INDUSTRIAL APPLICATIONS - Application of High-Energy Photon CT System With Laser-Compton Scattering to Non-Destructive Test (English)
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IEEE transactions on nuclear science
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55
, 6
; 3571-3578
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2008
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- Article (Journal) / Print
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Title:INDUSTRIAL APPLICATIONS - Application of High-Energy Photon CT System With Laser-Compton Scattering to Non-Destructive Test
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Published in:IEEE transactions on nuclear science ; 55, 6 ; 3571-3578
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Place of publication:New York, NY
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Publication date:2008
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 770/3450/5540
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Local classification TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Source:
Table of contents – Volume 55, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2801
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Table of contents| 2008
- 2807
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Editorial Conference Comments by the General ChairmanDodd, Paul E. et al. | 2008
- 2807
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NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) Tucson, AZ, July 14-18, 2008 - EDITORIAL - Conference Comments by the General ChairmanDodd, P.E. et al. | 2008
- 2807
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Conference Comments by the General ChairmanDodd, P.E. et al. | 2008
- 2810
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2008 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the EditorsSchwank, J. / Buchner, S. / Marshall, P. / Duzellier, S. / Brown, D. / Poivey, C. / Pease, R. et al. | 2008
- 2811
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2008 December Special NSREC Issue of the IEEE Transactions on Nuclear Science List of Reviewers| 2008
- 2811
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LIST OF REVIEWERS - 2008 December Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCEList of Reviewers| 2008
- 2813
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2008 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman| 2008
- 2813
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AWARDS - 2008 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the ChairmanXapsos, M. et al. | 2008
- 2815
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Outstanding Conference Paper Award 2008 IEEE Nuclear and Space Radiation Effects Conference| 2008
- 2819
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Single-Event Data AnalysisPetersen, E.L. et al. | 2008
- 2819
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NSREC SHORT COURSE REVIEW PAPERS - Single-Event Data AnalysisPetersen, E.L. et al. | 2008
- 2842
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Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter ChainsCavrois, V.F. / Pouget, V. / McMorrow, D. / Schwank, J.R. / Fel, N. / Essely, F. / Flores, R.S. / Paillet, P. / Gaillardin, M. / Kobayashi, D. et al. | 2008
- 2842
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SESSION A: SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter ChainsCavrois, V.F. et al. | 2008
- 2854
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Generation and Propagation of Single Event Transients in 0.18-µm Fully Depleted SOIGouker, P. et al. | 2008
- 2854
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Generation and Propagation of Single Event Transients in 0.18-$\mu{\rm m}$ Fully Depleted SOIGouker, P. / Brandt, J. / Wyatt, P. / Tyrrell, B. / Soares, A. / Knecht, J. / Keast, C. / McMorrow, D. / Narasimham, B. / Gadlage, M. et al. | 2008
- 2861
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Single-Event Transient Pulse Propagation in Digital CMOSMassengill, L.W. / Tuinenga, P.W. et al. | 2008
- 2872
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Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor TechniqueKobayashi, D. / Hirose, K. / Yanagawa, Y. / Ikeda, H. / Saito, H. / Ferlet-Cavrois, V. / McMorrow, D. / Gaillardin, M. / Paillet, P. / Arai, Y. et al. | 2008
- 2880
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Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMsTipton, A.D. / Pellish, J.A. / Hutson, J.M. / Baumann, R. / Deng, X. / Marshall, A. / Xapsos, M.A. / Kim, H.S. / Friendlich, M.R. / Campola, M.J. et al. | 2008
- 2886
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Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened CircuitryWarren, K.M. / Sternberg, A.L. / Weller, R.A. / Baze, M.P. / Massengill, L.W. / Reed, R.A. / Mendenhall, M.H. / Schrimpf, R.D. et al. | 2008
- 2895
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Modeling of Heavy Ion Induced Charge Loss Mechanisms in Nanocrystal Memory CellsCester, A. / Wrachien, N. / Schwank, J.R. / Vizkelethy, G. / Portoghese, R. / Gerardi, C. et al. | 2008
- 2904
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Direct Evidence of Secondary Recoiled Nuclei From High Energy ProtonsCellere, G. / Paccagnella, A. / Visconti, A. / Beltrami, S. / Schwank, J. / Shaneyfelt, M. / Lambert, D. / Paillet, P. / Ferlet-Cavrois, V. / Baggio, J. et al. | 2008
- 2914
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Temperature Dependence of Digital SET Pulse Width in Bulk and SOI TechnologiesChen Shuming, / Liang Bin, / Liu Biwei, / Liu Zheng, et al. | 2008
- 2921
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New SET Characterization Technique Using SPICE for Fully Depleted CMOS/SOI Digital CircuitryMakihara, A. / Ebihara, T. / Yokose, T. / Tsuchiya, Y. / Amano, Y. / Shindou, H. / Imagawa, R. / Takahashi, Y. / Kuboyama, S. et al. | 2008
- 2928
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Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse BroadeningWirth, G. / Kastensmidt, F.L. / Ribeiro, I. et al. | 2008
- 2936
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Laser-Induced Current Transients in Silicon-Germanium HBTsPellish, J.A. / Reed, R.A. / McMorrow, D. / Melinger, J.S. / Jenkins, P. / Sutton, A.K. / Diestelhorst, R.M. / Phillips, S.D. / Cressler, J.D. / Pouget, V. et al. | 2008
- 2943
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Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge CollectionBlack, J.D. / Ball, D.R. / Robinson, W.H. / Fleetwood, D.M. / Schrimpf, R.D. / Reed, R.A. / Black, D.A. / Warren, K.M. / Tipton, A.D. / Dodd, P.E. et al. | 2008
- 2948
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Single Event Mechanisms in 90 nm Triple-Well CMOS DevicesRoy, T. / Witulski, A.F. / Schrimpf, R.D. / Alles, M.L. / Massengill, L.W. et al. | 2008
- 2957
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Evaluation of Radiation-Hardened Design Techniques Using Frequency Domain AnalysisOlson, B.D. / Holman, W.T. / Massengill, L.W. / Bhuva, B.L. et al. | 2008
- 2962
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Risk Assessment Based on Upset Rates From High Energy Proton Tests and Monte Carlo SimulationsFoster, C.C. / O'Neill, P.M. / Kouba, C.K. et al. | 2008
- 2970
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SESSION B: BASIC MECHANISMS OF RADIATION EFFECTS - High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent DefectsMarinoni, M. et al. | 2008
- 2970
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High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent DefectsMarinoni, M. / Touboul, A.D. / Zander, D. / Petit, C. / Wrobel, F. / Carvalho, A.M.J.F. / Arinero, R. / Ramonda, M. / Saigne, F. / Weulersse, C. et al. | 2008
- 2975
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Radiation Effects on the $1/f$ Noise of Field-Oxide Field Effect TransistorsZhou, X.J. / Fleetwood, D.M. / Schrimpf, R.D. / Faccio, F. / Gonella, L. et al. | 2008
- 2981
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Total Ionizing Dose Effects on Strained HfO2-Based nMOSFETsPark, H. et al. | 2008
- 2981
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Total Ionizing Dose Effects on Strained ${\rm HfO}_{2}$-Based nMOSFETsHyunwoo Park, / Dixit, S.K. / Youn Sung Choi, / Schrimpf, R.D. / Fleetwood, D.M. / Nishida, T. / Thompson, S.E. et al. | 2008
- 2986
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Electron Capture, Hydrogen Release, and Enhanced Gain Degradation in Linear Bipolar DevicesFleetwood, D.M. / Schrimpf, R.D. / Pantelides, S.T. / Pease, R.L. / Dunham, G.W. et al. | 2008
- 2992
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Amorphous Inclusions in Irradiated Silicon and Their Effects on Material and Device PropertiesPalko, J.W. / Srour, J.R. et al. | 2008
- 3000
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Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell ArraysWrachien, N. / Cester, A. / Portoghese, R. / Gerardi, C. et al. | 2008
- 3009
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Calculations of Radiation Dose-Rate Sensitivity of Bipolar TransistorsHjalmarson, H.P. / Pease, R.L. / Devine, R.A.B. et al. | 2008
- 3016
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Effect of Proton and Silicon Ion Irradiation on Defect Formation in GaAsWarner, J.H. / Inguimbert, C. / Twigg, M.E. / Messenger, S.R. / Walters, R.J. / Romero, M.J. / Summers, G.P. et al. | 2008
- 3025
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Atomic Displacement Effects in Single-Event Gate RuptureBeck, M.J. / Tuttle, B.R. / Schrimpf, R.D. / Fleetwood, D.M. / Pantelides, S.T. et al. | 2008
- 3032
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Post-Irradiation Annealing Mechanisms of Defects Generated in Hydrogenated Bipolar OxidesChen, X.J. / Barnaby, H.J. / Vermeire, B. / Holbert, K.E. / Wright, D. / Pease, R.L. / Schrimpf, R.D. / Fleetwood, D.M. / Pantelides, S.T. / Shaneyfelt, M.R. et al. | 2008
- 3039
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Effects of Hydrogen on the Radiation Response of Bipolar Transistors: Experiment and ModelingBatyrev, I.G. / Hughart, D. / Durand, R. / Bounasser, M. / Tuttle, B.R. / Fleetwood, D.M. / Schrimpf, R.D. / Rashkeev, S.N. / Dunham, G.W. / Law, M. et al. | 2008
- 3046
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Electron and Ion Tracks in Silicon: Spatial and Temporal EvolutionMurat, M. / Akkerman, A. / Barak, J. et al. | 2008
- 3055
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Comparison Between Experimental and Simulation Results for Ion Beam and Neutron Irradiations in Silicon Bipolar Junction TransistorsBielejec, E. / Vizkelethy, G. / Fleming, R.M. / Wampler, W.R. / Myers, S.M. / King, D.B. et al. | 2008
- 3060
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Evidence for a Radiation Induced Electromotive Force (RIEMF) in Dielectrics Exposed to Very High 14 MeV Neutron Flux by Means of Neutron Induced RecoilsLeray, J.-L. / Bazzoli, S. / Sauvestre, J.-E. / Glebov, V.Yu. et al. | 2008
- 3070
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SESSION C: HARDNESS ASSURANCE - An Automated Approach to Estimating Hardness Assurance Issues in Triple-Modular Redundancy Circuits in Xilinx FPGAsQuinn, H. et al. | 2008
- 3070
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An Automated Approach to Estimating Hardness Assurance Issues in Triple-Modular Redundancy Circuits in Xilinx FPGAsQuinn, H. / Graham, P. / Pratt, B. et al. | 2008
- 3077
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Extended SET Pulses in Sequential Circuits Leading to Increased SE VulnerabilityNarasimham, B. / Amusan, O.A. / Bhuva, B.L. / Schrimpf, R.D. / Holman, W.T. et al. | 2008
- 3082
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From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-IIHarboe-Sorensen, R. / Poivey, C. / Guerre, F.-X. / Roseng, A. / Lochon, F. / Berger, G. / Hajdas, W. / Virtanen, A. / Kettunen, H. / Duzellier, S. et al. | 2008
- 3088
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Comparison of TID Effects in Space-Like Variable Dose Rates and Constant Dose RatesHarris, R.D. / McClure, S.S. / Rax, B.G. / Evans, R.W. / Jun, I. et al. | 2008
- 3096
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Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance TestingShaneyfelt, M.R. / Felix, J.A. / Dodd, P.E. / Schwank, J.R. / Dalton, S.M. / Baggio, J. / Ferlet-Cavrois, V. / Paillet, P. / Blackmore, E.W. et al. | 2008
- 3106
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Review of Deposited Dose Calculation Methods Using Ray Tracing ApproximationsCalvel, P. / Barillot, C. / Porte, A. / Auriel, G. / Chatry, C. / Peyrard, P.-F. / Santin, G. / Ecoffet, R. / Jordan, T.M. et al. | 2008
- 3114
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Laser Dose-Rate Simulation to Complement LINAC Discrete Device DataNation, S.A. / Massengill, L.W. / McMorrow, D. / Evans, L. / Straatveit, A. et al. | 2008
- 3122
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Recommended Test Conditions for SEB Evaluation of Planar Power DMOSFETsLiu, S. / Titus, J.L. / DiCienzo, C. / Huy Cao, / Zafrani, M. / Boden, M. / Berberian, R. et al. | 2008
- 3130
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A Built-In Self-Test (BIST) Technique for Single-Event Testing in Digital CircuitsBalasubramanian, A. / Bhuva, B.L. / Massengill, L.W. / Narasimham, B. / Shuler, R.L. / Loveless, T.D. / Holman, W.T. et al. | 2008
- 3136
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Simulation Study on the Effect of Multiple Node Charge Collection on Error Cross-Section in CMOS Sequential LogicCasey, M.C. / Duncan, A.R. / Bhuva, B.L. / Robinson, W.H. / Massengill, L.W. et al. | 2008
- 3141
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Hafnium and Uranium Contributions to Soft Error Rate at Ground LevelWrobel, F. / Gasiot, J. / Saigne, F. et al. | 2008
- 3141
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SESSION D: SPACE AND TERRESTRIAL ENVIRONMENTS - Hafnium and Uranium Contributions to Soft Error Rate at Ground LevelWrobel, F. et al. | 2008
- 3146
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Neutron Induced Energy Deposition in a Silicon DiodeRocheman, S. / Wrobel, F. / Vaille, J.-R. / Saigne, F. / Weulersse, C. / Buard, N. / Carriere, T. et al. | 2008
- 3151
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Galileo GIOVE-A MEORAD Results and AnalysisTaylor, B. / Underwood, C. / Evans, H. / Daly, E. / Ryden, K.A. / Santin, G. et al. | 2008
- 3158
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An Algorithm for Determining Energy Deposition Profiles in Elemental Slabs by Low ($≪ 100$ keV) Energy Electrons: An Internal Charging ApplicationWousik Kim, / Insoo Jun, / Garrett, H.B. et al. | 2008
- 3164
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HETC-HEDS Code Validation Using Laboratory Beam Energy Loss Spectra DataCharara, Y.M. / Townsend, L.W. / Gabriel, T.A. / Zeitlin, C.J. / Heilbronn, L.H. / Miller, J. et al. | 2008
- 3169
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SESSION E: RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear CircuitsPease, R.L. et al. | 2008
- 3169
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The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear CircuitsPease, R.L. / Adell, P.C. / Rax, B.G. / Xiao Jie Chen, / Barnaby, H.J. / Holbert, K.E. / Hjalmarson, H.P. et al. | 2008
- 3174
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Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated CircuitsDusseau, L. / Bernard, M. / Boch, J. / Gonzalez Velo, Y. / Roche, N. / Lorfevre, E. / Bezerra, F. / Calvel, P. / Marec, R. / Saigne, F. et al. | 2008
- 3182
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Microdose and Breakdown Effects Induced by Heavy Ions on Sub 32-nm Triple-Gate SOI FETsGriffoni, A. / Gerardin, S. / Meneghesso, G. / Paccagnella, A. / Simoen, E. / Put, S. / Claeys, C. et al. | 2008
- 3189
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Analysis of Proton and Heavy-Ion Irradiation Effects on Phase Change Memories With MOSFET and BJT SelectorsGasperin, A. / Paccagnella, A. / Schwank, J.R. / Vizkelethy, G. / Ottogalli, F. / Pellizzer, F. et al. | 2008
- 3197
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Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on >Thin-Film SOI TechnologyBellini, M. / Phillips, S.D. / Diestelhorst, R.M. / Cheng, P. / Cressler, J.D. / Marshall, P.W. / Turowski, M. / Avenier, G. / Chantre, A. / Chevalier, P. et al. | 2008
- 3202
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Total Dose Radiation Response of NROM-Style SOI Non-Volatile Memory ElementsDraper, B. / Dockerty, R. / Shaneyfelt, M. / Habermehl, S. / Murray, J. et al. | 2008
- 3206
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Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term AgingSchwank, J.R. / Shaneyfelt, M.R. / Dasgupta, A. / Francis, S.A. / Zhou, X.J. / Fleetwood, D.M. / Schrimpf, R.D. / Pantelides, S.T. / Felix, J.A. / Dodd, P.E. et al. | 2008
- 3216
-
Degradation Induced by X-Ray Irradiation and Channel Hot Carrier Stresses in 130-nm NMOSFETs With Enclosed LayoutSilvestri, M. / Gerardin, S. / Paccagnella, A. / Faccio, F. et al. | 2008
- 3224
-
Origin of High Total Dose Sensitivity on the OP400 Bipolar Operational AmplifierBernard, M.F. / Dusseau, L. / Moindjie, S. / Bouchet, T. et al. | 2008
- 3231
-
Analysis of Commercial Trench Power MOSFETs' Responses to Co60 IrradiationLiu, S. et al. | 2008
- 3231
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Analysis of Commercial Trench Power MOSFETs' Responses to ${\rm Co}^{60}$ IrradiationLiu, S. / DiCienzo, C. / Bliss, M. / Zafrani, M. / Boden, M. / Titus, J.L. et al. | 2008
- 3237
-
Ionizing Radiation Effect on Ferroelectric Nonvolatile Memories and Its Dependence on the Irradiation TemperatureZanata, M. / Wrachien, N. / Cester, A. et al. | 2008
- 3246
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On the Radiation Tolerance of SiGe HBT and CMOS-Based Phase Shifters for Space-Based, Phased-Array Antenna SystemsThrivikraman, T.K. / Peng Cheng, / Phillips, S.D. / Comeau, J.P. / Morton, M.A. / Cressler, J.D. / Papapolymerou, J. / Marshall, P.W. et al. | 2008
- 3253
-
The Effects of Proton Irradiation on the Performance of High-Voltage n-MOSFETs Implemented in a Low-Voltage SiGe BiCMOS PlatformNajafizadeh, L. / Tuan Vo, / Phillips, S.D. / Peng Cheng, / Wilcox, E.P. / Cressler, J.D. / Mojarradi, M. / Marshall, P.W. et al. | 2008
- 3259
-
Gate-Length and Drain-Bias Dependence of Band-to-Band Tunneling-Induced Drain Leakage in Irradiated Fully Depleted SOI DevicesMamouni, F.E. / Dixit, S.K. / Schrimpf, R.D. / Adell, P.C. / Esqueda, I.S. / McLain, M.L. / Barnaby, H.J. / Cristoloveanu, S. / Xiong, W. et al. | 2008
- 3265
-
Physical Mechanisms of Ion-Induced Stuck Bits in the Hyundai 16M x 4 SDRAMEdmonds, L.D. et al. | 2008
- 3265
-
Physical Mechanisms of Ion-Induced Stuck Bits in the Hyundai 16M$\,\times\,$ 4 SDRAMEdmonds, L.D. / Scheick, L.Z. et al. | 2008
- 3272
-
Comprehensive Study of Total Ionizing Dose Damage Mechanisms and Their Effects on Noise Sources in a 90 nm CMOS TechnologyRe, V. / Gaioni, L. / Manghisoni, M. / Ratti, L. / Traversi, G. et al. | 2008
- 3280
-
The Impact of Total Ionizing Dose on Unhardened SRAM Cell MarginsXiaoyin Yao, / Hindman, N. / Clark, L.T. / Holbert, K.E. / Alexander, D.R. / Shedd, W.M. et al. | 2008
- 3288
-
Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMSMavis, D.G. / Eaton, P.H. / Sibley, M.D. / Lacoe, R.C. / Smith, E.J. / Avery, K.A. et al. | 2008
- 3288
-
SESSION F: SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMSMavis, D.G. et al. | 2008
- 3295
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Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop DesignsBaze, M.P. / Hughlock, B. / Wert, J. / Tostenrude, J. / Massengill, L. / Amusan, O. / Lacoe, R. / Lilja, K. / Johnson, M. et al. | 2008
- 3302
-
Key Contributions to the Cross Section of NAND Flash Memories Irradiated With Heavy IonsBagatin, M. / Gerardin, S. / Cellere, G. / Paccagnella, A. / Visconti, A. / Beltrami, S. / Harboe-Sorensen, R. / Virtanen, A. et al. | 2008
- 3309
-
Laser Verification of On-Chip Charge-Collection Measurement CircuitAmusan, O.A. / Fleming, P.R. / Bhuva, B.L. / Massengill, L.W. / Witulski, A.F. / Balasubramanian, A. / Casey, M.C. / McMorrow, D. / Nation, S.A. / Barsun, F. et al. | 2008
- 3314
-
The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational AmplifierBuchner, S. / McMorrow, D. / Roche, N. / Dusseau, L. / Pease, R.L. et al. | 2008
- 3321
-
Probing With Heavy Ions the SET Sensitivity of Linear DevicesDuzellier, S. / Inguimbert, C. / Nuns, T. / Bezerra, F. / Dangla, D. et al. | 2008
- 3328
-
Configuration and Routing Effects on the SET Propagation in Flash-Based FPGAsRezgui, S. / Wang, J.J. / Sun, Y. / Cronquist, B. / McCollum, J. et al. | 2008
- 3336
-
Implications of Total Dose on Single-Event Transient (SET) Pulse Width Measurement TechniquesBalasubramanian, A. / Narasimham, B. / Bhuva, B.L. / Massengill, L.W. / Eaton, P.H. / Sibley, M. / Mavis, D. et al. | 2008
- 3342
-
Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low PowerCasey, M.C. / Amusan, O.A. / Nation, S.A. / Loveless, T.D. / Balasubramanian, A. / Bhuva, B.L. / Reed, R.A. / McMorrow, D. / Weller, R.A. / Alles, M.L. et al. | 2008
- 3347
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C-CREST Technique for Combinational Logic SET TestingAhlbin, J.R. / Black, J.D. / Massengill, L.W. / Amusan, O.A. / Balasubramanian, A. / Casey, M.C. / Black, D.A. / McCurdy, M.W. / Reed, R.A. / Bhuva, B.L. et al. | 2008
- 3352
-
Investigation of Single-Event Transients in Linear Voltage RegulatorsIrom, F. / Miyahira, T.F. / Adell, P.C. / Laird, J.S. / Conder, B. / Pouget, V. / Essely, F. et al. | 2008
- 3360
-
3-D Mixed-Mode Simulation of Single Event Transients in SiGe HBT Emitter Followers and Resultant Hardening GuidelinesXiaoyun Wei, / Tong Zhang, / Guofu Niu, / Varadharajaperumal, M. / Cressler, J.D. / Marshall, P.W. et al. | 2008
- 3367
-
Single Event Effect Induced Multiple-Cell Upsets in a Commercial 90 nm CMOS Digital TechnologyLawrence, R.K. / Kelly, A.T. et al. | 2008
- 3375
-
Alpha-Particle, Carbon-Ion and Proton- Induced Flip-Flop Single-Event-Upsets in 65 nm Bulk TechnologyWissel, L. / Cannon, E.H. / Heidel, D.F. / Gordon, M.S. / Rodbell, K.P. et al. | 2008
- 3381
-
Monte Carlo Analysis of the Effects of Soft Errors Accumulation in SRAM-Based FPGAsBattezzati, N. / Sterpone, L. / Violante, M. et al. | 2008
- 3388
-
Study of Latent Damage in Power MOSFETs Caused by Heavy Ion IrradiationIkeda, N. / Kuboyama, S. / Satoh, Y. / Tamura, T. et al. | 2008
- 3394
-
Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAMHeidel, D.F. / Marshall, P.W. / LaBel, K.A. / Schwank, J.R. / Rodbell, K.P. / Hakey, M.C. / Berg, M.D. / Dodd, P.E. / Friendlich, M.R. / Phan, A.D. et al. | 2008
- 3401
-
Pulsed Laser Single-Event Effects in Highly Scaled CMOS Technologies in the Presence of Dense Metal CoverageBalasubramanian, A. / McMorrow, D. / Nation, S.A. / Bhuva, B.L. / Reed, R.A. / Massengill, L.W. / Loveless, T.D. / Amusan, O.A. / Black, J.D. / Melinger, J.S. et al. | 2008
- 3407
-
Tissue Equivalence Correction in Silicon Microdosimetry for Protons Characteristic of the LEO Space EnvironmentGuatelli, S. / Reinhard, M.I. / Mascialino, B. / Prokopovich, D.A. / Dzurak, A.S. / Zaider, M. / Rosenfeld, A.B. et al. | 2008
- 3407
-
SESSION G: DOSIMETRY - Tissue Equivalence Correction in Silicon Microdosimetry for Protons Characteristic of the LEO Space EnvironmentGuatelli, S. et al. | 2008
- 3414
-
A Cylindrical Silicon-on-Insulator Microdosimeter: Charge Collection CharacteristicsZiebell, A.L. / Lim, W.H. / Reinhard, M.I. / Cornelius, I. / Prokopovich, D.A. / Siegele, R. / Dzurak, A.S. / Rosenfeld, A.B. et al. | 2008
- 3421
-
Feasibility of Fibered Monitoring System for Pulsed Dose-Rate Facilities Based on Radioluminescence of SrS:Ce,Sm PhosphorBenoit, D. / Vaille, J.-R. / Lautissier, J. / Matias-Vaille, S. / Isturiz, J. / Garcia, P. / Brichard, B. / Dusseau, L. et al. | 2008
- 3428
-
A Solar Flare Simulation Wheel for the Radiation Test Beamline at the Francis H. BurrProton Therapy CenterCascio, E.W. / Sarkar, S. et al. | 2008
- 3435
-
Self-Voting Dual-Modular-Redundancy Circuits for Single-Event-Transient MitigationTeifel, J. et al. | 2008
- 3435
-
SESSION H: HARDNESS BY DESIGN - Self-Voting Dual-Modular-Redundancy Circuits for Single-Event-Transient MitigationTeifel, J. et al. | 2008
- 3440
-
Single-Event Effect Mitigation in Switched-Capacitor Comparator DesignsOlson, B.D. / Holman, W.T. / Massengill, L.W. / Bhuva, B.L. / Fleming, P.R. et al. | 2008
- 3447
-
A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked LoopsLoveless, T.D. / Massengill, L.W. / Bhuva, B.L. / Holman, W.T. / Casey, M.C. / Reed, R.A. / Nation, S.A. / McMorrow, D. / Melinger, J.S. et al. | 2008
- 3456
-
Quantifying the Effect of Guard Rings and Guard Drains in Mitigating Charge Collection and Charge SpreadNarasimham, B. / Gambles, J.W. / Shuler, R.L. / Bhuva, B.L. / Massengill, L.W. et al. | 2008
- 3461
-
Design Implications of Single Event Transients in a Commercial 45 nm SOI Device TechnologyKleinosowski, A.J. / Cannon, E.H. / Pellish, J.A. / Oldiges, P. / Wissel, L. et al. | 2008
- 3467
-
A Double-Power-MOSFET Circuit for Protection From Single Event BurnoutBarak, J. / Haran, A. / David, D. / Rapaport, S. et al. | 2008
- 3473
-
Radiation Effects on Silica-Based Preforms and Optical Fibers—I: Experimental Study With Canonical SamplesGirard, S. / Ouerdane, Y. / Origlio, G. / Marcandella, C. / Boukenter, A. / Richard, N. / Baggio, J. / Paillet, P. / Cannas, M. / Bisutti, J. et al. | 2008
- 3473
-
SESSION I: PHOTONIC DEVICES AND INTEGRATED CIRCUITS - Radiation Effects on Silica-Based Preforms and Optical Fibers — I: Experimental Study With Canonical SamplesGirard, S. et al. | 2008
- 3483
-
Radiation Effects in InGaAs and Microbolometer Infrared Sensor Arrays for Space ApplicationsHopkinson, G. / Sorensen, R.H. / Leone, B. / Meynart, R. / Mohammadzadeh, A. / Rabaud, W. et al. | 2008
- 3494
-
Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior AnalysisGoiffon, V. / Magnan, P. / Saint-pe, O. / Bernard, F. / Rolland, G. et al. | 2008
- 3502
-
In Situ Irradiation and Measurement of Triple Junction Solar Cells at Low Intensity, Low Temperature (LILT) ConditionsHarris, R.D. / Imaizumi, M. / Walters, R.J. / Lorentzen, J.R. / Messenger, S.R. / Tischler, J.G. / Ohshima, T. / Sato, S. / Sharps, P.R. / Fatemi, N.S. et al. | 2008
- 3508
-
Radiation Effects on Silica-Based Preforms and Optical Fibers-II: Coupling Ab initio Simulations and ExperimentsGirard, S. / Richard, N. / Ouerdane, Y. / Origlio, G. / Boukenter, A. / Martin-Samos, L. / Paillet, P. / Meunier, J.-P. / Baggio, J. / Cannas, M. et al. | 2008
- 3515
-
Prediction of Corning InfiniCor 300 Optical Fiber Attenuation at Low Gamma Dose RatesHolbert, K.E. / Heger, A.S. / Geschke, D.M. / Stewart, R.M. et al. | 2008
- 3523
-
Conference Author Index| 2008
- 3527
-
The IEEE Digital Library| 2008
- 3528
-
Leading the field since 1884| 2008
- 3531
-
ACCELERATOR TECHNOLOGY - Comparative Analysis of Methods for Isochronous Magnetic-Field CalculationCirkovic, S. et al. | 2008
- 3531
-
Comparative Analysis of Methods for Isochronous Magnetic-Field CalculationCirkovic, S. / Ristic-Djurovic, J.L. / Ilic, A.Z. / Vujovic, V. / Neskovic, N. et al. | 2008
- 3539
-
Physics Analysis Tools for the CMS Experiment at LHCFabozzi, F. / Jones, C.D. / Hegner, B. / Lista, L. et al. | 2008
- 3539
-
COMPUTING, SIMULATION, AND SOFTWARE - Physics Analysis Tools for the CMS Experiment at LHCFabozzi, F. et al. | 2008
- 3544
-
Effect of Normalization Algorithms on the Analysis of Bragg Peak ProfilesLechner, A. / Pia, M.G. et al. | 2008
- 3550
-
Monte Carlo Simulation of a ^1^9^8Au Thin Foil: The Response of a 4π beta - gamma DetectorBignell, L.J. / Mo, L. / Smith, M.L. / Alexiev, D. / Hashemi-Nezhad, S.R. et al. | 2008
- 3550
-
Monte Carlo Simulation of a $^{198}$Au Thin Foil: The Response of a $4\pi \beta \hbox{-} \gamma$ DetectorBignell, L.J. / Mo, L. / Smith, M.L. / Alexiev, D. / Hashemi-Nezhad, S.R. et al. | 2008
- 3550
-
Monte Carlo Simulation of a 198Au Thin Foil: The Response of a 4πβ-γ DetectorBignell, L.J. et al. | 2008
- 3556
-
DATA ACQUISITION SYSTEMS - The ATLAS Event BuilderVandelli, W. et al. | 2008
- 3556
-
The ATLAS Event BuilderVandelli, W. / Abolins, M. / Battaglia, A. / Beck, H.P. / Blair, R. / Bogaerts, A.J. / Bosman, M. / Ciobotaru, M.D. / Cranfield, R. / Crone, G. et al. | 2008
- 3563
-
DIGITAL SIGNAL PROCESSING - Digital Pulse Shape Acquisition From the Focal Plane Detector of MAGNEX SpectrometerBoiano, C. et al. | 2008
- 3563
-
Digital Pulse Shape Acquisition From the Focal Plane Detector of MAGNEX SpectrometerBoiano, C. / Cappuzzello, F. / Cavallaro, M. / Cunsolo, A. / Foti, A. / Guazzoni, P. / Moser, S. / Orrigo, S. / Riccio, F. / Rodrigues, M. et al. | 2008
- 3571
-
Application of High-Energy Photon CT System With Laser-Compton Scattering to Non-Destructive TestToyokawa, H. / Kanada, H. / Kaihori, T. / Koike, M. / Yamada, K. et al. | 2008
- 3571
-
INDUSTRIAL APPLICATIONS - Application of High-Energy Photon CT System With Laser-Compton Scattering to Non-Destructive TestToyokawa, H. et al. | 2008
- 3579
-
NUCLEAR POWER INSTRUMENTATION AND CONTROL - Ecological Interface Design in the Nuclear Domain: An Application to the Secondary Subsystems of a Boiling Water Reactor Plant SimulatorLau, N. et al. | 2008
- 3579
-
Ecological Interface Design in the Nuclear Domain: An Application to the Secondary Subsystems of a Boiling Water Reactor Plant SimulatorLau, N. / Veland, O. / Kwok, J. / Jamieson, G.A. / Burns, C.M. / Braseth, A.O. / Welch, R. et al. | 2008
- 3597
-
Ecological Interface Design in the Nuclear Domain: An Empirical Evaluation of Ecological Displays for the Secondary Subsystems of a Boiling Water Reactor Plant SimulatorLau, N. / Jamieson, G.A. / Skraaning, G. / Burns, C.M. et al. | 2008
- 3611
-
Enhanced Neural Network Based Fault Detection of a VVER Nuclear Power Plant With the Aid of Principal Component AnalysisHadad, K. / Mortazavi, M. / Mastali, M. / Safavi, A.A. et al. | 2008
- 3620
-
PHOTODETECTORS - Quantum Detection Efficiency in Geiger Mode Avalanche PhotodiodesMazzillo, M. et al. | 2008
- 3620
-
Quantum Detection Efficiency in Geiger Mode Avalanche PhotodiodesMazzillo, M. / Piazza, A. / Condorelli, G. / Sanfilippo, D. / Fallica, G. / Billotta, S. / Belluso, M. / Bonanno, G. / Cosentino, L. / Pappalardo, A. et al. | 2008
- 3626
-
New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation EnvironmentGilard, O. / Boutillier, M. / Quadri, G. / Rolland, G. / Germanicus, R. et al. | 2008
- 3626
-
RADIATION DAMAGE EFFECTS - New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation EnvironmentGilard, O. et al. | 2008
- 3633
-
RADIATION EFFECTS - Radiation Effects on InGaN Quantum Wells and GaN Simultaneously Probed by Ion Beam-Induced LuminescenceTringe, J.W. et al. | 2008
- 3633
-
Radiation Effects on InGaN Quantum Wells and GaN Simultaneously Probed by Ion Beam-Induced LuminescenceTringe, J.W. / Conway, A.M. / Felter, T.E. / Chan, W.J.M. / Castelaz, J. / Lordi, V. / Xia, Y. / Stevens, C.G. / Wetzel, C. et al. | 2008
- 3638
-
Short Strips for the sLHC: A P-Type Silicon Microstrip Detector in 3-D TechnologyKuhn, S. / Betta, G.-F.D. / Eckert, S. / Jakobs, K. / Parzefall, U. / Zoboli, A. / Zorzi, N. et al. | 2008
- 3643
-
A Fieldable-Prototype, Large-Area, Gamma-Ray Imager for Orphan Source SearchZiock, K.P. / Fabris, L. / Carr, D. / Collins, J. / Cunningham, M. / Habte, F. / Karnowski, T. / Marchant, W. et al. | 2008
- 3643
-
RADIATION IMAGING - A Fieldable-Prototype, Large-Area, Gamma-Ray Imager for Orphan Source SearchZiock, K.P. et al. | 2008
- 3654
-
The Use of Gamma-Ray Imaging to Improve Portal Monitor PerformanceZiock, K.P. / Collins, J. / Cunningham, M. / Fabris, L. / Gee, T. / Goddard, J. / Habte, F. / Karnowski, T. et al. | 2008
- 3665
-
READOUT ELECTRONICS - Small-Scale Readout System Prototype for the STAR PIXEL DetectorSzelezniak, M.A. et al. | 2008
- 3665
-
Small-Scale Readout System Prototype for the STAR PIXEL DetectorSzelezniak, M.A. / Besson, A. / Colledani, C. / Dorokhov, A. / Dulinski, W. / Greiner, L.C. / Himmi, A. / Hu, C. / Matis, H.S. / Ritter, H.G. et al. | 2008
- 3673
-
A 128-Channel CMOS Charge Readout ASIC for Flat-Panel X-Ray DetectorsAdachi, S. / Nishimura, A. / Yoshimuta, T. / Tanabe, K. / Okamura, S. et al. | 2008
- 3684
-
Investigation of Luminescence Properties of Lu$_{2}$SiO$_{5}$:Ce (LSO) Powder Scintillator in the X-Ray Radiography Energy RangeDavid, S.L. / Michail, C.M. / Valais, I.G. / Toutountzis, A.E. / Liaparinos, P.F. / Cavouras, D.A. / Kandarakis, I.S. / Panayiotakis, G.S. et al. | 2008
- 3684
-
SCINTILLATION DETECTORS - Investigation of Luminescence Properties of Lu2SiO5:Ce (LSO) Powder Scintillator in the X-Ray Radiography Energy RangeDavid, S.L. et al. | 2008
- 3692
-
Exploratory Research on the Development of Novel ${\rm Ce}^{3+}$-Activated Phosphate Glass ScintillatorsWisniewski, D. / Boatner, L.A. / Ramey, J.O. / Wisniewska, M. / Neal, J.S. / Jellison, G.E. et al. | 2008
- 3692
-
Exploratory Research on the Development of Novel Ce3+-Activated Phosphate Glass ScintillatorsWisniewski, D. et al. | 2008
- 3703
-
Light Emission Efficiency of Gd2O2S:Eu (GOS:Eu) Powder Screens Under X-Ray Mammography ConditionsMichail, C.M. et al. | 2008
- 3703
-
Light Emission Efficiency of ${\rm Gd}_{2} {\rm O} _{2} {\rm S}\!\!\!:\!\!\!{\rm Eu}$ (GOS:Eu) Powder Screens Under X-Ray Mammography ConditionsMichail, C.M. / Valais, I.G. / Toutountzis, A.E. / Kalyvas, N.E. / Fountos, G.P. / David, S.L. / Kandarakis, I.S. / Panayiotakis, G.S. et al. | 2008
- 3710
-
Boron-10 Loaded BC523A Liquid Scintillator for Neutron Detection in the Border MonitoringSwiderski, L. / Moszynski, M. / Wolski, D. / Batsch, T. / Nassalski, A. / Syntfeld-Kazuch, A. / Szczesniak, T. / Kniest, F. / Kusner, M.R. / Pausch, G. et al. | 2008
- 3717
-
Energy Resolution of Plastic Scintillation Detector for Beta RaysVo, H.H. / Kanamaru, S. / Marquet, C. / Nakamura, H. / Nomachi, M. / Piquemal, F. / Ricol, J.S. / Sugaya, Y. / Yasuda, K. et al. | 2008
- 3725
-
Polarization Studies of CdZnTe Detectors Using Synchrotron X-Ray RadiationCamarda, G.S. / Bolotnikov, A.E. / Yonggang Cui, / Hossain, A. / Awadalla, S.A. / Mackenzie, J. / Chen, H. / James, R.B. et al. | 2008
- 3725
-
SOLID STATE DETECTORS - Polarization Studies of CdZnTe Detectors Using Synchrotron X-Ray RadiationCamarda, G.S. et al. | 2008
- 3731
-
Test Beam Characterization of 3-D Silicon Pixel DetectorsMathes, M. / Cristinziani, M. / Da Via, C. / Garcia-Sciveres, M. / Einsweiler, K. / Hasi, J. / Kenney, C. / Parker, S.I. / Reuen, L. / Ruspa, M. et al. | 2008
- 3736
-
An SiC/GaN Detector/Front-End Detection System for High-Resolution Alpha-Particle SpectroscopyPullia, A. / Bertuccio, G. / Maiocchi, D. / Caccia, S. / Zocca, F. et al. | 2008
- 3741
-
Ion Beam Induced Charge Studies of CdZnTe Grown by Modified Vertical Bridgman MethodVeale, M.C. / Sellin, P.J. / Parkin, J. / Lohstroh, A. / Davies, A.W. / Seller, P. et al. | 2008
- 3746
-
Development of CMOS Monolithic Pixel Sensors With In-Pixel Correlated Double Sampling and Fast ReadoutBattaglia, M. / Bussat, J.-M. / Contarato, D. / Denes, P. / Giubilato, P. / Glesener, L.E. et al. | 2008
- 3746
-
SOLID STATE TRACKING DETECTORS - Development of CMOS Monolithic Pixel Sensors With In-Pixel Correlated Double Sampling and Fast ReadoutBattaglia, M. et al. | 2008
- 3751
-
2008 Index IEEE Transactions on Nuclear Science Vol. 55| 2008
- 3751
-
2008 INDEX| 2008
- 3836
-
Introducing ieee.tv| 2008
- C1
-
[Front cover]| 2008
- C2
-
IEEE Transactions on Nuclear Science publication information| 2008
- C3
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IEEE Transactions on Nuclear Science information for authors| 2008
- C4
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2008