Surface analysis and surface measuring techniques in firearm offences (English)
National licence
- New search for: Wenz, H. W.
- New search for: Lichtenberg, W. J.
- New search for: Katterwe, H.
- New search for: Wenz, H. W.
- New search for: Lichtenberg, W. J.
- New search for: Katterwe, H.
In:
Fresenius' Journal of Analytical Chemistry
;
341
, 3
;
155-165
;
1991
- Article (Journal) / Electronic Resource
-
Title:Surface analysis and surface measuring techniques in firearm offences
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Contributors:
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Published in:Fresenius' Journal of Analytical Chemistry ; 341, 3 ; 155-165
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Publisher:
- New search for: Springer-Verlag
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Place of publication:Berlin/Heidelberg
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Publication date:1991-03-01
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Size:11 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 341, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 155
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Surface analysis and surface measuring techniques in firearm offencesWenz, H. W. / Lichtenberg, W. J. / Katterwe, H. et al. | 1991
- 166
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Raman-microanalysis of strain and crystal orientation in laser-crystallized siliconKolb, G. / Salbert, Th. / Abstreiter, G. et al. | 1991
- 171
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Peculiarities of AES-depth profiling results from multilayered X-ray monochromatorsKlosowski, J. / Mai, H. / Oertel, G. / Procop, M. / Völlmar, S. et al. | 1991
- 176
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Growth and characterization of Si/Sb superlatticesJorke, H. / Herzog, H. -J. / Kibbel, H. et al. | 1991
- 180
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Application of the two-dimensional lateral microanalysis by SIMS and EPMA in materials researchOswald, S. / Siegert, L. / Große, G. et al. | 1991
- 184
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Scanning tunneling microscopy of lead selenide monocrystals and epitaxial layers on barium fluorideStocker, W. / Magonov, S. N. / Cantow, H. -J. / Böttner, H. / Schelb, S. / Meihofer, M. / Tacke, M. et al. | 1991
- 189
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A fully computer controlled, low cost STMWenzel, M. / Ehinger, M. / Bicknell-Tassius, R. N. / Landwehr, G. et al. | 1991
- 193
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A fully computerized modular scanning tunneling microscope systemFries, Th. / Becker, C. / Böhmer, M. / Wandelt, K. et al. | 1991
- 196
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Characterization of tungsten tips for STM by SEM/AES/XPSLisowski, W. / Berg, A. H. J. / Kip, G. A. M. / Hanekamp, L. J. et al. | 1991
- 200
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AES and XPS investigations for the topochemical characterization of dope elements on WC powdersBaalmann, A. / Schlett, V. et al. | 1991
- 207
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Detection of particulate polycyclic aromatic hydrocarbons by laser-induced time-resolved fluorescenceNiessner, Reinhard / Robers, Wilfried / Krupp, Andreas et al. | 1991
- 214
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SIMS for hydrogen quantification and structural analysis of amorphous silicon germanium compoundsEicke, A. / Bilger, G. et al. | 1991
- 219
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SIMS and AES measurements on the LaNi5-hydrogen systemZüchner, H. / Dobrileit, R. / Rauf, T. et al. | 1991
- 224
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The application of surface analytical techniques to silicon technologyDowsett, M. G. et al. | 1991
- 235
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Surface analysis of functional layers for semiconductor productionNaoumidis, A. / Brennfleck, K. et al. | 1991
- 241
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Approaches for quantitative Auger electron spectroscopy of silicon after high dose nickel implantationSchönborn, A. / Bubert, H. / Kaat, E. H. et al. | 1991
- 245
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Dose determination of nickel implantations in silicon wafersBubert, H. / Burba, P. / Klockenkämper, R. / Schönborn, A. / Wielunski, M. et al. | 1991
- 248
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Studies of GaAs surface roughness and organic masks resistance depending on the ion-beam energyWalkow, B. / Loeb, H. W. / Freisinger, J. / Mößner, C. et al. | 1991
- 251
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Measurement of the electric potential in silicon solar cells employing an electron-beam testerSchmoranzer, H. / Mayer, A. / Jank, A. et al. | 1991
- 255
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Charge effects during surface analysis of poorly conducting inorganic materialsBorchardt, G. / Scherrer, S. / Weber, S. et al. | 1991
- 260
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Analysis of ionic solids with SNMSSchmidt, U. C. / Fichtner, M. / Goschnick, J. / Lipp, M. / Ache, H. J. et al. | 1991
- 265
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Comparative bulk, surface and depth profile analyses on AlN and SiC-coated B4C powdersJenett, H. / Grallath, E. / Riedel, R. / Strecker, K. / Gijbels, R. / Kennis, P. et al. | 1991
- 272
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Novel optical techniques for the analysis of polymer surfaces and thin filmsKnoll, W. / Hickel, W. / Sawodny, M. / Stumpe, J. / Knobloch, H. et al. | 1991
- 279
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Observation of spectral interferences for the determination of volume and surface effects of thin filmsGauglitz, G. / Nahm, W. et al. | 1991
- 284
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X-ray and neutron reflectometry for the investigation of polymer diffusionReiter, G. / Hüttenbach, S. / Foster, M. / Stamm, M. et al. | 1991
- 289
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CEMS/XPS study of iron stearate Langmuir-Blodgett layersMeisel, W. / Tippmann-Krayer, P. / Möhwald, H. / Gütlich, P. et al. | 1991
- 292
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Stoichiometric and structural analyses of thin high-Tc superconducting Bi-Sr-Ca-Cu-O films on siliconLorenz, M. / Bothe, H. -K. / Becker, S. / Dietze, H. -J. et al. | 1991
- 296
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Photoemission studies of BaPb1−xBixO3 and Ba1−yKyBiO3 crystalsWiniarski, A. / Wübbeler, G. / Scharfschwerdt, Chr. / Clausing, E. / Neumann, M. et al. | 1991
- 301
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Characterization of sputter-deposited YBaCuO films by X-ray photoelectron spectroscopyBehner, H. / Gieres, G. / Sipos, B. et al. | 1991
- 308
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Interface analysis of the system Si/YBa2Cu3O7−xZiegler, C. / Baudenbacher, F. / Karl, H. / Kinder, H. / Göpel, W. et al. | 1991