Use Of Photoluminescence Spectroscopy To Characterize The Crystalline Quality Of Cdte Films Grown By A Modified Csvt Technique (English)
- New search for: Mendoza-Alvarez, J. G.
- New search for: Sanchez-Sinencio, F.
- New search for: Zelaya, O.
- New search for: Gonzalez-Hernandez, J.
- New search for: Cardenas, M.
- New search for: Chao, S. S.
- New search for: Mendoza-Alvarez, J. G.
- New search for: Sanchez-Sinencio, F.
- New search for: Zelaya, O.
- New search for: Gonzalez-Hernandez, J.
- New search for: Cardenas, M.
- New search for: Chao, S. S.
In:
Proc. SPIE
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0794
; 38
;
1987
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Use Of Photoluminescence Spectroscopy To Characterize The Crystalline Quality Of Cdte Films Grown By A Modified Csvt Technique
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Contributors:Mendoza-Alvarez, J. G. ( author ) / Sanchez-Sinencio, F. ( author ) / Zelaya, O. ( author ) / Gonzalez-Hernandez, J. ( author ) / Cardenas, M. ( author ) / Chao, S. S. ( author )
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Conference:Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices ; 1987 ; Bay Point,FL,United States
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Published in:Proc. SPIE ; 0794 ; 38
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Publisher:
- New search for: SPIE
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Publication date:1987-04-22
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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An Overview Of Optical Characterization Of Semiconductor Structures And AlloysBajaj, K. K. / Reynolds, D. C. et al. | 1987
- 11
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Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal ApproachAmer, Nabil M. et al. | 1987
- 20
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Scanning PhotoluminescenceRiemer, E. K. / Stoebe, T. G. / Khan, A. A. et al. | 1987
- 27
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Photoluminescence Studies Of Donors In MBE-Grown ZnSePotts, J. E. / Smith, T. L. / Cheng, H. et al. | 1987
- 34
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Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed MatterEesley, Gary L. / Paddock, Carolyn A. / Clemens, Bruce M. et al. | 1987
- 38
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Use Of Photoluminescence Spectroscopy To Characterize The Crystalline Quality Of Cdte Films Grown By A Modified Csvt TechniqueMendoza-Alvarez, J. G. / Sanchez-Sinencio, F. / Zelaya, O. / Gonzalez-Hernandez, J. / Cardenas, M. / Chao, S. S. et al. | 1987
- 44
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Optical Characterization Of Single Quantum Wells Fabricated Under Conditions Of Interrupted GrowthElman, B. S. / Koteles, Emil S. / Jagannath, C. / Chen, Y. J. / Charbonneau, S. / Thewalt, M. L. et al. | 1987
- 50
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Spectrally Filtered Cathodoluminescence Of CdTeBubulac, L. O. / Bajaj, J. / Tennant, W. E. / Newman, P. R. et al. | 1987
- 55
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Optical Characterization Of GaAs/AlxGai-xAs Quantum Well Structures And Superlattices By Photoluminescence And Photoexcitation Spectroscopy.Song, J. J. / Yoon, Y. S. / Jung, P. S. / Fedotowsky, A. / Kim, Y. B. et al. | 1987
- 61
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Low Temperature Photoluminescence Signature Of A Two-Dimensional Electron GasKoteles, Emil S. / Chi, J. Y. / Holmstrom, R. P. et al. | 1987
- 66
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Photoluminescence And Stimulated Emission Of Highly Excited Gaas/A1Gaas Single Quantum WellsBorenstain, S. / Fekete, D. / Ron, Arza / Cohen, E. et al. | 1987
- 74
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Photoreflectance Characterization Of Microstructures Using A Dye Laser SystemGlembocki, O. J. / Shanabrook, B. V. et al. | 1987
- 81
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Electroreflectance And Photoreflectance Characterization Of The Space Charge Region In Semiconductors: Ito/Inp As A Model SystemBhattacharya, R. N. / Shen, H. / Parayanthal, P. / Pollak, Fred H. / Coutts, T. / Aharoni, H. et al. | 1987
- 88
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Comparative Responses Of Electroreflectance And Photoreflectance In GaasGlosser, R. / Bottka, N. et al. | 1987
- 96
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Photoreflectance Spectroscopy Studies Of Alloy Compositions And Ion Implant Damage In Zincblende-Type SemiconductorsBowman, R. C. / Alt, R. L. / Brown, K. W. et al. | 1987
- 105
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Piezomodulated Electronic Spectra Of Semiconductor Heterostructures: Gaas/Alxgal_Xas Quantum Well StructuresLee, Y. R. / Ramdas, A. K. / Chambers, F. A. / Meese, J. M. / Ram Mohan, L. R. et al. | 1987
- 111
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Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.Niquet, G. / Dufour, J. P. / Chabrier, G. / Q' Jani, M. / Vernier, P. et al. | 1987
- 116
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Study Of GaAs/AlGaAs And InGaAs/GaAs Multiple Quantum Wells Grown On Non-Polar Substrates By PhotoreflectanceReddy, U. K. / Ji, G. / Houdre, R. / Unlu, H. / Huang, D. / Morkoc, H. et al. | 1987
- 121
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Approaches To Enhancing The Sensitivity Of Direct Coupled Photoacoustic Spectroscopy As Applied To GaasJanousek, Bruce K. / Carscallen, Richard C. et al. | 1987
- 128
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Microwave-Detected Photoconductivity-Transient Spectroscopy For Non-Destructive Evaluation Of Gaas WafersGutmann, R. J. / Borrego, J. M. / Lo, C. S. / Heimlich, M. C. / Paz, O. et al. | 1987
- 136
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Spatial Characterization Of Semiconductors Using 'Laser Beam Induced Current (LBIC)'Bajaj, J. / Bubulac, L. O. / Newman, P. R. / Tennant, W. E. et al. | 1987
- 142
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Infrared-Wavelength Modulation Spectra Of InGaAs Grown By MBE And LPENee, T. W. / Cole, T. L. / Green, A. K. / Hills, M. E. / Lowe-Ma, C. K. / Rehn, Victor et al. | 1987
- 152
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Defect Detection In Silicon By Optical Beam Induced Reflectance (OBIR)Carver, G. E. / Michalski, J. D. et al. | 1987
- 160
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Growth Of Atomic Layer Structures By Modified MOCVD And Their CharacterizationHorikoshi, Y. / Kobayashi, N. / Toriyama, T. et al. | 1987
- 167
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Raman Microscopy Of Semiconductor FilmsFauchet, Philippe M. / Campbell, Ian H. et al. | 1987
- 170
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Raman Scattering From Semiconductor Thin FilmsJackson, Howard E. / Boyd, Joseph T. / Dasgupta, Samhita / Lu, Hsindao E. / Mantei, Thomas D. et al. | 1987
- 173
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Raman Scattering For Semiconductor Interface AnalysisNemanich, R. J. et al. | 1987
- 179
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Raman And Optical Spectroscopy Of Nanocrystalline Silicon FilmsIqbal, Z. / Veprek, S. et al. | 1987
- 183
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Optical Characterization Of Monocrystalline Silicon Carbide Thin FilmsKim, H. J. / Davis, R. F. et al. | 1987
- 192
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Electric Field And Impurity-Induced Symmetry Forbidden Lo Phonon Raman Scattering In Heavily Doped <100> N-GaAsShen, H. / Parayanthal, P. / Pollak, Fred H. / Sacks, R. N. / Hickman, G. et al. | 1987
- 197
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Far Infrared Reflectance Spectroscopy Of AlAs-GaAs MicrostructuresSudharsanan, R. / Perkowitz, S. / Yom, S. S. / Drummond, T. J. et al. | 1987
- 202
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Infrared Reflectance Spectroscopy Of Ion-Implanted Soi StructuresLacquet, Bea M. / Swart, Pieter L. et al. | 1987
- 209
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Raman Scattering Characterization Of Quantum Wells And SuperlatticesColvard, Carl et al. | 1987
- 215
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A Complete System For Semiconductor Characterization Incorporating Both Photoluminescence And Raman SpectroscopyPurcell, F . J. / Kaminski, Raymond et al. | 1987
- 226
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Optical Characterization Of Epitaxial And Doped SemiconductorsGeddo, M. / Maghini, D. / Stella, A . / Cottini, M. et al. | 1987
- 231
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Non-Destructive Characterization Of Carrier Concentration And Thickness Uniformity For Semiconductors Using Infrared Reflectance SpectroscopyGaskill, D. K. / Davis, J. / Sillmon, R. S. / Sydor, M. et al. | 1987
- 239
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Picosecond Transient Reflectivity Of Photowashed Gallium Arsenide SurfacesWessel, J. E. / Beck, S. M. / Marvin, D. C. et al. | 1987
- 242
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In Situ Ellipsometry Characterization Of The Growth Of Thin Film Amorphous SemiconductorsCollins, R. W. / Cavese, J. M. et al. | 1987
- 252
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Spectroellipsometric Characterization Of Inhomogeneous FilmsTirri, B. A. / Turner, A. / Van Buskirk, P. C. et al. | 1987
- 262
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Nonlinear Transmission Of Semiconductor Thin FilmsVan Stryland, E. W. / Miller, Steven A. / Wherrett, B. S. et al. | 1987
- 266
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Reflected Millimeter Wave Power From Moving Strip Illuminated Semiconductor Panel (RMWPFMSISP)Rahnavard, M. H. / Habibzadeh, A. et al. | 1987
- 272
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Resonant Atr (Attenuated Total Reflection) Spectroscopy & The Nondestructive Characterization Of Multilayer StructuresBosacchi, Bruno / Oehrle, Robert C. et al. | 1987