Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage (English)
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In:
IEEE transactions on nuclear science
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64
, 8
; 2188
;
2017
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ISSN:
- Article (Journal) / Print
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Title:Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage
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Contributors:
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Published in:IEEE transactions on nuclear science ; 64, 8 ; 2188
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Publisher:
- New search for: IEEE
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Place of publication:New York, NY
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Publication date:2017
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 770/3450/5540
- New search for: 33.40
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Keywords:
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Classification:
Local classification TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Source:
Table of contents – Volume 64, Issue 8
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2318
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Cathodoluminescence Characterization of Point Defects in Optical FibersReghioua, I. / Girard, S. / Raine, M. / Alessi, A. / Di Francesca, D. / Fanetti, M. / Martin-Samos, L. / Richard, N. / Valant, M. / Boukenter, A. et al. | 2017
- 2300
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Resistance State Locking in CBRAM Cells Due to Displacement Damage EffectsTaggart, J. L. / Fang, R. / Gonzalez-Velo, Y. / Barnaby, H. J. / Kozicki, M. N. / Pacheco, J. L. / Bielejec, E. S. / McLain, M. L. / Chamele, N. / Mahmud, A. et al. | 2017
- 2007
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Measurement of Cosmic Ray and Trapped Proton LET Spectra on the STS-95 HOST MissionStassinopoulos, E. G. / Barth, J. L. / Stauffer, C. A. et al. | 2017
- 2023
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Benchmarking Ionizing Space Environment ModelsBourdarie, S. / Inguimbert, C. / Standarovski, D. / Vaille, J.-R. / Sicard-Piet, A. / Falguere, D. / Ecoffet, R. / Poivey, C. / Lorfevre, E. et al. | 2017
- 2307
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Gamma Radiation Tests of Radiation-Hardened Fiber Bragg Grating-Based Sensors for Radiation EnvironmentsKuhnhenn, J. / Weinand, U. / Morana, A. / Girard, S. / Marin, E. / Perisse, J. / Genot, J. S. / Grelin, J. / Hutter, L / Melin, G. et al. | 2017
- 2268
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Preliminary Guidelines and Predictions for 14-MeV Neutron SEE TestingWeulersse, Cecile / Guibbaud, Nicolas / Beltrando, Anne-Lise / Galinat, Jeremy / Beltrando, Cyrille / Miller, Florent / Trochet, Patrick / Alexandrescu, Dan et al. | 2017
- 2122
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Effects of Temperature and Supply Voltage on SEU- and SET-Induced Errors in Bulk 40-nm Sequential CircuitsChen, R. M. / Diggins, Z. J. / Mahatme, N. N. / Wang, L. / Zhang, E. X. / Chen, Y. P. / Zhang, H. / Liu, Y. N. / Narasimham, B. / Witulski, A. F. et al. | 2017
- 2219
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Error Detection Technique for a Median FilterAranda, Luis Alberto / Reviriego, Pedro / Maestro, Juan Antonio et al. | 2017
- 2046
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Total Ionizing Dose Influence on the Single Event Effect Sensitivity in Samsung 8Gb NAND Flash MemoriesEdmonds, Larry D. / Irom, Farokh / Allen, Gregory R. et al. | 2017
- 2136
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Experimental Investigation of Single-Event Transient Waveforms Depending on Transistor Spacing and Charge Sharing in 65-nm CMOSMitrovic, Mladen / Hofbauer, Michael / Goll, Bernhard / Schneider-Hornstein, Kerstin / Swoboda, Robert / Steindl, Bernhard / Voss, Kay-Obbe / Zimmermann, Horst et al. | 2017
- 2001
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Table of contents| 2017
- 2004
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Comments by the EditorsFleetwood, Dan M. / Brown, Dennis / Girard, Sylvain / Gerardin, Simone / Quinn, Heather / Kobayashi, Daisuke / Esqueda, Ivan Sanchez / Robinson, William / Moss, Steven et al. | 2017
- 2005
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List of Reviewes list| 2017
- 2016
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High-Energy Electron-Induced SEUs and Jovian Environment ImpactTali, Maris / Alia, Ruben Garcia / Brugger, Markus / Ferlet-Cavrois, Veronique / Corsini, Roberto / Farabolini, Wilfrid / Mohammadzadeh, Ali / Santin, Giovanni / Virtanen, Ari et al. | 2017
- 2031
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Heavy-Ion-Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition DependenceJavanainen, Arto / Turowski, Marek / Galloway, Kenneth F. / Nicklaw, Christopher / Ferlet-Cavrois, Veronique / Bosser, Alexandre / Lauenstein, Jean-Marie / Muschitiello, Michele / Pintacuda, Francesco / Reed, Robert A. et al. | 2017
- 2038
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Experimental and Simulation Studies of the Effects of Heavy-Ion Irradiation on HfO2-Based RRAM CellsAlayan, M. / Bagatin, M. / Gerardin, S. / Paccagnella, A. / Larcher, L. / Vianello, E. / Nowak, E. / De Salvo, B. / Perniola, L. et al. | 2017
- 2054
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Floating Gate Dosimeter Suitability for Accelerator-Like EnvironmentsBrucoli, M. / Danzeca, S. / Brugger, M. / Masi, A. / Pineda, A. / Cesari, J. / Dusseau, L. / Wrobel, F. et al. | 2017
- 2061
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Total Ionizing Dose Response of Multiple-Gate Nanowire Field Effect TransistorsGaillardin, M. / Marcandella, C. / Martinez, M. / Duhamel, O. / Lagutere, T. / Paillet, P. / Raine, M. / Richard, N. / Andrieu, F. / Barraud, S. et al. | 2017
- 2069
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Understanding Charge Collection Mechanisms in InGaAs FinFETs Using High-Speed Pulsed-Laser Transient Testing With Tunable WavelengthNi, Kai / Sternberg, Andrew L. / Zhang, En Xia / Kozub, John A. / Jiang, Rong / Schrimpf, Ronald D. / Reed, Robert A. / Fleetwood, Daniel M. / Alles, Michael L. / McMorrow, Dale et al. | 2017
- 2079
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Modeling Single-Event Transient Propagation in a SiGe BiCMOS Direct-Conversion ReceiverIldefonso, Adrian / Song, Ickhyun / Tzintzarov, George N. / Fleetwood, Zachary E. / Lourenco, Nelson E. / Wachter, Mason T. / Cressler, John D. et al. | 2017
- 2089
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Investigation of Electrical Latchup and SEL Mechanisms at Low Temperature for Applications Down to 50 KAl Youssef, A. / Artola, L. / Ducret, S. / Hubert, G. / Perrier, F. et al. | 2017
- 2098
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Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential CircuitsChen, R. M. / Mahatme, N. N. / Diggins, Z. J. / Wang, L. / Zhang, E. X. / Chen, Y. P. / Liu, Y. N. / Narasimham, B. / Witulski, A. F. / Bhuva, B. L. et al. | 2017
- 2107
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Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space ApplicationsSecondo, R. / Alia, R. Garcia / Peronnard, P. / Brugger, M. / Masi, A. / Danzeca, S. / Merlenghi, A. / Vaille, J. R. / Dusseau, L. et al. | 2017
- 2115
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Estimating Single-Event Logic Cross Sections in Advanced TechnologiesHarrington, R. C. / Kauppila, J. S. / Warren, K. M. / Chen, Y. P. / Maharrey, J. A. / Haeffner, T. D. / Loveless, T. D. / Bhuva, B. L. / Bounasser, M. / Lilja, K. et al. | 2017
- 2129
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Compact Modeling and Simulation of Heavy Ion-Induced Soft Error Rate in Space Environment: Principles and ValidationZebrev, Gennady I. / Galimov, Artur M. et al. | 2017
- 2144
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Single-Event Upset Characterization of Common First- and Second-Order All-Digital Phase-Locked LoopsChen, Y. P. / Massengill, L. W. / Kauppila, J. S. / Bhuva, B. L. / Holman, W. T. / Loveless, T. D. et al. | 2017
- 2152
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Statistical Deviations From the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMsFranco, Francisco J. / Clemente, Juan Antonio / Baylac, Maud / Rey, Solenne / Villa, Francesca / Mecha, Hortensia / Agapito, Juan A. / Puchner, Helmut / Hubert, Guillaume / Velazco, Raoul et al. | 2017
- 2161
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Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGATonfat, Jorge / Lima Kastensmidt, Fernanda / Artola, Laurent / Hubert, Guillaume / Medina, Nilberto H. / Added, Nemitala / Aguiar, Vitor A. P. / Aguirre, Fernando / Macchione, Eduardo L. A. / Silveira, Marcilei A. G. et al. | 2017
- 2169
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Experimental and Analytical Analysis of Sorting Algorithms Error Criticality for HPC and Large Servers ApplicationsLunardi, Caio / Quinn, Heather / Monroe, Laura / Oliveira, Daniel / Navaux, Philippe / Rech, Paolo et al. | 2017
- 2179
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Register File Criticality and Compiler Optimization Effects on Embedded Microprocessor ReliabilityLins, Filipe M. / Tambara, Lucas A. / Kastensmidt, Fernanda L. / Rech, Paolo et al. | 2017
- 2188
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Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias VoltageClemente, Juan Antonio / Hubert, Guillaume / Franco, Francisco J. / Villa, Francesca / Baylac, Maud / Mecha, Hortensia / Puchner, Helmut / Velazco, Raoul et al. | 2017
- 2196
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Analyzing the Impact of Fault-Tolerance Methods in ARM Processors Under Soft Errors Running Linux and Parallelization APIsRodrigues, Gennaro S. / Rosa, Felipe / de Oliveira, Adria Barros / Kastensmidt, Fernanda Lima / Ost, Luciano / Reis, Ricardo et al. | 2017
- 2204
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Radiation and High-Voltage Tolerant Space CAN Driver in Standard Low-Voltage 3.3-V CMOS TechnologyJansen, R. J. E. / Lindner, S. / Furano, G. / Boatella-Polo, C. / Glass, B. et al. | 2017
- 2212
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Compact Modeling of MOSFET $I$ – $V$ Characteristics and Simulation of Dose-Dependent Drain CurrentsZebrev, Gennady I. / Orlov, Vasily V. / Bakerenkov, Alexander S. / Felitsyn, Vladislav A. et al. | 2017
- 2227
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ELDRS Susceptibility of Bipolar Transistors and Integrated Circuits During Low-Temperature IrradiationBakerenkov, Alexander S. / Pershenkov, Viacheslav S. / Felitsyn, Vladislav A. / Rodin, Alexander S. / Telets, Vitaly A. / Belyakov, Vladimir V. / Shurenkov, Vladimir V. et al. | 2017
- 2235
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Effects of Channel Implant Variation on Radiation-Induced Edge Leakage Currents in n-Channel MOSFETsMcLain, Michael L. / Barnaby, Hugh J. / Schlenvogt, Garrett et al. | 2017
- 2242
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TCAD Simulation of the Single Event Effects in Normally-OFF GaN Transistors After Heavy Ion RadiationZerarka, M. / Austin, P. / Bensoussan, A. / Morancho, F. / Durier, A. et al. | 2017
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Fault Modeling and Worst Case Test Vector Generation for Flash-Based FPGAs Exposed to Total DoseAbou-Auf, A. A. / Abdel-Aziz, M. M. / Abdel-Aziz, M. A. / Ammar, A. A. et al. | 2017
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Effects of Interface Donor Trap States on Isolation Properties of Detectors Operating at High-Luminosity LHCMoscatelli, F. / Passeri, D. / Morozzi, A. / Mattiazzo, S. / Betta, G.-F. Dalla / Dragicevic, M. / Bilei, G. M. et al. | 2017
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On the Robustness of Stochastic Bayesian MachinesCoelho, Alexandre / Laurent, Raphael / Solinas, Miguel / Fraire, Juan / Mazer, Emmanuel / Zergainoh, Nacer-Eddine / Karaoui, Said / Velazco, Raoul et al. | 2017
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A Comparative Study on TID Influenced Lateral Diffusion of Group 11 Metals Into GexS1−x and GexSe1−x Systems: A Flexible Radiation Sensor Development PerspectiveMahmud, A. / Gonzalez-Velo, Y. / Barnaby, H. J. / Kozicki, M. N. / Mitkova, M. / Holbert, K. E. / Goryll, M. / Alford, T. L. / Taggart, J. L. / Chen, W. et al. | 2017
- 2312
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Irradiation Temperature Influence on the In Situ Measured Radiation Induced Attenuation of Ge-Doped FibersAlessi, A. / Di Francesca, D. / Girard, S. / Agnello, S. / Cannas, M. / Reghioua, I. / Martin-Samos, L. / Marcandella, C. / Richard, N. / Paillet, P. et al. | 2017
- 2325
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Characterization of Novel Lightweight Radiation Shielding Materials for Space ApplicationsSteffens, Michael / Hepp, Felicitas / Hoffgen, Stefan K. / Krzikalla, Philipp / Metzger, Stefan / Pellowski, Frank / Santin, Giovanni / Tiedemann, Lars / Tighe, Adrian / Weinand, Udo et al. | 2017
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SEP Protons in GEO Measured With the ESA MultiFunctional SpectrometerArruda, L. / Goncalves, P. / Sandberg, I. / Giamini, S. A. / Daglis, I. A. / Marques, A. / Pinto, J. Costa / Aguilar, A. / Marinho, P. / Sousa, T. et al. | 2017
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Ionizing Dose Calculations for Low Energy Electrons in Silicon and AluminumPierron, J. / Inguimbert, C. / Belhaj, M. / Raine, M. / Puech, J. et al. | 2017
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