Comparative analysis of interferometric measurements of PMD on optical fibers (English)
- New search for: Ferreira da Silva, T.
- New search for: Ferreira, J.
- New search for: Borghi, G.
- New search for: Menegotto, T.
- New search for: Vilela de Faria, G.
- New search for: von der Weid, J. P.
- New search for: Ferreira da Silva, T.
- New search for: Ferreira, J.
- New search for: Borghi, G.
- New search for: Menegotto, T.
- New search for: Vilela de Faria, G.
- New search for: von der Weid, J. P.
In:
Proc. SPIE
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8082
; 80822U
;
2011
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Comparative analysis of interferometric measurements of PMD on optical fibers
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Contributors:Ferreira da Silva, T. ( author ) / Ferreira, J. ( author ) / Borghi, G. ( author ) / Menegotto, T. ( author ) / Vilela de Faria, G. ( author ) / von der Weid, J. P. ( author )
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Conference:Optical Measurement Systems for Industrial Inspection VII ; 2011 ; Munich,Germany
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Published in:Proc. SPIE ; 8082 ; 80822U
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Publisher:
- New search for: SPIE
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Publication date:2011-05-26
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 80820A
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Synthetic aperture engineering for super-resolved microscopy in digital lensless Fourier holographyMicó, Vicente / Granero, Luis / Zalevsky, Zeev / García, Javier et al. | 2011
- 80820B
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Dual-wavelength holographic shape measurement with iterative phase unwrappingRosendahl, Sara / Bergström, Per / Gren, Per / Sjödahl, Mikael et al. | 2011
- 80820C
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Infrared digital holography for large objects investigationGeltrude, A. / Locatelli, M. / Poggi, P. / Pelagotti, A. / Paturzo, M. / Ferraro, P. / Meucci, R. et al. | 2011
- 80820D
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Remote laboratory for digital holographic metrologyWilke, Marc / Alekseenko, Igor / Situ, Guohai / Sarker, Konica / Riedel, Margarita / Pedrini, Giancarlo / Osten, Wolfgang et al. | 2011
- 80820E
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Simultaneous out-of-plane and in-plane displacements measurement by using digital holography around a hole or indentationViotti, Matias R. / Kohler, Christian / Albertazzi, Armando et al. | 2011
- 80820G
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Recent advances in the field of super resolved imaging and sensingZalevsky, Zeev / Borkowski, Amikam / Marom, Emanuel / Javidi, Bahram / Beiderman, Yevgeny / Micó, Vicente / García, Javier et al. | 2011
- 80820H
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Advanced 2D die placement inspection system for reliable flip chip interconnections based on 3D information of die and substrate by a phase measuring profilometryLee, Hyun-Kee / Kim, Min Young et al. | 2011
- 80820I
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3D interconnect metrology in CMS/ITRIKu, Y. S. / Shyu, D. M. / Hsu, W. T. / Chang, P. Y. / Chen, Y. C. / Pang, H. L. et al. | 2011
- 80820J
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Pattern placement metrology using PROVE high precision optics combined with advanced correction algorithmsLängle, Mario / Rosenkranz, Norbert / Seidel, Dirk / Beyer, Dirk et al. | 2011
- 80820K
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Detection of micro-probe displacement using a Shack-Hartmann wavefront sensorDierke, H. / Schrader, C. / Tutsch, R. et al. | 2011
- 80820L
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Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objectsMigukin, Artem / Katkovnik, Vladimir / Astola, Jaakko et al. | 2011
- 80820M
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The effect of misalignment in phase retrieval based on a spatial light modulatorAgour, Mostafa / Falldorf, Claas / von Kopylow, Christoph / Bergmann, Ralf B. et al. | 2011
- 80820N
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Quantitative determination of the optical properties of phase objects by using a real-time phase retrieval techniqueFrank, Johannes / Wernicke, Guenther / Matrisch, Jan / Wette, Sebastian / Beneke, Jan / Altmeyer, Stefan et al. | 2011
- 80820O
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Phase extraction in microscopy using tunable defocusing by means of a SLMCamacho, Luis / Micó, Vicente / Zalevsky, Zeev / García, Javier et al. | 2011
- 80820P
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Three-dimensional refractive index and thickness distribution of thin film measurements through dynamic multiwavelength interferometryWu, Kai / Lee, Cheng-Chung et al. | 2011
- 80820Q
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Comparison of fast Fourier transform and convolution in wavelength scanning interferometryMuhamedsalih, H. / Jiang, X. / Gao, F. et al. | 2011
- 80820R
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Absolute surface profilometry of an object with large gaps by means of monochromatic laser interferometryLiu, Zhiqiang / Uchikawa, Kiyoshi / Takeda, Mitsuo et al. | 2011
- 80820S
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Structured-illumination microscopy on technical surfaces: 3D metrology with nanometer sensitivityVogel, Markus / Yang, Zheng / Kessel, Alexander / Kranitzky, Christoph / Faber, Christian / Häusler, Gerd et al. | 2011
- 80820T
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Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers using spectral interferometryHlubina, P. / Ciprian, D. / Martynkien, T. / Mergo, P. / Urbańczyk, W. et al. | 2011
- 80820U
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Inspection of processes during silicon wafer sawing using low coherence interferometry in the near infrared wavelength regionGastinger, Kay / Johnsen, Lars / Simonsen, Ove / Aksnes, Astrid et al. | 2011
- 80820V
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Uncertainty of height information in coherence scanning interferometrySeewig, J. / Böttner, T. / Broschart, D. et al. | 2011
- 80820W
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Improvement of lateral resolution and reduction of batwings in vertical scanning white-light interferometryNiehues, Jan / Lehmann, Peter et al. | 2011
- 80820X
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Parallel optical coherence tomography (pOCT) for industrial 3D inspectionLambelet, Patrick et al. | 2011
- 80820Y
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High speed fringe projection for fast 3D inspectionCaspar, Sandra / Honegger, Marc / Rinner, Stefan / Lambelet, Patrick / Bach, Carlo / Ettemeyer, Andreas et al. | 2011
- 80820Z
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Radial expansion measurements of a high-speed rotor using an interferometric array sensorCzarske, J. / Günther, P. / Dreier, F. / Pfister, T. / Haupt, T. / Hufenbach, W. et al. | 2011
- 80821A
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Optical measurement and comparison of large free form surfaces through a regular meshPinto, Tiago L. / Kohler, Christian / Albertazzi, Armando et al. | 2011
- 80821B
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Accurate calibration of a fringe projection system by considering telecentricityHaskamp, Klaus / Kästner, Markus / Reithmeier, Eduard et al. | 2011
- 80821C
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Some aspects of error influences in interferometric measurements of optical surface formsSchulz, M. / Wiegmann, A. et al. | 2011
- 80821D
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Diffractive simultaneous lateral shearing interferometryNercissian, Vanusch / Harder, Irina / Mantel, Klaus / Berger, Andreas / Lindlein, Norbert et al. | 2011
- 80821E
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Aspherical surface measurement using quadri-wave lateral shearing interferometryBoucher, William / Delage, Pascal / Wattellier, Benoit et al. | 2011
- 80821F
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Advanced studies on the measurement of aspheres and freeform surfaces with the tilted-wave interferometerGarbusi, Eugenio / Baer, Goran / Osten, Wolfgang et al. | 2011
- 80821G
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A subaperture stitching algorithm for aspheric surfacesLin, Po-Chih / Chen, Yi-Chun / Lee, Chung-Min / Liang, Chao-Wen et al. | 2011
- 80821I
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Axicon metrology using high line density computer-generated hologramsMa, Jun / Pruss, Christof / Häfner, Matthias / Zhu, Rihong / Gao, Zhishan / Yuan, Caojin / Osten, Wolfgang et al. | 2011
- 80821J
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3D profilometry on aspheric and freeform lensesBeutler, A. et al. | 2011
- 80821K
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Measurements of aberrations of aspherical lenses using experimental ray tracingCeyhan, Ufuk / Henning, Thomas / Fleischmann, Friedrich / Hilbig, David / Knipp, Dietmar et al. | 2011
- 80821L
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Automated alignment of aspheric and freeform surfaces in a non-null test interferometerBaer, Goran / Garbusi, Eugenio / Lyda, Wolfram / Pruss, Christof / Osten, Wolfgang et al. | 2011
- 80821M
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Complete characterization of assembled optics with respect to centering error and lens distancesHeinisch, J. / Langehanenberg, P. / Pannhoff, H. et al. | 2011
- 80821N
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Interferometric measurement of profile deviations of large precision mirrorsMüller, Andreas / Jäger, Gerd / Manske, Eberhard et al. | 2011
- 80821O
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Measuring amplitude and phase of light emerging from microstructures with HRIMScharf, Toralf / Kim, Myun-Sik / Herzig, Hans Peter et al. | 2011
- 80821P
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Extended range metrology: an age old problemTowers, Catherine E. / Towers, David P. / Falaggis, K. et al. | 2011
- 80821Q
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Numerical noise reduction via diffraction for surface profiling interferometryToba, Hidemitsu / Nakayama, Shigeru / Homma, Hideaki / Gemma, Takashi / Uchikawa, Kiyoshi et al. | 2011
- 80821R
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Dynamic measurements using a Fizeau interferometerSykora, Daniel M. / Holmes, Michael L. et al. | 2011
- 80821S
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Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometerFrade, María / Enguita, José María / Álvarez, Ignacio / Rodríguez-Jiménez, Silvia et al. | 2011
- 80821T
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State of polarization mapping using a calibrated interferometric polarimeterNaik, Dinesh N. / Singh, Rakesh Kumar / Itou, Hitoshi / Miyamoto, Yoko / Takeda, Mitsuo et al. | 2011
- 80821U
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High resolution speckle interferometry by replacing temporal information with spatial informationArai, Y. / Inoue, T. / Yokozeki, S. et al. | 2011
- 80821V
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SLM-based multipoint vibrometryHaist, Tobias / Tarbeyevskaya, Alena / Warber, Michael / Osten, Wolfgang / Rembe, Christian / Ludwig, Mario / Stork, Wilhelm et al. | 2011
- 80821W
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Adaptive optical head for industrial vibrometry applicationsAtashkhooei, R. / Zabit, U. / Royo, S. / Bosch, T. / Bony, F. et al. | 2011
- 80821X
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Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting methodStyk, A. / Brzeziński, M. et al. | 2011
- 80821Y
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Application of wavelet transform and image morphology in processing vibration speckle interferogram for automatic analysisKumar, Rajesh / Jena, Dibya Prakash / Shakher, Chandra et al. | 2011
- 80821Z
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High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticlesIshii, Katsuhiro / Nakamura, Sohichiro / Sato, Yuki et al. | 2011
- 80822A
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Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of KGR-134 inhibited seawater by holographic interferometry techniquesHabib, K. et al. | 2011
- 80822B
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Reconstruction of 3D refractive index distribution across the graded index optical fibre using digital holographic interferometryWahba, H. H. / Shams El-Din, M. A. et al. | 2011
- 80822C
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Characterization of a waveguide written by a UV laser into a planar polymer chip by digital holographic interferometryShams El-Din, M. A. / Wahba, H. H. / Vollertsen, F. et al. | 2011
- 80822D
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Compensation of reference beam sphericity in a multi-perspective digital holography based record-display setupPandey, Nitesh / Hennelly, Bryan et al. | 2011
- 80822E
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Novel method for automatic filtering in the Fourier space applied to digital hologram reconstructionRincon, O. J. / Amezquita, R. / Torres, Y. M. / Agudelo, V. et al. | 2011
- 80822F
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Digital holographic microscopy for dynamic imaging of hydrogelsYuan, Caojin / Pedrini, Giancarlo / Fu, Guodong / Ma, Jun / Osten, Wolfgang et al. | 2011
- 80822G
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Particle concentration effect on diffraction efficiency in two views off-axis hologramsBouamama, L. / Kara, S. / Chaab, O. / Simoëns, S. et al. | 2011
- 80822H
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Zero-order elimination in digital holography by use of two holograms: one is made by tilting the CCDAbolhassani, Mohammad / Rostami, Yadollah et al. | 2011
- 80822I
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Coherence effects in Makyoh topographyRiesz, Ferenc et al. | 2011
- 80822J
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Spatial phase-shift interferometry: implementation of an effective phase-recovering algorithmVannoni, Maurizio / Melozzi, Mauro / Barilli, Marco / Sordini, Andrea / Molesini, Giuseppe et al. | 2011
- 80822K
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Adaptive holographic illumination in comparative electronic speckle pattern interferometrySéfel, Richárd / Kornis, János / Varga-Fogarasi, Szilvia et al. | 2011
- 80822L
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Transmission sphere calibration and its current limitsYang, Pengqian / Xu, Jia / Zhu, Jianqiang / Hippler, Stefan et al. | 2011
- 80822N
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Development of error estimation method for phase detection in phase shift methodHanayama, Ryohei / Hibino, Kenichi et al. | 2011
- 80822O
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Hybrid light source for scanning white light interferometry-based MEMS quality controlHeikkinen, V. / Hanhijärvi, K. / Aaltonen, J. / Räikkönen, H. / Wälchli, B. / Paulin, T. / Kassamakov, I. / Grigoras, K. / Franssila, S. / Hæggström, E. et al. | 2011
- 80822P
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Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration referenceCouceiro, Iakyra B. / Ferreira da Silva, Thiago / Tarelho, Luiz V. G. / Azeredo, Carlos L. S. / Malinovski, Igor / Grieneisein, Hans P. H. / Barros, Wellington S. / Faria, Giancarlo V. / von der Weid, Jean P. / Amaral, Marcello M. et al. | 2011
- 80822Q
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Dispersion optimized white-light interferometer based on a Schwarzschild objectiveKühnhold, Peter / Lehmann, Peter / Niehues, Jan et al. | 2011
- 80822R
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Interferometric multiwavelength system for long gauge blocks measurementsWengierow, Michal / Sałbut, Leszek / Ramotowski, Zbigniew et al. | 2011
- 80822S
-
Investigation of organic light emitting diodes for interferometric purposesPakula, Anna / Zimak, Marzena / Sałbut, Leszek et al. | 2011
- 80822T
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Spectral polarimetry-based measurement of the thickness of a thin filmHlubina, P. / Luňáček, J. / Ciprian, D. et al. | 2011
- 80822U
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Comparative analysis of interferometric measurements of PMD on optical fibersFerreira da Silva, T. / Ferreira, J. / Borghi, G. / Menegotto, T. / Vilela de Faria, G. / von der Weid, J. P. et al. | 2011
- 80822V
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Determination of the characteristics of the surface of objects at optical remote sensing by the polarization-holographic imaging Stokes spectropolarimeterKilosanidze, Barbara / Kakauridze, George et al. | 2011
- 80822W
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Mueller matrix imaging of plasmonic polarizers on nanopatterned surfaceAas, Lars Martin S. / Nerbø, Ingar Stian / Kildemo, Morten / Chiappe, Daniele / Martella, Christian / Buatier de Mongeot, Francesco et al. | 2011
- 80822X
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Measurement of five-degrees-of-freedom error motions for a micro high-speed spindle using an optical techniqueMurakami, Hiroshi et al. | 2011
- 80822Y
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Measurement system for hot heavy forgings and its calibrationDu, Yueyang / Du, Zhengchun et al. | 2011
- 80822Z
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3D shape measurement of optical free-form surface based on fringe projectionLi, Shaohui / Liu, Shugui / Zhang, Hongwei et al. | 2011
- 80823B
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Dynamic concentricity measurement of large interval-diameter ratio holes with virtual annular quadrant methodLiu, Qian / Yang, Weichuan / Yao, Bing / Jang, Jiadong / Hu, Jun et al. | 2011
- 80823C
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Novel method for misalignments measurement on imaging systems through quality image analysisOteo, Esther / Fernández-Dorado, José / Arasa, J. / Blanco, P. / Pizarro, C. et al. | 2011
- 80823D
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Visual alignment of mechanical structures using a Bessel beam datum: practical implementationGale, David M. et al. | 2011
- 80823E
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Choice of the reflector for the autocollimating alignment telescopeAnisimov, Andrey G. / Timofeev, Alexandr N. / Korotaev, Valery V. et al. | 2011
- 80823F
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Measuring the performance of visible, NIR, and LWIR optical components: a reliable, robust, high-accuracy lens measurement systemFantone, Stephen D. / Orband, Daniel G. et al. | 2011
- 80823G
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The Ronchi test using a liquid crystal display as a phase gratingMora-González, Miguel / Casillas, Francisco J. / Muñoz-Maciel, Jesús / Chiu-Zarate, Roger / Peña-Lecona, Francisco G. et al. | 2011
- 80823H
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Software configurable optical test system for refractive opticsDominguez, Margaret Z. / Wang, Lirong / Su, Peng / Parks, Robert E. / Burge, James H. et al. | 2011
- 80823I
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High pressure measurement by fat long period grating sensor on a single mode optical fiberZibaii, M. I. / Kheiri, M. / Nori, S. / Sadeghi, J. / Pourbeyram, H. / Latifi, H. / Ghezelaiagh, M. H. et al. | 2011
- 80823J
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Time-resolved oblique incidence interferometer for vibration analysis of rough surfaceMizutani, Yasuhiro / Higuchi, Takayuki / Iwata, Tetsuo / Otani, Yukitoshi et al. | 2011
- 80823K
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Optimized dust-proof optical fiber sensing system for real-time monitoring of frequency, phase, and vibration of rotating partsProkopczuk, K. / Lesiak, P. / Poczęsny, T. / Rozwadowski, K. / Woliński, T. R. / Domański, A. W. et al. | 2011
- 80823L
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Optical fiber macro-bend seismic sensor for real-time vibration monitoring in harsh industrial environmentPoczęsny, T. / Prokopczuk, K. / Makowski, P. L. / Domański, A. W. et al. | 2011
- 80823M
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High temperature sensing with FBGs using a tunable laser interrogation systemEder, B. / Plattner, M. / Putzer, P. / Eckert, P. / Reutlinger, A. / Zeh, T. et al. | 2011
- 80823N
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Optical vibration measurements of cross coupling effects in capacitive micromachined ultrasonic transducer arraysLeirset, Erlend / Aksnes, Astrid et al. | 2011
- 80823O
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Submicron displacements measurement by measuring autocorrelation of the transmission function of a gratingMadanipour, K. / Tavassoly, M. T. et al. | 2011
- 80823P
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Optical sensor based on combined GI/DSPI technique for strain monitoring in crucial points of big engineering structuresSałbut, Leszek / Kujawińska, Małgorzata / Malowany, Krzysztof et al. | 2011
- 80823Q
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Evaluation of thermal expansion coefficient of Fabry-Perot cavity using an optical frequency combOulehla, Jindřich / Šmíd, Radek / Buchta, Zdeněk / Mikel, Břetislav / Jedlička, Petr / Lazar, Josef et al. | 2011
- 80823R
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Optic-electronic systems for measuring the angle deformations and line shifts of the reflecting elements at the rotateable radio-telescopeKonyakhin, Igor A. / Timofeev, Alexandr N. / Usik, Alexandr A. / Zhukov, Dmitry V. et al. | 2011
- 80823S
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Sub-ppm absolute distance measurements using an optical frequency comb generated by a conventional dual-drive Mach-Zehnder modulatorLe Floch, S. / Llera, M. / Salvadé, Y. et al. | 2011
- 80823T
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A novel diffractive encoding principle for absolute optical encodersHopp, D. / Wibbing, D. / Pruss, C. / Osten, W. / Binder, J. / Schinköthe, W. / Sterns, F. / Seybold, J. / Fritz, K.-P. / Mayer, V. et al. | 2011
- 80823U
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AFM nanometrology interferometric system with the compensation of angle errorsHrabina, Jan / Lazar, Josef / Klapetek, Petr / Cip, Ondrej et al. | 2011
- 80823V
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Noncontact interferometric technique for calibration of coordinate measuring machinesMiks, A. / Novak, J. / Novak, P. et al. | 2011
- 80823W
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Influences of colorful LED emissions on spectrophotometric properties of a LED based white light sourceSametoglu, F. / Celikel, O. et al. | 2011
- 80823X
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Experimental study of the heat transfer process of air around atmospheric arc plasmaSalimi Meidanshahi, F. / Madanipour, Kh. / Shokri, Babak et al. | 2011
- 80823Y
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Optical characterization of three-dimensional structures within a DRAM capacitorKrupinski, Martin / Kasic, Alexander / Hecht, Thomas / Klude, Matthias / Heitmann, Johannes / Erben, Elke / Mikolajick, Thomas et al. | 2011
- 80823Z
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3D laser scanner system based on a galvanometer scan head for high temperature applicationsHegna, Torunn / Pettersson, Hans / Laundal, Karl Magnus / Grujic, Katarina et al. | 2011
- 808201
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Front Matter: Volume 8082| 2011
- 808202
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Assistant systems for efficient multiscale measurement and inspectionBurla, Avinash / Haist, Tobias / Lyda, Wolfram / Aissa, Mohamed Hassanine / Osten, Wolfgang et al. | 2011
- 808203
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Multisensor technology based on a laser focus probe for nanomeasuring applications over large areasManske, Eberhard / Jäger, Gerd / Hausotte, Tino / Machleidt, Torsten et al. | 2011
- 808204
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Conceptual consideration for the process integration of optical sensorsFleischle, David / Lyda, Wolfram / Mauch, Florian / Osten, Wolfgang et al. | 2011
- 808205
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Some figures of merit so as to compare digital Fresnel holography and speckle interferometrySlangen, Pierre / Karray, Mayssa / Picart, Pascal et al. | 2011
- 808206
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Reference wave adaptation in digital lensless Fourier holography by means of a spatial light modulatorMeeser, Thomas / Falldorf, Claas / von Kopylow, Christoph / Bergmann, Ralf B. et al. | 2011
- 808207
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Self interference digital holographic microscopy approach for inspection of technical and biological phase specimensKemper, Björn / Schlichthaber, Frank / Vollmer, Angelika / Ketelhut, Steffi / Przibilla, Sabine / von Bally, Gert et al. | 2011
- 808208
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Stokes holography for recording and reconstructing objects using polarization fringesSingh, Rakesh Kumar / Naik, Dinesh N. / Itou, Hitoshi / Miyamoto, Yoko / Takeda, Mitsuo et al. | 2011
- 808209
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An algorithm for the estimation of the in-focus distance for speckle hologramsMemmolo, P. / Distante, C. / Paturzo, M. / Finizio, A. / Ferraro, P. / Javidi, B. et al. | 2011
- 808210
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High-speed, on-line 4D microscopy using continuously scanning white light interferometry with a high-speed camera and real-time FPGA image processingMontgomery, P. / Anstotz, F. / Montagna, J. et al. | 2011
- 808211
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3D high-speed profilometer for inspection of micro-manufactured transparent partsLjubicic, Dean M. / Anthony, Brian W. et al. | 2011
- 808212
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Fringe projection based high-speed 3D sensor for real-time measurementsBräuer-Burchardt, Christian / Breitbarth, Andreas / Kühmstedt, Peter / Schmidt, Ingo / Heinze, Matthias / Notni, Gunther et al. | 2011
- 808213
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Alignment methods for ultraprecise deflectometric flatness metrologyEhret, Gerd / Schulz, Michael / Fitzenreiter, Arne / Baier, Maik / Jöckel, Wolfgang / Stavridis, Manuel / Elster, Clemens et al. | 2011
- 808214
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Measurement and characterization of cylindrical surfaces by deflectometry applied to ballistic identificationFantin, A. V. / Veiga, C. / Albertazzi, A. et al. | 2011
- 808215
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Endoscopic geometry inspection by modular fiber optic sensors with increased depth of focusOhrt, Christoph / Kästner, Markus / Reithmeier, Eduard et al. | 2011
- 808216
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3D measuring in the field of endoscopySchick, Anton / Forster, Frank / Stockmann, Michael et al. | 2011
- 808217
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3D shape measurement based on color-encoded sinusoidal fringe projectionZhang, Qican / Ma, Ke et al. | 2011
- 808218
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New structured light measurement and calibration method for 3D documenting of engineering structuresSitnik, Robert / Kujawińska, Małgorzata / Błaszczyk, Paweł M. et al. | 2011
- 808219
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Fast 3D shape measurements using laser speckle projectionSchaffer, Martin / Grosse, Marcus / Harendt, Bastian / Kowarschik, Richard et al. | 2011
- 808220
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Novel non-contact optical characterisation methods of polymeric nanocomposite structures based on their particle loading and dispersion profileKoukoulas, Triantafillos / Broughton, William R. / Tedaldi, Matthew / Theobald, Pete D. et al. | 2011
- 808221
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Mueller matrix imaging of nematic textures in colloidal dispersions of Na-fluorohectorite synthetic clayKildemo, Morten / Aas, Lars M. S. / Ellingsen, Pål G. / Hemmen, Henrik / Hansen, Elisabeth L. / Fossum, Jon O. et al. | 2011
- 808222
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3D optical measuring technologies for industrial applicationsChugui, Yuri / Verkhogliad, Alexander / Kalikin, Vadim / Zav'yalov, Peter et al. | 2011
- 808223
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Lockin-interferometric imaging of thermal waves for nondestructive testingMenner, Philipp / Busse, Gerd et al. | 2011
- 808224
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Laser ultrasonics evaluation and testing of coated HTR nuclear fuelAmziane, Ahmed / Amari, Mohamed / Mounier, Denis / Breteau, Jean-Marc / Joly, Nicolas / Edely, Mathieu / Larcher, Maxime / Noiré, Paul / Banchet, Julien / Tisseur, David et al. | 2011
- 808225
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Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin filmsMühlig, Christian / Bublitz, Simon / Paa, Wolfgang et al. | 2011
- 808226
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Reflectometry for TSV etching depth inspectionHsu, Wei-Te / Ku, Yi-Sha et al. | 2011
- 808227
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Optical characterization of phase gratings written by a UV femtosecond laser in PMMADe Nicola, S. / Abdalah, S. / Al-Naimee, K. / Geltrude, A. / Locatelli, M. / Meucci, R. / Baum, A. / Perrie, W. / Scully, P. J. / Taranu, A. et al. | 2011
- 808228
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Development of a FD-OCT for the inline process metrology in laser structuring systemsSchmitt, Robert / Mallmann, Guilherme / Peterka, Pavel et al. | 2011
- 808229
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Turning process monitoring using a robust and miniaturized non-incremental interferometric distance sensorGünther, P. / Dreier, F. / Pfister, T. / Czarske, J. et al. | 2011
- 808230
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Material tests using the ARAMIS system: a laboratory reportAcevedo Pardo, Carlos / Ohlendieck, Jens / Krahwinkel, Manuel / Sternberg, Harald et al. | 2011
- 808231
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Calibration routine for in-process roundness measurements of steel rings during heat treatmentGafsi, H. / Goch, G. et al. | 2011
- 808232
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A new type of color-coded light structures for an adapted and rapid determination of point correspondences for 3D reconstructionCaulier, Yannick / Bernhard, Luc / Spinnler, Klaus et al. | 2011
- 808233
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Positioning of scanned part inside of the laser triangulation systemStankiewicz, M. / Reiner, J. / Kotnarowski, G. et al. | 2011
- 808234
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Industrial surface inspection by wavelet analysisKreis, Thomas / Rosenboom, Lars / Jüptner, Werner et al. | 2011
- 808235
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Design and fabrication of White Light Confocal Microscope with tunable resolution and sensitivityBehroodi, E. / Mousavian, A. / Latifi, H. et al. | 2011
- 808236
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Shape and thickness measurements using a reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropyMacedo, M. P. / Correia, C. M. B. A. et al. | 2011
- 808238
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Multiresolution analysis of angle-resolved light scattering measurements on ground surfacesBöhm, J. A. / Vernes, A. / Vorlaufer, G. / Vellekoop, M. J. et al. | 2011
- 808239
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New method for evaluating high-quality fog protective coatingsCzeremuszkin, Grzegorz / Latreche, Mohamed / Mendoza-Suarez, Guillermo et al. | 2011
- 808240
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In-process fault detection for textile fabric production: onloom imagingNeumann, Florian / Holtermann, Timm / Schneider, Dorian / Kulczycki, Ashley / Gries, Thomas / Aach, Til et al. | 2011
- 808241
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Fluorescence errors in integrating sphere measurements of remote phosphor type LED light sourcesKeppens, A. / Zong, Y. / Podobedov, V. B. / Nadal, M. E. / Hanselaer, P. / Ohno, Y. et al. | 2011
- 808242
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Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filtersFadeyev, A. V. / Pozhar, V. E. et al. | 2011
- 808243
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Spectrally resolved measurement of small optical losses by cavity enhanced spectroscopy techniquesZeuner, T. / Paa, W. / Schmidl, G. / Mühlig, Ch. et al. | 2011
- 808244
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Microlens array manufactured by inkjet printing: study of the effects of the solvent and the polymer concentration on the microstructure shapeGrimaldi, I. A. / De Girolamo Del Mauro, A. / Loffredo, F. / Nenna, G. / Villani, F. / Minarini, C. et al. | 2011
- 808245
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Laser self-mixing sensor to monitor in situ the penetration depth during short pulse laser drilling of metal targetsMezzapesa, Francesco P. / Ancona, Antonio / Sibillano, Teresa / De Lucia, Francesco / Dabbicco, Maurizio / Lugarà, Pietro Mario / Scamarcio, Gaetano et al. | 2011
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Self interference digital holographic microscopy approach for inspection of technical and biological phase specimens [8082-06]Kemper, B. / Schlichtaber, F. / Vollmer, A. / Ketelhut, S. / Przibilla, S. / von Bally, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Three-dimensional refractive index and thickness distribution of thin film measurements through dynamic multiwavelength interferometry [8082-25]Wu, K. / Lee, C.-C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Broad spectral range measurement of chromatic dispersion of polarization modes in holey fibers using spectral interferometry [8082-29]Hlubina, P. / Ciprian, D. / Martynkien, T. / Mergo, P. / Urbanczyk, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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High-speed, on-line 4D microscopy using continuously scanning white light interferometry with a high-speed camera and real-time FPGA image processing [8082-36]Montgomery, P. / Anstotz, F. / Montagna, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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New structured light measurement and calibration method for 3D documenting of engineering structures [8082-44]Sitnik, R. / Kujawinska, M. / Blaszczyk, P.M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Advanced studies on the measurement of aspheres and freeform surfaces with the tilted-wave interferometer [8082-51]Garbusi, E. / Baer, G. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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A subaperture stitching algorithm for aspheric surfaces [8082-52]Lin, P.-C. / Chen, Y.-C. / Lee, C.-M. / Liang, C.-W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Complete characterization of assembled optics with respect to centering error and lens distances [8082-58]Heinisch, J. / Langehanenberg, P. / Pannhoff, H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Development of a FD-OCT for the inline process metrology in laser structuring systems [8082-80]Schmitt, R. / Mallmann, G. / Peterka, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Digital holographic microscopy for dynamic imaging of hydrogels [8082-125]Yuan, C. / Pedrini, G. / Fu, G. / Ma, J. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Calibration routine for in-process roundness measurements of steel rings during heat treatment [8082-129]Gafsi, H. / Goch, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Noncontact interferometric technique for calibration of coordinate measuring machines [8082-134]Miks, A. / Novak, J. / Novak, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D laser scanner system based on a galvanometer scan head for high temperature applications [8082-91]Hegna, T. / Pettersson, H. / Laundal, K.M. / Grujic, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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In-process fault detection for textile fabric production: onloom imaging [8082-103]Neumann, F. / Holtermann, T. / Schneider, D. / Kulczycki, A. / Gries, T. / Aach, T. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Simultaneous out-of-plane and in-plane displacements measurement by using digital holography around a hole or indentation [8082-14]Viotti, M.R. / Kohler, C. / Albertazzi, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Absolute surface profilometry of an object with large gaps by means of monochromatic laser interferometry [8082-27]Liu, Z. / Uchikawa, K. / Takeda, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Fringe projection based high-speed 3D sensor for real-time measurements [8082-38]Brauer-Burchardt, C. / Breitbarth, A. / Kuhmstedt, P. / Schmidt, I. / Heinze, M. / Notni, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical measurement and comparison of large free form surfaces through a regular mesh [8082-46]Pinto, T.L. / Kohler, C. / Albertazzi, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Axicon metrology using line density computer-generated holograms [8082-54]Ma, J. / Pruss, C. / Hafner, M. / Zhu, R. / Gao, Z. / Yuan, C. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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State of polarization mapping using a calibrated interferometric polarimeter [8082-65]Naik, D.N. / Singh, R.K. / Itou, H. / Miyamoto, Y. / Takeda, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles [8082-71]Ishii, K. / Nakamura, S. / Sato, Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D shape measurement of optical free-form surface based on fringe projection [8082-106]Li, S. / Liu, S. / Zhang, H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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A novel diffractive encoding principle for absolute optical encoders [8082-154]Hopp, D. / Wibbing, D. / Pruss, C. / Osten, W. / Binder, J. / Schinkothe, W. / Sterns, F. / Seybold, J. / Fritz, K.-P. / Mayer, V. et al. | 2011
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Multisensor technology based on a laser focus probe for nanomeasuring applications over large areas [8082-02]Manske, E. / Jager, G. / Hausotte, T. / Machleidt, T. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Infrared digital holography for large objects investigation [8082-12]Geitrude, A. / Locatelli, M. / Poggi, P. / Pelagotti, A. / Paturzo, M. / Ferraro, P. / Meucci, R. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Detection of micro-probe displacement using a Shack-Hartmann wavefront sensor [8082-20]Dierke, H. / Schrader, C. / Tutsch, R. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Structured-illumination microscopy on technical surfaces: 3D metrology with nanometer sensitivity [8082-28]Vogel, M. / Yang, Z. / Kessel, A. / Kranitzky, C. / Faber, C. / Hausler, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Uncertainty of height information in coherence scanning interferometry [8082-31]Seewig, J. / Bottner, T. / Broschart, D. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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High-speed fringe projection for fast 3D inspection [8082-34]Caspar, S. / Honegger, M. / Rinner, S. / Lambelet, P. / Bach, C. / Ettemeyer, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Alignment methods for ultraprecise deflectometric flatness metrology [8082-39]Ehret, G. / Schulz, M. / Fitzenreiter, A. / Baier, M. / Jockel, W. / Stavridis, M. / Elster, C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D measuring in the field of endoscopy [8082-42]Schick, A. / Forster, F. / Stockmann, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Some aspects of error influences in interferometric measurements of optical surface forms (Invited Paper) [8082-48]Schulz, M. / Wiegmann, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measurements of aberrations of aspherical lenses using experimental ray tracing [8082-56]Ceyhan, U. / Henning, T. / Fleischmann, F. / Hilbig, D. / Knipp, D. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Application of wavelet transform and image morphology in processing vibration speckle interferogram for automatic analysis [8082-70]Kumar, R. / Jena, D.P. / Shakher, C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Novel method for automatic filtering in the Fourier space applied to digital hologram reconstruction [8082-123]Rincon, O.J. / Amezquita, R. / Torres, Y.M. / Agudelo, V. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Adaptive holographic illumination in comparative electronic speckle pattern interferometry [8082-108]Sefel, R. / Kornis, J. / Varga-Fogarasi, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Spatial phase-shift interferometry: implementation of an effective phase-recovering algorithm [8082-90]Vannoni, M. / Melozzi, M. / Barilli, M. / Sordini, A. / Molesini, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measurement system for hot heavy forgings and its calibration [8082-105]Du, Y. / Du, Z. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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A new type of color-coded light structures for an adapted and rapid determination of point correspondences for 3D reconstruction [8082-130]Caulier, Y. / Bernhard, L. / Spinnler, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Design and fabrication of White Light Confocal Microscope with tunable resolution and sensitivity [8082-98]Behroodi, E. / Mousavian, A. / Latifi, H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Time-resolved oblique incidence interferometer for vibration analysis of rough surface [8082-120]Mizutani, Y. / Higuchi, T. / Iwata, T. / Otani, Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Evaluation of thermal expansion coefficient of Fabry-Perot cavity using an optical frequency comb [8082-145]Oulehla, J. / Smid, R. / Buchta, Z. / Cizek, M. / Mikel, B. / Jedlicka, P. / Lazar, J. / Cip, O. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optic-electronic systems for measuring the angle deformations and line shifts of the reflecting elements at the rotateable radio-telescope [8082-150]Konyakhin, I.A. / Timofeev, A.N. / Usik, A.A. / Zhukov, D.V. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Recent advances in the field of super resolved imaging and sensing (Invited Paper) [8082-16]Zalevsky, Z. / Borkowski, A. / Marom, E. / Javidi, B. / Beiderman, Y. / Mico, V. / Garcia, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Advanced 2D die placement inspection system for reliable flip chip interconnections based on 3D information of die and substrate by a phase measuring profilometry [8082-17]Lee, H.-K. / Kim, M.Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Fast 3D shape measurements using laser speckle projection [8082-45]Schaffer, M. / Grosse, M. / Harendt, B. / Kowarschik, R. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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High resolution speckle interferometry by replacing temporal information with spatial information [8082-66]Arai, Y. / Inoue, T. / Yokozeki, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin films [8082-77]Muhlig, C. / Bublitz, S. / Paa, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical characterization of phase gratings written by a UV femtosecond laser in PMMA [8082-79]De Nicola, S. / Abdalah, S. / Al-Naimee, K. / Geltrude, A. / Locatelli, M. / Meucci, R. / Baum, A. / Perrie, W. / Scully, P.J. / Taranu, A. et al. | 2011
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Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of KGR-134 inhibited seawater by holographic interferometry techniques [8082-82]Habib, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Investigation of organic light emitting diodes for interferometric purposes [8082-160]Pakula, A. / Zimak, M. / Salbut, L. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Spectral polarimetry-based measurement of the thickness of a thin film [8082-115]Hlubina, P. / Lunacek, J. / Ciprian, D. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Dynamic concentricity measurement of large interval-diameter ratio holes with virtual annular quadrant method [8082-92]Liu, Q. / Yang, W. / Yao, B. / Jang, J. / Hu, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Assistant systems for efficient multiscale measurement and inspection [8082-01]Burla, A. / Haist, T. / Lyda, W. / Aissa, M.H. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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An algorithm for the estimation of the in-focus distance for speckle holograms [8082-08]Memmolo, P. / Distante, C. / Paturzo, M. / Finizio, A. / Ferraro, P. / Javidi, B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Synthetic aperture engineering for super-resolved microscopy in digital lensless Fourier holography [8082-09]Mico, V. / Granero, L. / Zalevsky, Z. / Garcia, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Comparison of fast Fourier transform and convolution in wavelength scanning interferometry [8082-26]Muhamedsalih, H. / Jiang, X. / Gao, F. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Inspection of processes during silicon wafer sawing using low coherence interferometry in the near infrared wavelength region [8082-30]Gastinger, K. / Johnsen, L. / Simonsen, O. / Aksnes, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Radial expansion measurements of a high-speed rotor using an interferometric array sensor [8082-35]Czarske, J. / Gunther, P. / Dreier, F. / Pfister, T. / Haupt, T. / Hufenbach, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D profilometry on aspheric and freeform lenses [8082-55]Beutler, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Automated alignment of aspheric and freeform surfaces in a non-null test interferometer [8082-57]Baer, G. / Garbusi, E. / Lyda, W. / Pruss, C. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Dynamic measurements using a Fizeau interferometer [8082-63]Sykora, D.M. / Holmes, M.L. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Hybrid light source for scanning white light interferometry-based MEMS quality control [8082-107]Heikkinen, V. / Hanhijarvi, K. / Aaltonen, J. / Raikkonen, H. / Walchli, B. / Paulin, T. / Kassamakov, I. / Grigoras, K. / Franssila, S. / Haeggstrom, E. et al. | 2011
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Shape and thickness measurements using a reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy [8082-113]Macedo, M.P. / Correia, C.M.B.A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measuring the performance of visible, NIR, and LWIR optical components: a reliable, robust, high-accuracy lens measurement system [8082-139]Fantone, S.D. / Orband, D.G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical sensor based on combined GI/DSPI technique for strain monitoring in crucial points of big engineering structures [8082-137]Lukaszewski, D. / Salbut, L. / Kujawinska, M. / Malowany, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Experimental study of the heat transfer process of air around atmospheric arc plasma [8082-86]Meidanshahi, F.S. / Madanipour, K. / Shokri, B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Pattern placement metrology using PROVE high precision optics combined with advanced correction algorithms [8082-19]Langle, M. / Rosenkranz, N. / Seidel, D. / Beyer, D. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Parallel optical coherence tomography (pOCT) for industrial 3D inspection [8082-33]Lambelet, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D shape measurement based on color-encoded sinusoidal fringe projection [8082-43]Zhang, Q. / Ma, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Mueller matrix imaging of nematic textures in colloidal dispersions of Na-fluorohectorite synthetic clay [8082-73]Kildemo, M. / Aas, L.M.S. / Ellingsen, P.G. / Hemmen, H. / Nilsen, E.L. / Fossum, J.O. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Novel non-contact optical characterisation methods of polymeric nanocomposite structures based on their particle loading and dispersion profile [8082-72]Koukoulas, T. / Broughton, W.R. / Tedaldi, M. / Theobald, P.D. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Reconstruction of 3D refractive index distribution across the graded index optical fibre using digital holographic interferometry [8082-83]Wahba, H.H. / El-Din, M.A.S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Compensation of reference beam sphericify in a multi-perspective digital holography based record-display setup [8082-104]Pandey, N. / Hennelly, B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Dispersion optimized white-light interferometer based on a Schwarzschild objective [8082-117]Kuhnhold, P. / Lehmann, P. / Niehues, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Material tests using the ARAMIS system: a laboratory report [8082-128]Pardo, C.A. / Ohlendieck, J. / Krahwinkel, M. / Sternberg, H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Industrial surface inspection by wavelet analysis [8082-94]Kreis, T. / Rosenboom, L. / Juptner, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Choice of the reflector for the autocollimating alignment telescope [8082-100]Anisimov, A.G. / Timofeev, A.N. / Korotaev, V.V. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Software configurable optical test system for refractive optics [8082-149]Dominguez, M.Z. / Wang, L. / Su, P. / Parks, R.E. / Burge, J.H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Influences of colorful LED emissions on spectrophotometric properties of a LED based white light source [8082-85]Sametoglu, F. / Celikel, O. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filters [8082-110]Fadeyev, A.V. / Pozhar, V.E. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Remote laboratory for digital holographic metrology [8082-13]Wilke, M. / Alekseenko, I. / Situ, G. / Sarker, K. / Riedel, M. / Pedrini, G. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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The effect of misalignment in phase retrieval based on a spatial light modulator [8082-22]Agour, M. / Falldorf, C. / von Kopylow, C. / Bergmann, R.B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Accurate calibration of a fringe projection system by considering telecentricity [8082-47]Haskamp, K. / Kastner, M. / Reithmeier, E. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measuring amplitude and phase of light emerging from microstructures with HRIM [8082-60]Scharf, T. / Kim, M.-S. / Herzig, H.P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Characterization of a waveguide written by a UV laser into a planar polymer chip by digital holographic interferometry [8082-84]El-Din, M.A.S. / Wahba, H.H. / Vollertsen, F. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Coherence effects in Makyoh topography [8082-88]Riesz, F. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Development of error estimation method for phase detection in phase shift method [8082-146]Hanayama, R. / Hibino, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Mueller matrix imaging of plasmonic polarizers on nanopatterned surface [8082-138]Aas, L.M.S. / Nerbo, I.S. / Kildemo, M. / Chiappe, D. / Martella, C. / de Mongeot, F.B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optimized dust-proof optical fiber sensing system for real-time monitoring of frequency, phase, and vibration of rotating parts [8082-136]Prokopczuk, K. / Lesiak, P. / Poczesny, T. / Rozwadowski, K. / Wolinski, T.R. / Domanski, A.W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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High temperature sensing with FBGs using a tunable laser interrogation system [8082-142]Eder, B. / Plattner, M. / Putzer, P. / Eckert, P. / Reutlinger, A. / Zeh, T. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Microlens array manufactured by inkjet printing: study of the effects of the solvent and the polymer concentration on the microstructure shape [8082-157]Grimaldi, I.A. / De Girolamo Del Mauro, A. / Loffredo, F. / Nenna, G. / Villani, F. / Minarini, C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D interconnect metrology in CMS/ITRI [8082-18]Ku, Y.S. / Shyu, D.M. / Hsu, W.T. / Chang, P.Y. / Chen, Y.C. / Pang, H.L. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D high-speed profilometer for inspection of micro-manufactured transparent parts [8082-37]Ljubicic, D.M. / Anthony, B.W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Reflectometry for TSV etching depth inspection [8082-78]Hsu, W.-T. / Ku, Y.-S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measurement of five-degrees-of-freedom error motions for a micro high-speed spindle using an optical technique [8082-95]Murakami, H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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AFM nanometrology interferometric system with the compensation of angle errors [8082-133]Hrabina, J. / Lazar, J. / Klapetek, P. / Cip, O. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Laser self-mixing sensor to monitor in situ the penetration depth during short pulse laser drilling of metal targets [8082-159]Mezzapesa, F.P. / Ancona, A. / Sibillano, T. / De Lucia, F. / Dabbicco, M. / Lugara, P.M. / Scamarcio, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Quantitative determination of the optical properties of phase objects by using a real-time phase retrieval technique [8082-23]Frank, J. / Wernicke, G. / Matrisch, J. / Wette, S. / Beneke, J. / Altmeyer, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Interferometric measurement of profile deviations of large precision mirrors [8082-59]Muller, A. / Jager, G. / Manske, E. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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SLM-based multipoint vibrometry [8082-67]Haist, T. / Tarbeyevskaya, A. / Warber, M. / Osten, W. / Rembe, C. / Ludwig, M. / Stork, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Adaptive optical head for industrial vibrometry applications [8082-68]Atashkhooei, R. / Zabit, U. / Royo, S. / Bosch, T. / Bony, F. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Laser ultrasonics evaluation and testing of coated HTR nuclear fuel [8082-76]Amziane, A. / Amari, M. / Mounier, D. / Breteau, J.-M. / Joly, N. / Edely, M. / Larcher, M. / Noire, P. / Banchet, J. / Tisseur, D. et al. | 2011
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Lockin-interferometric imaging of thermal waves for nondestructive testing [8082-75]Menner, P. / Busse, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Transmission sphere calibration and its current limits [8082-119]Yang, P. / Xu, J. / Zhu, J. / Hippler, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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New method for evaluating high-quality fog protective coatings [8082-132]Czeremuszkin, G. / Latreche, M. / Mendoza-Suarez, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces [8082-124]Bohm, J.A. / Vernes, A. / Vorlaufer, G. / Vellekoop, M.J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical vibration measurements of cross coupling effects in capacitive micromachined ultrasonic transducer arrays [8082-147]Leirset, E. / Aksnes, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Sub-ppm absolute distance measurements using an optical frequency comb generated by a conventional dual-drive Mach-Zehnder modulator [8082-153]Le Floch, S. / Llera, M. / Salvade, Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Fluorescence errors in integrating sphere measurements of remote phosphor type LED light sources [8082-109]Keppens, A. / Zong, Y. / Podobedov, V.B. / Nadal, M.E. / Hanselaer, P. / Ohno, Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Conceptual consideration for the process integration of optical sensors [8082-03]Fleischle, D. / Lyda, W. / Mauch, F. / Osten, W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Diffractive simultaneous lateral shearing interferometry [8082-49]Nercissian, V. / Harder, I. / Mantel, K. / Berger, A. / Lindlein, N. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Aspherical surface measurement using quadri-wave lateral shearing interferometry [8082-50]Boucher, W. / Delage, P. / Wattellier, B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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3D optical measuring technologies for industrial applications (Invited Paper) [8082-74]Chugui, Y. / Verkhogliad, A. / Kalikin, V. / Zav yalov, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Comparative analysis of interferometric measurements of PMD on optical fibers [8082-118]da Silva, T.F. / Ferreira, J. / Borghi, G. / Menegotto, T. / de Faria, G.V. / von der Weid, J.P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Determination of the characteristics of the surface of objects at optical remote sensing by the polarization-holographic imaging Stokes spectropolarimeter [8082-126]Kilosanidze, B. / Kakauridze, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Novel method for misalignments measurement on imaging systems through quality image analysis [8082-97]Oteo, E. / Fernandez-Dorado, J. / Arasa, J. / Blanco, P. / Pizarro, C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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The Ronchi test using a liquid crystal display as a phase grating [8082-141]Mora-Gonzalez, M. / Casillas, F.J. / Munoz-Maciel, J. / Chiu-Zarate, R. / Pena-Lecona, F.G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical characterization of three-dimensional structures within a DRAM capacitor [8082-89]Krupinski, M. / Kasic, A. / Hecht, T. / Klude, M. / Heitmann, J. / Erben, E. / Mikolajick, T. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Stokes holography for recording and reconstructing objects using polarization fringes [8082-07]Singh, R.K. / Naik, D.N. / Itou, H. / Miyamoto, Y. / Takeda, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Phase extraction in microscopy using tunable defocusing by means of a SLM [8082-24]Camacho, L. / Mico, V. / Zalevsky, Z. / Garcia, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Improvement of lateral resolution and reduction of batwings in vertical scanning white-light interferometry [8082-32]Niehues, J. / Lehmann, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Measurement and characterization of cylindrical surfaces by deflectometry applied to ballistic identification [8082-40]Fantin, A.V. / Veiga, C. / Albertazzi, A. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Numerical noise reduction via diffraction for surface profiling interferometry [8082-62]Toba, H. / Nakayama, S. / Homma, H. / Gemma, T. / Uchikawa, K. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer [8082-64]Frade, M. / Enguita, J.M. / Alvarez, I. / Rodriguez-Jimenez, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method [8082-69]Styk, A. / Brzezinski, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Zero-order elimination in digital holography by use of two holograms: one is made by tilting the CCD [8082-151]Abolhassani, M. / Rostami, Y. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Interferometric multiwavelength system for long gauge blocks measurements [8082-144]Wengierow, M. / Salbut, L. / Ramotowski, Z. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Development of traceability methodology for optical coherence tomography (OCT) using step height standard as calibration reference [8082-111]Couceiro, I.B. / da Silva, T.F. / Tarelho, L.V.G. / Azeredo, C.L.S. / Malinovski, I. / Grieneisein, H.P.H. / Barros, W.S. / Faria, G.V. / von der Weid, J.P. / Amaral, M.M. et al. | 2011
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High pressure measurement by fat long period grating sensor on a single mode optical fiber [8082-93]Zibaii, M.I. / Kheiri, M. / Nori, S. / Sadeghi, J. / Pourbeyram, H. / Latifi, H. / Ghezelaiagh, M.H. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optical fiber macro-bend seismic sensor for real-time vibration monitoring in harsh industrial environment [8082-140]Poczesny, T. / Prokopczuk, K. / Makowski, P.L. / Domanski, A.W. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Some figures of merit so as to compare digital Fresnel holography and speckle interferometry (Invited Paper) [8082-04]Slangen, P. / Karray, M. / Picart, P. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Reference wave adaptation in digital lensless Fourier holography by means of a spatial light modulator [8082-05]Meeser, T. / Falldorf, C. / von Kopylow, C. / Bergmann, R.B. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Dual-wavelength holographic shape measurement with iterative phase unwrapping [8082-11]Rosendahl, S. / Bergstrom, P. / Gren, P. / Sjodahl, M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Optimal phase retrieval from multiple observations with Gaussian noise: augmented Lagrangian algorithm for phase objects [8082-21]Migukin, A. / Katkovnik, V. / Astola, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Endoscopic geometry inspection by modular fiber optic sensors with increased depth of focus [8082-41]Ohrt, C. / Kastner, M. / Reithmeier, E. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Turning process monitoring using a robust and miniaturized non-incremental interferometric distance sensor [8082-81]Gunther, P. / Dreier, F. / Pfister, T. / Czarske, J. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Particle concentration effect on diffraction efficiency in two views off-axis holograms [8082-127]Bouamama, L. / Kara, S. / Chaab, O. / Simoens, S. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Positioning of scanned part inside of the laser triangulation system [8082-156]Stankiewicz, M. / Reiner, J. / Kotnarowski, G. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Visual alignment of mechanical structures using a Bessel beam datum: practical implementation [8082-99]Gale, D.M. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Submicron displacements measurement by measuring autocorrelation of the transmission function of a grating [8082-135]Madanipour, K. / Tavassoly, M.T. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011
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Spectrally resolved measurement of small optical losses by cavity enhanced spectroscopy techniques [8082-116]Zeuner, T. / Paa, W. / Schmidl, G. / Muhlig, C. / SPIE (Society) / European Association of Remote Sensing Companies et al. | 2011