Degradation Mechanisms of Aromatic Polycarbonate (English)
- New search for: Eggenhuisen, T. M.
- New search for: Hoeks, T. L.
- New search for: van Driel, Willem Dirk
- New search for: Yazdan Mehr, Maryam
- New search for: Eggenhuisen, T. M.
- New search for: Hoeks, T. L.
In:
Reliability of Organic Compounds in Microelectronics and Optoelectronics
: From Physics-of-Failure to Physics-of-Degradation
;
Chapter: 2
;
33-52
;
2022
- Article/Chapter (Book) / Electronic Resource
-
Title:Degradation Mechanisms of Aromatic Polycarbonate
-
Contributors:van Driel, Willem Dirk ( editor ) / Yazdan Mehr, Maryam ( editor ) / Eggenhuisen, T. M. ( author ) / Hoeks, T. L. ( author )
-
Published in:Reliability of Organic Compounds in Microelectronics and Optoelectronics : From Physics-of-Failure to Physics-of-Degradation ; Chapter: 2 ; 33-52
-
Publisher:
- New search for: Springer International Publishing
-
Place of publication:Cham
-
Publication date:2022-01-31
-
Size:20 pages
-
ISBN:
-
DOI:
-
Type of media:Article/Chapter (Book)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:
-
Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Degradation Mechanisms of Siliconesde Buyl, François / Yoshida, Shin et al. | 2022
- 2
-
Degradation Mechanisms of Aromatic PolycarbonateEggenhuisen, T. M. / Hoeks, T. L. et al. | 2022
- 3
-
EMC Oxidation Under High-Temperature AgingInamdar, A. / Gromala, P. / Prisacaru, A. / Kabakchiev, A. / Yang, Y. / Han, B. et al. | 2022
- 4
-
Peridynamic Modeling of Thermo-oxidative Degradation in PolymersRoy, P. / Behera, D. / Madenci, E. / Oterkus, S. et al. | 2022
- 5
-
Molecular Modeling for Reliability IssuesIwamoto, Nancy E. et al. | 2022
- 6
-
Health Monitoring, Machine Learning, and Digital Twin for LED Degradation AnalysisIbrahim, Mesfin Seid / Jing, Zhou / Fan, Jiajie et al. | 2022
- 7
-
Reliability and Failures in Solid State Lighting Systemsvan Driel, W. D. / Jacobs, B. J. C. / Onushkin, G. / Watte, P. / Zhao, X. / Davis, J. Lynn et al. | 2022
- 8
-
Degradation and Failures of Polymers Used in Light-Emitting DiodesMehr, M. Yazdan / van Driel, W. D. / Zhang, G. Q. et al. | 2022
- 9
-
Degradation and Reliability of Organic Materials in Organic Light-Emitting Diodes (OLEDs)Rountree, Kelley / Davis, J. Lynn / Riter, Karmann C. / Kim, Jean / McCombs, Michelle / Pope, Roger et al. | 2022
- 10
-
Artificial Intelligence and LED DegradationWei, J. et al. | 2022
- 11
-
Degradation Analysis for Reliability of OptoelectronicsQian, Cheng / Wu, Zeyu / Chen, Wei / Fan, Jiajie / Yang, Xi / Ren, Yi / Sun, Bo / Wang, Zili et al. | 2022
- 12
-
Reliability and Failure of Microelectronic MaterialsMavinkurve, A. / Rongen, R. T. H. / van Soestbergen, M. et al. | 2022
- 13
-
Degradation and Remaining Useful Life Prediction of Automotive ElectronicsGromala, P. / Inamdar, A. / Prisacaru, A. / Dressler, M. / Kabakchiev, A. et al. | 2022
- 14
-
Reliability and Degradation of Power Electronic MaterialsRoss, R. / Koopmans, G. et al. | 2022
- 15
-
Degradation of Cure-Induced Stress Levels in Micro-electronicsYang, Daoguo / Ernst, L. J. et al. | 2022
- 16
-
Manufacturing for Reliability of Panel-Level Fan-out PackagesBraun, T. / Hölck, O. et al. | 2022
- 17
-
Outlook: From Physics of Failure to Physics of Degradationvan Driel, W. D. / Mehr, M. Yazdan / Fan, X. J. / Zhang, G. Q. et al. | 2022