Tomography of High-k Dielectrics on Fin-FET Sidewalls (English)
- New search for: Foran, B.
- New search for: Foran, B.
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In:
Microscopy and microanalysis
;
14
, 2
; 444-445
;
2008
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ISSN:
- Article (Journal) / Print
-
Title:Tomography of High-k Dielectrics on Fin-FET Sidewalls
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Contributors:
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Published in:Microscopy and microanalysis ; 14, 2 ; 444-445
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Publisher:
- New search for: Cambridge University Press
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Place of publication:New York, NY
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Publication date:2008
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 33.18 / 42.03 / 35.30
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Source:
Table of contents – Volume 14, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Using Aberration-corrected STEM Imaging to Explore Chemical and Structural Variations in the M1 Phase of the MoVNbTeO Oxidation CatalystPyrz, Wd et al. | 2008
- 4
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Measuring and Quantitatively Analyzing the Electrical Characteristics of Individual Semiconducting Nanowires in an Nanowire ArrayPeng, L.-M. et al. | 2008
- 6
-
Size Effects in the Vapor-Liquid Solid (VLS) Growth of Semiconductor NanowiresDickey, Ec et al. | 2008
- 8
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TEM Study of the Formation of GaSb Core-Shell NanofibersPerez-Bergquist, A. et al. | 2008
- 10
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In Situ Synthesis of Fe Catalyst and Carbon Nanotubes by Chemical Vapor DepositionMoore, Es et al. | 2008
- 12
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Interdiffusion or Beam Spreading? Asymmetric Interface Profiles in LaVO3-SrTiO3 HeterostructuresKourkoutis, Lf et al. | 2008
- 14
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Strucuture of Low Loss EELS in Hf and Zr Metal, Dioxides and SilicatesShivaraman, R. et al. | 2008
- 16
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Electrostatic Potential Mapping across AlGaAs-AlAs-GaAs HeterostructureChung, S. et al. | 2008
- 18
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Probing Asymmetric Interfaces of LaMnO3 - SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron MicroscopyShah, Ab et al. | 2008
- 20
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Characterization of Nanodevices by using In-Situ TEM-STMKim, J. et al. | 2008
- 22
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Single Flat Gold Nanoparticle Microscopy and SpectroscopyTennyson, Wd et al. | 2008
- 24
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Characterization of the Organic-Inorganic Interface of Abalone Shell NacreLiu, Ww et al. | 2008
- 26
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Quantitative Evaluation of Auger Depth Profiles by LOGITOgiwara, T. et al. | 2008
- 28
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Comparison of Sample Preparation Methods for Analysis of Biological Samples by High Vacuum TechniquesDenault, L. et al. | 2008
- 30
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Transient Structural Studies of Nanoparticles Using Electron DiffractionRuan, C.-Y. et al. | 2008
- 32
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Optimization of Ultrafast Photo-electron Sources for DTEMSchroeder, Wa et al. | 2008
- 34
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Applications of Integrated Electron and Ion Beam Micro and Nanoanalysis to Understanding Earth and Planetary Materials.Brearley, Aj et al. | 2008
- 36
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Keilite (Fe>0.5, Mg<0.5)S as an indicator of extensive impact melting on enstatite chondrite parent asteroidsKeil, K. et al. | 2008
- 38
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Systematics of Cathodoluminescence and Trace Element Compositional Zoning in Natural Quartz from Volcanic Rocks: Ti mapping in QuartzLeeman, Wp et al. | 2008
- 40
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Orientation Imaging Microscopy of Stray Grain Formation in Single Crystal Weld StructuresAnderson, T. et al. | 2008
- 42
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The Role of Microscopy in the NIST World Trade Center InvestigationBanovic, S. et al. | 2008
- 44
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Quantitative Analysis of Fracture Surfaces Using Image AnalysisMurphy, Tf et al. | 2008
- 46
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Evaluation of Trimetallic JointDennies, Dp et al. | 2008
- 48
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Improper Weld Repair of a CF8M Cast Stainless Steel ImpellerSchmidt, Fe et al. | 2008
- 50
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What's New With U: Recent Advances In Uranium MetallographyKelly, Am et al. | 2008
- 52
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Ion Beam Surface Preparation of Uranium for EBSDCarpenter, Da et al. | 2008
- 54
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Off-Axis Electron Holography of Magnetic Fields in Biological MaterialsDunin-Borkowski, Re et al. | 2008
- 56
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WetSEM: Cell Surface Characteristics as Reporters for Cellular Energy StatePluk, H. et al. | 2008
- 58
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X-ray Microscopy of Soft MatterAde, H. et al. | 2008
- 60
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The FARSIGHT Project: Associative 4D-5D Image Analysis Methods for Quantifying Complex and Dynamic Biological MicroenvironmentsRoysam, B. et al. | 2008
- 62
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Confocal Microscopy Reveals Molecular Interactions Between DNA-binding Drugs and Chromatin in Live CellsDobrucki, Jw et al. | 2008
- 64
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Soft X-ray Tomography Generates Quantitative Images of Whole Cells Using Intrinsic ContrastLe Gros, Ma et al. | 2008
- 66
-
Development of a Versatile Apertureless Near-field Microscope for Biological and Material ApplicationsSánchez, Ej et al. | 2008
- 68
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Driving CARS into Biomedical FieldCheng, J.-X. et al. | 2008
- 70
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Hyperspectral Imaging in TEM: New Ways of Information Extraction and DisplaySchaffer, B. et al. | 2008
- 72
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X-ray Absorption Spectroscopy and Spectrum-Imaging in the SEMHunt, Ja et al. | 2008
- 74
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Aspects of Using a Boersch Type Phase Shifting Device for Contrast Enhancement in Macromolecular Electron MicroscopyTypke, D. et al. | 2008
- 76
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Spectroscopic Imaging Detectors for Electrons and X-raysStrüder, L. et al. | 2008
- 78
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Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy - Recent Advances on the TEAM 0.5 InstrumentKisielowski, C. et al. | 2008
- 80
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Breaking Down Barriers: Using Microscopy to Demystify Science and Change Students' Perspective of Their WorldJohnson, Cb et al. | 2008
- 82
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The Electron Microscopy Database: Example Data Sets for Teaching and Learning Quantitative TEMVoyles, Pm et al. | 2008
- 84
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Instruction and Training at the University of Georgia EM LabShields, Jp et al. | 2008
- 86
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Electronic Training Resource for Higher EducationSchierbeek, K. et al. | 2008
- 88
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Quantitative analyses of early stages of phase transformation by atom probe tomographyMarquis, Ea et al. | 2008
- 90
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Ionization of inner shells of atoms by electron impactSalvat, F. et al. | 2008
- 92
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopyNellist, Pd et al. | 2008
- 94
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Applications of Scanned Probe Microscopy in Physical SciencesRussell, Pe et al. | 2008
- 96
-
Towards multi-scale 3D biological imaging: The role of dual-beam serial sectioningGilpin, Cj et al. | 2008
- 98
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Detecting nanoparticles in cells using FIB-EDSScott, K. et al. | 2008
- 100
-
In-situ Mechanical Testing of Micro-Sized Specimens Fabricated by FIBWheeler, R. et al. | 2008
- 102
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Using Light Microscopy in the Analysis of Textile MaterialsSullivan, Ml et al. | 2008
- 104
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Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopesNellist, Pd et al. | 2008
- 106
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Supermontaging: Reconstructing Large Cellular Volumes by Stitching Together Laterally Adjacent TomogramsMastronarde, Dn et al. | 2008
- 108
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Specimen Heterogeneity Analysis RevisitedMeisenkothen, F. et al. | 2008
- 110
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Determining Bulk Chemical Compositions of Chondrules by Electron Microprobe: Modal Recombination versus Defocused Beam AnalysesBerlin, J. et al. | 2008
- 112
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Trace-element Analyses in Lunar Meteorite Sayh al Uhaymir 169Zeigler, Ra et al. | 2008
- 114
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Impact of 40 Years of Technology Advances on EDS System PerformanceMccarthy, Jj et al. | 2008
- 116
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Results from Two Four-Channel Si-drift Detectors on an SEM: Conventional and Annular GeometriesKotula, Pg et al. | 2008
- 117
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Cell Patterning: Interaction of Cardiac Myocytes and Fibroblasts in Three-Dimensional CultureBaudino, T.A. / McFadden, A. / Fix, C. / Hastings, J. / Price, R. / Borg, T.K. et al. | 2008
- 118
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Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer ScaleVladár, Ae et al. | 2008
- 120
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Backscattered Electron Imaging in the Scanning Electron Microscope: the Use of Either: (a) High Incident Energy or (b) an Array DetectorGignac, Lm et al. | 2008
- 122
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Cryopreparation for Interfacial Atom-Probe AnalysisPanitz, Ja et al. | 2008
- 124
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Advantages of Using a Digital Detector for Field Ion MicroscopyUlfig, Rm et al. | 2008
- 126
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Numerical Calculation of Secondary Fluorescence Effects Near Phase Boundaries in EPMAEscuder, Ja et al. | 2008
- 126
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On the Experimental Use of Light Metal Salts for Negative StainingMassover, W.H. et al. | 2008
- 128
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Using molecular envelope information derived from SAXS and EM for cystallographic phasingHao, Q. et al. | 2008
- 130
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Global Interactive Docking and Hessian Filtering for Multi-Resolution Fitting of Biomolecular AssembliesHeyd, J. et al. | 2008
- 132
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyMuller, Da et al. | 2008
- 134
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Application of Monochromated Electrons in EELSSigle, W. et al. | 2008
- 136
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Atomic-Resolution STEM at 60kV Primary VoltageDellby, N. et al. | 2008
- 138
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Lorentz Microscopy: A Versatile Technique for Studying Magnetic Multilayers, Elements and NanowiresChapman, Jn et al. | 2008
- 138
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Lysosomal Cholesterol Accumulation Inhibits Subsequent Hydrolysis of Lipoprotein Cholesteryl EsterJerome, W.G. / Cox, B.E. / Griffin, E.E. / Ullery, J.C. et al. | 2008
- 140
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Three Dimensional (3D) Visualization of Damage in Metal-Ceramic Nanolayers by Focused Ion Beam (FIB) Serial SectioningChawla, N. et al. | 2008
- 142
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Microstructural and Interface Analysis of Ceramic Eutectic CompositesDickey, Ec et al. | 2008
- 144
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A Tubular Scaffold that Modulates Differentiation of Rat Bone Marrow Stem CellsPotts, J. et al. | 2008
- 146
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Human Ciliopathies: An Overview of The First One Hundred YearsCarson, Jl et al. | 2008
- 148
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Switchgrass for Biofuels: Insights through MicroscopySarath, G. et al. | 2008
- 150
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Correlation between Enterococcus faecalis Biofilms Development Stage and Quantitative Surface Roughness Using Atomic Force MicroscopySantos, R.P. / Arruda, T.T.P. / Carvalho, C.B.M. / Carneiro, V.A. / Braga, L.Q.V. / Teixeira, E.H. / Arruda, F.V.S. / Cavada, B.S. / Havt, A. / de Oliveira, T.M. et al. | 2008
- 150
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Structure of Porous Starch Microcellular Foam ParticlesGlenn, Gm et al. | 2008
- 152
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Visualizing Dynamic Immune Cell Interaction and Function with Two-photon MicroscopyTong, C. et al. | 2008
- 154
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Lemons to Lemonade (EM Techniques for Salvaging Suboptimal Specimens)Miller, Se et al. | 2008
- 156
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Nannobacteria, Organic Matter, and Precipitation in Hot Springs, Viterbo, Italy: Distinctions and RelevanceKirkland, Bl et al. | 2008
- 158
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Flexibility, Heterogeneity and Resolution in Single Particle ReconstructionLudtke, S. et al. | 2008
- 159
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Immunolabeling for Correlative Light and Electron Microscopy on Ultrathin CryosectionsKandela, I.K. / Bleher, R. / Albrecht, R.M. et al. | 2008
- 160
-
Packaging of Proteins into Viral Capsids and their ActivationHeymann, Jb et al. | 2008
- 162
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Single Particle Reconstruction of Yeast RNA Degradation Machine, Exosome, Using Electron MicroscopyWang, Hw et al. | 2008
- 164
-
Pharmaceutical Research Applications of Transmission Electron Microscopy of Mammalian Cells in CultureMegill, Jr et al. | 2008
- 166
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Quantitative Energy Dispersive X-ray Microanalysis of Electron Beam-Sensitive Alloyed NanoparticlesBraidy, N. / Jakubek, Z.J. / Simard, B. / Botton, G.A. et al. | 2008
- 166
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Negative Stain Transmission Electron Microscopy Quality Assessment of Viruses and Recombinant Virus-Like ParticlesHumphrey, Cd et al. | 2008
- 168
-
3D Scanning Transmission Electron Microscopy for Catalysts: Imaging and Data AnalysisBorisevich, Ay et al. | 2008
- 170
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Cs-corrected STEM studies of Ge nanodots grown on slightly oxidized Si(001) surfacesTanaka, N. et al. | 2008
- 172
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Direct Observation of Au Nanoislands on TiO2 (110) Surface by HAADF STEMShibata, N. et al. | 2008
- 174
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Precise Measurement of the Metal Nanocluster Size in a Supported Catalyst: Ta-SiO2Mehraeen, S. et al. | 2008
- 176
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Oxide Support Modification during Pd Particle Aging at Elevated TemperaturesGoeke, Rs et al. | 2008
- 176
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Development and Application of an Internet Electron Microscopy System for the Outreach Program in JapanTanaka, M. / Tameike, A. / Ishikawa, N. / Furuya, K. et al. | 2008
- 178
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Imaging of Gold Nanoparticles within Mesoporous Silica SupportsGabaldon, Jp et al. | 2008
- 180
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Methods for location of palladium catalyst nanoparticles in mesoporous silicatesQian, H. et al. | 2008
- 182
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Support Effects on Adatom Emission from NanoparticlesHouk, L. et al. | 2008
- 184
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Luminescence Database I-Minerals and MaterialsMacRae, C.M. / Wilson, N.C. et al. | 2008
- 184
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Size-dependent crystallinity and relative orientations of nano-Pt-γ-Al2O3Li, L. et al. | 2008
- 186
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Microstructural Characterization of Colloid-Derived Bimetallic Pd-Cu Nanocatalysts Supported on γ-Al2O3 for Nitrate ReductionLiu, Z. et al. | 2008
- 188
-
Electron Microscopy of Nanodevices: In Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon NanotubesZuo, Jm et al. | 2008
- 190
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Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization ChemistryHitchcock, Ap et al. | 2008
- 192
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Imaging of magnetite nanoparticle ferrofluid under the influence of magnetic field by Cryo-TEMWu, Js et al. | 2008
- 194
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Diameter-Dependent Microstructure, Electronic Structure and Transport Properties of Bi NanowiresZhang, Q. et al. | 2008
- 196
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New Insights into the Nanowire Nucleation and Growth KineticsKodambaka, S. et al. | 2008
- 198
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Structure of Coated Ge-nanowiresKlementová, M. et al. | 2008
- 200
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Study of Au Nanoparticle Catalyzed Growth Processes of ZnO NanowiresWang, J. et al. | 2008
- 202
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Well Aligned ZnO-ZnSe Coaxial Nanocable Array on Transparent Conducting Oxide Substrate for Solar CellsWang, K. et al. | 2008
- 204
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Direct Imaging of Point Defect Configurations for Au inside Si NanowiresBenthem, K.van et al. | 2008
- 205
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Force Microscopy: Applications in Biology and Medicine. Edited by Bhanu P. Jena and J.K. Heinrich HorberAnderson, L.L. et al. | 2008
- 206
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Catalyst Dynamics during Carbon Nanotube and Si Nanowire CVDHofmann, S. et al. | 2008
- 208
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Assembly, Analysis and Functionalization of Complex Epitaxial NanostructuresHull, R. et al. | 2008
- 210
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Solid State Synthesis and Crystal Structure of Ca10(VxP1-xO4)6F2 ApatiteDong, Z. et al. | 2008
- 212
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Nanoscale Disorder in MgB2 Thin Films Grown by Hybrid Physical-Chemical Vapor DepositionZhu, Y. et al. | 2008
- 214
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Mechanistic Control of the Nucleation and Growth Conditions for Narrow Composition Distributions in FePt NanoparticlesSrivastava, C. et al. | 2008
- 216
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In-situ Z-STEM Imaging of Chemical Ordering in FePt Magnetic NanoparticlesWittig, Je et al. | 2008
- 218
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Surface Segregation and Ordering in Pt3Co Nanoparticles Observed by Aberration-Corrected STEMFerreira, Pj et al. | 2008
- 220
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FePt (core)-FeRh (shell) Nanoparticles: Structure and MagnetismShamsuzzoha, M. et al. | 2008
- 222
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Structure of Complex Oxides in High Electric FieldsGrigoriev, A. et al. | 2008
- 224
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Determination of Zener-Polaron-Type Charge and Orbital Ordering in Pr1-xCaxMnO3 ManganiteWu, L. et al. | 2008
- 226
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TEM Characterization of Microtwins in VOx thin filmsLi, J. et al. | 2008
- 228
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TEM Characterization of Nanometer-Scale Spinel -Rocksalt Phase Decomposition in Nickel Magnanite Thin FilmLi, J. et al. | 2008
- 230
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The Life Cycle of Metal Oxide SensorsMeier, Dc et al. | 2008
- 232
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Plan-view TEM Study on Interfacial Structure of (La, Ca)MnO3-MgOJiang, Jc et al. | 2008
- 234
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SrO Segregation on High-energy SrLaAlO4 surfacesBecerra-Toledo, Ae et al. | 2008
- 236
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Disordered Vanadium Oxide Thin Films for Use in Infrared DetectionGauntt, Bd et al. | 2008
- 238
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On Mapping Ferroelectric Fields by Medium-Resolution Electron HolographySchofield, Ma et al. | 2008
- 240
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Misfit Dislocations in Ferroelectric Thin filmsArredondo, M. et al. | 2008
- 242
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Synthesis of Nanostructures using Electron Beam Induced DepositionKruit, P. et al. | 2008
- 244
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Fabrication and Application of Nanopores using TEM, STEM and Ion BeamsBell, Dc et al. | 2008
- 246
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In situ Microscopy: A Tool to Understand MechanismsBasu, J. et al. | 2008
- 248
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Nanopatterning and Grain Growth in FluoridesMöbus, G. et al. | 2008
- 250
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Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEMShan, Zw et al. | 2008
- 252
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Self Healing Nanoparticles: In-situ High-Resolution TEM Indentation of NanoparticlesCarlton, Ce et al. | 2008
- 254
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Analytical Electron Microscopy of InN thin films Prepared by Pulsed Laser DepositionDrazic, G. et al. | 2008
- 256
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Microstructural Characterization of InN-GaN Multiple Quantum WellsZhou, L. et al. | 2008
- 258
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Structural Analysis of Threading Dislocations in AlN Thin FilmsTokumoto, Y. et al. | 2008
- 260
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Synthesis and Microstructure of ZnO films deposited on (0001) and r-cut α-Al2O3 using MOCVDWang, Cm et al. | 2008
- 262
-
Study of Pd-ZnO Nanocatalysts for Hydrogen ProductionLiu, J. et al. | 2008
- 264
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Tin catalyzed growth of ZnO nanostructuresWang, J. et al. | 2008
- 266
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TEM-QED Study of FePt Ultrathin Films and Co-CoO Core-Shell ParticlesLi, Xz et al. | 2008
- 268
-
Novel 2212-based Fe-rich strontium ferrites: layered and collapsed structuresMalo, S. et al. | 2008
- 270
-
Microscopy of Clathrate Compounds: Determining the Structure and Hydrogen Encapsulation Properties Through Aberration-Corrected HAADF-STEMRamasse, Qm et al. | 2008
- 272
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Preparation of Nanoplatelets Using Vacuum Roll CoatingPoenitzsch, Vz et al. | 2008
- 274
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Phase Formation as a Function of Substrate Temperature in Thin Layers of BiTe grown by CSVTCruz-Gandarilla, F. et al. | 2008
- 276
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Synthesis and Characterization of Gold Nanostars, Nanowires and NanoboxesTiruvalam, Rc et al. | 2008
- 278
-
Investigation of Beam Damage Mechanism of Ball-milled MgH2 PowderDanaie, M. et al. | 2008
- 280
-
Combined Structural and Chemical Investigations of Ceria Nanoparticles in the TEMWinterstein, Jp et al. | 2008
- 282
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Ex Situ and In Situ Synthesis and Characterization of Nickel Nanoparticles on High Surface Area Silica SupportBanerjee, R. et al. | 2008
- 284
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3D characterization and metrology of nanostructures by electron tomographyHernandez, Jc et al. | 2008
- 286
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Release and Agglomeration Behavior of Nanoscale Iron Core from Carbon-encapsulated Iron Nanoparticles by in-situ TEM ObservationLiu, Z. et al. | 2008
- 288
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Synthesis, Rietveld Refinement and High Resolution Transmission Electron Microscopy of Yb doped Silicate Oxyapatite for Ultrafast Laser SystemsShen, Yq et al. | 2008
- 290
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Electron Microscopy Characterization of High Yield Growth of Thin TiO2 NanowiresLi, H. et al. | 2008
- 292
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Electron Microscopy Characterization of Pd-Ce Interaction on α-Al2O3 SupportMoreno, Ms et al. | 2008
- 294
-
Structural and Electron Field Emission Propereties of Fe-doped GaN NanowiresChen, Y. et al. | 2008
- 296
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Growth and Characterization of InP Nanowires on Si(111)Pozuelo, M. et al. | 2008
- 298
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Novel Fabrication of Carbon Nanotube Vias for VLSI InterconnectsWu, J. et al. | 2008
- 300
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Characterization of Nanocomposite Materials using Electron MicroscopyRangari, Vk et al. | 2008
- 302
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Synthesis and Interfacial Characterization of Au Nanoparticles on Si NanowiresSayed, Sy et al. | 2008
- 304
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Electron Microscopy and Raman Characterization of Multi-Walled Carbon Nanotubes Grown by Chemical Vapor DepositionEllis, M. et al. | 2008
- 306
-
STEM Studies of Novel Gold CatalystsLupini, Ar et al. | 2008
- 308
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Sol-gel Prepared Cu-Ce-Ni Nanoparticle Alumina Catalysts for WGS Hydrogen ProductionSeetala, Nv et al. | 2008
- 310
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Characterization of Y2O3-MgO Nanostructures Prepared by Argon Shrouded-Plasma SprayingAl-Sharab, Jf et al. | 2008
- 312
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SHG detection on Glycine-Lithium Nitrate crystalsValenzuela, Ra González et al. | 2008
- 314
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Hollow ZnO Structures Formed by Evaporating Zn and InI3 MixtureLi, C. et al. | 2008
- 316
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TEM-SEM Studies of microstructural transformations in ultrathin TiDy-Pd films evaporated on Si(100) after TDMS induced decomposition of the TiDy phaseKeim, Eg et al. | 2008
- 318
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High Resolution HAADF-STEM Imaging Analysis of N related defects in GaNAs Quantum WellsHerrera, M. et al. | 2008
- 320
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Crystalline behavior and microstructure analysis in Fe73.28Si13.43B8.72Cu0.94Nb3.63 alloy with annealing temperatureOh, Yh et al. | 2008
- 322
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In-situ Observation of Nano-particulate Gold Catalysts under Reaction Gas and Non-reaction Gas ConditionsKawasaki, T. et al. | 2008
- 324
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Arsenic Segregation to Dislocation Loops in SiliconLarson, Dj et al. | 2008
- 326
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Ni-Cu-Zn Ferrite Prepared by Aloe Vera Plant Extract or Egg WhiteDuong, B. et al. | 2008
- 328
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Anodic Tantalum Pentoxide: Chemical and Structural Characterization of a Bi-Layer OxideSloppy, J.Ray et al. | 2008
- 330
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Characterization of TaN thin films synthesized by ICP assisted sputteringBaik, S.-I. et al. | 2008
- 332
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Effect of Charge and Discharge on the Capacitance of Supercapacitor of Hydrous Ruthenium Oxides and Carbon Nanotube CoatingsHwang, H.-S. et al. | 2008
- 334
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Crystallite Morphology of Rutile TiO2 Nanocrystals: A TEM StudyKuznetsov, Ay et al. | 2008
- 336
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Thin Film Properties Measurement using SEM-based Energy Dispersive Spectroscopy for Nanoscience StudiesSharp, S. et al. | 2008
- 338
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Morphology Effects on Photocatalytic Activity of Niobate MaterialsSarahan, Mc et al. | 2008
- 340
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Dual-Axis STEM Tomography of Dy-doped YBa2Cu3O7-x Coated SuperconductorsOrtalan, V. et al. | 2008
- 342
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Microstructural Investigation of the Most Efficient Vortex Pinning in a Superconducting YBa2Cu3O7 Thin FilmKametani, F. et al. | 2008
- 344
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Experimental and Simulated Strain Field Maps in Stacked Quantum WiresBen, T. et al. | 2008
- 346
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Microstructure of Ferroelectric BaTiO3 Thin Films on Ti SubstrateHe, J. et al. | 2008
- 348
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Beam-induced Changes of FePt Nanoparticles during STEM In-situ AnnealingWittig, J. et al. | 2008
- 350
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Low Energy Electron Holography of Charged TipMcmorran, B. et al. | 2008
- 352
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Microstructure Characterization of FePt-Ti-Si Thin FilmsZhang, Y. et al. | 2008
- 354
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Crystal structure of TiO2 Nano-particlesPokrant, S. et al. | 2008
- 356
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Effect of Nitrogen Incorporated Methods on Optical Properties of InAs-GaAs Quantum DotsChiung-Chih, H. et al. | 2008
- 358
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Modeling of Periodic Ordered Nanostructures:Shape-evolution and Shape-Control During Precipitation of Inorganic Precursors and UreaBakardjieva, S. et al. | 2008
- 360
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Electron Microscopy Analysis of CdS Coated Diatom Cell WallsGutu, T. et al. | 2008
- 362
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ELNES of Al-Al4C3 Nanoparticles Produced By Mechanical MillingSantos-Beltrán, A. et al. | 2008
- 364
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Selective Dealloying with Supercritical Carbon DioxideDorame, K. et al. | 2008
- 366
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Pt Nanoparticles by EELS and ab initio calculationsGochi-Ponce, Y. et al. | 2008
- 368
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Microstructural Characterization of Aluminum - Silver Nanoparticles Composites Produced by Mechanical MillingMendoza-Ruiz, Dc et al. | 2008
- 370
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Phase Separation and Crystallization of Magnetic Nanoparticles in a Borosilicate GlassIii, Ma Laurenzi et al. | 2008
- 372
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XAS and grazing angle XRD of the CoTi2 thin films grown by DC co-sputtering techniqueYocupicio-Villegas, I. et al. | 2008
- 374
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Complementary Microscopy Techniques for Characterizing NanostructuresBasu, J. et al. | 2008
- 376
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Coupling LEAP and HRSTEM to study the nanoscale structure and chemistry of interfacesSrinivasan, R. et al. | 2008
- 378
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Nanotech drives imaging toward faster, sleeker, more economicFoster, B. et al. | 2008
- 380
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Advances in TEM Sample Preparation Using a Focused Ion BeamLeer, B.Van et al. | 2008
- 382
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Sample Preparation Considerations for Electron Microscopy Characterization of Nano-MaterialsWalck, Sd et al. | 2008
- 384
-
Challenging Analysis for the Gate Stack and Strained Channel of the Advanced CMOSLian, G. et al. | 2008
- 386
-
Quantitative Strain Measurement in Sub-45 nm CMOS Transistors by Convergent Beam Electron Diffraction (CBED) at Low Temperature and Nano Beam Diffraction (NBD)Clement, L. et al. | 2008
- 388
-
Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS DevicesChung, J. et al. | 2008
- 390
-
EFTEM- and STEM-EDXS Spectral Imaging of "Hidden" Si-based Semiconductor Device DefectsSchamp, Ct et al. | 2008
- 392
-
EBIC Targeting for Dual Beam FIB Based TEM Sample PreparationPresser, N. et al. | 2008
- 394
-
Tunneling Magnetoresistance and B Diffusion in CoFeB-MgO-CoFeB Magnetic Tunnel Junctions Characterized by STEM-EELSCha, Jj et al. | 2008
- 396
-
Structural Analysis for Luminous Defects on GaN Epitaxial LayersYongchoon, P. et al. | 2008
- 398
-
In-situ probing the electrical, mechanical, and thermal properties of individual carbon nanotubes and nanowires by using a TEM-SPM platformHuang, J.-Y. et al. | 2008
- 400
-
In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron HolographyHan, M. et al. | 2008
- 402
-
P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical MeasurementPark, Sy et al. | 2008
- 404
-
Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron HolographyLi, L. et al. | 2008
- 406
-
Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin FilmsJohn, Db Saint et al. | 2008
- 408
-
Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron MicroscopyMahalingam, K. et al. | 2008
- 410
-
CNT-FET Schottky Barrier Devices Fabricated by E-beam LithographyPerello, D. et al. | 2008
- 412
-
TEM Characterization of Nanoindentation in Nanoscale Metallic MultilayersBhattacharyya, D. et al. | 2008
- 414
-
TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP NanowiresBell, Dc et al. | 2008
- 416
-
Characterization of CNTs-Al dispersions using FE-TEM and FE-SEMPoirier, D. et al. | 2008
- 418
-
Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping LayersLebeau, Jm et al. | 2008
- 420
-
Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO2 Induced by Ion IrradiationZaluzec, Nj et al. | 2008
- 422
-
A TEM Study of Alkaline-Earth Metal Hexaboride NanowiresLi, S. et al. | 2008
- 424
-
4D STEM-EELS Characterization of Au Nanodots in a ZnO Thin FilmLeonard, Dn et al. | 2008
- 426
-
Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEMChang, Ly et al. | 2008
- 428
-
Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3-(111) SrTiO3Gunawan, L. et al. | 2008
- 430
-
Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in CeriaWang, R. et al. | 2008
- 432
-
Deep RIE and Cryo-Etching of Nanostructures in Silicon and PolymersDerose, G. et al. | 2008
- 434
-
Nanobead Formation and Nanopatterning in GlassesMöbus, G. et al. | 2008
- 436
-
Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron MicroscopyYang, G. et al. | 2008
- 438
-
Characterization of Al In GaN-GaN Heterointerface by HAADF-STEM and Electron HolographyTakeguchi, M. et al. | 2008
- 440
-
Preparation and characterization of titanate nanotubesKlementová, M. et al. | 2008
- 442
-
Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam IrradiationIii, Ma Laurenzi et al. | 2008
- 444
-
Tomography of High-k Dielectrics on Fin-FET SidewallsForan, B. et al. | 2008
- 446
-
Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applicationsGarcia-Gutierrez, Di et al. | 2008
- 448
-
Exploring the Morphological Diversity of Amyloid's Cross-β StructureChilders, Ws et al. | 2008
- 450
-
Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate FilmsZhang, L. et al. | 2008
- 452
-
Interface Structure of a V2O3 Layer Grown on Cu3Au (001) by Cs Corrected Transmission Electron MicroscopyCalderon, H. et al. | 2008
- 454
-
Performance Advantages of a Modern, Ultra-High Mass Resolution Atom ProbeClifton, P. et al. | 2008
- 456
-
Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing TechniqueProsa, T. et al. | 2008
- 458
-
Microstructural Investigation of Pd-Pt-Au and Pd-Ru-Au Ohmic Contacts to InAlSb-InAs Heterostructures for High Electron Mobility TransistorsZhang, Q. et al. | 2008
- 460
-
Nanofabrication by 3D E-beam CuttingGnanavel, T. et al. | 2008
- 462
-
Characterization with TEM of AlN-GaN Heterostructures for Implant Activation AnnealingZheleva, Ts et al. | 2008
- 464
-
Characterizing Nanomaterials by Combining Electron Microscopy and Surface AnalysisGaspar, Dj et al. | 2008
- 466
-
Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMSHammond, Js et al. | 2008
- 468
-
Analysis of Multi-Component Polymer Blends with the Confocal Raman AFMSchmidt, U. et al. | 2008
- 470
-
Surface Microscopy and Microanalysis in the Medical Device IndustryBelu, Am et al. | 2008
- 472
-
New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic DataArtyushkova, K. et al. | 2008
- 474
-
Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon NanotubesBajaj, P. et al. | 2008
- 476
-
Probing Polymeric Interfaces with Synchrotron TechniquesLenhart, Jl et al. | 2008
- 478
-
Surface Versus Bulk Defects on Devices using Complementary TechniquesSmentkowski, Vs et al. | 2008
- 480
-
Evaluation of Chemical State Analysis and Imaging by Micro XPSIwai, H. et al. | 2008
- 482
-
Single-Shot Dynamic Transmission Electron Microscopy: Present and FutureReed, Bw et al. | 2008
- 484
-
Lights, Action, Camera: Making Movies of Molecules (and Materials) with Femtosecond Electron DiffractionSiwick, Bj et al. | 2008
- 486
-
Time-Resolved Electron Microscopy: Accomplishments, Challenges, and the Future DirectionsLobastov, Va et al. | 2008
- 488
-
Dynamic Studies by Repetively Pulsed and Pump-probe MicroscopyHowie, A. et al. | 2008
- 490
-
Exanding In-situ Mechanical Testing into the "Ultrafast" RegimeStach, Ea et al. | 2008
- 492
-
Benefits of Aberration Correction for Ultra-Fast TEM ExperimentsKabius, B. et al. | 2008
- 494
-
Extreme Beams for Single-shot Ultrafast Electron DiffractionLuiten, J. et al. | 2008
- 496
-
Review of Single Shot Electron Diffraction Experiments with Sub ps Resolution Using an RF Gun Electron SourceSchmerge, Jf et al. | 2008
- 498
-
Optimizing the RF Photoinjector for Ultra-fast Electron DiffractionRosenzweig, Jb et al. | 2008
- 500
-
A Quantum-degenerate Electron SourceZolotorev, M. et al. | 2008
- 502
-
Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at SurfacesPark, H. et al. | 2008
- 504
-
Particle Swarm Optimization of Iterative Phase Retrieval Algorithms for Ultrafast Coherent Diffractive ImagingMasiel, D. et al. | 2008
- 506
-
Electron Backscatter Diffraction: Operation and ApplicationsField, Dp et al. | 2008
- 508
-
Making the most of small extraterrestrial samples: Chemical and isotopic information for chondrules obtained using multiple microbeam techniques.Jones, R. et al. | 2008
- 510
-
Digesting meteorites to decipher asteroids: The work of eugene jarosewichMccoy, Tj et al. | 2008
- 512
-
Challenges and Results of Real Comet Dust Analyses: The Stardust MissionRietmeijer, Fjm et al. | 2008
- 514
-
X-ray Mapping Analyses of Lunar Meteorite Dhofar 961: Characterization and Origin of the Mafic Impact-Melt ComponentJolliff, Bl et al. | 2008
- 516
-
Development of Lunar Regolith Simulant: From the Macro to the MicroLowers, Ha et al. | 2008
- 518
-
NanoSIMS and TEM Studies of SiC and Si3N4 Supernova CondensatesStroud, Rm et al. | 2008
- 520
-
Recent Advances in Analytical Methods Used to Study Iron MeteoritesGoldstein, Ji et al. | 2008
- 522
-
Hyperspectral X-ray Analysis of Submicrometer-scale Heterogeneities in a Venerable Compositional Standard Provided by Nature: Kakanui HornblendeVicenzi, Ep et al. | 2008
- 524
-
Nanobeam Analysis of the Oxidation States of Transition Metals in Primitive Planetary MaterialsZega, Tj et al. | 2008
- 526
-
Mineral Recorders of Martian History: Reading the Record with Microbeam Trace Element Analyses.Shearer, Ck et al. | 2008
- 528
-
Smithsonian Microbeam Standards: Not Just Our Father's Microprobe StandardsRose, Tr et al. | 2008
- 530
-
EPMA Standards: The Good, the Bad, and the UglyCarpenter, Pk et al. | 2008
- 532
-
Quantitative Mineralogy of Fine-grained Sedimentary Rocks: A Preliminary Look at QEMSCAN®Grauch, Ri et al. | 2008
- 534
-
Laser Ablation ICP-MS in Geochemistry and Biogeochemistry: A Progress ReportRidley, Wi et al. | 2008
- 536
-
Chromium, Vanadium and Phosphorous Contents in Garnets from the Smithsonian Institution Reference Materials Collection: a Preliminary Examination by MicroanalysisLogan, Mav et al. | 2008
- 538
-
Microprobing MineralsHlava, P. et al. | 2008
- 540
-
New Mexico Underground: Extreme Geomicrobiology of Caves in the SouthwestSpilde, Mn et al. | 2008
- 542
-
Gemstone SynthesisHlava, P. et al. | 2008
- 544
-
Imaging Systems and Materials CharacterizationMurr, Le et al. | 2008
- 546
-
Examination of Sectioning Damage by EBSDLucas, Gm et al. | 2008
- 548
-
Delineation and Measurement of Grain Size by EBSDVoort, Gf Vander et al. | 2008
- 550
-
SEM and EBSD Investigations of High-Chromium Cast IronsHinckley, Bh et al. | 2008
- 552
-
In Situ EBSD of Microstructure Evolution During DeformationMishra, R. et al. | 2008
- 554
-
Metallographic Analysis of Aluminum Alloy AA 6061 for Quality Control and Process VerificationWang, Z. et al. | 2008
- 556
-
Challenges in Preparing Aluminum Alloys for Grain Boundary CharacterizationUnocic, Ka et al. | 2008
- 558
-
Characterization of Metallurgical Effects in Laser-Drilling of SuperalloysGarofano, Jkm et al. | 2008
- 560
-
Dynamic Tensile Extrusion Response of TantalumCao, F. et al. | 2008
- 562
-
Influence of Reinforcement Particles Addition and Processing Intensity on the Mechanical Properties in an Al-7075 Composite Produced by Mechanical MillingEstrada-Guel, I. et al. | 2008
- 564
-
Microstructural and Hot Extrusion Evaluation of Aluminum Alloy Al2024 During Mechanical Milling,Carreño-Gallardo, C. et al. | 2008
- 566
-
Effect of Metallized Graphite Addition and Milling Intensity on Final Powder Morphology in an Aluminum 7075 CompositeEstrada, I. et al. | 2008
- 568
-
Fractographs of Bending Fatigued Electrodeposited Nano-Crystalline NiLai, L.-C. et al. | 2008
- 570
-
A New Method for Fracturing Mineral Particles for Cross-Sectional FESEM AnalysisHuntington, C. et al. | 2008
- 572
-
Searching for the Limits of RIMAPS Technique ApplicationFuentes, No et al. | 2008
- 574
-
Microstructure and Fractography of Eutectoid Fe30Ni20Mn35Al15Liao, Y. et al. | 2008
- 576
-
Al-MWCNT Composites Obtained by Mechanical MillingPerez-Bustamante, R. et al. | 2008
- 578
-
A Study of the Ni-Ru-Y system at 1200°C using SEM and EDXCoetzee, Sh et al. | 2008
- 580
-
TEM and FESEM: The Right Combination for Enhanced Particle CharacterizationBunker, Kl et al. | 2008
- 582
-
Characterization of Flake Graphite Forms in Gray Iron through Image AnalysisLucas, Gm et al. | 2008
- 584
-
The Use of Color in Quantitative Image AnalysisSusan, Df et al. | 2008
- 586
-
Image Analysis in A Visual Programming EnvironmentLiang, L. et al. | 2008
- 588
-
Accuracy of Optical Dimensional Metrology at the Nano-scalePotzick, J. et al. | 2008
- 590
-
Speed Limitations and Trade-off's for SEM-EDS Particle AnalysisScheller, S. et al. | 2008
- 592
-
3D Metrology of Nanoparticles by Tomogram ProcessingXu, Xj et al. | 2008
- 594
-
Quantifying the layer dispersion degree in polymer layered silicate nanocomposites by quantitative transmission electron microscopyLuo, Zp et al. | 2008
- 596
-
BioImageXD software in batch analysis of integrin interactionsPahajoki, Ka et al. | 2008
- 598
-
Co-Relation of Double Diffraction Pattern and Coincident Site LatticeShamsuzzoha, M. et al. | 2008
- 600
-
Spectral Image Aberration Correction Using Image TransformationsNoek, Rm et al. | 2008
- 602
-
Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy ImagesSimmons, Jp et al. | 2008
- 604
-
Extracting Rich, Quantitative Information from Images Using Open-Source SoftwareCarpenter, Ae et al. | 2008
- 606
-
Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS)Heckmann, W. et al. | 2008
- 608
-
Improvements in automated photometric stereo 3D SEMPintus, R. et al. | 2008
- 610
-
Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEMSung, Zh et al. | 2008
- 612
-
Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 VehicleJohnson, Cn et al. | 2008
- 614
-
Metallurgical and Metallographic Aspects of Engineering Failure AnalysisStevenson, Me et al. | 2008
- 616
-
Microstructural Evaluation of Electron Beam Melted Ti-6Al-4VWooten, Jr et al. | 2008
- 618
-
Cosmetic Defects Due to Contamination in an Electroplated DepositWasag, Kr et al. | 2008
- 620
-
Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB-SEM System Equipped With a New Secondary Ion DetectorLaquerre, A. et al. | 2008
- 622
-
Failure Analysis of a Fractured Ductile Cast Iron BracketRaebel, S. et al. | 2008
- 624
-
Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN-AlN-GaN High Electron Mobility TransistorsLi, L. et al. | 2008
- 626
-
Identification of Surface Deposits found in Failures of Water Purification Filters and MembranesWilliard, Jn et al. | 2008
- 628
-
Failure Analysis of a Tree Pruner Saw Blade Anchor ScrewStevenson, Me et al. | 2008
- 630
-
Failure Analysis of Peelable Seals Utilizing Light and Transmission Electron MicroscopiesGarcia-Meitin, Ei et al. | 2008
- 632
-
Investigation of Microcracks in a Multilayered Coating of a Camera LensYu, Y.-S. et al. | 2008
- 634
-
Nanostructure origin of leakage current in GaN-InGaN lighting emitting diode using patterned sapphire substrateYoon, Y.-J. et al. | 2008
- 636
-
Evaluation of High Temperature Alloys in a Microturbine Recuperator Test RigHowe, Jy et al. | 2008
- 638
-
Electron Backscatter Diffraction (EBSD) Characterization of Twinning Related Deformation and Fracture in α-UraniumMccabe, Rj et al. | 2008
- 640
-
Preparation of Metal Surfaces for Optical Metallography and EBSD using Ion Beam PolishingBridges, B. et al. | 2008
- 642
-
Understanding stress corrosion cracking with electron tomographyLozano-Perez, S. et al. | 2008
- 644
-
Microstructural Analysis of Lead-Induced Transgranular SCC of Alloy 690 in PbO + 10% NaOH SolutionBurke, Mg et al. | 2008
- 646
-
Oxide Nanoparticle Dispersion in an ODS-Fe12Cr Model AlloyCastro, V.de et al. | 2008
- 648
-
High-Resolution Characterization of Oxygen Incorporation in Erbium Dihydride Thin FilmsParish, Cm et al. | 2008
- 650
-
Cathodoluminescence Microcharacterization of Electron Radiation Induced Defects in Borosilicate GlassesStevens-Kalceff, Ma et al. | 2008
- 652
-
Microanalysis of PlutoniumMatthews, M. et al. | 2008
- 654
-
Surface Preparation of Uranium and Uranium Alloys for Electron MicroscopyCartwright, T. et al. | 2008
- 656
-
Growth of Inclusions in Uranium-Niobium AlloyBrierley, M. et al. | 2008
- 658
-
Transmission Electron Microscopy Study of Uranium Thorium Zirconium Hydride FuelsTerrani, Ka et al. | 2008
- 660
-
Effects of annealing and ion implantation on the nano-structure of the ODS Eurofer 97 steelWilliams, C. et al. | 2008
- 662
-
Megapixel Quantitative EFTEM Imaging of Calcium in Biological SpecimensAronova, Ma et al. | 2008
- 664
-
Laboratory Sources for Soft-X-Ray Imaging of Hydrated Biological MaterialHunt, Ja et al. | 2008
- 666
-
Quantitative 3-D Imaging of Eukaryotic Cells using Soft X-Ray TomographyParkinson, Dy et al. | 2008
- 668
-
Imaging Carbon Nanoparticles in CellsGass, Mh et al. | 2008
- 670
-
Electron Microscopy Characterization of Composite Organic-Inorganic Nanoparticles (COINs) as Raman Labels for Extra-cellular AnalysesKoh, Al et al. | 2008
- 672
-
Negative Staining Produces Images of Proteins by Which Contrast Mechanisms?Massover, Wh et al. | 2008
- 674
-
The Real Carbon K-EdgeAlexander, Dtl et al. | 2008
- 676
-
Electron microscopy through thin film windows of cell cultures and liquid processes in microfluidic chipsMølhave, K. et al. | 2008
- 678
-
Evaluation of STEM-in-SEM vs. TEM for Polymer Applications in an Industrial SettingGuise, O. et al. | 2008
- 680
-
Life-Like Physical Fixation of Large Samples for Correlative MicroscopyRensing, K. et al. | 2008
- 682
-
ESEM, STEM-in-ESEM and 200 kV STEM Imaging of Soft Matter and Liquid-State SpecimensJonge, N.De et al. | 2008
- 684
-
Electron Irradiation Effects in Carbon Nanostructures: Surface Reconstruction, Extreme Compression and Nanotube GrowthTerrones, M. et al. | 2008
- 686
-
Multimodal Imaging of Nanostructures with FEG SEMMuto, A. et al. | 2008
- 688
-
Focused Ion Beam Processing of Polymeric Materials for Analytical Sample PreparationKooi, Se et al. | 2008
- 690
-
Spectroscopic Imaging of Soft MaterialsYakovlev, S. et al. | 2008
- 692
-
Advanced Transmission Electron Microscopy for Functional Polymer SystemsLoos, J. et al. | 2008
- 694
-
Quantitative STEM and EFTEM Characterization of Dendrimer-Based Nanoparticles Used in Magnetic Resonance Imaging and Drug DeliverySousa, A. et al. | 2008
- 696
-
Surface characterization of amphiphilic polymer networksTaylor, Nm et al. | 2008
- 698
-
Characterization of Closed-Cell Foam Skin Thickness by Backscatter Electron Imaging in an SEMTodd, Cs et al. | 2008
- 700
-
Use of X-ray Micro Computed Tomography in the Evaluation of Bread Crumb StructureLape, Ad et al. | 2008
- 702
-
Quantum Dots - Utilization in TEMKing, J. et al. | 2008
- 704
-
Two Methods of Conductive Coating for Scanning Electron Microscopy of Maize Weevils (Sitophilus zeamais) Compared by Energy Dispersive SpectroscopyPendleton, Mw et al. | 2008
- 706
-
Lab-Tek Chamber Slide for EM Prep: New Protocols for in situ Ultrastructural Study of Monolayer CulturesHazen, M. et al. | 2008
- 708
-
A Simple Method to Enumerate T4 Phages by Scanning Electron MicroscopyModla, S. et al. | 2008
- 710
-
Imaging Quantum Dots (Qdots) Oligomer Networks with Confocal Fluorescence Laser Scanning and Transmission Electron Microscopy (CFLSM and TEM)Vundyala, N. et al. | 2008
- 712
-
Detection of As, Cd and Pb in walnuts by using EXAFS spectrometry.Gallegos-Loya, E. et al. | 2008
- 714
-
Live Cell Imaging: Building the Perfect System for the Core Imaging FacilityWatkins, Sc et al. | 2008
- 716
-
High-Throughput Multiphoton Tissue CytometrySo, Ptc et al. | 2008
- 718
-
Controlled Light Exposure Microscopy (CLEM) for prolonged live-cell imaging and strongly reduced photobleachingHoebe, R. et al. | 2008
- 720
-
Laser Sources For Improved Optical MicroscopyMcconnell, G. et al. | 2008
- 722
-
A Novel Software Algorithm for the Quantitative Assessment of Fluorescent Reporter Proteins in Multi-Cellular Tumor SpheroidsRoux, L.Le et al. | 2008
- 724
-
BioImageXD - Free Microscopy Image Processing SoftwareKankaanpää, Pp et al. | 2008
- 726
-
Robust Adaptive 3-D Segmentation of Vessel Laminae from Fluorescence Confocal Microscope Images & Parallel GPU ImplementationNarayanaswamy, A. et al. | 2008
- 728
-
Confocal Microscopy and Optical Contrast Agents for In Vivo Detection Of CancerPierce, Mc et al. | 2008
- 730
-
Confocal Microscopy of Thick Tissue Sections: 3D Visualization of Rat Kidney Glomeruli.Zucker, Rm et al. | 2008
- 732
-
A fluorescence technique for identifying distribution of endophytic fungi in perennial grassKane, K. et al. | 2008
- 734
-
Optimizing Imaging of 3D Multicellular Tumor Spheroids with Fluorescent Reporter Proteins using Confocal MicroscopyRoux, L.Le et al. | 2008
- 736
-
Second Harmonic Generation Imaging Studies of Diseased StatesNadiarnykh, O. et al. | 2008
- 738
-
Quantitative Phase MicroscopyNugent, Ka et al. | 2008
- 740
-
Deep Ultraviolet Microscopy and its Application to Cancer ImmunologyZeskind, Bj et al. | 2008
- 742
-
A polarized light field microscope with fast polarization switcher and microlens array reveals the 3-D birefringence distribution of complex anisotropic structuresOldenbourg, R. et al. | 2008
- 744
-
Cryo-Fluorescence: A Tool for Correlative Cryo-Light and Cryo-Electron MicroscopySchwartz, Cl et al. | 2008
- 746
-
Confocal Microscopy and Flow Cytometry System Performance: Assessment of QA Parameters that Effect Data Quantification.Zucker, R. et al. | 2008
- 748
-
Microscopy Study of Interactions of Carbon Nanotubes with Astrocytoma CellsDong, L. et al. | 2008
- 750
-
Pico-second Fluorescence Lifetime Microscope System in the Deep UV-Visible (240nm - 850nm) using both Time- and Frequency-Domain Time-Resolved TechniquesChandler, L. et al. | 2008
- 752
-
Perspectives on Cellular Analysis: Linking Quantitation to Structure and Function by Instrumental Methods and AnalysisSmith, Rw et al. | 2008
- 754
-
Detection of FISH-stained microorganisms in soil microstructure by fluorescence microscopyEickhorst, T. et al. | 2008
- 756
-
Light Emitting Diodes as Illumination Sources for Microscopy: A Bright New FutureCole, Rw et al. | 2008
- 758
-
Simple High Performance Multi-modal Coherent Anti-Stokes Raman Scattering (CARS) Microscopy Based on a Two-Photon MicroscopePegoraro, A. et al. | 2008
- 760
-
Combined x(3) Microscopy of the Peripheral Nervous TissuePfeffer, Cp et al. | 2008
- 762
-
Correlating Composition and Luminescence Variations in III-Nitride Semiconductor AlloysEdwards, Pr et al. | 2008
- 764
-
Analysis of Combined Multi-signal Hyperspectral Datasets Using a Clustering Algorithm and Visualisation ToolsWilson, N. et al. | 2008
- 766
-
Methodology for the Quantification of Hyperspectral CathodoluminescenceMacrae, Cm et al. | 2008
- 768
-
Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEMKotula, Pg et al. | 2008
- 770
-
X-ray Spectrum Imaging of Sintering Additives in Thick-Film (Pb, La)(Zr, Ti)O3Parish, Cm et al. | 2008
- 772
-
Hyperspectral analysis in soft x-ray spectromicroscopyJacobsen, C. et al. | 2008
- 774
-
Statistical and Systematic Errors in EFTEM Spectral ImagingAnderson, Im et al. | 2008
- 776
-
Multivariate Analysis of XPS Data for Enhanced Chemical InformationFulghum, Je et al. | 2008
- 778
-
Acquisition of Combined Real-Reciprocal Space Multi-Dimensional DatasetsTwesten, Rd et al. | 2008
- 780
-
Hardware and Software for Nano-Area Diffractive Imaging in S-TEMVolkov, Vv et al. | 2008
- 782
-
Fast Hyperspectral Raman Imaging with Confocal Raman Microscopy at Optimized Spatial ResolutionKalbac, M. et al. | 2008
- 784
-
Enhancing the Field of View for Cathodoluminescence Spectrum Imaging in the Scanning Electron MicroscopeStowe, Dj et al. | 2008
- 786
-
Enhanced Mapping of C Kα with a Grazing-incidence X-ray OpticBrown, G. et al. | 2008
- 788
-
Development of a high accuracy, large range and backlash free single-tilt-rotation (alpha-gamma) holder for precise alignment of TEM samplesSalmon, N. et al. | 2008
- 790
-
Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic ResolutionZhang, Xf et al. | 2008
- 792
-
A New Paradigm for Ultra-High-Resolution Imaging at Elevated TemperaturesAllard, Lf et al. | 2008
- 794
-
Four-dimensional STEM-EELS tomography of nano-structured materialsJarausch, K. et al. | 2008
- 796
-
Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurementsTerauchi, M. et al. | 2008
- 798
-
Automated Large Scale Tilt Pair Data Collection for TEMYoshioka, C. et al. | 2008
- 800
-
Progress on the Development of a Cc-Cs Corrector for TEAMHaider, M. et al. | 2008
- 802
-
Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 MicroscopeSawada, S. et al. | 2008
- 804
-
Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron MicroscopyTietz, Hr et al. | 2008
- 806
-
A Pixel Array Detector for Scanning Transmission Electron MicroscopyErcius, P. et al. | 2008
- 808
-
Development of Fast CCD Cameras for in-situ Electron MicroscopyTsung, L. et al. | 2008
- 810
-
Electron Gun Design for Pulsed TEM OperationZiegler, A. et al. | 2008
- 812
-
Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object RecognitionLu, Y. et al. | 2008
- 814
-
Development of Double-Probe Piezo-Driving Holder for TEMYamazaki, K. et al. | 2008
- 816
-
Development of Stage-Scanning Type Confocal STEMHashimoto, A. et al. | 2008
- 818
-
Use of a commercial RF plasma cleaner in eliminating adventitious carbon contamination in an XPS systemStrein, E. et al. | 2008
- 820
-
Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen PlasmaHoriuchi, S. et al. | 2008
- 822
-
Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxidesTerauchi, M. et al. | 2008
- 824
-
Very Low Energy TEM Diffraction of NanostructuresMcmorran, B. et al. | 2008
- 826
-
Development of New Diffraction Microscope Based on Conventional Scanning Electron MicroscopeKamimura, O. et al. | 2008
- 828
-
Measurement of Electron Beam Coherence Using a Lau InterferometerMcmorran, B. et al. | 2008
- 830
-
Control of Parasitic Aberrations in Multipole Corrector OpticsBatson, Pe et al. | 2008
- 832
-
Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording MediaPhatak, C. et al. | 2008
- 834
-
Young's Fringes Are Not Evidence of HRTEM ResolutionO'Keefe, Ma et al. | 2008
- 836
-
Development of Sample Preparation Method for Observation of Dopant Profile by Electron HolographySato, T. et al. | 2008
- 838
-
In-line Point Projection Holography of Titanium Oxide NanoparticlesLivadaru, L. et al. | 2008
- 840
-
Routine Phase Resolution of 2π-100 and Better in Off-axis (Electron) HolographyVoelkl, E. et al. | 2008
- 842
-
On-line Dynamic Digital Electron HolographyHirayama, T. et al. | 2008
- 844
-
Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEMVoelkl, E. et al. | 2008
- 846
-
Absolute Strain at the Nanoscale from HREM ImagesJohnson, Cl et al. | 2008
- 848
-
Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium AlloyNag, S. et al. | 2008
- 850
-
Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line SplittingDiercks, Dr et al. | 2008
- 852
-
Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon TransistorDiercks, Dr et al. | 2008
- 854
-
Evaluating Visibility and Spatial Resolution in Electron HolographyMcleod, Ra et al. | 2008
- 856
-
Odyssey of a Chemical MicroscopistDelly, Jg et al. | 2008
- 858
-
Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years OnWallace, C. et al. | 2008
- 860
-
AFM Learning Activities for a 7-11 Grade Nanotechnology CourseLeonard, Dn et al. | 2008
- 862
-
Sherlock Holmes to CSI: Microscopy in the Forensic Geology ClassroomWilliams, Tj et al. | 2008
- 864
-
Teaching Aids for Optical Mineralogy in the GeosciencesKile, De et al. | 2008
- 866
-
Training Electron Microscopy TechniciansKostrna, Ms et al. | 2008
- 868
-
Electron Microscope Education in the Community CollegeVillalovoz, F. et al. | 2008
- 870
-
Manufacturer Training of Electron Microscopists: X-ray MicroanalysisRowlands, N. et al. | 2008
- 872
-
Remote Teaching for Electron MicroscopyIsabell, Tc et al. | 2008
- 874
-
Remote Microscopy for Education and OutreachSeraphin, S. et al. | 2008
- 876
-
Remote Microscopy for Training Groups of Student UsersMansfield, Jf et al. | 2008
- 878
-
Teaching Advanced Transmission Electron MicroscopyCrozier, Pa et al. | 2008
- 880
-
Methodologies for Teaching Undergraduate Level Electron MicroscopyMcintyre, Bl et al. | 2008
- 882
-
A Personal Perspective on Teaching Microscopy: Lessons Learned from the Classroom and LaboratoryCooke, Pm et al. | 2008
- 884
-
Microscopy Short Courses for Industrial, Governmental, and Academic UsersLyman, Ce et al. | 2008
- 886
-
Design and Implementation of a Practical, Hands-On TEM Short CourseNicholls, Aw et al. | 2008
- 888
-
Training Objectives and Challenges of Maintaining Competency and Relevancy of Microscopy Staff in an Academic Core FacilitySchalek, R. et al. | 2008
- 890
-
Coloring Pictures for Electron Microscopists, or Elements of Digital Image Manipulation for StudentsDusevich, Vm et al. | 2008
- 892
-
SEM Remote Control with a 3D OptionMighela, F. et al. | 2008
- 894
-
Do-It-Yourself Web-Based Diagnosis for the Scanning Electron MicroscopeCaldwell, Nhm et al. | 2008
- 896
-
Opportunities and Challenges Growing a User Base in a Multi-User FacilityDempere, La et al. | 2008
- 898
-
An Introduction to ImageJ: A Useful Tool for Biological Image Processing and AnalysisSheffield, Jb et al. | 2008
- 900
-
Atomistic Studies of Line Defects at Grain BoundariesMedlin, Dl et al. | 2008
- 902
-
HAADF Imaging and Ab Initio Analysis of GPBII zones in Al-Cu-Mg alloysKovarik, L. et al. | 2008
- 904
-
Microstructure-Property Relationships Based on 3D Images of PolycrystalsRollett, Ad et al. | 2008
- 906
-
On the Evolution of Friction-Induced Microstructures in Single Crystal NickelPrasad, Sv et al. | 2008
- 908
-
Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysisEl-Gomati, Mm et al. | 2008
- 910
-
Artificial SEM Images for Testing Resolution-Measurement MethodsCizmar, P. et al. | 2008
- 912
-
Counting Electrons in Transmission Electron MicroscopesMoldovan, G. et al. | 2008
- 914
-
Model of Fluctuation Electron Microscopy for a Nanocrystal -Amorphous CompositeYi, F. et al. | 2008
- 916
-
The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD SystemsCocle, J. et al. | 2008
- 918
-
Predicting Visibility in Elemental Maps Derived from X-ray Spectrum ImagesNewbury, D. et al. | 2008
- 920
-
Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural AnalysisZuo, Jm et al. | 2008
- 922
-
Simulation of Atomic Resolution Images in STEMAllen, Lj et al. | 2008
- 924
-
Critical Role of Inelastic Interactions in Quantitative Electron MicroscopyMkhoyan, Ka et al. | 2008
- 926
-
Controlling Channeling Effects in Aberration-Corrected STEM TomographyXin, Hl et al. | 2008
- 928
-
Simulating Atomic Resolution STEM Images of Non-Periodic SamplesFindlay, Sd et al. | 2008
- 930
-
Quantitative Image Simulation for Scanning Transmission Electron MicroscopyOxley, Mp et al. | 2008
- 932
-
Geometrical Interpretation and Simulation of HOLZ PatternsLi, Xz et al. | 2008
- 934
-
EBSD Characterization of the Deformation Behavior of Alloy 182 Weld MetalOthon, Ma et al. | 2008
- 936
-
Computation of Current Density in Particle BeamsOral, M. et al. | 2008
- 938
-
HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104,Kovarik, L. et al. | 2008
- 940
-
High-resolution electron imaging of amorphous layers with aberration-corrected probesMaccagnano-Zacher, S. et al. | 2008
- 942
-
Quantitative Image Contrast Variations in STEMBenthem, K.van et al. | 2008
- 944
-
An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental SolidsWalker, Cgh et al. | 2008
- 946
-
Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE SignalBonet, C. et al. | 2008
- 948
-
Cross Sections for the Ionization of Atoms by Electron Impact. A Numerical Database and an Analytical FormulaBote, D. et al. | 2008
- 950
-
Multimodal Atomic Force Microscopy for Nanomedicine: Biological Nanoimaging, Nanomechanics and NanodevicesLal, R. et al. | 2008
- 952
-
Single Cell Viability Measured by Scanning Electrochemical Microscopy and Live-DeadTM StainingJeerage, Km et al. | 2008
- 954
-
Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force MicroscopyJungk, T. et al. | 2008
- 956
-
Probing Molecular Machines on Surfaces: The Nanocar and BeyondKelly, Kf et al. | 2008
- 958
-
Lateral Resolution in Piezoresponse Force MicroscopyJungk, T. et al. | 2008
- 960
-
Local Potential Imaging of a Multilayer Ceramic Capacitor Using Kelvin Probe Force MicroscopyKomatsubara, T. et al. | 2008
- 962
-
Dynamic Studies of Nanoscale Thermal and Mechanical Property Development of Automotive Refinish ClearcoatsGerminario, Lt et al. | 2008
- 964
-
Aggregation Phenomena Studied by AFM and MDSC in Nanocarbon Composite MembranesTerrazas-Bandala, Lp et al. | 2008
- 966
-
Study of the Surface Porosity of Cellulose Triacetate Membranes by AFMTerrazas-Bandala, Lp et al. | 2008
- 968
-
FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-TomographyMarko, M. et al. | 2008
- 970
-
DualBeam Electron Microscopy for Targeted Whole Cell ArchitectureHumbel, Bm et al. | 2008
- 972
-
3D Imaging of Diatoms with Ion Abrasion Scanning Electron MicroscopyHildebrand, M. et al. | 2008
- 974
-
Direct Three-Dimensional Microstructural Characterization and Reconstruction Across Varying Length Scales in α-β Titanium Alloys by Serial Sectioning Using a FEI DualBeam™ (FIB-SEM) and Robo-Met.3DWilliams, Rea et al. | 2008
- 976
-
Low Energy Ga+ and Ar+ Ion Milling for Improved EBSD Sample PreparationMichael, Jr et al. | 2008
- 978
-
Measuring the Five Parameter Grain Boundary Character Distribution From Three-Dimensional Orientation MapsDillon, Sj et al. | 2008
- 980
-
A 3D Analysis of the Nugget Zone of AA5052 Processed via Friction Stir ProcessingAdams-Hughes, M. et al. | 2008
- 982
-
3D Energy-Dispersive X-ray Spectrometry (3D EDXS) in a DualBeam FIB: Aspects of Sample Preparation and Quantitative AnalysisSchaffer, M. et al. | 2008