Stress-Induced Nanostructures Through Laser-Assisted Scanning Probe Nanolithography (English)
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In:
Scanning
;
32
, 5
; 327-336
;
2010
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ISSN:
- Article (Journal) / Print
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Title:Stress-Induced Nanostructures Through Laser-Assisted Scanning Probe Nanolithography
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Contributors:
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Published in:Scanning ; 32, 5 ; 327-336
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Publisher:
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Place of publication:Hoboken, NJ
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Publication date:2010
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Table of contents – Volume 32, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 257
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Probing nanotribological and electrical properties of organic molecular films with atomic force microscopy| 2010
- 265
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The Exponent 3/2 at Pyramidal NanoindentationsKaupp, G et al. | 2010
- 282
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Mechanical properties of thin polymer films on stiff substrates| 2010
- 294
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Evolution of ZDDP-Derived Reaction Layer Morphology With Rubbing TimeNaveira-Suarez, A et al. | 2010
- 304
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Thermally driven stability of octadecylphosphonic acid thin films grown on SS316L| 2010
- 312
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Evaluation of surface structural and mechanical changes following remineralization of dentin| 2010
- 320
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Nanoscale crystallization of phase change Ge2Sb2Te5 film with AFM lithography| 2010
- 327
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Stress‐induced nanostructures through laser‐assisted scanning probe nanolithography| 2010
- 336
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Tribo‐electrochemical surface modification of tantalum using in situ AFM techniques| 2010
- v
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Nanotribology and nanoindentation using advanced scanning probe techniquesKim, B. I. et al. | 2010
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Calendar of Meetings BMI| 2010