Near-field scanning optical microscope probe analysis (English)
- New search for: Klapetek, Petr
- New search for: Klapetek, Petr
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In:
Ultramicroscopy
;
108
, 7
; 671-677
;
2008
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ISSN:
- Article (Journal) / Print
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Title:Near-field scanning optical microscope probe analysis
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Contributors:
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Published in:Ultramicroscopy ; 108, 7 ; 671-677
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Publisher:
- New search for: Elsevier
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Place of publication:New York, NY [u.a.]
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Publication date:2008
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 42.03 / 33.05 / 33.05
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Keywords:
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Source:
Table of contents – Volume 108, Issue 7
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 613
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In situ measurements and transmission electron microscopy of carbon nanotube field-effect transistorsKim, Taekyung / Kim, Seongwon / Olson, Eric / Zuo, Jian-Min et al. | 2007
- 619
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Study of the sensitivity of the first four flexural modes of an AFM cantilever with a sidewall probeChang, Win-Jin / Lee, Haw-Long / Chen, Terry Yuan-Fang et al. | 2007
- 625
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Characterization of JEOL 2100F Lorentz-TEM for low-magnification electron holography and magnetic imagingSchofield, M.A. / Beleggia, M. / Zhu, Y. / Pozzi, G. et al. | 2007
- 635
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Chemical mapping of the distribution of viruses into infected bacteria with a photothermal methodDazzi, A. / Prazeres, R. / Glotin, F. / Ortega, J.M. / Al-Sawaftah, M. / de Frutos, M. et al. | 2007
- 642
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Quantitative characterization of crosstalk effects for friction force microscopy with scan-by-probe SPMsPrunici, Pavel / Hess, Peter et al. | 2007
- 646
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Real-time imaging of surface evolution driven by variable-energy ion irradiationSwiech, W. / Rajappan, M. / Ondrejcek, M. / Sammann, E. / Burdin, S. / Petrov, I. / Flynn, C.P. et al. | 2007
- 656
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STEM nanodiffraction technique for structural analysis of CoPt nanoparticlesAlloyeau, D. / Ricolleau, C. / Oikawa, T. / Langlois, C. / Le Bouar, Y. / Loiseau, A. et al. | 2007
- 663
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Imaging of intracellular spherical lamellar structures and tissue gross morphology by a focused ion beam/scanning electron microscope (FIB/SEM)Drobne, Damjana / Milani, Marziale / Lešer, Vladka / Tatti, Francesco / Zrimec, Alexis / Žnidaršič, Nada / Kostanjšek, Rok / Štrus, Jasna et al. | 2007
- 671
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Near-field scanning optical microscope probe analysisKlapetek, Petr / Buršík, Jiří / Valtr, Miroslav / Martinek, Jan et al. | 2007
- 677
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Volcano structure in atomic resolution core-loss imagesD’Alfonso, A.J. / Findlay, S.D. / Oxley, M.P. / Allen, L.J. et al. | 2007
- 688
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Planar diffracted-beam interferometry/holographyHerring, R.A. et al. | 2007
- 698
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Electron cryo-microscopy of biological specimens on conductive titanium–silicon metal glass filmsRhinow, Daniel / Kühlbrandt, Werner et al. | 2007
- 706
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Energy-filtered electron backscatter diffraction: A correctionDeal, Andrew / Hooghan, Tejpal / Eades, Alwyn et al. | 2008
- IFC
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IFC (Editorial Board)| 2008