Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperature (English)
- New search for: Markham, James R.
- New search for: Markham, James R.
- New search for: Kinsella, Karen
- New search for: Carangelo, Robert M.
- New search for: Brouillette, Carl R.
- New search for: Carangelo, Martin D.
- New search for: Best, Philip E.
- New search for: Solomon, Peter R.
In:
Review of scientific instruments
;
64
, 9
; 2515-2522
;
1993
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ISSN:
- Article (Journal) / Print
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Title:Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperature
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Contributors:
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Published in:Review of scientific instruments ; 64, 9 ; 2515-2522
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Publisher:
- New search for: AIP
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Place of publication:Melville, NY
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Publication date:1993
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 50.03 / 33.05 / 30.03
- Further information on Basic classification
- New search for: 770/3420
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Keywords:
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Classification:
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Source:
Table of contents – Volume 64, Issue 9
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2423
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Using a free‐standing thermistor array to measure VUV emission from a tokamak plasmaPaul, S. F. / Fonck, R. J. / MacAulay, A. K. et al. | 1993
- 2428
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Signal analysis of fluctuations in toroidal fusion plasmasBell, J. D. / Harris, J. H. / Dunlap, J. L. / Crocker, N. A. / Pare´, V. K. et al. | 1993
- 2434
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rf plasma source using a magnetic line‐cusp fieldYamauchi, Kazuo / Takahashi, Keiji / Yabe, Eiji et al. | 1993
- 2440
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A workstation based Langmuir probe system for low‐pressure dc plasmasSudit, Isaac D. / Woods, R. Claude et al. | 1993
- 2449
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The gas‐chromatographic analysis system in the JET active gas handling plantLa¨sser, R. / Grieveson, B. / Hemmerich, J. L. / Stagg, R. / Dowhyluk, T. / Torr, K. / Massey, R. / Chambers, P. et al. | 1993
- 2459
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Scintillator studies with MeV charged particle beamsTuszewski, M. / Zweben, S. J. et al. | 1993
- 2466
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Disktron acceleratorShoji, M. / Takahashi, K. / Hanamoto, K. / Tsuji, H. / Tsubakihara, M. / Nakabayashi, T. / Tsuchida, K. / Okada, N. / Nakano, H. / Furuta, K. et al. | 1993
- 2475
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Increasing the frequency stability of single‐frequency lasersJaffe, S. M. / Rochon, M. / Yen, W. M. et al. | 1993
- 2482
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Variable coupling rotational wand for on‐line laser beam samplingSellathamby, C. V. / Seguin, H. J. J. / Akitt, D. R. / Reshef, H. et al. | 1993
- 2488
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Truncated cone as a pseudoconjugator in a high‐power carbon dioxide laserNikumb, Suwas K. / Seguin, H. J. J. et al. | 1993
- 2493
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Nanosecond time‐resolved vacuum ultraviolet spectrometer for ion diode spectroscopyNash, T. / Noack, D. / Filuk, A. B. et al. | 1993
- 2496
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Femtosecond transient absorption microspectrophotometer combined with optical trapping techniqueTamai, N. / Asahi, T. / Masuhara, H. et al. | 1993
- 2504
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Implementation of a dual linear image sensor for measurements of transient absorption spectra in the picosecond time regimeNagamura, T. / Nakamura, N. / Ibuki, K. / Nakayama, T. / Hamanoue, K. et al. | 1993
- 2508
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Compact standalone data acquisition system for submicrosecond time‐resolved Fourier transform spectroscopyBerg, P. A. / Sloan, J. J. et al. | 1993
- 2515
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Bench top Fourier transform infrared based instrument for simultaneously measuring surface spectral emittance and temperatureMarkham, James R. / Kinsella, Karen / Carangelo, Robert M. / Brouillette, Carl R. / Carangelo, Martin D. / Best, Philip E. / Solomon, Peter R. et al. | 1993
- 2523
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Infrared‐optical transmission and reflection measurements on loose powdersKuhn, J. / Korder, S. / Arduini‐Schuster, M. C. / Caps, R. / Fricke, J. et al. | 1993
- 2531
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Phase‐locked detection of fluorescence lifetimeZhang, Zhiyi / Grattan, Kenneth T. V. / Palmer, Andrew W. et al. | 1993
- 2541
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Development of a battery‐operated portable synchronous luminescence spectrofluorometerAlarie, Jean Pierre / Vo‐Dinh, Tuan / Miller, Gordon / Ericson, M. Nance / Maddox, S. Randall / Watts, Wendi / Eastwood, DeLyle / Lidberg, Russ / Dominguez, Martha et al. | 1993
- 2547
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Dynamic light scattering with a CCD cameraWong, Apollo P. Y. / Wiltzius, P. et al. | 1993
- 2550
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Rejection of stochastic background noise in low‐level pulsed light scattering experimentsWang, Jyhpyng / Mazur, Eric et al. | 1993
- 2552
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High resolution in the soft x‐ray range from a toroidal grating monochromatorReich, T. / Hussain, Z. / Moler, E. / Blackwell, M. / Kaindl, G. / Shirley, D. A. / Howells, M. R. et al. | 1993
- 2558
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Doing double‐crystal diffraction experiments with a conventional four‐circle diffractometerChao, W. K. / Gao, E. Z. / Wong, H. K. et al. | 1993
- 2561
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Measurement of radii of curvature of slightly bent crystals using a one‐dimensional detectorGao, Dachao / Wilkins, Stephen W. / Stevenson, Andrew W. / Pogany, Andrew P. et al. | 1993
- 2566
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Radiation position‐sensitive detector based on plastic scintillating fibersIkhlef, A. / Skowronek, M. et al. | 1993
- 2570
-
Low-energy conversion electron Mössbauer spectroscopy using a chevron microchannel plate detectorSinor, T.W. et al. | 1993
- 2570
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Low‐energy conversion electron Mo¨ssbauer spectroscopy using a chevron microchannel plate detectorSinor, T. W. / Standifird, J. D. / Taylor, K. N. / Hong, C. / Carroll, J. J. / Collins, C. B. et al. | 1993
- 2570
-
Low-energy conversion electron Moessbauer spectroscopy using a chevron microchannel plate detectorSinor, T. W. / Standifird, J. D. / Taylor, K. N. / Hong, C. et al. | 1993
- 2574
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A linear magnetic field spectrometer for electron energy‐loss measurementsPage, S. C. / Mei, L. / Palfreyman, D. / Read, F. H. et al. | 1993
- 2579
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Combinations of point source electron beams and simple electrostatic lenses: Initial demonstrations of micron‐scale lensesShedd, G. M. / Schmid, H. / Unger, P. / Fink, H.‐W. / Dubner, A. D. et al. | 1993
- 2585
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Exact two‐dimensional quadrupole field and superposition of a homogeneous fieldWang, Y. / Wanczek, K.‐P. / Jiang, X. Q. / Hua, Z. Y. et al. | 1993
- 2591
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A multipurpose scanning probe microscopeSander, M. et al. | 1993
- 2595
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z calibration of the atomic force microscope by means of a pyramidal tipJensen, F. et al. | 1993
- 2598
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Whole electronic cantilever control for atomic force microscopyTakata, Keiji et al. | 1993
- 2601
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Scanning instrumentation for measuring magnetic field trapping in high Tc superconductorsSisk, R. C. / Helton, A. J. et al. | 1993
- 2604
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Novel method for determining the Curie temperature of ferroelectric filmsKwok, Chi Kong / Desu, Seshu B. et al. | 1993
- 2607
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Miniature diamond‐anvil cell for electrical transport measurements in high magnetic fieldsTozer, S. W. et al. | 1993
- 2612
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A sensitive interferometric accelerometerStephens, M. et al. | 1993
- 2615
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Time‐resolved temperature measurements during pulsed laser irradiation using thin film metal thermometersBrunco, D. P. / Kittl, J. A. / Otis, C. E. / Goodwin, P. M. / Thompson, Michael O. / Aziz, M. J. et al. | 1993
- 2615
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Time-resolved temperature measurements during pulsed laser irradiation using thin metal thermometersBrunco, D. P. / Kittl, J. A. / Otis, C. E. / Goodwin, P. M. et al. | 1993
- 2624
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Fabrication of Ge–Au film thermometers using interfacial atomic diffusionZhu, Da‐Ming / Lin, Fengqi et al. | 1993
- 2627
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Measurement of displacement current across single monolayers with thermal stimulationKubota, Tohru / Iwamoto, Mitsumasa et al. | 1993
- 2632
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Holographic pattern photobleaching apparatus for the measurement of lateral transport processes at interfaces—Design and performanceMiehlich, Rainer / Gaub, Herman E. et al. | 1993
- 2639
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New technique of measuring dendrite growth velocities in undercooled metallic meltsEckler, K. / Kratz, M. / Egry, I. et al. | 1993
- 2643
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Computer‐controlled float zone crystal growthChan, Y. T. / Mailloux, P. A. et al. | 1993
- 2650
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Formation and measurement of tapers in optical fibersBrophy, Timothy J. / Shankar, P. Mohana / Bobb, Lloyd C. et al. | 1993
- 2655
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A numerical procedure to determine near midgap level defect parameters in Schottky diodes with significant leakage current densitiesDmowski, K. / Losson, E. / Lepley, B. et al. | 1993
- 2661
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Collocated and simultaneous measurement of surface slope and amplitude of water wavesBarter, J. D. / Beach, K. L. / Lee, P. H. Y. et al. | 1993
- 2666
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A standing‐wave flow measurement system for small diameter pipes using long acoustic wavesIkpe, E. S. / Scarrott, G. / Weight, J. P. / Grattan, K. T. V. et al. | 1993
- 2673
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A particle bed heater for creating a clear, high‐temperature, high‐pressure gas flowBirk, Avi / McQuaid, Michael J. / Bliesener, Gary G. et al. | 1993
- 2676
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Automatic calibration of inductive voltage dividers for the NASA Zeno experimentAvramov, Svetlana / Oldham, Nile M. et al. | 1993
- 2679
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Long‐pulse analog integrationAli‐Arshad, S. / de Kock, L. et al. | 1993
- 2683
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New technique for the measurement of adsorbed moisture concentration on a solid surfaceOhmi, T. / Nakagawa, Y. / Aomi, H. / Takano, J. et al. | 1993
- 2687
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A compact micropositioner for use in ultrahigh vacuumCurtis, Robert / Pearson, Chris / Gaard, Peter / Ganz, Eric et al. | 1993
- 2691
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An intelligent radiological instrument for field samples and contamination measurementsDrndarevic, Vujo R. / Djuric, Danko J. et al. | 1993
- 2696
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A novel hollow cathode device for the detection of trace elements in coal ashCollett, W. L. / Mahajan, S. M. / Ventrice, C. A. et al. | 1993
- 2699
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Two scanning tunneling microscope devices for large samplesPicotto, G. B. / Desogus, S. / Barbato, G. et al. | 1993
- 2702
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High‐intensity low tube‐voltage x‐ray source for laboratory extended x‐ray absorption fine structure measurementsSakurai, Kenji / Sakurai, Hitoshi et al. | 1993
- 2704
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A technique for eliminating white phosphorus deposits in vapor phase epitaxy systemsWilt, D. M. / Hoffman, R. W. et al. | 1993
- 2706
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A femtosecond autocorrelator with internal calibrationOksanen, J. A. I. / Helenius, V. M. / Korppi‐Tommola, J. E. I. et al. | 1993
- 2708
-
New Instruments| 1993
- 2711
-
New Materials and Components| 1993
- 2715
-
CALENDAR UPDATE| 1993
- 2716
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CUMULATIVE AUTHOR INDEX| 1993