Comparison of hydrothermal performance between plate fins and plate-pin fins subject to nanofluid-cooled corrugated miniature heat sinks (English)
- New search for: Khoshvaght-Aliabadi, M
- New search for: Khoshvaght-Aliabadi, M
- New search for: Hassani, S.M
- New search for: Mazloumi, S.H
In:
Microelectronics reliability
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70
; 84-96
;
2017
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ISSN:
- Article (Journal) / Print
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Title:Comparison of hydrothermal performance between plate fins and plate-pin fins subject to nanofluid-cooled corrugated miniature heat sinks
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Contributors:
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Published in:Microelectronics reliability ; 70 ; 84-96
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam [u.a.]
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Publication date:2017
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 275/5670
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Keywords:
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Source:
Table of contents – Volume 70
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Review of silver nanoparticle based die attach materials for high power/temperature applicationsPaknejad, Seyed Amir / Mannan, Samjid H. et al. | 2017
- 12
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Mechanism of gate dielectric degradation by hydrogen migration from the cathode interfaceHigashi, Yusuke / Takaishi, Riichiro / Kato, Koichi / Suzuki, Masamichi / Nakasaki, Yasushi / Tomita, Mitsuhiro / Mitani, Yuichiro / Matsumoto, Masuaki / Ogura, Shohei / Fukutani, Katsuyuki et al. | 2017
- 22
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Investigation of dependence between time-zero and time-dependent variability in high-κ NMOS transistorsHassan, Mohammad Khaled / Roy, Kaushik et al. | 2017
- 32
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Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistorsWhiting, P.G. / Holzworth, M.R. / Lind, A.G. / Pearton, S.J. / Jones, K.S. / Liu, L. / Kang, T.S. / Ren, F. / Xin, Y. et al. | 2017
- 41
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Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contactsWhiting, P.G. / Rudawski, N.G. / Holzworth, M.R. / Pearton, S.J. / Jones, K.S. / Liu, L. / Kang, T.S. / Ren, F. et al. | 2017
- 49
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Corrosion behavior of crystalline silicon solar cellsXiong, Huaping / Gan, Chuanhai / Yang, Xiaobing / Hu, Zhigang / Niu, Haiyan / Li, Jianfeng / Si, Jianfang / Xing, Pengfei / Luo, Xuetao et al. | 2017
- 59
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Interacting multiple model particle filter for prognostics of lithium-ion batteriesSu, Xiaohong / Wang, Shuai / Pecht, Michael / Zhao, Lingling / Ye, Zhe et al. | 2017
- 70
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Prognostics of Li(NiMnCo)O2-based lithium-ion batteries using a novel battery degradation modelYang, Fangfang / Wang, Dong / Xing, Yinjiao / Tsui, Kwok-Leung et al. | 2017
- 79
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Thermal state of electronic assemblies applied to smart building equipped with QFN64 device subjected to natural convectionBaïri, A. / Roseiro, L. / Martín-Garín, A. / Adeyeye, K. / Millán-García, J.A. et al. | 2017
- 84
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Comparison of hydrothermal performance between plate fins and plate-pin fins subject to nanofluid-cooled corrugated miniature heat sinksKhoshvaght-Aliabadi, M. / Hassani, S.M. / Mazloumi, S.H. et al. | 2017
- 97
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Effects of dimension parameters and defect on TSV thermal behavior for 3D IC packagingPan, Yuanxing / Li, Fei / He, Hu / Li, Junhui / Zhu, Wenhui et al. | 2017
- 103
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Peridynamic wetness approach for moisture concentration analysis in electronic packagesDiyaroglu, C. / Oterkus, S. / Oterkus, E. / Madenci, E. / Han, S. / Hwang, Y. et al. | 2017
- 112
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Methods of sequential test optimization in dynamic environmentYang, Chenglin / Su, Ruoshan / Long, Bing et al. | 2016
- IFC
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Editorial Board| 2016