Simulation of isotope effects in the sputtering of 63Cu- 65)Cu (Unknown)
- New search for: Zheng, L.-P.
- New search for: Zheng, L.-P.
- New search for: Li, R.-S.
- New search for: Li, D.-X.
In:
Vacuum
;
46
, 3
; 277-280
;
1995
-
ISSN:
- Article (Journal) / Print
-
Title:Simulation of isotope effects in the sputtering of 63Cu- 65)Cu
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Contributors:
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Published in:Vacuum ; 46, 3 ; 277-280
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Publisher:
- New search for: Elsevier Science
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Place of publication:Kidlington
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Publication date:1995
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ISSN:
-
ZDBID:
-
Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 52.78 / 33.09 / 58.19
- Further information on Basic classification
- New search for: 275/3422
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Keywords:
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Classification:
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Source:
Table of contents – Volume 46, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 211
-
CVV Auger line shapes in FeS2Raikar, G.N. et al. | 1995
- 219
-
A reliable compact ultra-high vacuum scanning tunneling microscopeLyubinetsky, I.V. et al. | 1995
- 223
-
Electron temperature measurements in uhv systems by spectroscopic and Langmuir probe techniquesDesai, T.M. et al. | 1995
- 227
-
Effect of sample temperature on the irradiation effects of energetic particles in the YBCO systemDas, S.K. et al. | 1995
- 229
-
Computer simulation of film thickness distribution in symmetrical magnet magnetron sputteringFan, Q.-h. et al. | 1995
- 233
-
Deposition and properties of titanium nitride films produced by dc reactive magnetron sputteringMeng, L.-J. et al. | 1995
- 241
-
Surface morphology of films having columnar grainsBhattacharyya, D. et al. | 1995
- 247
-
The influence of surface topographic features on angular distribution of sputtered atomsZhenxia, W. et al. | 1995
- 251
-
Development of pressure-time dependence methods for the calibration of vacuum gauges: A reviewKuz'min, V.V. et al. | 1995
- 251
-
Development of pressure-time dependence methods for the calibration of vacuum gaugesKuz'min, V. V. et al. | 1995
- 265
-
Hydrogen profiling and the stoichiometry of an a-SiNx:H filmAvasthi, D.K. et al. | 1995
- 269
-
Investigation of multilayered Ge-Si structures with varying thicknessesKiselev, N.A. et al. | 1995
- 277
-
Simulation of isotope effects in the sputtering of 63Cu- 65)CuZheng, L.-P. et al. | 1995
- 281
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Small area X-ray photoelectron spectroscopy (SAXPS) analysis of microscopic contamination in semiconductor materials and processesMarks, M.R. et al. | 1995
- 287
-
Some recent advances in silicon microtechnology and their dependence on processing techniquesHurley, R.E. / Gamble, H.S. et al. | 1995
- 287
-
Some recent advances in silicon microtechnology and their dependence on processing techniqueHurley, R.E. et al. | 1995
- 295
-
Study on depth profiles or hydrogen in the surface region of metal by ERDAChanggeng, L. et al. | 1995
- 295
-
Study on depth profiles of hydrogen in the surface region of metal by ERDALiao, Changgeng / Wang, Yongqiang / Yang, Shengsheng / Jiang, Hui / Zheng, Zhihao et al. | 1995
- 299
-
Studies of atom beams produced by a saddle field source used for depositing diamond-like carbon films on glassVoevodin, A.A. et al. | 1995
- 305
-
On the ion energy transfer to the substrate during titanium deposition in a hollow cathode arc dischargeKersten, H. et al. | 1995
- 309
-
Determination of optical constants and band gaps of bilayered semiconductor filmsBhattacharyya, D. et al. | 1995
- 315
-
Electrical properties of thin gold films on (3-Mercaptopropyl) trimethoxysilane (MPS) treated glass substratesNewton, M.I. et al. | 1995
- 315
-
Electrical properties of thin gold films on (3-Mercatopropyl) trimethoxysilane (MPS) treated glass substratesNewton, M. I. / McHale, G. / Hooper, P. D. / Willis, M. R. et al. | 1995
- 319
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Absorption tail of polycrystalline semiconductor filmsMaity, A.B. et al. | 1995
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VACUUM DIARY| 1995