15th IEEE VLSI test symposium (English)
In:
Journal of Electronic Testing
;
9
, 1-2
; 219-219
;
1996
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ISSN:
- Article (Journal) / Print
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Title:15th IEEE VLSI test symposium
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Published in:Journal of Electronic Testing ; 9, 1-2 ; 219-219
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Publisher:
- New search for: Kluwer Academic Publishers
- New search for: Kluwer
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Place of publication:Boston, Mass. [u.a.]
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Publication date:1996
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 53.00 / 53.55 / 53.03 / 53.15
- Further information on Basic classification
- New search for: 770/5670
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Keywords:
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Source:
Table of contents – Volume 9, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 5
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EditorialAgrawal, Vishwani D. et al. | 1996
- 7
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Guest editorialKaminska, Bozena / Courtois, Bernard et al. | 1996
- 9
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Selecting measurements to test the functional behavior of analog circuitsVan Spaandonk, J. / Kevenaar, T. A. M. et al. | 1996
- 19
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Behavior model of mixed ADC systemsGertners, A. / Zagursky, V. / Saldava, D Z. et al. | 1996
- 29
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A unified approach for fault simulation of linear mixed-signal circuitsBalivada, Ashok / Zheng, Hong / Nagi, Naveena / Chatterjee, Abhijit / Abraham, Jacob A. et al. | 1996
- 43
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Fault-based ATPG for linear analog circuits with minimal size multifrequency test setsMir, S. / Lubaszewski, M. / Courtois, B. et al. | 1996
- 59
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Optimization-based multifrequency test generation for analog circuitsAbderrahman, A. / Kaminska, B. / Cerny, E. et al. | 1996
- 75
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Mixed current/voltage observation towards effective testing of analog and mixed-signal circuitsda Silva, J. Machado / Silva Matos, J. / Bell, Ian M. / Taylor, Gaynor E. et al. | 1996
- 89
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Signature analysis for fault detection of mixed-signal ICs based on dynamic power-supply currentArgüelles, Javier / Bracho, Salvador et al. | 1996
- 109
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A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSIVerfaillie, Johan / Haspeslagh, Didier et al. | 1996
- 117
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A BIST-DFT technique for DC test of analog modulesDufaza, Christian / Ihs, Hassan et al. | 1996
- 135
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Unified Built-In Self-Test/or Fully Differential Analogue CircuitsMir, S. / Lubaszewski, M. / Courtois, B. et al. | 1996
- 135
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Unified built-in self-test for fully differential analog circuitsMir, S. / Lubaszewski, M. / Courtois, B. et al. | 1996
- 153
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Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysisZhou, Yingquan / Wong, Mike W. T. / Min, Yinghua et al. | 1996
- 165
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A data optimization test technique for characterizing embedded ADCsRaczkowycz, J. / Allott, S. / Pritchard, T. I. et al. | 1996
- 177
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Reconstruction method for jitter tolerant data acquisition systemBelhaouane, Adel / Savaria, Yvon / Kaminska, Bozena / Massicotte, Daniel et al. | 1996
- 187
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Parametric testing of mixed-signal circuits by ANN processing of transient responsesMaterka, Andrzej / Strzelecki, Michal et al. | 1996
- 203
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Test and diagnosis of analog circuits: When fuzziness can lead to accuracyMohamed, Firas / Marzouki, Meryem et al. | 1996
- 203
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Test and Diagnosis of Analog Devices: When Fuzziness can Lead to AccuracyMohamed, F. / Marzouki, M. et al. | 1996
- 217
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Erratum| 1996
- 219
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15th IEEE VLSI test symposium| 1996