Significance of matrix diagonalization in modelling inelastic electron scattering (English)
- New search for: Lee, Z
- New search for: Lee, Z
- New search for: Hambach, R
- New search for: Kaiser, U
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In:
Ultramicroscopy
;
175
; 58-66
;
2017
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ISSN:
- Article (Journal) / Print
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Title:Significance of matrix diagonalization in modelling inelastic electron scattering
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Contributors:
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Published in:Ultramicroscopy ; 175 ; 58-66
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Publisher:
- New search for: Elsevier
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Place of publication:New York, NY [u.a.]
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Publication date:2017
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 42.03 / 33.05 / 33.05
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- New search for: 535/3040
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Source:
Table of contents – Volume 175
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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TEM sample preparation by femtosecond laser machining and ion milling for high-rate TEM straining experimentsVoisin, Thomas / Grapes, Michael D. / Zhang, Yong / Lorenzo, Nicholas / Ligda, Jonathan / Schuster, Brian / Weihs, Timothy P. et al. | 2016
- 9
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Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulationKorayem, Moharam. Habibnejad / Saraie, Maniya. B. / Saraee, Mahdieh. B. et al. | 2017
- 25
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Publisher's Note| 2017
- 25
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Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopySinclair, Robert et al. | 2017
- 36
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Tensor decompositions for the analysis of atomic resolution electron energy loss spectraSpiegelberg, Jakob / Rusz, Ján / Pelckmans, Kristiaan et al. | 2016
- 46
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Multi-MHz micro-electro-mechanical sensors for atomic force microscopyLegrand, Bernard / Salvetat, Jean-Paul / Walter, Benjamin / Faucher, Marc / Théron, Didier / Aimé, Jean-Pierre et al. | 2017
- 58
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Significance of matrix diagonalization in modelling inelastic electron scatteringLee, Z. / Hambach, R. / Kaiser, U. / Rose, H. et al. | 2016
- 67
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Optimising electron microscopy experiment through electron optics simulationKubo, Y. / Gatel, C. / Snoeck, E. / Houdellier, F. et al. | 2017
- 81
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Measuring thermal conductivity of thin films by Scanning Thermal Microscopy combined with thermal spreading resistance analysisJuszczyk, J. / Kaźmierczak-Bałata, A. / Firek, P. / Bodzenta, J. et al. | 2017
- 87
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Automated discrete electron tomography – Towards routine high-fidelity reconstruction of nanomaterialsZhuge, Xiaodong / Jinnai, Hiroshi / Dunin-Borkowski, Rafal E. / Migunov, Vadim / Bals, Sara / Cool, Pegie / Bons, Anton-Jan / Batenburg, Kees Joost et al. | 2017
- 97
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Three-dimensional analysis of Eu dopant atoms in Ca-α-SiAlON via through-focus HAADF-STEM imagingSaito, Genki / Yamaki, Fuuta / Kunisada, Yuji / Sakaguchi, Norihito / Akiyama, Tomohiro et al. | 2017
- 105
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Comparison of the quantitative analysis performance between pulsed voltage atom probe and pulsed laser atom probeTakahashi, J. / Kawakami, K. / Raabe, D. et al. | 2017
- 111
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Multislice simulations for in-situ HRTEM studies of nanostructured magnesium hydride at ambient hydrogen pressureSurrey, Alexander / Schultz, Ludwig / Rellinghaus, Bernd et al. | 2017
- 116
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Studying substrate effects on localized surface plasmons in an individual silver nanoparticle using electron energy-loss spectroscopyFujiyoshi, Yoshifumi / Nemoto, Takashi / Kurata, Hiroki et al. | 2017
- 121
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Spatial coherence of electron beams from field emitters and its effect on the resolution of imaged objectsLatychevskaia, Tatiana et al. | 2016
- IFC
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IFC (Editorial Board)| 2017