Multilayer supermirror coating for hard x-ray telescope (English)
- New search for: Tawara, Yuzuru
- New search for: Yamashita, Koujun
- New search for: Kunieda, Hideyo
- New search for: Haga, Kazutoshi
- New search for: Akiyama, Kazuya
- New search for: Furuzawa, Akihiro
- New search for: Terashima, Yuichi
- New search for: Serlemitsos, Peter J.
- New search for: Tawara, Yuzuru
- New search for: Yamashita, Koujun
- New search for: Kunieda, Hideyo
- New search for: Haga, Kazutoshi
- New search for: Akiyama, Kazuya
- New search for: Furuzawa, Akihiro
- New search for: Terashima, Yuichi
- New search for: Serlemitsos, Peter J.
In:
Proc. SPIE
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2805
; 236
;
1996
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Multilayer supermirror coating for hard x-ray telescope
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Contributors:Tawara, Yuzuru ( author ) / Yamashita, Koujun ( author ) / Kunieda, Hideyo ( author ) / Haga, Kazutoshi ( author ) / Akiyama, Kazuya ( author ) / Furuzawa, Akihiro ( author ) / Terashima, Yuichi ( author ) / Serlemitsos, Peter J. ( author )
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Conference:Multilayer and Grazing Incidence X-Ray/EUV Optics III ; 1996 ; Denver,CO,United States
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Published in:Proc. SPIE ; 2805 ; 236
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Publisher:
- New search for: SPIE
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Publication date:1996-07-19
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Advanced X-Ray Astrophysics Facility (AXAF)Weisskopf, Martin C. / O'Dell, Stephen L. / Van Speybroeck, Leon P. et al. | 1996
- 2
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Advanced X-Ray Astrophysics Facility (AXAF) (Overview Paper) [2805-01]Weisskopf, M. C. / O'Dell, S. L. / Van Speybroeck, L. P. / SPIE et al. | 1996
- 8
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Monitoring program for the coating of the AXAF flight optics [2802-02]Romaine, S. E. / Bruni, R. J. / Clark, A. M. / Podgorski, W. A. / SPIE et al. | 1996
- 8
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Monitoring program for the coating of the AXAF flight opticsRomaine, Suzanne E. / Bruni, Ricardo J. / Clark, Anna M. / Podgorski, William A. / Schultz, D. / Schwartz, Daniel A. / Van Speybroeck, Leon P. / Zhou, Ying / Hahn, Robert E. / Johnston, George T. et al. | 1996
- 18
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Refectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV [2805-42]Graessle, D. E. / Clark, A. M. / Fitch, J. J. / Harris, B. / SPIE et al. | 1996
- 18
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Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keVGraessle, Dale E. / Clark, Anna M. / Fitch, Jonathan J. / Harris, Bernard / Schwartz, Daniel A. / Blake, Richard L. et al. | 1996
- 32
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Performance modeling of grazing incidence optics with structural deformations and fabrication errorsZissa, David E. / Ahmad, Anees / Feng, Chen et al. | 1996
- 32
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Performance modeling of grazing incidence optics with structural deformations and fabrication errors [2805-04]Zissa, D. E. / Ahmad, A. / Feng, C. / SPIE et al. | 1996
- 44
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ACIS UV/optical blocking filter calibration at the National Synchrotron Light Source [2805-05]Chartas, G. / Garmire, G. P. / Nousek, J. A. / Townsley, L. K. / SPIE et al. | 1996
- 44
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ACIS UV/optical blocking filter calibration at the National Synchrotron Light SourceChartas, George / Garmire, Gordon P. / Nousek, John A. / Townsley, Leisa K. / Powell, Forbes R. / Blake, Richard L. / Graessle, Dale E. et al. | 1996
- 56
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Characteristics of the flight model optics for the JET-X telescope onboard the Spectrum-X-Gamma satelliteCitterio, Oberto / Campana, Sergio / Conconi, Paolo / Ghigo, Mauro / Mazzoleni, Francesco / Poretti, Ennio / Conti, Giancarlo / Cusumano, Giancarlo / Sacco, Bruno / Braeuninger, Heinrich W. et al. | 1996
- 56
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Characteristics of the flight model optics for the JET-X telescope onboard the Spectrum-X-Gamma satellite (Invited Paper) [2805-06]Citterio, O. / Campana, S. / Conconi, P. / Ghigo, M. / SPIE et al. | 1996
- 66
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Soft x-ray calibration of the Co/C multilayer mirrors for the Objective Crystal Spectrometer on the Spectrum Roentgen-Gamma satellite [2805-08]Abdali, S. / Tarrio, C. / Christensen, F. E. / Schnopper, H. W. / SPIE et al. | 1996
- 66
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Soft x-ray calibration of the Co/C multilayer mirrors for the Objective Crystal Spectrometer on the Spectrum Roentgen-Gamma satelliteAbdali, Salim / Tarrio, Charles / Christensen, Finn E. / Schnopper, Herbert W. et al. | 1996
- 74
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Lobster-eye x-ray telescope prototypeGorenstein, Paul / Whitbeck, Elizabeth / Austin, Gerald K. / Kenter, Almus T. / Pina, Ladislav / Inneman, Adolf V. / Hudec, Rene et al. | 1996
- 74
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Lobster-eye x-ray telescope prototype [2805-10]Gorenstein, P. / Whitbeck, E. / Austin, G. K. / Kenter, A. T. / SPIE et al. | 1996
- 82
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Role of sampling errors in the specification of x-ray mirror surfaces (Invited Paper) [2805-11]Church, E. L. / Takacs, P. Z. / SPIE et al. | 1996
- 82
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Role of sampling errors in the specification of x-ray mirror surfacesChurch, Eugene L. / Takacs, Peter Z. et al. | 1996
- 90
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Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part IIGougeon, Samuel / Hignette, Olivier / Freund, Andreas K. / Lienert, Ulrich / Gondoin, Philippe / de Chambure, Daniel et al. | 1996
- 90
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Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part II [2805-12]Gougeon, S. / Hignette, O. / Freund, A. K. / Lienert, U. / SPIE et al. | 1996
- 108
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Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space opticsQian, Shinan / Li, Haizhang / Takacs, Peter Z. et al. | 1996
- 108
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Pentaprism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics [2805-13]Qian, S. / Li, H. / Takacs, P. Z. / SPIE et al. | 1996
- 115
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Solar X-Ray Imager (SXI) optical performance analysis [2805-14]Smithers, M. E. / Zissa, D. E. / SPIE et al. | 1996
- 115
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Solar X-ray Imager (SXI) optical performance analysisSmithers, Martin E. / Zissa, David E. et al. | 1996
- 121
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Subarcsecond x-ray telescope for imaging the solar corona in the 0.25- to 1.2-keV band [2805-15]Gallagher, D. J. / Cash, W. C. / Jelsma, S. / Farmer, J. / SPIE et al. | 1996
- 121
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Subarcsecond x-ray telescope for imaging the solar corona in the 0.25- to 1.2-keV bandGallagher, Dennis J. / Cash, Webster C. / Jelsma, Schuyler / Farmer, Jason et al. | 1996
- 134
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Transmission maps of the ACIS UV/optical blocking filtersTownsley, Leisa K. / Powell, Forbes R. / MacKay, James F. / Lagally, Max G. / Nousek, John A. / Garmire, Gordon P. et al. | 1996
- 134
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Transmission maps of the ACIS UV/optical blocking filters (Invited Paper) [2805-16]Townsley, L. K. / Powell, F. R. / MacKay, J. F. / Lagally, M. G. / SPIE et al. | 1996
- 148
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High-efficiency holographic ion-etched gratings with multilayer coatings and operating on-blaze at normal incidence in the 125- to 300-A rangeSeely, John F. / Kowalski, Michael P. / Cruddace, Raymond G. / Rife, Jack C. / Barbee, Troy W. / Hunter, William R. / Holland, Glenn E. et al. | 1996
- 148
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High-efficiency holographic ion-etched gratings with multilayer coatings and operating on-blaze at normal incidence in the 125- to 300- range (Invited Paper) [2805-19]Seely, J. F. / Kowalski, M. P. / Cruddace, R. G. / Rife, J. C. / SPIE et al. | 1996
- 156
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High-resolution grazing incidence x-ray spectrometer and its characteristics [2805-17]Zhong, X. / He, S. / SPIE et al. | 1996
- 156
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High-resolution grazing incidence x-ray spectrometer and its characteristicsZhong, Xianxin / He, Shaotang et al. | 1996
- 158
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Double multilayer monochromator for harmonic rejection in the 5- to 60-keV range [2805-20]Lingham, M. / Ziegler, E. / Lueken, E. / Loeffen, P. / SPIE et al. | 1996
- 158
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Double multilayer monochromator for harmonic rejection in the 5-to60-keV rangeLingham, Manohar / Ziegler, Eric / Luken, Eike / Loeffen, Paul W. / Muellender, Stefan / Goulon, Jose et al. | 1996
- 169
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Design of stigmatic gratings for grazing incidence monochromator spectrographsSavushkin, Alexander V. et al. | 1996
- 169
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Design of stigmatic gratings for grazing incidence monochromator spectrographs [2805-21]Savushkin, A. V. / SPIE et al. | 1996
- 176
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Electromagnetic theory of multilayer gratings and zone plates (Invited Paper) [2805-22]Neviere, M. / Montiel, F. / SPIE et al. | 1996
- 176
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Electromagnetic theory of multilayer gratings and zone platesNeviere, Michel / Montiel, Frederic et al. | 1996
- 184
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Fabrication and test of one-dimensional Bragg-Fresnel lens using Ag/Al multilayer zone plate [2805-24]Koike, M. / Suzuki, I. H. / Komiya, S. / Amemiya, Y. / SPIE et al. | 1996
- 184
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Fabrication and test of one-dimensional Bragg-Fresnel lens using Ag/Al multilayer zone plateKoike, Masaki / Suzuki, Isao H. / Komiya, Satoshi / Amemiya, Yoshiyuki et al. | 1996
- 192
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Characterization of x-ray polycapillary optics with a high-resolution x-ray optical bench [2805-23]Jach, T. / Steel, E. / Chen-Mayer, H. / Ullrich, J. B. / SPIE et al. | 1996
- 192
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Characterization of x-ray polycapillary optics with a high-resolution x-ray optical benchJach, Terrence / Steel, Eric / Chen-Mayer, Huaiyu H. / Ullrich, Johannes B. / Downing, Robert G. / Thurgate, Stephen et al. | 1996
- 202
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Development of capillary optics for microbeam applications with synchrotron raditionPahl, Reinhard / Bilderback, Donald H. et al. | 1996
- 202
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Development of capillary optics for microbean applications with synchrotron radition [2805-26]Pahl, R. / Bilderback, D. H. / SPIE et al. | 1996
- 212
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MCP-based x-ray collimators for lithography of semiconductor devices [2805-27]Brunton, A. N. / Lees, J. E. / Fraser, G. W. / Tremsin, A. S. / SPIE et al. | 1996
- 212
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MCP-based x-ray collimators for lithography of semiconductor devicesBrunton, Adam N. / Lees, John E. / Fraser, George W. / Tremsin, Anton S. / Feller, W. Bruce / White, Paul L. et al. | 1996
- 224
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Diffractive-optic telescope for x-ray astronomyDewey, Daniel / Markert, Thomas H. / Schattenburg, Mark L. et al. | 1996
- 224
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Diffractive-optic telescope for x-ray astronomy [2805-29]Dewey, D. / Markert, T. H. / Schattenburg, M. L. / SPIE et al. | 1996
- 236
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Multilayer supermirror coating for hard x-ray telescopeTawara, Yuzuru / Yamashita, Koujun / Kunieda, Hideyo / Haga, Kazutoshi / Akiyama, Kazuya / Furuzawa, Akihiro / Terashima, Yuichi / Serlemitsos, Peter J. et al. | 1996
- 236
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Multilayer supermirror coating for hard x-ray telescope [2805-30]Tawara, Y. / Yamashita, K. / Kunieda, H. / Haga, K. / SPIE et al. | 1996
- 244
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Radiometric measurements for the purposes of the permanent space patrol of the solar EUV and soft x-ray radiation [2805-31]Avakyan, S. V. / SPIE et al. | 1996
- 244
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Radiometric measurements for the purposes of the permanent space patrol of the solar EUV and soft x-ray radiationAvakyan, Sergey V. et al. | 1996
- 254
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Possibility of creation of high-quality x-ray carbon mirrorsKondrashov, Pavel E. / Smirnov, Igor S. / Novoselova, Elena G. / Baranov, Alexander M. / Ivanovsky, G. F. et al. | 1996
- 254
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Possibility of creation of high-quality x-ray carbon mirrors [2805-35]Kondrashov, P. E. / Smirnov, I. S. / Novoselova, E. G. / Baranov, A. M. / SPIE et al. | 1996
- 260
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Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence [2805-45]Boscolo, A. / Poletto, L. / Tondello, G. / SPIE et al. | 1996
- 260
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Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidenceBoscolo, Alessio / Poletto, Luca / Tondello, Giuseppe et al. | 1996
- 268
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Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples [2805-36]Clark, A. M. / Bruni, R. J. / Romaine, S. E. / Schwartz, D. A. / SPIE et al. | 1996
- 268
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Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samplesClark, Anna M. / Bruni, Ricardo J. / Romaine, Suzanne E. / Schwartz, Daniel A. / Van Speybroeck, Leon P. / Yip, P. W. / Drehman, Alvin J. / Shapiro, Alan P. et al. | 1996
- 277
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EUV spectrometric facility with laser-focus plasma radiation source [2805-38]Papanyan, V. O. / Nersisyan, G. T. / SPIE et al. | 1996
- 277
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EUV spectrometric facility with laser-focus plasma radiation sourcePapanyan, Valeri O. / Nersisyan, Gagik T. et al. | 1996
- 282
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X-ray interferometry technique for mirror and multilayer characterization [2805-39]Schelokov, I. A. / Hignette, O. / Raven, C. / Snigirev, A. A. / SPIE et al. | 1996
- 282
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X-ray interferometry technique for mirror and multilayer characterizationSchelokov, Igor A. / Hignette, Olivier / Raven, Carsten / Snigirev, Anatoly A. / Snigireva, Irina / Suvorov, Alexey et al. | 1996
- 293
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Superfinish technology for enhanced grazing incidence reflectivity in x-ray telescope [2805-41]Graue, R. / Valsecchi, G. / SPIE et al. | 1996
- 293
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Superfinish technology for enhanced grazing incidence reflectivity in x-ray telescopesGraue, Roland / Valsecchi, Giuseppe et al. | 1996
- 301
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Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples [2805-03]Bruni, R. J. / Clark, A. M. / Moran, J. F. / Nguyen, D. T. / SPIE et al. | 1996
- 301
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Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samplesBruni, Ricardo J. / Clark, Anna M. / Moran, James M. / Nguyen, Dan T. / Romaine, Suzanne E. / Schwartz, Daniel A. / Van Speybroeck, Leon P. et al. | 1996
- 311
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Analysis of iridium reflectance measurements for AXAF withness mirrors from 2 to 12 keV [2805-43]Fitch, J. J. / Graessle, D. E. / Harris, B. / Hughes, J. P. / SPIE et al. | 1996
- 311
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Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keVFitch, Jonathan J. / Graessle, Dale E. / Harris, Bernard / Hughes, John P. / Nguyen, Dan T. / Schwartz, Daniel A. / Blake, Richard L. et al. | 1996
- 323
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Iridium optical constants from x-ray transmission measurements over 2 to 12 KeV [2805-44]Harris, B. / Graessle, D. E. / Fitch, J. J. / Juda, J. Z. / SPIE et al. | 1996
- 323
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Iridium optical constants from x-ray transmission measurements over 2 to 12 keVHarris, Bernard / Graessle, Dale E. / Fitch, Jonathan J. / Juda, Jiahong Z. / Blake, Richard L. / Schattenburg, Mark L. / Gullikson, Eric M. et al. | 1996
- 336
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Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes [2805-07]Hussain, A. M. / Joensen, K. D. / Hoeghoej, P. / Christensen, F. E. / SPIE et al. | 1996
- 336
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Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopesHussain, Ahsen M. / Joensen, Karsten D. / Hoeghoej, P. / Christensen, Finn E. / Louis, Eric / Voorma, Harm-Jan / Soong, Yang / White, Nicholas E. / Anderson, Ian S. et al. | 1996