Reliability comparisons for plastic-encapsulated microcircuits (English)
- New search for: Baker, B.
- New search for: Baker, B.
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In:
IEEE transactions on reliability
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44
, 1
; 6-7
;
1995
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ISSN:
- Article (Journal) / Print
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Title:Reliability comparisons for plastic-encapsulated microcircuits
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Contributors:Baker, B. ( author ) / Martin, S.
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Published in:IEEE transactions on reliability ; 44, 1 ; 6-7
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Place of publication:New York, NY
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Publication date:1995
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 85.35 / 50.16
- Further information on Basic classification
- New search for: 770/4575/5670
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Keywords:
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Classification:
BKL: 85.35 Fertigung / 50.16 Technische Zuverlässigkeit, Instandhaltung Local classification TIB: 770/4575/5670 -
Source:
Table of contents – Volume 44, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Back to Basics| 1995
- 1
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Models, Models Everywhere| 1995
- 2
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Electrical overstress and electrostatic dischargeDiaz, C. et al. | 1995
- 6
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Reliability comparisons for plastic-encapsulated microcircuitsBaker, B. et al. | 1995
- 8
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Demonstrate reliability of plastic-encapsulated microciruits for missile applicationsTam, S. et al. | 1995
- 8
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Demonstrated reliability of plastic-encapsulated microcircuits for missile applicationsSun Man Tam et al. | 1995
- 8
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Demonstrate reliability of plastic-encapsulated microcircuits for missile applicationsTam, S. et al. | 1995
- 13
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1995 P. K. McElroy Award| 1995
- 14
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Assembly-level reliability: A methodology for effective manufacturing of IC packagesNguyen et al. | 1995
- 19
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Modeling & maximizing burn-in effectivenessChien, W. et al. | 1995
- 19
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Modeling and maximizing burn-in effectivenessChien, W.T.K. / Way Kuo et al. | 1995
- 25
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1995 Alan O. Plait Award| 1995
- 26
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Determining the duration of a demonstration life-test before all units failDoganaksoy, N. et al. | 1995
- 31
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Weibull accelerated life testing with unreported early failuresGlaser, R. et al. | 1995
- 37
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Fault-tree analysis: A knowledge-engineering approachGeymayr, J. et al. | 1995
- 45
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Publications Price List for 1995| 1995
- 46
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Reliability analysis of complex models using SURE boundsNicol, D. et al. | 1995
- 54
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A reliability model for real-time rule-based expert systemsChen, I. et al. | 1995
- 62
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Manuscripts Received| 1995
- 63
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Genetic-algorithm-based reliability optimization for computer network expansionKumar, A. et al. | 1995
- 73
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Dependent & multimode failures in reliability evaluation of extra-stage ... MINsTrahan, J. et al. | 1995
- 73
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Dependent and multimode failures in reliability evaluation of extra-stage shuffle-exchange MINsTrahan, J.L. / Wang, D.X. / Rai, S. et al. | 1995
- 87
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A combinatorial approach to modeling imperfect coverageDoyle, S. et al. | 1995
- 94
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The 'Fit'| 1995
- 95
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Comment on: "Component relevancy in multistate reliability models"Kuhnert, I. et al. | 1995
- 97
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Effect of testing techniques on software-reliability estimates ... Using a time-domain modelChen et al. | 1995
- 97
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Effect of testing techniques on software reliability estimates obtained using a time-domain modelChen, Mei-Hwa / Mathur, A.P. / Rego, V.J. et al. | 1995
- 104
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Mixture models for reliability of software with imperfect debugging: identifiability of parametersFakhre-Zakeri, I. / Slud, E. et al. | 1995
- 104
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Mixture models for reliability of software with imperfect debugging: Identifiability ofSlud, E. et al. | 1995
- 114
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Computation in faulty stars (hypercube networks)Bagherzadeh, N. / Dowd, M. et al. | 1995
- 114
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Computation in faulty starsBagherzadeh, N. et al. | 1995
- 120
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Survey of reliability studies of consecutive-k-out-of-n:F & related systemsChao, M. et al. | 1995
- 127
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Invitation to Membership in the Reliability Society| 1995
- 128
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An O(k3log(k-n)) algorithm for consecutive-k-out-of-n:F systemsHwang, F. et al. | 1995
- 131
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Tutorial Papers -- Physics & Chemistry of Failure| 1995
- 132
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An O(n(log2(n))2) for computing reliability of k-out-of-n:G & k-to-l-out-of-n:G systemsBelfore II, L. et al. | 1995
- 132
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An O(n.(log2(n))2) algorithm for computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systemsBelfore, L.A. II et al. | 1995
- 137
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Comment on: Reliability of k-out-of-n:G systems with imperfect coverageNewton, J. et al. | 1995
- 137
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Comment on: Reliability of k-out-of-n:G systems with imperfect fault-coverageNewton, J. et al. | 1995
- 138
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Human Reliability and Safety Analysis Data HandbookGertman et al. | 1995
- 138
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Human Reliability and Safety Analysis Data Handbook by Gertman & Blackman| 1995
- 139
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A new framework for part failure-rate prediction modelsWong, K. et al. | 1995
- 147
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Sensitivity and uncertainty analysis of Markov-reward modelsHaverkort, B.R. / Meeuwissen, A.M.H. et al. | 1995
- 147
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Sensitivity & uncertainty analysis of Markov-reward modelsHaverkort, B. et al. | 1995
- 154
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Opinion Items| 1995
- 155
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Time-varying failure rates in availability & reliability analysis of repairable systemsHassett et al. | 1995
- 155
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Time-varying failure rates in the availability and reliability analysis of repairable systemsHassett, T.F. / Dietrich, D.L. / Szidarovszky, F. et al. | 1995
- 161
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Referee list| 1995
- 161
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Past Editors| 1995
- 167
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Information for Readers & Authors| 1995
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EDITORIALSEvans, R.A. et al. | 1995