7.3.2 The surfaces of III-V compounds (English)
Electronic structure of surfaces
- New search for: Bertoni, C. M.
- New search for: Cappellini, G.
- New search for: Finocchi, F.
- New search for: Monachesi, P.
- New search for: Chiarotti, G.
- New search for: Chiaradia, P.
- New search for: Bertoni, C. M.
- New search for: Cappellini, G.
- New search for: Finocchi, F.
- New search for: Monachesi, P.
In:
Physics of Solid Surfaces
: Subvolume A
;
372-383
;
2015
- Article/Chapter (Book) / Electronic Resource
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Title:7.3.2 The surfaces of III-V compounds
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Subtitle:Electronic structure of surfaces
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Contributors:Chiarotti, G. ( editor ) / Chiaradia, P. ( editor ) / Bertoni, C. M. ( author ) / Cappellini, G. ( author ) / Finocchi, F. ( author ) / Monachesi, P. ( author )
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Published in:Physics of Solid Surfaces : Subvolume A ; 372-383Landolt-Börnstein - Group III Condensed Matter ; 45A ; 372-383
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Publisher:
- New search for: Springer Berlin Heidelberg
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Place of publication:Berlin, Heidelberg
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Publication date:2015-01-01
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Size:12 pages
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ISBN:
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ISSN:
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DOI:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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1 General introduction to the Volume “Physics of Solid Surfaces”, LB III/45AChiarotti, G. / Chiaradia, P. et al. | 2015
- 15
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2.1 Introduction to scanning tunneling microscopy of metals and semiconductorFeenstra, R. M. / Hla, S. W. et al. | 2015
- 16
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2.2 MetalsFeenstra, R. M. / Hla, S. W. et al. | 2015
- 17
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2.2.1 Ag, SilverFeenstra, R. M. / Hla, S. W. et al. | 2015
- 22
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2.2.2 Au, GoldFeenstra, R. M. / Hla, S. W. et al. | 2015
- 27
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2.2.3 Cr, ChromiumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 29
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2.2.4 Cu, CopperFeenstra, R. M. / Hla, S. W. et al. | 2015
- 32
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2.2.5 Fe, IronFeenstra, R. M. / Hla, S. W. et al. | 2015
- 33
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2.2.6 Ir, IridiumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 35
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2.2.7 Mo, MolybdenumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 36
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2.2.8 Ni, NickelFeenstra, R. M. / Hla, S. W. et al. | 2015
- 38
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2.2.9 Pd, PalladiumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 39
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2.2.10 Pt, PlatinumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 41
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2.2.11 Ta, TantalumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 42
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2.2.12 V, VanadiumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 43
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2.2.13 W, TungstenFeenstra, R. M. / Hla, S. W. et al. | 2015
- 44
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2.3 SemiconductorFeenstra, R. M. / Hla, S. W. et al. | 2015
- 45
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2.3.1 AlAs, Aluminum ArsenideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 46
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2.3.2 AlN, Aluminum NitrideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 47
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2.3.3 AlSb, Aluminum AntimonideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 48
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2.3.4 C, DiamondFeenstra, R. M. / Hla, S. W. et al. | 2015
- 49
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2.3.5 CdSe, Cadmium Selenide, and CdS, Cadmium SulfideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 50
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2.3.6 GaAs, Gallium ArsenideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 52
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2.3.7 GaN, Gallium NitrideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 54
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2.3.8 GaP, Gallium PhosphideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 55
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2.3.9 GaSb, Gallium AntimonideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 56
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2.3.10 Ge, GermaniumFeenstra, R. M. / Hla, S. W. et al. | 2015
- 58
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2.3.11 InAs, Indium ArsenideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 60
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2.3.12 InP, Indium PhosphideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 61
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2.3.13 InN, Indium NitrideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 62
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2.3.14 Si, SiliconFeenstra, R. M. / Hla, S. W. et al. | 2015
- 65
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2.3.15 SiC, Silicon CarbideFeenstra, R. M. / Hla, S. W. et al. | 2015
- 67
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3.1 Introduction to manipulation of surfaces with the methods of scanning probe microscopyMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 69
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3.2 Lateral manipulationMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 74
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3.3 Vertical manipulation and desorptionMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 77
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3.4 Atomic-scale chemistryMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 79
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3.5 Molecular mechanicsMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 81
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3.6 Manipulation on insulatorsMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 84
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3.7 Atomic/molecular switchesMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 86
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3.8 Tip functionalization by atomic/molecular manipulationMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 88
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3.9 Substrate manipulationMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 90
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3.10 Manipulation of surfaces with the methods of scanning probe microscopy: DataMeyer, G. / Gross, L. / Repp, J. et al. | 2015
- 100
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4.1 Introduction to X-ray diffraction of surface structuresSauvage-Simkin, M. et al. | 2015
- 108
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4.2.1 Metals and alloysSauvage-Simkin, M. et al. | 2015
- 116
-
4.2.2 Oxide surfaces and interfacesSauvage-Simkin, M. et al. | 2015
- 123
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4.2.3 Semiconductor surfaces, interfaces, and nanostructuresSauvage-Simkin, M. et al. | 2015
- 127
-
4.2.4 In-situ X-ray diffraction experiments on surfaces and interfacesSauvage-Simkin, M. et al. | 2015
- 134
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5.1 Introduction to elastic scattering and diffraction of electrons and positronsMoritz, W. et al. | 2015
- 135
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5.2 LEEDMoritz, W. et al. | 2015
- 152
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5.3 RHEEDMoritz, W. et al. | 2015
- 155
-
5.4 SPA-LEEDMoritz, W. et al. | 2015
- 159
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5.5 VLEEDMoritz, W. et al. | 2015
- 162
-
5.6 SPLEEDMoritz, W. et al. | 2015
- 164
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5.7 LEPDMoritz, W. et al. | 2015
- 165
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5.8 Elastic scattering and diffraction of electrons and positrons: Introduction to DataMoritz, W. et al. | 2015
- 167
-
5.8.1 AgMoritz, W. et al. | 2015
- 171
-
5.8.2 AlMoritz, W. et al. | 2015
- 175
-
5.8.3 AuMoritz, W. et al. | 2015
- 177
-
5.8.4 Be, BiMoritz, W. et al. | 2015
- 178
-
5.8.5 C, Ca, CdMoritz, W. et al. | 2015
- 180
-
5.8.6 CoMoritz, W. et al. | 2015
- 182
-
5.8.7 CrMoritz, W. et al. | 2015
- 183
-
5.8.8 CuMoritz, W. et al. | 2015
- 192
-
5.8.9 FeMoritz, W. et al. | 2015
- 195
-
5.8.10 GaMoritz, W. et al. | 2015
- 197
-
5.8.11 Gd, GeMoritz, W. et al. | 2015
- 199
-
5.8.12 H, InMoritz, W. et al. | 2015
- 200
-
5.8.13 IrMoritz, W. et al. | 2015
- 202
-
5.8.14 K, La, LiMoritz, W. et al. | 2015
- 203
-
5.8.15 MgMoritz, W. et al. | 2015
- 204
-
5.8.16 MoMoritz, W. et al. | 2015
- 206
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5.8.17 Na, NbMoritz, W. et al. | 2015
- 207
-
5.8.18 NiMoritz, W. et al. | 2015
- 211
-
5.8.19 PbMoritz, W. et al. | 2015
- 212
-
5.8.20 PdMoritz, W. et al. | 2015
- 215
-
5.8.21 PtMoritz, W. et al. | 2015
- 221
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5.8.22 Rb, ReMoritz, W. et al. | 2015
- 222
-
5.8.23 RhMoritz, W. et al. | 2015
- 225
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5.8.24 RuMoritz, W. et al. | 2015
- 230
-
5.8.25 SiMoritz, W. et al. | 2015
- 237
-
5.8.26 Sn, SrMoritz, W. et al. | 2015
- 238
-
5.8.27 Ta, Tb, TiMoritz, W. et al. | 2015
- 240
-
5.8.28 VMoritz, W. et al. | 2015
- 241
-
5.8.29 WMoritz, W. et al. | 2015
- 243
-
5.8.30 Xe, Zn, ZrMoritz, W. et al. | 2015
- 244
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6.1 Introduction to elastic and inelastic scattering of ionsGladys, M. J. / O’Connor, D. J. et al. | 2015
- 251
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6.2 Low Energy Ion ScatteringGladys, M. J. / O’Connor, D. J. et al. | 2015
- 262
-
6.3 Medium Energy Ion ScatteringGladys, M. J. / O’Connor, D. J. et al. | 2015
- 271
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6.4 Rutherford backscatteringGladys, M. J. / O’Connor, D. J. et al. | 2015
- 273
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6.5 High energy elastic recoilGladys, M. J. / O’Connor, D. J. et al. | 2015
- 275
-
6.6 Recent applications of ion beam techniquesGladys, M. J. / O’Connor, D. J. et al. | 2015
- 278
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6.7 Summary of ion scatteringGladys, M. J. / O’Connor, D. J. et al. | 2015
- 279
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7.1 Introduction to electronic structure of surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 284
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7.2 Introduction to Metal surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 285
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7.2.1 Noble metalsBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 311
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7.2.2 Transition metalsBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 326
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7.2.3 sp metalsBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 331
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7.3 Introduction to Semiconductor surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 332
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7.3.1 Group-IV semiconductor surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 372
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7.3.2 The surfaces of III-V compoundsBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 384
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7.3.3 II-VI compound surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 387
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7.3.4 CaF2 and other fluorides surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 392
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7.4 Introduction to Oxide surfacesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 393
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7.4.1 Silicon oxidesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 397
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7.4.2 The surfaces of rocksalt alkaline-earth monoxides: MgO, CaO, SrO and BaOBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 404
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7.4.3 The surfaces of metal dioxides: TiO2 and SnO2Bertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 411
-
7.4.4 The surfaces of cubic perovskitesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 427
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7.4.5 Magnetic oxidesBertoni, C. M. / Cappellini, G. / Finocchi, F. / Monachesi, P. et al. | 2015
- 431
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8.1 Introduction to optical properties of surfacesChiaradia, P. et al. | 2015
- 440
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8.2.1 Introduction to MetalsChiaradia, P. et al. | 2015
- 441
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8.2.1.1 Ag(110)Chiaradia, P. et al. | 2015
- 446
-
8.2.1.2 Al(110)Chiaradia, P. et al. | 2015
- 448
-
8.2.1.3 Au(110)Chiaradia, P. et al. | 2015
- 452
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8.2.1.4 Cu(110)Chiaradia, P. et al. | 2015
- 458
-
8.2.1.5 Cu(111)Chiaradia, P. et al. | 2015
- 459
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8.2.1.6 Ni(110)Chiaradia, P. et al. | 2015
- 461
-
8.2.1.7 Rh(110)Chiaradia, P. et al. | 2015
- 462
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8.2.1.8 W(110)Chiaradia, P. et al. | 2015
- 463
-
8.2.2.1.1 C(100) (diamond)Chiaradia, P. et al. | 2015
- 467
-
8.2.2.1.2 C(111) (diamond)Chiaradia, P. et al. | 2015
- 468
-
8.2.2.1.3 Ge(100)Chiaradia, P. et al. | 2015
- 470
-
8.2.2.1.4 Ge(110)Chiaradia, P. et al. | 2015
- 471
-
8.2.2.1.5 Ge(111)Chiaradia, P. et al. | 2015
- 473
-
8.2.2.1.6 Si(100)Chiaradia, P. et al. | 2015
- 478
-
8.2.2.1.7 Si(110)Chiaradia, P. et al. | 2015
- 479
-
8.2.2.1.8 Si(111)-(2×1)Chiaradia, P. et al. | 2015
- 481
-
8.2.2.1.9 Si(111)-(7×7)Chiaradia, P. et al. | 2015
- 484
-
8.2.2.2.1 GaAs(100)Chiaradia, P. et al. | 2015
- 489
-
8.2.2.2.2 GaAs(110)Chiaradia, P. et al. | 2015
- 490
-
8.2.2.2.3 InAs(100)Chiaradia, P. et al. | 2015
- 491
-
8.2.2.2.4 InP(100)Chiaradia, P. et al. | 2015
- 492
-
8.2.2.2.5 InP(110)Chiaradia, P. et al. | 2015
- 493
-
8.2.2.3.1 CdS(100)Chiaradia, P. et al. | 2015
- 494
-
8.2.2.3.2 CdSeChiaradia, P. et al. | 2015
- 495
-
8.2.2.3.3 CdTe(110)Chiaradia, P. et al. | 2015
- 497
-
8.2.2.3.4 ZnOChiaradia, P. et al. | 2015
- 498
-
8.2.2.3.5 ZnSChiaradia, P. et al. | 2015
- 499
-
8.2.2.3.6 ZnSe(100)Chiaradia, P. et al. | 2015
- 501
-
8.2.2.3.7 ZnTe(110)Chiaradia, P. et al. | 2015
- 502
-
8.2.2.3.8 ZnTe(100)Chiaradia, P. et al. | 2015
- 503
-
8.2.2.4.1 PbS(100)Chiaradia, P. et al. | 2015
- 505
-
8.2.2.4.2 PbSeChiaradia, P. et al. | 2015
- 506
-
8.2.2.4.3 PbTeChiaradia, P. et al. | 2015
- 507
-
8.2.2.4.4 SnTeChiaradia, P. et al. | 2015
- 508
-
9.1 Introduction to inelastic scattering of electrons and 9.2 Advances in the spectrometer designRocca, M. et al. | 2015
- 510
-
9.3 Surface vibrationsRocca, M. et al. | 2015
- 512
-
9.4 Plasmon-Phonon coupling in semiconductorRocca, M. et al. | 2015
- 513
-
9.5 Surface plasmon dispersion and single particle excitationsRocca, M. et al. | 2015
- 515
-
9.6 Magnetic surfaces and surface magnon dispersionRocca, M. et al. | 2015
- 516
-
9.7.1 MetalsRocca, M. et al. | 2015
- 538
-
9.7.2 SemimetalsRocca, M. et al. | 2015
- 545
-
9.7.3 SemiconductorRocca, M. et al. | 2015
- 572
-
10.1 Introduction to interaction of atoms with surfaces and surface phononsBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 575
-
10.2 Introduction to atom-surface interactionBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 586
-
10.3 Introduction to surface phononsBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 616
-
10.4 Interaction of atoms with surfaces and surface phonons: Introduction to DataBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 617
-
10.4.1 Insulator surfaces measured with helium atom scattering and related calculations, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 622
-
10.4.2 Semiconductor surfaces measured with helium atom scattering and related calculations, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 626
-
10.4.3 Layered compound surfaces measured with helium atom scattering and related calculations, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 628
-
10.4.4 Metal, metal alloy, and elemental semi-metal surfaces measured with helium atom scattering and related calculationsBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 638
-
10.4.5 Vibrations of adsorbates on insulator surfaces measured with helium atom scattering, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 640
-
10.4.6 Vibrations of adsorbates on metal and semimetal surfaces measured with helium atom scattering, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 643
-
10.4.7 Vibrations of diatomic adsorbates on metal surfaces measured with helium atom scattering, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 645
-
10.4.8 Vibrations of polyatomic adsorbates on metal surfaces measured with helium atom scattering, with referencesBenedek, G. / Campi, D. / Toennies, J. P. et al. | 2015
- 647
-
11.1 Introduction to magnetic properties at surfaceMattera, L. et al. | 2015
- 649
-
11.2.1 Thickness dependence of the Curie temperatureMattera, L. et al. | 2015
- 652
-
11.2.2 Magnetization vs. TMattera, L. et al. | 2015
- 655
-
11.2.3 Surface enhancement of magnetic momentsMattera, L. et al. | 2015
- 657
-
11.2.4 Magnetic anisotropyMattera, L. et al. | 2015
- 666
-
12.1 Introduction – C nanotubesZecchina, A. / Scarano, D. / Cesano, F. et al. | 2015
- 681
-
12.2 BN nanotubesZecchina, A. / Scarano, D. / Cesano, F. et al. | 2015
- 684
-
12.3 Oxides nanotubesZecchina, A. / Scarano, D. / Cesano, F. et al. | 2015
- 689
-
12.4 Metal sulfides nanotubesZecchina, A. / Scarano, D. / Cesano, F. et al. | 2015
- 691
-
12.5 Surface properties of nanotubes: ConclusionsZecchina, A. / Scarano, D. / Cesano, F. et al. | 2015
- 692
-
13.1 Introduction – van der Waals and Casimir forcesIannuzzi, D. / Sedmik, R. et al. | 2015
- 702
-
13.2 Casimir force experiments: a historical panoramaIannuzzi, D. / Sedmik, R. et al. | 2015
- 708
-
13.3 Dependence on dielectric functionsIannuzzi, D. / Sedmik, R. et al. | 2015
- 726
-
13.4 Dependence on geometryIannuzzi, D. / Sedmik, R. et al. | 2015
- 739
-
13.5 Dependence on surface roughnessIannuzzi, D. / Sedmik, R. et al. | 2015
- 743
-
13.6 Casimir force experiments: surface effectsIannuzzi, D. / Sedmik, R. et al. | 2015
- 746
-
13.7 Casimir force in gaseous and liquid environmentsIannuzzi, D. / Sedmik, R. et al. | 2015