Local crystal textures: experimental techniques and future trends (English)
- New search for: Schwarzer, R. A.
- New search for: Schwarzer, R. A.
In:
Fresenius' Journal of Analytical Chemistry
;
361
, 6-7
; 522-526
;
1998
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ISSN:
- Article (Journal) / Print
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Title:Local crystal textures: experimental techniques and future trends
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Contributors:Schwarzer, R. A. ( author )
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Published in:Fresenius' Journal of Analytical Chemistry ; 361, 6-7 ; 522-526
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Publisher:
- New search for: Springer-Verlag
- New search for: Springer
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Place of publication:Berlin
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Publication date:1998
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 35.23 / 35.71
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Source:
Table of contents – Volume 361, Issue 6-7
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 513
-
Ninth International Conference on Solid State AnalysisMarx, G. et al. | 1998
- 515
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Nanostructure investigations with the analytical transmission electron microscopeBauer, H.-D. / Rennekamp, Reinhold / Thomas, Jürgen et al. | 1998
- 522
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Local crystal textures: experimental techniques and future trendsSchwarzer, R. A. et al. | 1998
- 527
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Chemical-bond analysis of nanostructured materials using near-edge fine structures (ELNES)Schneider, R. et al. | 1998
- 532
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Contributions to accuracy improvement of simultaneous ICP atomic emission spectrometry using multi-line measurements of analyte and internal standard elements Applications for the analysis of permalloyKucharkowski, R. / Jankova, D. / Herrmann, E. / John, A. et al. | 1998
- 540
-
The effect of water vapor on the oxidation behavior of 9%Cr steels in simulated combustion gasesNickel, H. / Wouters, Y. / Thiele, M. / Quadakkers, W. J. et al. | 1998
- 545
-
Identification of amber and imitations by near infrared reflection spectroscopyGolloch, A. / Heidbreder, Stefan / Lühr, Christoph et al. | 1998
- 547
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Interface analysis of new tooth filling materialsZiegler, C. / Reusch, B. / Geis-Gerstorfer, J. et al. | 1998
- 554
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Porous silicon: repeatability of generation?Sperveslage, G. / Grobe, J. / Egbers, G. / Benninghoven, A. et al. | 1998
- 558
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Infrared spectroscopic characterization of the buried interface and surfaces of bonded silicon wafersFriedrich, M. / Hiller, K. / Wiemer, M. / Geßner, T. / Zahn, D. R. T. et al. | 1998
- 560
-
Cathodoluminescence depth analysis in SiO2-Si-systemsGoldberg, M. / Barfels, T. / Fitting, H.-J. et al. | 1998
- 562
-
Nanoscopic phase-analysis of SiC containing BaTiO3-ceramicNeumann-Zdralek, J. / Koschel, F. / Röder, A. / Abicht, H.-P. / Engler, N. / Riemann, A. et al. | 1998
- 564
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Auger investigations of thin SiC filmsEcke, G. / Rößler, H. / Cimalla, V. / Pezoldt, J. / Stauden, T. et al. | 1998
- 568
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Microstructure and composition of silicon carbide films deposited on carbon fibers by chemical vapor depositionDietrich, D. / Podlesak, H. / Marx, G. / Wielage, B. et al. | 1998
- 570
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Investigation of metallization schemes for high temperature devices based on silicon carbideScholz, T. / Getto, R. / Gottfried, K. / Kurz, G. / Kriz, J. / Lauer, V. et al. | 1998
- 574
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Correlation between mechanical and electrical properties on conductive SiC-fibre reinforced compositesFankhänel, B. / Müller, Eberhard / Fankhänel, Torsten / Siegel, Winfried et al. | 1998
- 576
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Nucleation and crystallisation of amorphous SiC from polymeric precursorsMartin, H.-P. / Kurtenbach, D. / Müller, E. et al. | 1998
- 578
-
In situ investigations of the thermal fatigue behaviour of hot pressed Si3N4 by laser shock loading inside an SEMKadner, Juliane / Menzel, Siegfried / Wetzig, K. et al. | 1998
- 582
-
The analysis of Si3N4, SiC and BN by combustion with elemental fluorine coupled to mass spectrometryRuße, K. / Broekaert, J. A. C. et al. | 1998
- 585
-
IR spectroscopic investigations on the determination of the water content in glassesHarder, U. / Geißler, Heinz et al. | 1998
- 587
-
An X-ray photoelectron spectroscopic study of novel SiON glassesFranke, R. / Girgenrath, C. / Kohn, S. / Jansen, M. et al. | 1998
- 590
-
On matrix effects in HF-plasma-SNMS analysis of sintered ceramic Ti-Al-(Si)-OBörner, H. / Jenett, H. / Hodoroaba, V.-D. et al. | 1998
- 592
-
Characterization of precursor-ceramic conversion in Si-C-(O,N)-systems by thermoanalytical methodsBreuning, T. / Boden, G. et al. | 1998
- 594
-
Investigations of nanocrystalline ceramics and powders by TEM, AFM and plasticity measurementsMüller, E. / Oestreich, C. / Popp, U. / Michel, G. / Rendtel, A. et al. | 1998
- 598
-
Phases and solid structures by calcination of precursors for lead-magnesium-niobatesHeegn, H. / Trinkler, Michael et al. | 1998
- 601
-
ESCA investigations on pyrolytic carbon films for fiber coatingsDietrich, D. / Dietrich, D. A. et al. | 1998
- 602
-
Study of CVD diamond C(100) by X-ray absorption spectroscopiesLübbe, M. / Bressler, P. R. / Braun, W. / Schaarschmidt, G. / Hinneberg, H. J. / Zahn, D. R. T. et al. | 1998
- 604
-
Investigation of the electron beam induced transformation of Cu3 N-filmsLesch, N. / Karduck, P. / Cremer, R. / v. Richthofen, A. et al. | 1998
- 608
-
Phase formation process of sputtered NiCr(37:63) thin filmsPitschke, W. / Brückner, W. et al. | 1998
- 609
-
Investigation of the microstructure of IrSiX thin filmsKurt, R. / Pitschke, W. / Thomas, J. / Wendrock, H. / Brückner, W. / Wetzig, K. et al. | 1998
- 613
-
Investigation of ZnS thin films on Si(100) by phase detection imaging and Young’s modulus microscopyResch, R. / Friedbacher, G. / Grasserbauer, M. / Lindroos, S. / Kanniainen, T. / Valkonen, M. P. / Leskelä, M. et al. | 1998
- 617
-
Structural studies of ITO films using grazing incidence x-ray diffractometryQuaas, M. / Wulff, H. et al. | 1998
- 619
-
Structural characterization of thin films formed or changed on materials by micro Raman spectroscopyWitke, K. / Brzezinka, Klaus-Werner / Reich, Peter et al. | 1998
- 621
-
Characterization of Fe/Cr multilayers by analytical transmission electron microscopyRennekamp, R. / Thomas, Jürgen / Arnold, Birgit / Suenaga, Kazutomo et al. | 1998
- 625
-
Depth profiling of Co/Ti – silicide films using total reflection X-ray fluorescence (TXRF) spectrometry combined with low energy ion beam etching (IBE) for sample preparationFrank, W. / Schindler, A. / Thomas, H.-J. et al. | 1998
- 628
-
Investigation of the metal adsorbate interface of the system silver coumarin and silver hydrocoumarin by means of surface enhanced Raman spectroscopyVogel, E. / Kiefer, W. et al. | 1998
- 630
-
Surface- and microanalytical characterization of ion-implanted Si-C-N layersKlewe-Nebenius, H. / Bruns, M. / Lutz, H. / Baumann, H. / Link, F. / Bethge, K. et al. | 1998
- 633
-
Characterization of multilayers by means of EDXS in the analytical TEMThomas, J. / Rennekamp, Reinhold / van Loyen, Ludwig et al. | 1998
- 637
-
EDX depth profiling by means of effective layersMyint, Kyaw / Barfels, T. / Kuhr, J.-C. / Fitting, H.-J. et al. | 1998
- 639
-
Improvement of the oxidation behavior of Ti1-xAlxN hard coatings by optimization of the Ti/Al ratioWitthaut, M. / Cremer, Rainer / von Richthofen, Alexander / Neuschütz, Dieter et al. | 1998
- 642
-
Determination of the cubic to hexagonal structure transition in the metastable system TiN-AlNCremer, R. / Witthaut, Mirjam / von Richthofen, Alexander / Neuschütz, Dieter et al. | 1998
- 645
-
In-situ and ex-situ examination of the early stages of chemical vapor depositionStock, H.-R. / Jarms, C. / Berndt, H. / Wielage, B. / Hofmann, A. et al. | 1998
- 647
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Mass spectrometric investigations on the vanadium-hydrogen-oxygen systemPaulus, H. / Müller, K.-H. / Kiss, G. et al. | 1998
- 649
-
Point defects in (Ti, Fe)N hard coatings, a Mössbauer studyKirsten, A. / Pietzsch, C. / Oettel, H. et al. | 1998
- 649
-
Point defects in (Ti, Fe)N hard coatings, a Moessbauer studyKirsten, A. / Pietzsch, C. / Oettel, H. et al. | 1998
- 652
-
Investigations of residual stresses in carbon fibre/aluminium-composites using X-ray diffractionWielage, B. / Fritsche, Gudrun / Dorner, Annett et al. | 1998
- 653
-
XPS investigations on boron nitride fibre coatings prepared by chemical vapour deposition in comparison to their hydrolytic rateDietrich, D. / Stöckel, S. / Marx, G. et al. | 1998
- 656
-
TEM-characterization of rapidly solidified Nb-Al ribbonsArnold, B. / Löser, Wolfgang / Leonhardt, Monika et al. | 1998
- 659
-
SNMS and GDOES studies of the oxidation behavior of TiAl modified by niobium additionSunderkötter, J. D. / Gilliland, D. D. / Jenett, H. / Haanappel, V. A. C. / Stroosnijder, M. F. et al. | 1998
- 662
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Electrochemical characterisation of laser welding tracksMüller, W.-D. / Manthey, H. / Lange, K.-P. / Gundlach, H.-W. / Plank, T. et al. | 1998
- 667
-
Investigation of non-metallic impurities in High Speed Steel using SIMS imaging and scanning techniquesBrunner, C. / Hutter, H. / Piplits, K. / Gritsch, M. / Pöckl, G. / Grasserbauer, M. et al. | 1998
- 672
-
Atom probe study on the segregation behavior of the binary alloy Pt95Mo5Eckschlager, A. / Athenstaedt, W. / Leisch, M. et al. | 1998
- 674
-
In-situ observation of the nitrogenation of Sm2Fe17 by means of high temperature x-ray diffractionTeresiak, Angelika / Gebel, Bernhard / Handstein, Axel / Mattern, Norbert / Klose, H. / Müller, Karl-Hartmut et al. | 1998
- 674
-
In-situ observation of the nitrogenation of Sm~2Fe3~1~7 by means of high temperature x-ray diffractionTeresiak, A. / Gebel, B. / Handstein, A. / Mattern, N. / Kiose, H. / Mueller, K.-H. et al. | 1998
- 677
-
Characterization and application of supported metal catalysts with well-tailored pore systems and metal dispersionsClaus, P. / Crozier, Peter A. / Druska, Peter et al. | 1998
- 680
-
X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield techniqueSchedel-Niedrig, T. et al. | 1998
- 682
-
Electron probe microanalysis and magnetic characterization of compounds of the system Y-Ni-B-CSzillat, H. / Majewski, P. / Aldinger, F. et al. | 1998
- 684
-
Characterization of nanoscale metal structures obtained by template synthesisSchlottig, F. / Textor, M. / Spencer, N. D. / Sekinger, K. / Schnaut, U. / Paulet, J.-F. et al. | 1998
- 687
-
Microanalytical investigations on optical phase gratings in K(TiO)PO4 single crystalsKriegel, R. / Wellendorf, Robert / Kaps, Christian et al. | 1998
- 689
-
SXPS analysis of passivation and complexation on the CdS (101¯ 0) surfaceMayer, D. / Hallmeier, K. H. / Chassé, T. / Szargan, R. et al. | 1998
- 692
-
Submonolayer detection of polymer additives at the surface of industrial productsDietrich, R. et al. | 1998
- 694
-
Polarization sensitive in situ infrared spectroscopy: the adsorption of simple ions at platinum electrodesBron, Michael / Holze, R. et al. | 1998
- 697
-
Surface analysis of titanium based biomaterialsBorn, R. / Scharnweber, D. / Rößler, S. / Stölzel, M. / Thieme, M. / Wolf, C. / Worch, H. et al. | 1998
- 701
-
SEM-, EDS- and GDOES investigations for the identification of historical ferrous ore and slag from Sternmuehlenthal valley in the outskirts of ChemnitzDietrich, D. / Heger, P. / Baeucker, E. / Nuys, G. J. / Grafe, T. / Urban, G. et al. | 1998
- 701
-
SEM-, EDS- and GDOES investigations for the identification of historical ferrous ore and slag from Sternmühlenthal valley in the outskirts of ChemnitzDietrich, D. / Heger, P. / Bäucker, E. / Nuys, G. J. / Grafe, T. / Urban, G. et al. | 1998
- 704
-
Rapid soil analyses of overburden material from historic mines with SNMSGoschnick, J. / Sommer, M. et al. | 1998
- 707
-
The depth distribution of organic additives in mortar measured with plasma-based Secondary Neutral Mass SpectrometryGoschnick, J. / Mäder, U. / Sommer, M. et al. | 1998
- 710
-
Matrix sensitivity of solid sampling AAS. Determination of zinc in geological samplesDanzer, K. / Schrön, W. / Dreßler, B. / Jagemann, K.-U. et al. | 1998
- 710
-
Matrix sensitivity of solid sampling Determination of zinc in geological samplesDanzer, K. / Schroen, W. / Dressler, B. / Jagemann, K.-U. et al. | 1998
- 713
-
Fluorine profiles in Antarctic meteorites by nuclear reaction analysis (NRA)Noll, K. / Döbeli, M. / Krähenbühl, U. et al. | 1998
- 716
-
In-situ investigation of aerosol particles by atomic force microscopyKöllensperger, G. / Friedbacher, G. / Grasserbauer, M. et al. | 1998
- 722
-
New software tools for visualization of analytical dataWolkenstein, M. G. / Hutter, H. / Grasserbauer, M. et al. | 1998
- 725
-
Structure analysis of [Be(NCS)2(C5H5N)2]Böhland, H. / Hanay, W. / Noltemeyer, M. / Meller, A. / Schmidt, H. G. et al. | 1998
- 728
-
Investigation of divergent beam X-ray reflex sections especially indication by computer simulation and assignment to the grains in polycrystalline samplesLanger, E. / Däbritz, S. / Kurt, R. / Hauffe, W. et al. | 1998
- 733
-
Electrolytic hydride generation electrothermal atomic absorption spectrometry – in situ trapping of As on different pre-conditioned end-heated graphite tubesDenkhaus, E. / Golloch, A. / Kampen, T. U. / Nierfeld, M. / Telgheder, U. et al. | 1998
- 737
-
On tertiary BOx± ions in HF-plasma SNMSJenett, H. / Hodoroaba, Vasile-Dan et al. | 1998
- 740
-
Investigations of the solid state reaction process in mechanically alloyed Zr-Al-Cu-Ni bulk metallic glasses by analytical transmission electron microscopySeidel, M. / Reibold, M. / Eckert, J. et al. | 1998