A fast algorithm for detecting die extrusion defects in IC packages (English)
National licence
- New search for: Zhou, H.
- New search for: Kassim, A.A.
- New search for: Ranganath, S.
- New search for: Zhou, H.
- New search for: Kassim, A.A.
- New search for: Ranganath, S.
In:
Machine Vision and Applications
;
11
, 1
;
37-41
;
1998
- Article (Journal) / Electronic Resource
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Title:A fast algorithm for detecting die extrusion defects in IC packages
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Contributors:
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Published in:Machine Vision and Applications ; 11, 1 ; 37-41
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Publisher:
- New search for: Springer-Verlag
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Place of publication:Berlin Heidelberg
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Publication date:1998-06-01
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Size:5 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 11, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Genetic algorithms for clustering in machine visionCucchiara, Rita et al. | 1998
- 7
-
Image retrieval using efficient local-area matchingVinod, V.V. / Murase, Hiroshi et al. | 1998
- 16
-
Visual routines for real-time monitoring of vehicle behaviorAste, Marco / Rossi, Massimo / Cattoni, Roldano / Caprile, Bruno et al. | 1998
- 24
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An interactive tool for recognizing structured figures with variable shapesMaeda, Akira / Wakimoto, Koji / Nagahisa, Hiroto / Nakamura, Itsuji et al. | 1998
- 37
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A fast algorithm for detecting die extrusion defects in IC packagesZhou, H. / Kassim, A.A. / Ranganath, S. et al. | 1998
- 42
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A deformable model of the human iris for measuring small three-dimensional eye movementsIvins, James P. / Porrill, John et al. | 1998