ionsPhilipp, P. / Wirtz, T. / Migeon, H.-N. / Scherrer, H. et al. | 2004
- 758
-
Hydrogen redistribution in CVD SiO2 during post-oxidation annealing investigated by SIMSKawashima, Yoshiya / Kawano, Hideo / Terashima, Koichi / Hamada, Koji / Aoyagi, Satoka / Kudo, Masahiro et al. | 2004
- 762
-
Sputtered depth scales of multi-layered samples with in situ laser interferometry: arsenic diffusion in Si/SiGe layersRonsheim, P.A. / Loesing, R. / Madan, A. et al. | 2004
- 768
-
Short-term and long-term RSF repeatability for CAMECA SC-Ultra SIMS measurementsBarozzi, M. / Giubertoni, D. / Anderle, M. / Bersani, M. et al. | 2004
- 772
-
Front- and back-end process characterization by SIMS to achieve electrically matched devicesBudri, Thanas / Kouzminov, Dimitry et al. | 2004
- 776
-
Effects of contamination on selective epitaxial growthMacDonald, Brian J. / Paton, Eric / Adem, Ercan / En, Bill et al. | 2004
- 781
-
Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrumentPivovarov, A. / Gu, C. / Stevie, F. / Griffis, D. et al. | 2004
- 786
-
Improved charge neutralization method for depth profiling of bulk insulators using O2+ primary beam on a magnetic sector SIMS instrumentPivovarov, A.L. / Stevie, F.A. / Griffis, D.P. et al. | 2004
- 791
-
SIMS study of Cu trapping and migration in low-k dielectric filmsLi, Yupu / Hunter, Jerry / Tate, Tom J. et al. | 2004
- 796
-
Optimization of SIMS analysis conditions for Na, S, P and N in Cu filmsLi, Yupu et al. | 2004
- 800
-
Deconvolution analysis of dopant depth profile of Si at AlGaAs/GaAs interface using Al composition profile as referenceKawashima, Yoshiya / Ide, Takashi / Aoyagi, Satoka / Kudo, Masahiro et al. | 2004
- 804
-
Copper–indium–gallium–diselenide/molybdenum layers analyzed by corrected SIMS depth profilesBilger, G. / Grabitz, P.O. / Strohm, A. et al. | 2004
- 808
-
Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysisReedy, R.C. et al. | 2004