Preparation and properties of ZnO layers grown by various methods (English)
- New search for: Vincze, A.
- New search for: Vincze, A.
- New search for: Kováč, J.
- New search for: Novotný, I.
- New search for: Bruncko, J.
- New search for: Haško, D.
- New search for: Šatka, A.
- New search for: Shtereva, K.
In:
Applied surface science
;
255
, 4
; 1419-1422
;
2009
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ISSN:
- Article (Journal) / Print
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Title:Preparation and properties of ZnO layers grown by various methods
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Contributors:Vincze, A. ( author ) / Kováč, J. / Novotný, I. / Bruncko, J. / Haško, D. / Šatka, A. / Shtereva, K.
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Published in:Applied surface science ; 255, 4 ; 1419-1422
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2009
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 52.78 / 35.18 / 33.68
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- New search for: 535/3485
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Keywords:
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Source:
Table of contents – Volume 255, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 803
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PrefaceKudo, Masahiro / Oiwa, Retsu / Yurimoto, Hisayashi et al. | 2008
- 805
-
Semiconductor profiling with sub-nm resolution: Challenges and solutionsVandervorst, W. et al. | 2008
- 813
-
Predicting secondary ion formation in molecular dynamics simulations of sputteringWeidtmann, B. / Duvenbeck, A. / Wucher, A. et al. | 2008
- 816
-
Fundamental studies of molecular depth profiling and 3D imaging using Langmuir–Blodgett films as a modelZheng, Leiliang / Wucher, Andreas / Winograd, Nicholas et al. | 2008
- 819
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C60 sputtering of organics: A study using TOF-SIMS, XPS and nanoindentationFisher, Gregory L. / Dickinson, Michelle / Bryan, Scott R. / Moulder, John et al. | 2008
- 824
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Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometryWehbe, Nimer / Delcorte, Arnaud / Heile, Andreas / Arlinghaus, Heinrich F. / Bertrand, Patrick et al. | 2008
- 828
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Trench formation and lateral damage induced by gallium milling of siliconRusso, Michael F. Jr. / Maazouz, Mostafa / Giannuzzi, Lucille A. / Chandler, Clive / Utlaut, M. / Garrison, Barbara J. et al. | 2008
- 831
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Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionizationWillingham, D. / Kucher, A. / Winograd, N. et al. | 2008
- 834
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State selective detection of sputtered Al neutrals by resonant laser ionization SNMSHayashi, S. / Kubota, N. et al. | 2008
- 837
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Simulations of C60 bombardment of Si, SiC, diamond and graphiteKrantzman, Kristin D. / Webb, Roger P. / Garrison, Barbara J. et al. | 2008
- 841
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Molecular dynamics simulations of sputtering of organic overlayers by slow, large clustersRzeznik, L. / Czerwinski, B. / Garrison, B.J. / Winograd, N. / Postawa, Z. et al. | 2008
- 844
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Angle of incidence effects in a molecular solidRyan, Kathleen E. / Smiley, Edward J. / Winograd, Nicholas / Garrison, Barbara J. et al. | 2008
- 847
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Dynamic SIMS ion microscopy imaging of individual bacterial cells for studies of isotopically labeled moleculesChandra, Subhash / Pumphrey, Graham / Abraham, Joshua M. / Madsen, Eugene L. et al. | 2008
- 852
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G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptidesGreen, F.M. / Gilmore, I.S. / Seah, M.P. et al. | 2008
- 856
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Fragment distribution of thermal decomposition for PS and PET with QMD calculations by considering the excited and charged model moleculesEndo, Kazunaka / Masumoto, Chie / Matsumoto, Daisuke / Ida, Tomonori / Mizuno, Motohiro / Kato, Nobuhiko et al. | 2008
- 860
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SIMS depth profile analysis of sodium in silicon dioxideYamamoto, Y. / Shimodaira, N. et al. | 2008
- 863
-
Assessment of the Nd/U ratio for the quantification of neodymium in UO2Desgranges, L. / Pasquet, B. / Roure, I. / Portier, S. / Brémier, S. / C.T.Walker / Hasnaoui, R. / Gavillet, D. / Martin, M. / Raimbault, L. et al. | 2008
- 866
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The Storing Matter technique: Preliminary results on PS and PVCPhilipp, P. / Douhard, B. / Lacour, F. / Wirtz, T. / Houssiau, L. / Pireaux, J.-J. / Migeon, H.-N. et al. | 2008
- 870
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Angular distribution of sputtered matter under Cs+ bombardment with oblique incidenceVerdeil, C. / Wirtz, T. / Migeon, H.-N. / Scherrer, H. et al. | 2008
- 874
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Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on goldTuccitto, N. / Torrisi, V. / Delfanti, I. / Licciardello, A. et al. | 2008
- 877
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Critical distance for secondary ion formation: Experimental SIMS measurementsKudriavtsev, Y. / Gallardo, S. / Villegas, A. / Ramirez, G. / Asomoza, R. et al. | 2008
- 880
-
Secondary ion emission from Si bombarded with large Ar cluster ions under UHV conditionsNinomiya, Satoshi / Ichiki, Kazuya / Nakata, Yoshihiko / Honda, Yoshiro / Seki, Toshio / Aoki, Takaaki / Matsuo, Jiro et al. | 2008
- 883
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Desorption of cluster ions from adsorbed methane under cryogenic condition by low-energy ion irradiationNarita, Ayumi / Honda, Mitsunori / Hirao, Norie / Baba, Yuji / Yaita, Tsuyoshi et al. | 2008
- 886
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Controlling energy deposition during the C60+ bombardment of silicon: The effect of incident angle geometryKozole, Joseph / Winograd, Nicholas et al. | 2008
- 890
-
Substrate effects on the analysis of biomolecular layers using Au+, Au3+ and C60+ bombardmentsKordys, Jeanette / Fletcher, John S. / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 893
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Friction model to describe cluster bombardmentRyan, Kathleen E. / Russo, Michael F. Jr. / Smiley, Edward J. / Postawa, Zbigniew / Garrison, Barbara J. et al. | 2008
- 897
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Combined simulations and analytical model for predicting trends in cluster bombardmentRusso, Michael F. Jr. / Ryan, Kathleen E. / Czerwinski, Bartlomiej / Smiley, Edward J. / Postawa, Zbigniew / Garrison, Barbara J. et al. | 2008
- 901
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Resonance enhanced multi-photon ionization of neutral atoms sputtered with Ga-FIBKoizumi, M. / Sakamoto, T. et al. | 2008
- 905
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Quantum molecular dynamics simulation for fragmentation of arginine molecule induced by ion impactKato, Nobuhiko / Kudo, Masahiro et al. | 2008
- 908
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Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7x7 surfaceSakuma, Y. / Kato, M. / Shinde, N. / Yagi, S. / Soda, K. et al. | 2008
- 908
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Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7×7 surfaceSakuma, Y. / Kato, M. / Shinde, N. / Yagi, S. / Soda, K. et al. | 2008
- 912
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Investigation of molecular weight effects of polystyrene in ToF-SIMS using C60+ and Au+ primary ion beamsPiwowar, Alan M. / Lockyer, Nicholas / Vickerman, John C. et al. | 2008
- 916
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Cluster SIMS using metal cluster complex ionsFujiwara, Yukio / Kondou, Kouji / Teranishi, Yoshikazu / Watanabe, Kouji / Nonaka, Hidehiko / Saito, Naoaki / Itoh, Hiroshi / Fujimoto, Toshiyuki / Kurokawa, Akira / Ichimura, Shingo et al. | 2008
- 922
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TOF-SIMS investigation of Streptomyces coelicolor, a mycelial bacteriumVaidyanathan, Seetharaman / Fletcher, John S. / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 926
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Depth profiling of cells and tissues by using C60+ and SF5+ as sputter ionsMalmberg, Per / Kriegeskotte, Christian / Arlinghaus, Heinrich F. / Hagenhoff, Birgit / Holmgren, Jan / Nilsson, Mikael / Nygren, Håkan et al. | 2008
- 929
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Imaging macrophages in trehalose with SIMSParry, S.A. / Kurczy, M.E. / Fan, X. / Halleck, M.S. / Schlegel, R.A. / Winograd, N. et al. | 2008
- 934
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Artifacts in the sputtering of inorganics by C60n+Lee, J.L.S. / Seah, M.P. / Gilmore, I.S. et al. | 2008
- 938
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Analysis of TOF-SIMS spectra from fullerene compoundsKato, N. / Yamashita, Y. / Iida, S. / Sanada, N. / Kudo, M. et al. | 2008
- 941
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Metal-assisted SIMS and cluster ion bombardment for ion yield enhancementHeile, A. / Lipinsky, D. / Wehbe, N. / Delcorte, A. / Bertrand, P. / Felten, A. / Houssiau, L. / Pireaux, J.-J. / De Mondt, R. / Van Vaeck, L. et al. | 2008
- 944
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MD simulation study of the sputtering process by high-energy gas cluster impactAoki, Takaaki / Seki, Toshio / Ninomiya, Satoshi / Matsuo, Jiro et al. | 2008
- 948
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Extremely low-energy projectiles for SIMS using size-selected gas cluster ionsMoritani, Kousuke / Hashinokuchi, Michihiro / Nakagawa, Jun / Kashiwagi, Takahiro / Toyoda, Noriaki / Mochiji, Kozo et al. | 2008
- 951
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The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beamMiyayama, Takuya / Sanada, Noriaki / Iida, Shin-ichi / Hammond, John S. / Suzuki, Mineharu et al. | 2008
- 954
-
On the road to high-resolution 3D molecular imagingDelcorte, Arnaud et al. | 2008
- 959
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Molecular depth profiling of trehalose using a C60 cluster ion beamWucher, Andreas / Cheng, Juan / Winograd, Nicholas et al. | 2008
- 962
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C60 ion sputtering of layered organic materialsShard, Alexander G. / Green, Felicia M. / Gilmore, Ian S. et al. | 2008
- 966
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Depth profiling of organic materials using improved ion beam conditionsCramer, H.-G. / Grehl, T. / Kollmer, F. / Moellers, R. / Niehuis, E. / Rading, D. et al. | 2008
- 970
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Molecular depth profiling of polymers with very low energy ionsHoussiau, L. / Douhard, B. / Mine, N. et al. | 2008
- 973
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MCsn+ cluster formation on organic surfaces: A novel way to depth-profile organics?Mine, N. / Douhard, B. / Houssiau, L. et al. | 2008
- 977
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ToF-SIMS study of growth behavior in all-nanoparticle multilayer films using a novel indicator layerChen, Bo-Jung / Yin, Yu-Sheng / Ling, Yong-Chien et al. | 2008
- 981
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ToF-SIMS study of chemical composition and formation of all-nanoparticle multilayer filmsChen, Bo-Jung / Yin, Yu-Sheng / Ling, Yong-Chien et al. | 2008
- 984
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Three-dimensional molecular imaging using mass spectrometry and atomic force microscopyWucher, Andreas / Cheng, Juan / Zheng, Leiliang / Willingham, David / Winograd, Nicholas et al. | 2008
- 987
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Analysis of surface and bulk polymerization of a thin film using a chemical derivatization technique and TOF-SIMSMaekawa, Toshihiko / Senga, Takeshi et al. | 2008
- 992
-
Towards quantitative chemical imaging with ToF-SIMSWagner, Matthew S. et al. | 2008
- 997
-
TOF-SIMS analysis of polystyrene/polybutadiene blend using chemical derivatization and multivariate analysisKono, Teiichiro / Iwase, Eijiro / Kanamori, Yukiko et al. | 2008
- 1001
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Lamellar orientation on the surface of a polymer determined by ToF-SIMS and AFMLau, Yiu-Ting R. / Weng, Lu-Tao / Ng, Kai-Mo / Chan, Chi-Ming et al. | 2008
- 1006
-
Nano- and microstructured polymer LB layers: A combined AFM/SIMS studyTorrisi, V. / Tuccitto, N. / Delfanti, I. / Audinot, J.N. / Zhavnerko, G. / Migeon, H.-N. / Licciardello, A. et al. | 2008
- 1011
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Photocatalytic decomposition of methylene blue and 4-chlorophenol on nanocrystalline TiO2 films under UV illumination: A ToF-SIMS studyOrendorz, Adam / Ziegler, Christiane / Gnaser, Hubert et al. | 2008
- 1015
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Comparison of secondary ion intensity enhancement from polymers on silicon and silver substrates by using Au-TOF-SIMSKudo, M. / Aimoto, K. / Sunagawa, Y. / Kato, N. / Aoyagi, S. / Iida, S. / Sanada, N. et al. | 2008
- 1018
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Influences of water on photoresist surface in immersion lithography technologySado, M. / Teratani, T. / Fujii, H. / Iikawa, R. / Iida, H. et al. | 2008
- 1022
-
Mapping of the cationic starch adsorbed on pulp fibers by ToF-SIMSMatsushita, Yasuyuki / Suzuki, Ayumi / Sekiguchi, Takuya / Saito, Kaori / Imai, Takanori / Fukushima, Kazuhiko et al. | 2008
- 1025
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ToF-SIMS study on the cleaning methods of Au surface and their effects on the reproducibility of self-assembled monolayersMin, Hyegeun / Park, Ji-Won / Shon, Hyun Kyong / Moon, Dae Won / Lee, Tae Geol et al. | 2008
- 1029
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Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)—Discussion of static limitGhonaim, N.W. / Nieradko, M. / Xi, L. / Nie, H.-Y. / Francis, J.T. / Grizzi, O. / Yeung, K.K.C. / Lau, Leo W.M. et al. | 2008
- 1033
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Investigation of natural dyes and ancient textiles from korea using TOF-SIMSLee, Yeonhee / Lee, Jihye / Kim, Youngsoo / Choi, Seokchan / Ham, Seung Wook / Kim, Kang-Jin et al. | 2008
- 1037
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Quantitative analysis of mixed self-assembled monolayers using ToF-SIMSMin, Hyegeun / Jung, Ganghyuk / Moon, Dae Won / Choi, Insung S. / Lee, Tae Geol et al. | 2008
- 1040
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Simulation of SIMS for monomer and dimer of lignin under the assumption of thermal decomposition using QMD methodKato, Kenichi / Endo, Kazunaka / Matsumoto, Daisuke / Ida, Tomonori / Saito, Kaori / Fukushima, Kazuhiko / Kato, Nobuhiko et al. | 2008
- 1044
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Quantitative analysis of organic additive content in a polymer by ToF-SIMS with PCAIto, Hidemi / Kono, Teiichiro et al. | 2008
- 1048
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Fragment distribution of thermal decomposition for lignin monomer by QMD calculations using the excited and charged model moleculesEndo, Kazunaka / Matsumoto, Daisuke / Kato, Kenichi / Takagi, Yusuke / Ida, Tomonori / Mizuno, Motohiro / Saito, Kaori / Fukushima, Kazuhiko / Kato, Nobuhiko et al. | 2008
- 1052
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Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometryMorita, Yoshihiro / Owari, Masanori et al. | 2008
- 1055
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The effect of C60 cluster ion beam bombardment in sputter depth profiling of organic–inorganic hybrid multiple thin filmsShon, Hyun Kyong / Lee, Tae Geol / Kim, Dahl Hyun / Kang, Hee Jae / Lee, Byoung Hoon / Sung, Myung Mo / Moon, Dae Won et al. | 2008
- 1058
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Possibilities and limitations of high-resolution mass spectrometry in life sciencesArlinghaus, Heinrich F. et al. | 2008
- 1064
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Gold nanoparticle-enhanced secondary ion mass spectrometry and its bio-applicationsKim, Young-Pil / Oh, Eunkeu / Shon, Hyun Kyong / Moon, Dae Won / Lee, Tae Geol / Kim, Hak-Sung et al. | 2008
- 1068
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The effect of incident angle on the C60+ bombardment of molecular solidsKozole, Joseph / Willingham, David / Winograd, Nicholas et al. | 2008
- 1071
-
TOF-SIMS structural characterization of self-assembly monolayer of cytochrome b5 onto gold substrateAoyagi, Satoka / Rouleau, Alain / Boireau, Wilfrid et al. | 2008
- 1075
-
ToF-SIMS investigation of FIB-patterning of lactoferrin by using self-assembled monolayers of iron complexesTuccitto, N. / Giamblanco, N. / Marletta, G. / Licciardello, A. et al. | 2008
- 1079
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Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopyNie, H.-Y. / Francis, J.T. / Taylor, A.R. / Walzak, M.J. / Chang, W.H. / MacFabe, D.F. / Lau, W.M. et al. | 2008
- 1084
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ToF-SIMS PC-DFA analysis of prostate cancer cell linesBaker, M.J. / Gazi, E. / Brown, M.D. / Clarke, N.W. / Vickerman, J.C. / Lockyer, N.P. et al. | 2008
- 1088
-
Chemical differences between sapwood and heartwood of Chamaecyparis obtusa detected by ToF-SIMSSaito, K. / Mitsutani, T. / Imai, T. / Matsushita, Y. / Yamamoto, A. / Fukushima, K. et al. | 2008
- 1092
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TOF-SIMS analysis of the interface between bone and titanium implants—Effect of porosity and magnesium coatingNygren, Håkan / Eriksson, Cecilia / Hederstierna, Karin / Malmberg, Per et al. | 2008
- 1096
-
Evaluation of oriented lysozyme immobilized with monoclonal antibodyAoyagi, Satoka / Okada, Keigo / Shigyo, Ayako / Man, Naoki / Karen, Akiya et al. | 2008
- 1100
-
TOF-SIMS analysis of magnetic materials in chum salmon headYano, Akira / Aoyagi, Satoka et al. | 2008
- 1104
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Evaluation of immobilized-lysozyme by means of TOF-SIMSOkada, Keigo / Aoyagi, Satoka / Dohi, Makoto / Kato, Nobuhiko / Kudo, Masahiro / Tozu, Miyako / Miyayama, Takuya / Sanada, Noriaki et al. | 2008
- 1107
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Marker experiments to determine diffusing species and diffusion path in medical Nitinol alloysLutz, J. / Lindner, J.K.N. / Mändl, S. et al. | 2008
- 1110
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Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regressionKim, Young-Pil / Hong, Mi-Young / Shon, Hyun Kyong / Chegal, Won / Cho, Hyun Mo / Moon, Dae Won / Kim, Hak-Sung / Lee, Tae Geol et al. | 2008
- 1113
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A new approach for preventing charging up of soft material samples by coating with conducting polymers in SIMS analysisMise, Takaya / Ishikawa, Makishi / Nishimoto, Kensaku / Meguro, Takashi et al. | 2008
- 1116
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Investigation of the cosmetic ingredient distribution in the stratum corneum using NanoSIMS imagingTanji, N. / Okamoto, M. / Katayama, Y. / Hosokawa, M. / Takahata, N. / Sano, Y. et al. | 2008
- 1119
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Differentiation between human normal colon mucosa and colon cancer tissue using ToF-SIMS imaging technique and principal component analysisPark, Ji-Won / Shon, Hyun Kyong / Yoo, Byong Chul / Kim, In Hoo / Moon, Dae Won / Lee, Tae Geol et al. | 2008
- 1123
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Behcet brain tissue identified with increased levels of Si and AlAranyosiova, Monika / Kopani, Martin / Rychly, Boris / Jakubovsky, Jan / Velic, Dusan et al. | 2008
- 1126
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ToF-SIMS cluster ion imaging of hippocampal CA1 pyramidal rat neuronsFrancis, J.T. / Nie, H.-Y. / Taylor, A.R. / Walzak, M.J. / Chang, W.H. / MacFabe, D.F. / Lau, W.M. et al. | 2008
- 1131
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Molecular imaging of enhanced Na+ expression in the liver of total sleep deprived rats by TOF-SIMSChang, Hung-Ming / Chen, Bo-Jung / Wu, Un-In / Huang, Yi-Lun / Mai, Fu-Der et al. | 2008
- 1135
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Up-regulation of Na+ expression in the area postrema of total sleep deprived rats by TOF-SIMS analysisMai, Fu-Der / Chen, Bo-Jung / Ling, Yong-Chien / Wu, Un-In / Huang, Yi-Lun / Chang, Hung-Ming et al. | 2008
- 1139
-
Interaction between diesel exhaust particles and cellular oxidative stressSuzuki, K. / Komatsu, T. / Kubo-Irie, M. / Tabata, M. / Takeda, K. / Nihei, Y. et al. | 2008
- 1143
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Application of ToF-SIMS to the study on heartwood formation in Cryptomeria japonica treesKuroda, Katsushi / Imai, Takanori / Saito, Kaori / Kato, Toshiyuki / Fukushima, Kazuhiko et al. | 2008
- 1148
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High sputtering yields of organic compounds by large gas cluster ionsIchiki, K. / Ninomiya, S. / Nakata, Y. / Honda, Y. / Seki, T. / Aoki, T. / Matsuo, J. et al. | 2008
- 1151
-
Cesium pre-implantation of embedded biological sectionsGalle, Pierre / Levi-Setti, Riccardo / Labejof, Lise / Kaïtasov, Odile et al. | 2008
- 1154
-
Accumulations of Ca/P in the core of hairs from Taklamakan desert mummiesHallégot, P. / Walter, P. / Cotte, M. / Audinot, J.-N. / Guillot, J. / Migeon, H.-N. / Tallarek, E. / Hagenhoff, B. et al. | 2008
- 1158
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Relative quantification of cellular sections with molecular depth profiling ToF-SIMS imagingKurczy, M.E. / Kozole, Joseph / Parry, S.A. / Piehowski, P.D. / Winograd, Nicholas / Ewing, A.G. et al. | 2008
- 1162
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Protein fragment imaging using ink jet printing digestion techniqueKomatsu, Manabu / Murayama, Yohei / Hashimoto, Hiroyuki et al. | 2008
- 1165
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ToF-SIMS and SEM-EDS analysis of the surface of chosen bioindicatorsSzynkowska, M.I. / Pawlaczyk, A. / Rogowski, J. et al. | 2008
- 1170
-
Quantitative ToF-SIMS studies of protein drug release from biodegradable polymer drug delivery membranesBurns, Sarah A. / Gardella, Joseph A. Jr. et al. | 2008
- 1174
-
Introduction of ice protective film for 3D microscale analysis of biological sampleIwanami, T. / Kinoshita, K. / Nojima, M. / Owari, M. et al. | 2008
- 1177
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TOF-SIMS analysis of adipose tissue from patients with chronic kidney diseaseSjövall, Peter / Johansson, Björn / Belazi, Dalila / Stenvinkel, Peter / Lindholm, Bengt / Lausmaa, Jukka / Schalling, Martin et al. | 2008
- 1181
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SIMS imaging of gadolinium isotopes in tissue from Nephrogenic Systemic Fibrosis patients: Release of free Gd from magnetic resonance imaging (MRI) contrast agentsAbraham, Jerrold L. / Chandra, Subhash / Thakral, Charu / Abraham, Joshua M. et al. | 2008
- 1185
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Visualisation of thyroid hormone synthesis by ion imagingAudinot, J.N. / Senou, M. / Migeon, H.-N. / Many, M.-C. et al. | 2008
- 1190
-
Investigating lipid–lipid and lipid–protein interactions in model membranes by ToF-SIMSZheng, L. / McQuaw, C.M. / Baker, M.J. / Lockyer, N.P. / Vickerman, J.C. / Ewing, A.G. / Winograd, N. et al. | 2008
- 1193
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Discussions on fundamentals and bio-imaging chair: Professor Peter Williams and Professor John C. VickermanMurase, Atsushi et al. | 2008
- 1194
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Formation of atomic secondary ions in sputteringWucher, A. et al. | 2008
- 1201
-
Oxygen O18 method and the search for the ionization mechanism in sputtering of oxygenated surfacesLorincik, Jan / Sroubek, Zdenek et al. | 2008
- 1206
-
The fate of the (reactive) primary ion: Sputtering and desorptionVandervorst, W. / Janssens, T. / Huyghebaert, C. / Berghmans, B. et al. | 2008
- 1215
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General discussion| 2008
- 1217
-
Energy dependence of projectiles on ion formation in electrospray droplet impact SIMSAsakawa, Daiki / Mori, Kunihiko / Hiraoka, Kenzo et al. | 2008
- 1223
-
What do we want from computer simulation of SIMS using clusters?Webb, R.P. et al. | 2008
- 1229
-
Sputtering of organic molecules by clusters, with focus on fullerenesDelcorte, A. / Wehbe, N. / Bertrand, P. / Garrison, B.J. et al. | 2008
- 1235
-
What size of cluster is most appropriate for SIMS?Matsuo, Jiro / Ninomiya, Satoshi / Nakata, Yoshihiko / Honda, Yoshiro / Ichiki, Kazuya / Seki, Toshio / Aoki, Takaaki et al. | 2008
- 1241
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Biochemical imaging of tissues by SIMS for biomedical applicationsLee, Tae Geol / Park, Ji-Won / Shon, Hyun Kyong / Moon, Dae Won / Choi, Won Woo / Li, Kapsok / Chung, Jin Ho et al. | 2008
- 1249
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The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysisBreitenstein, D. / Rommel, C.E. / Stolwijk, J. / Wegener, J. / Hagenhoff, B. et al. | 2008
- 1257
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Construction of a novel stigmatic MALDI imaging mass spectrometerHazama, Hisanao / Aoki, Jun / Nagao, Hirofumi / Suzuki, Ren / Tashima, Toshio / Fujii, Ken-ichi / Masuda, Katsuyoshi / Awazu, Kunio / Toyoda, Michisato / Naito, Yasuhide et al. | 2008
- 1264
-
Uncovering new challenges in bio-analysis with ToF-SIMSFletcher, John S. / Henderson, Alex / Biddulph, Gregory X. / Vaidyanathan, Seetharaman / Lockyer, Nicholas P. / Vickerman, John C. et al. | 2008
- 1273
-
Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolutionChandra, Subhash et al. | 2008
- 1285
-
The cytochemistry of anaplastic thyroid tumour cells and differentiated thyrocytes analyzed by TOF-SIMS and depth profilingNygren, Håkan / Malmberg, Per / Nilsson, Mikael / Kriegeskotte, Christian / Arlinghaus, Heinrich F. et al. | 2008
- 1289
-
Quality of surface: The influence of sample preparation on MS-based biomolecular tissue imaging with MALDI-MS and (ME-)SIMSHeeren, Ron M.A. / Kükrer-Kaletaş, Başak / Taban, Ioana M. / MacAleese, Luke / McDonnell, Liam A. et al. | 2008
- 1298
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Which is more important in bioimaging SIMS experiments—The sample preparation or the nature of the projectile?Kurczy, M.E. / Piehowski, P.D. / Parry, S.A. / Jiang, M. / Chen, G. / Ewing, A.G. / Winograd, Nicholas et al. | 2008
- 1307
-
Ultralow-energy SIMS for shallow semiconductor depth profilingChanbasha, A.R. / Wee, A.T.S. et al. | 2008
- 1311
-
Accuracy of calibrated depth by delta-doped reference materials in shallow depth profilingTomita, M. / Tanaka, H. / Koike, M. / Kinno, T. / Hori, Y. / Yoshida, N. / Sasaki, T. / Takeno, S. et al. | 2008
- 1316
-
Cesium near-surface concentration in low energy, negative mode dynamic SIMSBerghmans, B. / Van Daele, B. / Geenen, L. / Conard, T. / Franquet, A. / Vandervorst, W. et al. | 2008
- 1320
-
Segregation under low-energy oxygen bombardment in the near-surface regionTada, Y. / Suzuki, K. / Kataoka, Y. et al. | 2008
- 1323
-
SIMS analysis of 83Kr implanted UO2Portier, S. / Brémier, S. / Hasnaoui, R. / Bildstein, O. / Walker, C.T. et al. | 2008
- 1327
-
SIMS depth profiles of alloying elements in surface layers formed in Cu-based alloys during annealingSuzuki, Shigeru / Shibata, Hiroyuki / Ito, Masuo / Kimura, Tarou et al. | 2008
- 1331
-
Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profilingVitchev, R.G. / Brison, J. / Houssiau, L. et al. | 2008
- 1334
-
Fluorine-doped SiO2 and fluorocarbon low-k dielectrics investigated by SIMSCwil, M. / Kalisz, M. / Konarski, P. et al. | 2008
- 1338
-
Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beamsFujiwara, Yukio / Kondou, Kouji / Watanabe, Kouji / Nonaka, Hidehiko / Saito, Naoaki / Fujimoto, Toshiyuki / Kurokawa, Akira / Ichimura, Shingo / Tomita, Mitsuhiro et al. | 2008
- 1341
-
SIMS characterization of segregation in InAs/GaAs heterostructuresGallardo, S. / Kudriatsev, Y. / Villegas, A. / Ramírez, G. / Asomoza, R. / Cruz-Hernández, E. / Rojas-Ramirez, J.S. / López-López, M. et al. | 2008
- 1345
-
Silicon isotope superlattices: Ideal SIMS standards for shallow junction characterizationShimizu, Yasuo / Takano, Akio / Itoh, Kohei M. et al. | 2008
- 1348
-
Evaluation of sputtering rate change in the silicon transient region under medium energy O2+ sputteringTakano, Akio / Takenaka, Hisataka et al. | 2008
- 1351
-
Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometryIshizaki, Y. / Yamamoto, T. / Fujii, M. / Owari, M. / Nojima, M. / Nihei, Y. et al. | 2008
- 1354
-
Highly accurate shave-off depth profiling by simulation methodFujii, M. / Nakamura, K. / Ishizaki, Y. / Nojima, M. / Owari, M. / Nihei, Y. et al. | 2008
- 1357
-
The optimization of incident angles of low-energy oxygen ion beams for increasing sputtering rate on silicon samplesSasaki, T. / Yoshida, N. / Takahashi, M. / Tomita, M. et al. | 2008
- 1360
-
Towards quantitative depth profiling with high spatial and high depth resolutionVanhove, N. / Lievens, P. / Vandervorst, W. et al. | 2008
- 1364
-
Quantification in dynamic SIMS: Current status and future needsStevie, F.A. / Griffis, D.P. et al. | 2008
- 1368
-
Ripple morphologies on ion irradiated Si1−xGexSarkar, S. / Van Daele, B. / Vandervorst, W. et al. | 2008
- 1373
-
Micro-area analysis in SIMS depth profiling by mesa-structure preparationSeki, S. / Tamura, H. / Wada, Y. / Tsutsui, K. / Ootomo, S. et al. | 2008
- 1377
-
Quantitative SIMS measurement of high concentration of boron in silicon (up to 20at.%) using an isotopic comparative methodDubois, Christiane / Prudon, Gilles / Gautier, Brice / Dupuy, Jean-Claude et al. | 2008
- 1381
-
SIMS depth profiling and TEM imaging of the SIMS altered layerChristofi, A. / Walker, J.F. / McPhail, D.S. et al. | 2008
- 1384
-
Oxygen flooding and sample cooling during depth profiling of HfSiON thin filmsMiwa, Shiro et al. | 2008
- 1387
-
Influence of primary ion beam irradiation conditions on the depth profile of hydrogen in tantalum filmAsakawa, T. / Nagano, D. / Denda, S. / Miyairi, K. et al. | 2008
- 1391
-
Investigation of surface morphology of SiC during SIMS analysisFukumoto, Noriaki / Mizukami, Yumiko / Yoshikawa, Sumikazu / Morita, Hiromi et al. | 2008
- 1395
-
Investigations of semiconductor devices using SIMS; diffusion, contamination, process controlLee, Jae Cheol / Won, Jeongyeon / Chung, Youngsu / Lee, Hyungik / Lee, Eunha / Kang, Donghun / Kim, Changjung / Choi, Jinhak / Kim, Jeomsik et al. | 2008
- 1400
-
Shave-off vector profiling for TEM samplesNojima, M. / Fujii, M. / Ishizaki, Y. / Owari, M. / Nihei, Y. et al. | 2008
- 1404
-
Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitationsGrehl, Thomas / Möllers, Rudolf / Niehuis, Ewald / Rading, Derk et al. | 2008
- 1408
-
Characterization of post-etched photoresist and residues by various analytical techniquesFranquet, A. / Claes, M. / Conard, T. / Kesters, E. / Vereecke, G. / Vandervorst, W. et al. | 2008
- 1412
-
Quantification of SiGe layer composition using MCs+ and MCs2+ secondary ions in ToF-SIMS and magnetic SIMSMarseilhan, D. / Barnes, J.P. / Fillot, F. / Hartmann, J.M. / Holliger, P. et al. | 2008
- 1415
-
Quantitative static Time-of-Flight Secondary Ion Mass Spectrometry analysis of anionic minority species in microelectronic substratesRavanel, X. / Trouiller, C. / Juhel, M. / Wyon, C. / Kwakman, L.F.Tz. / Léonard, D. et al. | 2008
- 1419
-
Preparation and properties of ZnO layers grown by various methodsVincze, A. / Kováč, J. / Novotný, I. / Bruncko, J. / Haško, D. / Šatka, A. / Shtereva, K. et al. | 2008
- 1423
-
SIMS depth profiling analysis of halogens in CdTe/CdS/TSO solar cells using Cs2M+ cluster ionsKoudriavtseva, O. / Morales-Acevedo, A. / Kudriavtsev, Yu. / Gallardo, S. / Asomoza, R. / Mendoza-Perez, R. / Sastre-Hernandez, J. / Contreras-Puente, G. et al. | 2008
- 1427
-
Long-term reproducibility of relative sensitivity factors obtained with CAMECA WfGui, D. / Xing, Z.X. / Huang, Y.H. / Mo, Z.Q. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1430
-
Film thickness determining method of the silicon isotope superlattices by SIMSTakano, Akio / Shimizu, Yasuo / Itoh, Kohei M. et al. | 2008
- 1433
-
Roughness development in the depth profiling with 500eV O2+ beam with the combination of oxygen flooding and sample rotationGui, D. / Xing, Z.X. / Huang, Y.H. / Mo, Z.Q. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1437
-
Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ techniqueGui, D. / Mo, Z.Q. / Xing, Z.X. / Huang, Y.H. / Hua, Y.N. / Zhao, S.P. / Cha, L.Z. et al. | 2008
- 1440
-
Static time-of-flight secondary ion mass spectrometry analysis of microelectronics related substrates using a polyatomic ion sourceRavanel, X. / Trouiller, C. / Juhel, M. / Wyon, C. / Kwakman, L.F.Tz. / Léonard, D. et al. | 2008
- 1443
-
Characterization of ionic migration on CoF substrate by ToF-SIMSMogi, S. / Wada, M. / Matsumura, Y. / Tabira, Y. et al. | 2008
- 1446
-
Isotopic imaging of refractory inclusions in meteorites with the NanoSIMS 50LIto, Motoo / Messenger, Scott et al. | 2008
- 1451
-
Invisible gold and arsenic in pyrite from the high-grade Hishikari gold deposit, JapanMorishita, Y. / Shimada, N. / Shimada, K. et al. | 2008
- 1455
-
Investigation of radiation enhanced diffusion of magnesium in substrates flown on the NASA genesis missionKing, B.V. / Pellin, M.J. / Burnett, D.S. et al. | 2008
- 1458
-
Discovery of 17,18O-rich material from meteorite by direct-imaging method using stigmatic-SIMS and 2D ion detectorSakamoto, Naoya / Itoh, Shoichi / Yurimoto, Hisayoshi et al. | 2008
- 1461
-
MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun’s oxygen isotopic compositionMao, Peter H. / Burnett, Donald S. / Coath, Christopher D. / Jarzebinski, George / Kunihiro, Takuya / McKeegan, Kevin D. et al. | 2008
- 1465
-
NanoSIMS analysis of Archean fossils and biomarkersKilburn, M.R. et al. | 2009