All opportunity-triggered replacement-policy for multiple-unit systems (English)
- New search for: Zheng, X.
- New search for: Zheng, X.
In:
IEEE transactions on reliability
;
44
, 4
; 648-652
;
1995
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ISSN:
- Article (Journal) / Print
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Title:All opportunity-triggered replacement-policy for multiple-unit systems
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Contributors:Zheng, X. ( author )
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Published in:IEEE transactions on reliability ; 44, 4 ; 648-652
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Place of publication:New York, NY
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Publication date:1995
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 85.35 / 50.16
- Further information on Basic classification
- New search for: 770/4575/5670
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Keywords:
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Classification:
BKL: 85.35 Fertigung / 50.16 Technische Zuverlässigkeit, Instandhaltung Local classification TIB: 770/4575/5670 -
Source:
Table of contents – Volume 44, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 537
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EDITORIALS: Models Models Everywhere -- And Not A one To Want Existence vs Level of AbstractionEvans, R.A. et al. | 1995
- 537
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EditorialsEvans, R.A. et al. | 1995
- 537
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Models Models Everywhere - And Not A One To Want Existence vs Level of AbstractionEvans, R. A. et al. | 1995
- 538
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1996 Symposium -- 21 + Tutorials (at no extra charge)| 1995
- 539
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Tutorial: Electrolytic method for metallic electromigration failure mechanismKrumbein, S. et al. | 1995
- 539
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Tutorial: Electrolytic models for metallic electromigration failure mechanismKrumbein, S. et al. | 1995
- 550
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Reliability problems of polysilicon-Al contacts due to grain-boundary enhanced thermoManku et al. | 1995
- 550
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Reliability problems of polysilicon/Al contacts due to grain-boundary enhanced thermomigration effectsManku, T. / Orchard-Webb, J.H. et al. | 1995
- 555
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Opinion Items| 1995
- 556
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Simulating IC reliability with emphasis on process-flaw related early failuresMoosa, M. et al. | 1995
- 561
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1995 Alan O. Plait Award| 1995
- 562
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Reliability prediction using nondestructive accelerated-degradation data: Case study onTang, L. et al. | 1995
- 567
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Mean time-to-first-failure of a repairable system with one cold spareSchneeweiss, W. et al. | 1995
- 567
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Mean time to first failure of repairable systems with one cold spareSchneeweiss, W.G. et al. | 1995
- 574
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The P. K. McElroy Award| 1995
- 575
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Improved task-allocation algorithms to maximize reliability of redundant distributed computingMurthy et al. | 1995
- 587
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Optimal configuration of redundant real-time systems in the face of correlated failureKrishna, C. et al. | 1995
- 595
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A recursive variance-reduction algorithm for estimating communication-network reliabilityCancela et al. | 1995
- 602
-
Whither US Military Standards, Specifications, and Handbooks| 1995
- 603
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Optimal algorithms for synthesis of reliable application-specific heterogeneous multiprocessorsDasgupta, A. / Karri, R. et al. | 1995
- 603
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Optimal algorithms for synthesis of reliable application-specific heterogenous multiprocessorsDasgupta et al. | 1995
- 613
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Manuscripts Received| 1995
- 614
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Component redundancy vs system redundancy in the hazard rate orderingBoland, P. et al. | 1995
- 620
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Comment on: reliability modeling and performance of variable link-capacity networksSchanzer, R. et al. | 1995
- 621
-
Tutorial Papers -- Physics & Chemistry of Failure| 1995
- 622
-
Unified approach to synchronous & asynchronous approximate agreement ... Hybrid faultsKieckhafer et al. | 1995
- 622
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Unified approach to synchronous and asynchronous approximate agreement in the presence of hybrid faultsKieckhafer, R.M. / Azadmanesh, M.H. et al. | 1995
- 632
-
Using multi-stage and stratified sampling for inferring fault-coverage probabilitiesConstantinescu, C. et al. | 1995
- 632
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Using multi-stage & stratified sampling for inferring fault-coverage probabilitiesConstantinescu, C. et al. | 1995
- 640
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Calculating exact top-event probabilities using Sp-PATRECHeger, A. et al. | 1995
- 640
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Calculating exact top-event probabilities using Sigma -PatrecHeger, A.S. / Bhat, J.K. / Stack, D.W. / Talbott, D.V. et al. | 1995
- 640
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Calculating exact top-event probabilities using cap pi-PATRECHeger, A. / Bhat, J. / Stack, D. / Talbott, D. et al. | 1995
- 644
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Free Proceedings| 1995
- 645
-
Optimum test-times for intermittent faultsChung, K. et al. | 1995
- 648
-
All opportunity-triggered replacement-policy for multiple-unit systemsZheng, X. et al. | 1995
- 653
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Using system reliability to determine supportability turnaround time at a repair depotLinton, D.G. / Khajenoori, S. / Hebert, G. / Bullington, J.V. et al. | 1995
- 653
-
Using system reliability to determine supportability turn-around timeLinton et al. | 1995
- 657
-
Publications Price List for 1996| 1995
- 658
-
Use of failure-intensity models in the software-validation phase for telecommunicationsDerriennic, H. et al. | 1995
- 658
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Use of failure-intensity models in tire software-validation phase for telecommunicationsDerrienic, D. / Le Gall, G. et al. | 1995
- 666
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Fault severity in models of fault-correction activityLanning, D. et al. | 1995
- 672
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An empirical model of enhancement-induced defect activity in softwareLanning, D. et al. | 1995
- 677
-
The impact of software enhancement on software reliabilityLanning, D. et al. | 1995
- 682
-
Invitation to Membership in the Reliability Society| 1995
- 683
-
Multistate reliability measuresXue, J. et al. | 1995
- 689
-
Symmetric relations in multistate systemsXue, J. et al. | 1995
- 694
-
Numerical methods for reliability evaluation of Markov closed fault-tolerant systemsLindemann et al. | 1995
- 705
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About the domination of k-out-of-n systemsBehr, A. et al. | 1995
- 705
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Domination of k-out-of-n systemsBehr, A. / Camarinopoulos, L. / Pampoukis, G. et al. | 1995
- 709
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Information for Readers & Authors| 1995
- 711
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1995 ANNUAL INDEX| 1995