Trend change in mean residual life (English)
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In:
IEEE transactions on reliability
;
44
, 2
; 291-295
;
1995
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ISSN:
- Article (Journal) / Print
-
Title:Trend change in mean residual life
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Contributors:
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Published in:IEEE transactions on reliability ; 44, 2 ; 291-295
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Place of publication:New York, NY
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Publication date:1995
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 85.35 / 50.16
- Further information on Basic classification
- New search for: 770/4575/5670
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Keywords:
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Classification:
BKL: 85.35 Fertigung / 50.16 Technische Zuverlässigkeit, Instandhaltung Local classification TIB: 770/4575/5670 -
Source:
Table of contents – Volume 44, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 169
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EDITORIALSEvans, R.A. et al. | 1995
- 170
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Design for Reliability: Guest Editors' PrologueKuo, W. et al. | 1995
- 172
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Genetic algorithms in optimization of system reliabilityPainton, L. et al. | 1995
- 179
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A system approach to reliability and life-cycle cost of process safety-systemsBodsberg, L. et al. | 1995
- 187
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Statistical tools for the rapid development & evaluation of high-reliability productsMeeker Jr, W. et al. | 1995
- 187
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Statistical tools for the rapid development and evaluation of high-reliability productsMeeker, W.Q. / Hamada, M. et al. | 1995
- 199
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Unreplicated experimental designs in reliability-growth programsBenski, H. et al. | 1995
- 205
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Manuscripts Received| 1995
- 206
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Using statistically designed experiments to improve reliability and to achieve robust reliabilityHamada, M. et al. | 1995
- 216
-
Reliability & quality in designGolomski, W. et al. | 1995
- 216
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Reliability and quality in designGolomski, W.A. et al. | 1995
- 220
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From product-oriented development to technology-oriented developmentUeno, K. et al. | 1995
- 225
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Quality engineering (Taguchi methods) for the development of electronic-circuit technologyTaguchi, G. et al. | 1995
- 230
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Designing for high performance of a command, control, communication and information networkRupe, A. / Gavirneni, S. et al. | 1995
- 230
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Designing for high performance for a command, control, communication, informationRupe, J. et al. | 1995
- 237
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A combined fuzzy-logic and physics-of-failure approach to reliability predictionBazu, M. et al. | 1995
- 237
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A combined fuzzy-logic & physics-of-failure approach to reliability predictionBazu, M. et al. | 1995
- 242
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Tutorial Papers -- Physics & Chemistry of Failure| 1995
- 243
-
Optimal design of flexible and reliable process systemsThomaidis, T.V. / Pistikopoulos, E.N. et al. | 1995
- 243
-
Optimal design of flexible & reliable process systemsThomaidis, T. et al. | 1995
- 250
-
Invitation to Membership in the Reliability Society| 1995
- 251
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Logic systhesis for reliability: An early start to controlling electromigration & hot-carrier effectsRoy, K. / Prasad, S. et al. | 1995
- 251
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Logic synthesis for reliability: An early start to controlling electromigration & hot-carrier effectsRoy, K. et al. | 1995
- 251
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Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effectsRoy, K. / Prasad, S. et al. | 1995
- 255
-
Publications Price List for 1995| 1995
- 256
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Designing-in-quality through axiomatic designSuh, N. et al. | 1995
- 256
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Designing-in of quality through axiomatic designSuh, N.P. et al. | 1995
- 265
-
A changing paradigm in qualityOh, H. et al. | 1995
- 270
-
Special Section on EOS-ESD| 1995
- 271
-
Corrosion of metallic materialsTullmin, M. / Roberge, P.R. et al. | 1995
- 271
-
Tutorial: Corrosion of metallic materialsTullmin, M. et al. | 1995
- 279
-
Stochastic modeling of aggregates & products of variable failure ratesSingh, N. et al. | 1995
- 279
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Stochastic modeling of aggregates and products of variable failure ratesSingh, N. et al. | 1995
- 285
-
Characterization of some concepts of agingRojo, J. et al. | 1995
- 291
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Trend change in mean residual lifeLim, J. et al. | 1995
- 296
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1995 Alan O. Plait Award| 1995
- 297
-
Homogeneity tests for scale parameters of 2-parameter exponential populations under timeThiagarajah, R. et al. | 1995
- 297
-
Homogeneity tests for scale parameters of 2-parameter exponential populations under time censoringThiagarajah, K.R. et al. | 1995
- 302
-
Best linear unbiased estimator of the Rayleigh scale parameter, based on fairly large censored samplesAdatia, A. et al. | 1995
- 310
-
Mean time to finish a randomly disturbed 2-phase missionSchneeweiss, W. et al. | 1995
- 315
-
Reliability-estimation & stopping-rules for software testing, based on repeated appearancesYang, M. et al. | 1995
- 315
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Reliability-estimation and stopping-rules for software testing, based on repeated appearances of bugsYang, M.C.K. / Chao, A. et al. | 1995
- 322
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Estimating the number of errors in a system, using a Martingale approachYip, P. et al. | 1995
- 326
-
Opinion Items| 1995
- 327
-
Self-repairing processor modulesKilmer, W. et al. | 1995
- 332
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1995 P.K. McElroy Award| 1995
- 333
-
Reliability of a linear connected-(r,s)-out-of:(m,n):F lattice systemYamamoto, H. et al. | 1995
- 337
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Reliability analysis of accelerated life-test data from a repairable systemGuida, M. et al. | 1995
- 347
-
Vertex cutsets of undirected graphsPatvardhan, C. et al. | 1995
- 354
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State-space decomposition-methods for computing performance measurements of stochasticAlexopoulos, C. et al. | 1995
- 354
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A note on state-space decomposition methods for analyzing stochastic flow networksAlexopoulos, C. et al. | 1995
- 359
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Information for Readers & Authors| 1995