Low voltage, high resolution SEM imaging for mesoporous materials (English)
- New search for: Takagi, O.
- New search for: Takeuchi, Shuichi
- New search for: Miyaki, Atsushi
- New search for: Ito, Hiroyuki
- New search for: Sato, Hirofumi
- New search for: Dan, Yukari
- New search for: Nakagawa, Mine
- New search for: Kataoka, Sho
- New search for: Inagi, Yuki
- New search for: Endo, Akira
- New search for: Luysberg, Martina
- New search for: Tillmann, Karsten
- New search for: Weirich, Thomas
- New search for: Takagi, O.
- New search for: Takeuchi, Shuichi
- New search for: Miyaki, Atsushi
- New search for: Ito, Hiroyuki
- New search for: Sato, Hirofumi
- New search for: Dan, Yukari
- New search for: Nakagawa, Mine
- New search for: Kataoka, Sho
- New search for: Inagi, Yuki
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In:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
: Volume 1: Instrumentation and Methods
;
Chapter: 316
;
631-632
;
2008
- Article/Chapter (Book) / Electronic Resource
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Title:Low voltage, high resolution SEM imaging for mesoporous materials
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Contributors:Luysberg, Martina ( editor ) / Tillmann, Karsten ( editor ) / Weirich, Thomas ( editor ) / Takagi, O. ( author ) / Takeuchi, Shuichi ( author ) / Miyaki, Atsushi ( author ) / Ito, Hiroyuki ( author ) / Sato, Hirofumi ( author ) / Dan, Yukari ( author ) / Nakagawa, Mine ( author )
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Published in:EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods ; Chapter: 316 ; 631-632
-
Publisher:
- New search for: Springer Berlin Heidelberg
-
Place of publication:Berlin, Heidelberg
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Publication date:2008-01-01
-
Size:2 pages
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ISBN:
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DOI:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Aberration corrected STEM and EELS: Atomic scale chemical mappingBleloch, A. L. / Gass, M. / Jiang, L. / Mendis, B. / Sader, K. / Wang, P. et al. | 2008
- 2
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An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future developmentDahmen, U. / Erni, R. / Kisielowki, C. / Radmilovic, V. / Ramasse, Q. / Schmid, A. / Duden, T. / Watanabe, M. / Minor, A. / Denes, P. et al. | 2008
- 3
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Synchrotron based X-ray Microscopy: state of the art and applicationsSusini, J. et al. | 2008
- 4
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High-resolution spectro-microscopy with low-voltage electrons and double aberration correctionSchmidt, Thomas / Marchetto, Helder / Fink, Rainer / Umbach, Eberhard et al. | 2008
- 5
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Developments of aberration correction systems for current and future requirementsHaider, M. / Müller, H. / Uhlemann, S. / Hartel, P. / Zach, J. et al. | 2008
- 6
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STEM Aberration Correction: an Integrated ApproachKrivanek, Ondrej / Dellby, Niklas / Murfitt, Matt / Own, Christopher / Szilagyi, Zoltan et al. | 2008
- 7
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Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materialsBotton, G. A. / Maunders, C. / Gunawan, L. / Cui, K. / Chang, L. Y. / Lazar, S. et al. | 2008
- 8
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Aberration corrected TEM and STEM for dynamic in situ experimentsGai, Pratibha L. / Boyes, Edward D. et al. | 2008
- 9
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HREM study of the SrTiO3 Σ3 (112) grain boundaryDudeck, K. J. / Benedek, N. / Cockayne, D. J. H. et al. | 2008
- 10
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A Method to Measure Source Size in Aberration Corrected Electron MicroscopesDwyer, C. / Etheridge, J. / Erni, R. et al. | 2008
- 11
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Determining resolution in the transmission electron microscope: object-defined resolution below 0.5ÅFreitag, B. / Kisielowski, C. et al. | 2008
- 12
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Direct measurement of aberrations by convergent-beam electron holography (CHEF)Gatel, C. / Houdellier, F. / Hÿtch, M. J. et al. | 2008
- 13
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Atomic Structure of BiFeO3-BiCrO3 film on (111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser DepositionGunawan, L. / Nechache, R. / Harnagea, C. / Pignolet, A. / Botton, G. A. et al. | 2008
- 14
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Demonstration of CC/CS-correction in HRTEMHartel, P. / Müller, H. / Uhlemann, S. / Zach, J. / Löbau, U. / Höschen, R. / Haider, M. et al. | 2008
- 15
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New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precessionHoudellier, Florent / Bals, Sara et al. | 2008
- 16
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The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National LaboratoryInada, H. / Zhu, Y. / Wall, J. / Volkov, V. / Nakamura, K. / Konno, M. / Kaji, K. / Jarausch, K. / Twesten, R. D. et al. | 2008
- 17
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Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stageInada, H. / Wall, J. / Zhu, Y. / Volkov, V. / Nakamura, K. / Konno, M. / Kaji, K. / Jarausch, K. et al. | 2008
- 18
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Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?Kaiser, U. / Chuvilin, A. / Schröder, R. R. / Haider, M. / Rose, H. et al. | 2008
- 19
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Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranesMeyer, J. C. / Kisielowski, C. / Erni, R. / Zettl, A. et al. | 2008
- 20
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Scanning confocal electron microscopy in a double aberration corrected transmission electron microscopeNellist, P. D. / Cosgriff, E. C. / Behan, G. / Kirkland, A. I. / D’Alfonso, A. J. / Findlay, S. D. / Allen, L. J. et al. | 2008
- 21
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Design of apochromatic TEM composed of usual round lensesNomura, S. et al. | 2008
- 22
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Back-Scattered Electron microscopy in Aberration corrected Electron microscopeOkunishi, E. / Kondo, Y. / Sawada, H. / Endo, N. / Yasuhara, A. / Endo, H. / Terao, M. / Shinpo, T. et al. | 2008
- 23
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Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEMRamasse, Q. M. / Okamoto, N. L. / Morgan, D. / Neiner, D. / Condron, C. L. / Wang, J. / Yu, P. / Browning, N. D. / Kauzlarich, S. et al. | 2008
- 24
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Performance of R005 Microscope and Aberration Correction SystemSawada, H. / Hosokawa, F. / Kaneyama, T. / Tomita, T. / Kondo, Y. / Tanaka, T. / Oshima, Y. / Tanishiro, Y. / Yamamoto, N. / Takayanagi, K. et al. | 2008
- 25
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Optimum operation of Schottky electron sources: brightness, energy spread and stabilityKruit, P. / Bronsgeest, M. S. / Schwind, G. A. et al. | 2008
- 26
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The MANDOLINE filter and its performanceEssers, E. / Mittmann, D. / Mandler, T. / Benner, G. et al. | 2008
- 27
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Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5ÅTiemeijer, P. C. / Bischoff, M. / Freitag, B. / Kisielowski, C. et al. | 2008
- 28
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First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltageFreitag, B. / Knippels, G / Kujawa, S. / Tiemeijer, P. C. / Van der Stam, M. / Hubert, D. / Kisielowski, C. / Denes, P. / Minor, A. / Dahmen, U. et al. | 2008
- 29
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Image Information transfer through a post-column energy filter detected by a lens-coupled CCD cameraLuecken, U. / Tiemeijer, P. / Barfels, M. / Mooney, P. / Bailey, B. / Agard, D. et al. | 2008
- 30
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Third-rank computation of electron and ion optical systems with several and rotated Wien filtersMarianowski, Karin / Plies, Erich et al. | 2008
- 31
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Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lensMuto, S. / Tatsumi, K. / Takahashi, H. et al. | 2008
- 32
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Miniature electrostatic-magnetostatic column for electronsRochow, C. / Ohnweiler, T. / Plies, E. et al. | 2008
- 33
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Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANESWalther, T. / Stegmann, H. et al. | 2008
- 34
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A hybrid electron energy loss spectrometer with simultaneous serial and parallel detectionYuan, Jun / Wang, Zhiway / Hu, Shu / Xie, Ling et al. | 2008
- 35
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In-focus phase contrast: Present state and future developmentsSchröder, R. R. / Barton, B. / Schultheiß, K. / Gamm, B. / Gerthsen, D. et al. | 2008
- 36
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The Detective Quantum Efficiency of Electron Area DetectorsHenderson, R. / McMullan, G. / Chen, S. / Faruqi, A. R. et al. | 2008
- 37
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Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detectorMcMullan, G. / Faruqi, A. R. / Henderson, R. / Guerrini, N. / Turchetta, R. / Jacobs, A. / van Hoften, G. et al. | 2008
- 38
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High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMsStrüder, Lothar et al. | 2008
- 39
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The image intensity in Zernike mode with electronsBeleggia, M. et al. | 2008
- 40
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Application of a Hilbert phase plate in transmission electron microscopy of materials science samplesDries, M. / Schultheiß, K. / Gamm, B. / Störmer, H. / Gerthsen, D. / Barton, B. / Schröder, R. R. et al. | 2008
- 41
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Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase PlateGamm, B. / Schultheiss, K. / Gerthsen, D. / Schröder, R. R. et al. | 2008
- 42
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Electron optical design of the Phase Aberration Corrected Electron MicroscopeMatijevic, M. / Lengweiler, S. / Preikszas, D. / Müller, H. / Schröder, R. R. / Benner, G. et al. | 2008
- 43
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Direct electron detectors for TEMMoldovan, G. / Li, X. / Wilshaw, P. / Kirkland, A. I. et al. | 2008
- 44
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A Newly Developed 64 MegaPixel camera for Transmission Electron MicroscopyTietz, H. R. et al. | 2008
- 45
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Characterization of a fiber-optically coupled 8k CCD/CMOS deviceTietz, D. / Tietz, H. / Nickell, S. / Baumeister, W. / Plitzko, J. M. et al. | 2008
- 46
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Direct Single-Electron Imaging using a pnCCD DetectorZiegler, Alexander / Hartmann, Robert / Andritschke, Robert / Schopper, Florian / Strüder, Lothar / Soltau, Heike / Plitzko, Jürgen M. et al. | 2008
- 47
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Quantitative TEM and STEM SimulationsKoch, C. T. et al. | 2008
- 48
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Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imagingGrillo, V. / Glas, F. / Carlino, E. et al. | 2008
- 49
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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy dataVan Aert, S. / Bals, S. / Chang, L. Y. / den Dekker, A. J. / Kirkland, A. I. / Van Dyck, D. / Van Tendeloo, G. et al. | 2008
- 50
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First time quantification of the HRTEM information-limit reveals insufficiency of the Young’s-fringe testBarthel, J. / Thust, A. et al. | 2008
- 51
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Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron MicroscopeBiskupek, J. / Chuvilin, A. / Jinschek, J. R. / Kaiser, U. et al. | 2008
- 52
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Quantitative characterisation of surfaces on bi-metallic Pt nanoparticles using combined exit wave restoration and aberration-corrected TEMChang, L. Y. / Maunders, C. / Baranova, E. A. / Bock, C. / Botton, G. et al. | 2008
- 53
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An HAADF investigation of AlAs-GaAs interfaces using SuperSTEMCraven, A. J. / Robb, P. / Finnie, M. et al. | 2008
- 54
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Spatial Coherence and the Quantitative Interpretation of Atomic Resolution ImagesDwyer, C. / Etheridge, J. et al. | 2008
- 55
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Analysis of HRTEM diffractograms from amorphous materials: a simple and minor (but not explained so far?) question revisitedEpicier, T. et al. | 2008
- 56
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HAADF-STEM image simulation of large scale nanostructuresGalindo, P. / Pizarro, J. / Rosenauer, A. / Yáñez, A. / Guerrero, E. / Molina, S. I. et al. | 2008
- 57
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Aberration-corrected HRTEM study of incommensurate misfit layer compound interfacesGarbrecht, M. / Spiecker, E. / Jäger, W. / Tillmann, K. et al. | 2008
- 58
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Influence of atomic displacements due to elastic strain in HAADF-STEM simulated imagesGuerrero, E. / Yáñez, A. / Galindo, P. / Pizarro, J. / Molina, S. I. et al. | 2008
- 59
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Effects of electron channeling in HAADF intensityHaruta, M. / Komatsu, H. / Kurata, H. / Azuma, M. / Shimakawa, Y. / Isoda, S. et al. | 2008
- 60
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Analysis of the mechanism of N incorporation in N-doped GaAs quantum wellsHerrera, M. / Ramasse, Q. M. / Browning, N. D. / Pizarro, J. / Galindo, P. / Gonzalez, D. / Garcia, R. / Du, M. W. / Zhang, S. B. / Hopkinson, M. et al. | 2008
- 61
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Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs FactorsHerring, R. A. et al. | 2008
- 62
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Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holographyHüe, F. / Houdellier, F. / Snoeck, E. / Destefanis, V. / Hartmann, J. M. / Bender, H. / Claverie, A. / Hÿtch, M. J. et al. | 2008
- 63
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PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain MappingIshizuka, K. / Galindo, P. / Pizarro, J. / Molina, S. I. et al. | 2008
- 64
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Domain structure in Delithiated LiFePO4, a cathode material for Li ion Battery ApplicationsKinyanjui, M. / Chuvilin, A. / Kaiser, U. / Axmann, P. / Wohlfahrt-Mehrens, M. et al. | 2008
- 65
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New Approach to Quantitative ADF STEMLeBeau, J. M. / Findlay, S. D. / Allen, L. J. / Stemmer, S. et al. | 2008
- 66
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Reconstruction of the projected crystal potential in high-resolution transmission electron microscopyLentzen, M. / Urban, K. et al. | 2008
- 67
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Three-dimensional atomic-scale structure of size-selected nanoclusters on surfacesLi, Z. Y. / Young, N. P. / Di Vece, M. / Palomba, S. / Palmer, R. E. / Bleloch, A. L. / Curley, B. C. / Johnston, R. L. / Jiang, J. / Yuan, J. et al. | 2008
- 68
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Direct retrieval of a complex wave from its diffraction patternMartin, A. V. / Allen, L. J. et al. | 2008
- 69
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HRTEM evaluation of iron in acid treated ground vermiculite from Santa Olalla (Huelva, Spain)Murafa, N. / Maqueda, C. / Perez-Rodriguez, J. L. / Šubrt, J. et al. | 2008
- 70
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopyNellist, P. D. / Cosgriff, E. C. / Hirsch, P. B. / Cockayne, D. J. H. et al. | 2008
- 71
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Quantitative local strain analysis of Si/SiGe heterostructures using HRTEMÖzdöl, V. Burak / Phillipp, F. / Kasper, E. / van Aken, P. A. et al. | 2008
- 72
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Displacement field analysis around hydrogen implantation induced platelets (HIPs) in semi-conductorsPailloux, F. / David, M.-L. / Pizzagalli, L. / Barbot, J.-F. et al. | 2008
- 73
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Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron MicroscopyParisini, A. / Morandi, V. / Mezzotero, S. A. et al. | 2008
- 74
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A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEMRosenauer, A. / Schowalter, M. / Titantah, J. T. / Lamoen, D. et al. | 2008
- 75
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Three-dimensional HREM Structure RetrievalSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
- 76
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Description of electron microscope image details based on structure relaxations with enhanced interaction potentialsScheerschmidt, K. et al. | 2008
- 77
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Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductorsSchowalter, M. / Rosenauer, A. / Titantah, J. T. / Lamoen, D. et al. | 2008
- 78
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Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series MatchingThiel, K. / Borgardt, N. I. / Niermann, T. / Seibt, M. et al. | 2008
- 79
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Novel carbon nanosheets as support foils for ultrahigh resolution TEM studies of nanoobjectsSologubenko, A. S. / Beyer, A. / Nottbohm, C. / Mayer, J. / Gölzhäuser, A. et al. | 2008
- 80
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Quantitative HRTEM studies of reconstructed exit-plane waves retrieved from CS-corrected electron microscopesSvete, M. / Mader, W. et al. | 2008
- 81
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Geometrical phase analysis of the 1:1 cation ordered domains in complex perovskite ferroelectricsTai, C. W. / Lereah, Y. et al. | 2008
- 82
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The Stobbs factor in HRTEM: Hunt for a phantom?Thust, A. et al. | 2008
- 83
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Measuring coherence in an electron beam for imagingWalther, T. / Atkinson, K. / Sweeney, F. / Rodenburg, J. M. et al. | 2008
- 84
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Argand plot: a sensitive fingerprint for electron channellingWang, A. / Van Aert, S. / Van Dyck, D. et al. | 2008
- 85
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Atomic-resolution studies of In2O3-ZnO compounds on aberration-corrected electron microscopesYu, Wentao / Houben, Lothar / Tillmann, Karsten / Mader, Werner et al. | 2008
- 86
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Advances in automated diffraction tomographyKolb, U. / Gorelik, T. / Mugnaioli, E. / Matveeva, G. / Otten, M. et al. | 2008
- 87
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Identification/ fingerprinting of nanocrystals by precession electron diffractionNicolopoulos, S. / Moeck, P. / Maniette, Y. / Oleynikov, P. et al. | 2008
- 88
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On the Origin and Asymmetry of High Order Laue Zone Lines Splitting in Convergent Beam Electron DiffractionBéché, A. / Clément, L. / Rouvière, J. L. et al. | 2008
- 89
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Precession electron diffraction: application to organic crystals and hybrid inorganic-organic materialsBithell, E. G. / Eddleston, M. D. / Merrill, C. A. / Jones, W. / Midgley, P. A. et al. | 2008
- 90
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Structural studies of amorphous materials using RDF, RMC and DFT refinementBorisensko, K. / Chen, Y. / Li, G. / Cockayne, D. J. H. / Song, S. A. et al. | 2008
- 91
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A Nanoprobe Electron Diffraction Study of Surface Phases in LiCoO2Cosandey, F. / Al-Sharab, J. F. / Pereira, N. / Badway, F. / Amatucci, G. G. et al. | 2008
- 92
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Structural features of RF magnetron sputter deposited Al-Fe and Al-Cu thin filmsLallouche, S. / Debili, M. Y. et al. | 2008
- 93
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Structural Investigation of a Layered Carbon Nitride Polymer by Electron DiffractionDöblinger, M. / Lotsch, B. V. / Seyfarth, L. / Senker, J. / Schnick, W. et al. | 2008
- 94
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Measuring the particle density of a nanocrystal deposit using DF images and a reciprocal space analysisDonnadieu, P. et al. | 2008
- 95
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Towards a quantitative understanding of precession electron diffractionEggeman, A. S. / White, T. A. / Midgley, P. A. et al. | 2008
- 96
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Electron crystallography by quantitative CHEFHoudellier, F. / Hÿtch, M. J. et al. | 2008
- 97
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Precession Electron Diffraction for the characterization of twinning in pseudo-symmetrical crystals: case of coesiteJacob, D. / Cordier, P. / Morniroli, J. P. / Schertl, H. P. et al. | 2008
- 98
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Electron precession characterization of pseudo-merohedral twins in the LaGaO3 perovskiteJi, G. / Morniroli, J. P. / Auchterlonie, G. J. / Jacob, D. et al. | 2008
- 99
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Kikuchi electron double diffractionKarakhanyan, R. K. / Karakhanyan, K. R. et al. | 2008
- 100
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The structure of the complex oxide PbMnO2.75 solved by precession electron diffractionKlein, H. et al. | 2008
- 101
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Software Precession Electron DiffractionKoch, C. T. / Bellina, P. / van Aken, P. A. et al. | 2008
- 102
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A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano-crystalsLábár, J. L. / Barna, P. B. / Geszti, O. / Grasin, R. / Lestyán, G. / Misják, F. / Radnóczi, G. / Sáfrán, G. / Székely, L. et al. | 2008
- 103
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Local structures of metallic glasses studied by experimental RDF and model refinementLi, G. / Borisenko, K. B. / Chen, Y. / Ma, E. / Cockayne, D. J. H. et al. | 2008
- 104
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Three groups of hexagonal phases and their relation to the i-phase in Zn-Mg-RE alloyLi, M. R. / Hovmöller, S. / Zou, X. D. et al. | 2008
- 105
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Diffraction analysis of incommensurate modulation in “chain-ladder” composite crystal (Sr/Ca)14Cu24O41Milat, O. / Salamon, K. / Tomić, S. / Vuletić, T. / Ivek, T. et al. | 2008
- 106
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Contribution of electron precession to the study of crystals displaying small symmetry departuresMorniroli, J. P. / Ji, G. / Jacob, D. / Auchterlonie, G. J. et al. | 2008
- 107
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The symmetry of microdiffraction electron precession patternsMorniroli, J. P. / Stadelmann, P. et al. | 2008
- 108
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Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobesMüller, Knut / Schowalter, Marco / Rosenauer, Andreas / Lamoen, Dirk / Titantah, John / Jansen, Jacob / Tsuda, Kenji et al. | 2008
- 109
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Differential Electron DiffractionNakashima, P. N. H. et al. | 2008
- 110
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Atomic Structure Determination by “Observing” Structural Phase in 3-Beam CBED PatternsNakashima, P. N. H. / Moodie, A. F. / Etheridge, J. et al. | 2008
- 111
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Automatic space group determination using precession electron diffraction patternsOleynikov, P. / Hovmöller, S. / Zou, X. D. et al. | 2008
- 112
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Compositional dependence of the (200) electron diffraction in dilute III–V semiconductor solid solutionsRubel, O. / Nemeth, I. / Stolz, W. / Volz, K. et al. | 2008
- 113
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Investigation of the local crystal lattice parameters in SiGe nanostructures by convergent-beam electron diffraction analysisRuh, E. / Mueller, E. / Mussler, G. / Gruetzmacher, D. et al. | 2008
- 114
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Computer simulation of electron nanodiffraction from polycrystalline materialsSugio, K. / Huang, X. et al. | 2008
- 115
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An analytical approach of the HOLZ lines splitting on relaxed samplesThibault, J. / Alfonso, C. / Alexandre, L. / Jurczak, G. / Leroux, C. / Saikaly, W. / Charaï, A. et al. | 2008
- 116
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ELDISCA C# — a new version of the program for identifying electron diffraction patternsThomas, J. / Gemming, T. et al. | 2008
- 117
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Mixing Real and Reciprocal SpaceTwesten, R. D. / Thomas, P. J. / Inada, H. / Zhu, Y. et al. | 2008
- 118
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Structure solution of intermediate tin oxide, SnO2−x, by electron precessionWhite, T. A. / Moreno, S. / Midgley, P. A. et al. | 2008
- 119
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“Phase-scrambling” multislice simulations of precession electron diffractionWhite, T. A. / Eggeman, A. S. / Midgley, P. A. et al. | 2008
- 120
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High-Resolution Electron Holography on FerroelectricsLinck, M. / Lichte, H. / Rother, A. / Röder, F. / Honda, K. et al. | 2008
- 121
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Imaging parameters for optimized noise properties in high-resolution off-axis holograms in a Cs-corrected TEMLinck, M. et al. | 2008
- 122
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Partial coherence in inelastic holographyVerbeeck, J. / Bertoni, G. / Van Dyck, D. / Lichte, H. / Schattschneider, P. et al. | 2008
- 123
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FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holographyAilliot, C. / Barnes, J. P. / Bertin, F. / Cooper, D. / Hartmann, J. M. / Rivallin, P. et al. | 2008
- 124
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Modelling kink vortices in high-Tc superconductorsBeleggia, M. / Pozzi, G. / Tonomura, A. et al. | 2008
- 125
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Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivityCooper, D. / Truche, R. / Rivallin, P. / Hartmann, J. / Laugier, F. / Bertin, F. / Chabli, A. et al. | 2008
- 126
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Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimensCooper, D. / Ailliot, C. / Truche, R. / Hartmann, J. / Barnes, J. / Bertin, F. et al. | 2008
- 127
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Analytical TEM and electron holography of magnetic field distribution in nanocrystalline Co layers deposited on CuDubiel, B. / Wolf, D. / Stepniowska, E. / Czyrska-Filemonowicz, A. et al. | 2008
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Electron Holography with Cs-corrected Tecnai F20 — elimination of the incoherent damping introduced by the biprism in conventional electron microscopesGeiger, D. / Rother, A. / Linck, M. / Lichte, H. / Lehmann, M. / Haider, M. / Freitag, B. et al. | 2008
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Can the discontinuity in the polarity of the oxide layers at the interface SrTiO3-LaAlO3 be resolved by using Electron Holography with Cs-corrected TEM?Geiger, D. / Thiel, S. / Mannhart, J. / Lichte, H. et al. | 2008
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Energy-filtered DBI/HHerring, R. A. et al. | 2008
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Strain determination by dark-field electron holographyHoudellier, F. / Hÿtch, M. J. / Hüe, F. / Snoeck, E. et al. | 2008
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Nonlinear Electron Inline HolographyKoch, C. T. / Rahmati, B. / van Aken, P. A. et al. | 2008
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Electron Holography: Performance and performance limitsLichte, Hannes et al. | 2008
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Reconstruction methods for in-line electron holography of nanoparticlesLivadaru, L. / Malac, M. / Wolkow, R. A. et al. | 2008
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Electron holography of soot nanoparticlesPawlyta, M. / Tai, C. W. / Rouzaud, J. -N. / Lereah, Y. et al. | 2008
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Holographic tomography of electrostatic potentials in semiconductor devicesRobb, P. D. / Twitchett-Harrison, A. C. et al. | 2008
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Electron Holography on the charge modulated structure In2O3(ZnO)m in comparison with DFT-calculationsRöder, Falk / Rother, Axel / Mader, Werner / Bredow, Thomas / Lichte, Hannes et al. | 2008
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Correction of the object wave using iteratively reconstructed local object tilt and thicknessScheerschmidt, K. et al. | 2008
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Extended field of view for medium resolution electron holography at Philips CM 200 MicroscopeSickmann, J. / Formánek, P. / Linck, M. / Lichte, H. et al. | 2008
- 140
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Electron holography of biological and organic objectsSimon, P. et al. | 2008
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Magnetic configurations of isolated and assemblies of iron 30 nm nanocubes studied by electron holographySnoeck, E. / Gatel, C. / Lacroix, L. M. / Blon, T. / Carrey, J. / Respaud, M. / Lachaize, S. / Chaudret, B. et al. | 2008
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Electron holography study of ferroelectric solid solutionsTai, C. W. / Lereah, Y. et al. | 2008
- 143
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Digital holographic interference microscopy of phase microscopic objects investigationTishko, T. V. / Tishko, D. N. / Titar, V. P. et al. | 2008
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Reconstruction of 3D (Ge,Si) islands by 2D phase mappingZheng, C. L. / Kirmse, H. / Häusler, I. / Scheerschmidt, K. / Neumann, W. et al. | 2008
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Quantitative electron tomography of biological structures using elastic and inelastic scatteringLeapman, R. D. / Aronova, M. A. / Sousa, A. A. / Zhang, G. / Hohmann-Marriott, M. F. et al. | 2008
- 146
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Discrete tomography in materials science: less is more?Bals, S. / Batenburg, K. J. / Van Tendeloo, G. et al. | 2008
- 147
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Towards atomic-scale bright-field electron tomography for the study of fullerene-like nanostructuresBar Sadan, M. / Houben, L. / Wolf, S. G. / Enyashin, A. / Seifert, G. / Tenne, R. / Urban, K. et al. | 2008
- 148
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DART explained: how to carry out a discrete tomography reconstructionBatenburg, K. J. / Bals, S. / Sijbers, J. / Van Tendeloo, G. et al. | 2008
- 149
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Optical depth sectioning of metallic nanoparticles in the aberration-corrected scanning transmission electron microscopeBehan, G. / Kirkland, A. I. / Nellist, P. D. et al. | 2008
- 150
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3D-Geometrical and chemical quantification of Au@SiOx nano-composites in HAADF-STEM imaging modeBenlekbir, S. / Epicier, T. / Martini, M. / Perriat, P. et al. | 2008
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Electron tomography of mesostructured cellular foam silicaBiermans, E. / Bals, S. / Beyers, E. / Wolf, D. / Verbeeck, J. / Cool, P. / Van Tendeloo, G. et al. | 2008
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A Study of Stacked Si Nanowire Devices by Electron TomographyCherns, P. D. / Dupré, C. / Cooper, D. / Aussenac, F. / Chabli, A. / Ernst, T. et al. | 2008
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Simulation of the electron radiation damage in an amorphous Ge sampleCroitoru, M. D. / Van Dyck, D. / Le Roux, S. / Jund, P. et al. | 2008
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Observation of Three-dimensional Elemental Distribution by using EF-TEM TomographyEndo, N. / Hamamoto, C. / Nishioka, H. / Oikawa, T. et al. | 2008
- 155
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HAADF-TEM Tomography of the precipitation state in an Al-Zn-Mg alloyEpicier, T. / Benlekbir, S. / Danoix, F. et al. | 2008
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STEM electron tomography of gold nanostructuresHernandez, J. C. / Moreno, M. S. / Coronado, E. A. / Midgley, P. A. et al. | 2008
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Three-dimensional imaging of semiconductor nanostructures by compositional-sensitive diffraction contrast electron tomography studiesHernandez, J. C. / Sanchez, A. M. / Beanland, R. / Midgley, P. A. et al. | 2008
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A full tilt range goniometer inside a TEM goniometerXu, X. J. / Lockwood, A. / Gay, R. / Wang, J. J. / Peng, Y. / Inkson, B. J. / Möbus, G. et al. | 2008
- 159
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Four-dimensional STEM-EELS TomographyJarausch, K. / Leonard, D. / Twesten, R. / Thomas, P. et al. | 2008
- 160
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Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomographyKondo, Hisatake / Oikawa, Tetsuo et al. | 2008
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Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi2 Nanocrystals in SiCLeschner, J. / Biskupek, J. / Chuvilin, A. / Kaiser, U. et al. | 2008
- 162
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3-D TEM observation of xenon nano-precipitates in aluminium crystalsSong, M. / Matsumoto, H. / Shimojo, M. / Furuya, K. et al. | 2008
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Dark-field TEM tomography of ordered domain morphology in a Ni4Mo alloyKimura, K. / Matsuyama, K. / Hata, S. / Matsumura, S. et al. | 2008
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Optimum optical condition of Tomography for thick samplesMotoki, S. / Hamamoto, C. / Nishioka, H. / Okura, Y. / Kondo, Y. / Jinnai, H. et al. | 2008
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3-dimensional nanoparticle analysis using electron tomographyOikawa, T. / Alloyeau, D. / Ricolleau, C. / Langlois, C. / Le Bouar, Y. / Loiseau, A. et al. | 2008
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Electron Tomography of ZnO Nanocones with Secondary Signals in TEMOrtalan, V. / Li, Y. / Lavernia, E. J. / Browning, N. D. et al. | 2008
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Quantification of Nanoparticle TomogramsSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
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Tomographic imaging ultra-thick specimens with nanometer resolutionSourty, E. / Freitag, B. / Wall, D. / Tang, D. / Lu, K. / Loos, J. et al. | 2008
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Three-dimensional imaging at the mesoscopic scale using STEM-in-SEMJornsanoh, P. / Thollet, G. / Gauthier, C. / Masenelli-Varlot, K. et al. | 2008
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Three-dimensional potential mapping of nanostructures with electron-holographic tomographyWolf, Daniel / Lenk, Andreas / Lichte, Hannes et al. | 2008
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Design of high-speed tomography with the 3MV ultrahigh voltage electron microscopeYoshida, Kiyokazu / Nishi, Ryuji / Mori, Hirotaro et al. | 2008
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The point spread function assessment of MeV electron imaging quality for thick specimensWang, Fang / Zhang, Hai-Bo / Cao, Meng / Nishi, Ryuji / Yoshida, Kiyokazu / Takaoka, Akio et al. | 2008
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Relevance of the minimum projection number to specimen structures for high-quality electron tomographyZhang, Hai-Bo / Cao, Meng / Lu, Yong / Li, Chao / Nishi, Ryuji / Takaoka, Akio et al. | 2008
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected MicroscopyMuller, D. A. / Fitting Kourkoutis, L. / Murfitt, M. / Song, J. H. / Hwang, H. Y. / Silcox, J. / Dellby, N. / Krivanek, O. L. et al. | 2008
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EMCD with nm Resolution and Below: Experiments, Proposals, and a ParadoxSchattschneider, P. / Stöger-Pollach, M. / Tian, F. / Verbeeck, J. et al. | 2008
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Combining electronic and optical spectroscopy at the nanometer scale in a STEMMazzucco, S. / Bernard, R. / Kociak, M. / Stéphan, O. / Tencé, M. / Zagonel, L. F. / Garcia de Abajo, F. J. / Colliex, C. et al. | 2008
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Deconvolution of core loss electron energy loss spectraBertoni, G. / Verbeeck, J. et al. | 2008
- 178
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Obtaining the loss function from angle resolved electron energy loss spectraBertoni, G. / Verbeeck, J. / Brosens, F. et al. | 2008
- 179
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Revisiting the determination of carbon sp2/sp3 ratios via analysis of the EELS carbon K-edgeBrydson, R. / Zhili, Z. / Brown, A. et al. | 2008
- 180
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Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxidesCalmels, L. / Warot, B. / Houdellier, F. / Schattschneider, P. / Gatel, C. / Serin, V. / Snoeck, E. et al. | 2008
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Probing bright and dark surface plasmon modes in individual and coupled Au nanoparticles using a fast electron beamChu, Ming-Wen / Myroshnychenko, Viktor / Javier García de Abajo, F. / Chen, Cheng Hsuan et al. | 2008
- 182
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Dual energy range EELS spectrum imaging using a fast beam switchCraven, A. J. / MacKenzie, M. / McFadzean, S. et al. | 2008
- 183
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Determination of local composition of Li-Si alloys by Electron Energy-Loss SpectroscopyDanet, J. / Guyomard, D. / Brousse, T. / Moreau, P. et al. | 2008
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Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging datade la Peña, F. / Arenal, R. / Stephan, O. / Walls, M. / Loiseau, A. / Colliex, C. et al. | 2008
- 185
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EELS analysis of plasmon resonance in the UV-vis energy range of metal alloy nanoparticlesEccles, J. W. L. / Bangert, U. / Christian, P. et al. | 2008
- 186
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Anisotropic effects in ELNES of the O-K edge in rutile: a case of trichroismMauchamp, V. / Epicier, T. / Le Bossé, J.C. et al. | 2008
- 187
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Dissimilar cation migration in (001) and (110) La2/3Ca1/3MnO3 thin filmsEstrade, S. / Infante, I.C. / Sanchez, F. / Fontcuberta, J. / de la Peña, F. / Walls, M. / Colliex, C. / Arbiol, J. / Peiró, F. et al. | 2008
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Energy-loss near edge structures of Cr2O3, CrO2 and YCrO4 phasesMoreno, M. S. / Urones-Garrote, E. / Otero-Díaz, L. C. et al. | 2008
- 189
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Distortion corrections of ESI data cubes for magnetic studiesGatel, C. / Warot-Fonrose, B. / Houdellier, F. / Schattschneider, P. et al. | 2008
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Optimisation of the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental MapsGralla, Benedikt / Kohl, Helmut et al. | 2008
- 191
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Band gap mapping using monochromated electronsGu, L. / Sigle, W. / Koch, C. T. / Srot, V. / Nelayah, J. / van Aken, P. A. et al. | 2008
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StripeSTEM, a new method for the isochronous acquisition of HAADF images and monolayer resolved EELSHeidelmann, M. / Houben, L. / Barthel, J. / Urban, K. et al. | 2008
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Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin MultilayersHeil, Tobias / Stender, Patrick / Schmitz, Guido / Kohl, Helmut et al. | 2008
- 194
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Development of a Process for Cleaning a TEM Column by Chemical Etching of Oxygen RadicalsHoriuchi, Shin / Hanada, Takeshi / Ebisawa, Masaharu et al. | 2008
- 195
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Low loss EELS study of gold nanoparticles using a monochromated TEMIrsen, S. / Pasoz, N. P. / Giersigr, M. et al. | 2008
- 196
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Analytical RPA response of Carbon and BN single-walled nanotubes: Application to EELS and wave loss spectraJoyes, P. / Stéphan, O. / Kociak, M. / Zobelli, A. / Colliex, C. et al. | 2008
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Improvement of energy resolution of VEELS spectra with deconvolution method for electronic and optical properties analysis on ferroelectric oxides in nano-scaleKiguchi, T. / Wakiya, N. / Shinozaki, K. / Konno, T. J. et al. | 2008
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Low Loss Electron Energy Spectroscopy on LiFePO4 for Li ion Battery ApplicationsKinyanjui, M. / Kaiser, U. / Wohlfahrt-Mehrens, M. / Li, J. / Vainkin, D. et al. | 2008
- 199
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Atomic-resolution studies of complex oxide materials using in-situ scanning transmission electron microscopyYang, G. / Zhao, Y. / Klie, R. F. et al. | 2008
- 200
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Low-loss EELS measurements on an oxide multilayer system using monochrome electronsKothleitner, G. / Schaffer, B. / Dienstleder, M. et al. | 2008
- 201
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White noise subtraction for calculating the two-particle-structure factor from inelastic diffractogramsKreyenschulte, C. / Kohl, H. et al. | 2008
- 202
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Local Analysis of BaTiO3/SrTiO3 interfaces by STEM-EELSKurata, H. / Kozawa, R. / Kawai, M. / Shimakawa, Y. / Isoda, S. et al. | 2008
- 203
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Experimental conditions and data evaluation for quantitative EMCD measurements in the TEMLidbaum, H. / Rusz, J. / Liebig, A. / Hjörvarsson, B. / Oppeneer, P. M. / Coronel, E. / Eriksson, O. / Leifer, K. et al. | 2008
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Investigation of the valency distribution in Cu1.2Mn1.8O4 using quantitative EELS near-edge structures analysisMaunders, C. / Martin, B. E. / Wei, P. / Petric, A. / Botton, G. A. et al. | 2008
- 205
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EELS mapping of surface plasmons in star-shaped gold nanoparticles: morphological behaviour of optical properties from star to sphereMazzucco, S. / Stéphan, O. / Kociak, M. / Colliex, C. et al. | 2008
- 206
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Fast local determination of phases in LixFePO4Moreau, P. / Mauchamp, V. / Boucher, F. et al. | 2008
- 207
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EELS/EFTEM in life science: proof of the presence of H2O2 in human skin by Ce deposition in melanosomesMüller, Elisabeth / Droste, Miriam / Gläser, Katja / Wepf, Roger et al. | 2008
- 208
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Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscopeNicotra, G. / Bongiorno, C. / Spinella, C. / Rimini, E. et al. | 2008
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Phase Identification of Aluminium Oxide Phases by Analysis of the Electron Energy-loss Near Edge StructurePark, Daesung / Weirich, Thomas E. / Mayer, Joachim et al. | 2008
- 210
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Valence sensitivity of Fe-L2,3 white-line ratios extracted from EELSRiedl, T. / Serra, R. / Calmels, L. / Serin, V. et al. | 2008
- 211
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Calculation of inelastic scattering events within second order QED — Implications of fully relativistic scatteringRother, A. et al. | 2008
- 212
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Role of asymmetries for EMCD sum rulesRusz, J. / Lidbaum, H. / Liebig, A. / Novák, P. / Oppeneer, P. M. / Eriksson, O. / Leifer, K. / Hjörvarsson, B. et al. | 2008
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Smart acquisition EELSSader, K. / Wang, P. / Bleloch, A. L. / Brown, A. / Brydson, R. et al. | 2008
- 214
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EELS fine structure tomography using spectrum imagingSaghi, Z. / Xu, X. / Möbus, G. et al. | 2008
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Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin filmFalke, M. / Schaarschmidt, T. / Schletter, H. / Jelitzki, R. / Schulze, S. / Beddies, G. / Hietschold, M. / MacKenzie, M. / Craven, A. J. / Bleloch, A. et al. | 2008
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Distribution of Fe and In dopants in ZnO: A combined EELS/EDS analysisSchmid, H. / Mader, W. et al. | 2008
- 217
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Changes in the Soot Microstructure during Combustion studied by SEM, TEM, Raman and EELSSchuster, M. E. / Knauer, M. / Ivleva, N. P. / Niessner, R. / Su, D. S. / Schlögl, R. et al. | 2008
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EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and MgSchwarz, S. / Stöger-Pollach, M. et al. | 2008
- 219
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EELS modelling using a pseudopotential DFT codeSeabourne, C. R. / Scott, A. J. / Brydson, R. et al. | 2008
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The EELS spectrum databaseSikora, Thierry / Serin, Virginie et al. | 2008
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STEM-EELS analysis of interface magnetic moments in Fe(100)/Co(bcc) superlatticesSerra, R. / Calmels, L. / Serin, V. / Warot-Fonrose, B. / Andrieu, S. et al. | 2008
- 222
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EMCD at high spatial resolution: comparison of STEM with EELS profilingStöger-Pollach, M. / Schattschneider, P. / Perkins, J. / McComb, D. et al. | 2008
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Elemental, Chemical and Physical State Mapping in Three-Dimensions using EELS-SI TomographyThomas, P. J. / Booth, C. / Harmon, R. / Markovic, S. / Twesten, R. D. / Jarausch, K. et al. | 2008
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Sub-0.5 eV EFTEM Mapping using the Zeiss SESAMKoch, C. T. / Sigle, W. / Nelayah, J. / Gu, L. / Srot, V. / van Aken, P. A. et al. | 2008
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Acquisition of the EELS data cube by tomographic spectroscopic imagingVan den Broek, W. / Verbeeck, J. / De Backer, S. / Schryvers, D. / Scheunders, P. et al. | 2008
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A low electron fluence EELS study of Fe-coordination within ferrihydrite and phosphorous doped ferrihydrite nanoparticlesVaughan, G. / Brown, A. P. / Brydson, R. / Sader, K. et al. | 2008
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Optimal aperture sizes and positions for EMCD experimentsVerbeeck, J. / Hébert, C. / Rubino, S. / Novák, P. / Rusz, J. / Houdellier, F. / Gatel, C. / Schattschneider, P. et al. | 2008
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Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)Verleysen, E. / Richard, O. / Bender, H. / Schryvers, D. / Vandervorst, W. et al. | 2008
- 229
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Retrieving dielectric function by VEELSZhang, L. / Verbeeck, J. / Erni, R. / Van Tendeloo, G. et al. | 2008
- 230
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Some Recent Materials Applications of In Situ High Resolution Electron MicroscopySinclair, R. / Kang, S. K. / Kim, K. H. / Park, J. S. et al. | 2008
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Melting and solidification of alloys embedded in a matrix at nanoscaleChattopadhyay, K. / Bhattacharya, V. / Biswas, K. et al. | 2008
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Advances in transmission electron microscopy: in situ nanoindentation and in situ straining experimentsDe Hosson, Jeff Th. M. et al. | 2008
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Observing Nanosecond Phenomena at the Nanoscale with the Dynamic Transmission Electron MicroscopeCampbell, G. H. / Browning, N. D. / Kim, J. S. / King, W. E. / LaGrange, T. / Reed, B. W. / Taheri, M. L. et al. | 2008
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TEM characterization of nanostructures formed from SiGeO films: effect of electron beam irradiationBallesteros, C. / Ortiz, M. I. / Morana, B. / Rodríguez, A. / Rodríguez, T. et al. | 2008
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In situ Lorentz microscopy in an alternating current magnetic fieldAkase, Z. / Kakinuma, H. / Shindo, D. / Inoue, M. et al. | 2008
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In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 (100) and (110) surfaces at high temperatureBellina, P. J. / Phillipp, F. / van Aken, P. A. et al. | 2008
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Probing integration strength of colloidal spheres self-assembled from TiO2 nanocrystals by in-situ TEM indentationChen, C. Q. / Pei, Y. T. / De Hosson, J. Th. M. et al. | 2008
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Installation and operation of an in situ electron microscopy facilityFay, M. W. / Edwards, H. K. / Zong, M. / Thurecht, K. J. / Howdle, S. M. / Brown, P. D. et al. | 2008
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Bringing chemical reactions to life: environmental transmission electron microscopy (E-TEM)Freitag, B. / Kim, S. M. / Zakharov, D. N. / Stach, E. A. / Stokes, D. J. et al. | 2008
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Dynamic in situ experiments in a 1Å double aberration corrected environmentGai, Pratibha L. / Boyes, Edward D. et al. | 2008
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A very high temperature (2000°C) stage for atomic resolution in situ ETEMGai, Pratibha L. / Boyes, Edward D. et al. | 2008
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Environmental High Resolution Electron Microscopy With a Closed Ecell: Application to CatalystsGiorgio, S. / Cabié, M. / Henry, C. R. et al. | 2008
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Pulsed-mode photon and electron microscopy surveyedHowie, A. et al. | 2008
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In-situ Observation of Nano-particulate Gold Catalysts during Reaction by Closed-type Environmental-cell Transmission Electron MicroscopeKawasaki, T. / Hasegawa, H. / Ueda, K. / Tanji, T. et al. | 2008
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In situ transmission electron microscopy on leadzirconate-titanate under electrical fieldKling, J. / Schmitt, L. / Kleebe, H. -J. / Fuess, H. et al. | 2008
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Elongation of Atomic-size Wires: Atomistic Aspects and Quantum Conductance StudiesLagos, M. / Rodrigues, V. / Ugarte, D. et al. | 2008
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Atomic-size Silver NanotubeLagos, M. / Sato, F. / Bettini, J. / Rdrigues, V. / Galvão, D. / Ugarte, D. et al. | 2008
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In-situ TEM mechanical testing of a Si MEMS nanobridgeLockwood, A. J. / Bunyan, R. J. T. / Inkson, B. J. et al. | 2008
- 249
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In-situ TEM nanoindentation and deformation of Si-nanoparticle clustersLockwood, A. J. / Inkson, B. J. et al. | 2008
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Electron Holography of in-situ ferroelectric polarisation switchingMatzeck, Ch. / Einenkel, B. / Müller, H. / Lichte, H. et al. | 2008
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Development of fast CCD Cameras for in-situ Electron MicroscopyMollon, Bill / Tsung, Lancy / Pan, Ming / Jia, Yan / Mooney, Paul / Mao, Chengye et al. | 2008
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In situ characterization of the mechanical properties of nanoparticles and nanoscale structuresDeneen Nowak, J. / Shan, Z. W. / Warren, O. L. et al. | 2008
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In-situ engineering of nanostructures with near atomic precision and property measurementsPeng, L. -M. / Wang, M. S. / Liu, Y. / Chen, Q. et al. | 2008
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In-situ TEM investigation of the contrast of nanocrystals embedded in an amorphous matrixPeterlechner, M. / Waitz, T. / Karnthaler, H. P. et al. | 2008
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In situ HRTEM — Image corrected and monochromated Titan equipped with environmental cellWagner, J. B. / Jinschek, J. R. / Hansen, T. W. / Boothroyd, C. B. / Dunin-Borkowski, R. E. et al. | 2008
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The surface dynamics of the transient oxidation stages of Cu and Cu binary alloysYang, J. C. / Li, Z. / Sun, L. / Zhou, G. W. / Pearson, J. E. / Eastman, J. A. / Fong, D. D. / Fuoss, P. H. / Baldo, P. M. / Rehn, L. E. et al. | 2008
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In-situ TEM for altering nanostructures and recording the changes at an atomic resolutionZhang, X. F. / Kamino, T. et al. | 2008
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Aberration correction in SEM: Relaunching an old projectZach, J. et al. | 2008
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Changes and reversals of contrasts in SEMCazaux, J. et al. | 2008
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Surface potential and SE detection in the SEMCazaux, J. et al. | 2008
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On the Spatial Resolution and Nanoscale Features Visibility in Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron MicroscopyMorandi, V. / Migliori, A. / Corticelli, F. / Ferroni, M. et al. | 2008
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Scanning electron microscopy techniques for cross-sectional analyses of thin-film solar cellsAbou-Ras, D. / Jahn, U. / Bundesmann, J. / Caballero, R. / Kaufmann, C. A. / Klaer, J. / Nichterwitz, M. / Unold, T. / Schock, H. W. et al. | 2008
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Maximising EBSD acquisition speed and indexing rateAsahina, Shunsuke / Charles, Franck / Dicks, Keith / Erdman, Natasha et al. | 2008
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Helium ion microscope: advanced contrast mechanisms for imaging and analysis of nanomaterialsBell, David C. / Stern, L. A. / Farkas, L. / Notte, J. A. et al. | 2008
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Hygroscopic properties of individual aerosol particles from aluminum smelter potrooms determined by environmental scanning electron microscopyBenker, N. / Ebert, M. / Drabløs, P. A. / Ellingsen, D. G. / Thomassen, Y. / Weinbruch, S. et al. | 2008
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Analysis of individual aerosol particles by automated scanning electron microscopyBenker, N. / Kandler, K. / Ebert, M. / Weinbruch, S. et al. | 2008
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A new quantitative height standard for the routine calibration of a 4-quadrant-large-angles-BSE-detectorBerger, D. / Ritter, M. / Hemmleb, M. / Dai, G. / Dziomba, T. et al. | 2008
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SEM-EDS for effective surface science and as a next generation defect review tool for nanoparticle analysis?Boyes, Edward D. et al. | 2008
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Detection of Signal Electrons by Segmental Ionization DetectorCernoch, P. / Jirak, J. et al. | 2008
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Low-voltage Scanning Transmission Electron Microscopy of InGaAs nanowiresFelisari, L. / Grillo, V. / Jabeen, F. / Rubini, S. / Martelli, F. et al. | 2008
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Secondary Electrons Characterization of Hydrogenated Dilute NitridesFelisari, L. / Grillo, V. / Rubini, S. / Martelli, F. / Trotta, R. / Polimeni, A. / Capizzi, M. / Mariucci, L. et al. | 2008
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Mapping of the local density of states with very slow electrons in SEMPokorná, Z. / Frank, L. et al. | 2008
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Thickness and composition measurement of thin TEM samples with EPMA and the thin film analysis software STRATAGemGalbert, F. / Berger, D. et al. | 2008
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Automatic acquisition of large amounts of 3D data at the ultrastructural level, using serial block face scanning electron microscopyGenoud, C. / Mancuso, J. / Monteith, S. / Kraus, B. et al. | 2008
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MCSEM- a modular Monte Carlo simulation program for various applications in SEM metrology and SEM photogrammetryGnieser, D. / Frase, C. G. / Bosse, H. / Tutsch, R. et al. | 2008
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Wien filter electron optical characteristics determining using shadow projection methodVlček, I. / Horáček, M. / Zobač, M. et al. | 2008
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Strain related Contrast mechanisms in crystalline materials imaged with AsB detectionJaksch, Heiner et al. | 2008
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Low Loss BSE imaging with the EsB Detection system on the Gemini Ultra FE-SEMJaksch, Heiner et al. | 2008
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Accurate calculations of thermionic electron gun propertiesJánský, P. / Lencová, B. / Zlámal, J. et al. | 2008
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Scintillation SE Detector for Variable Pressure Scanning Electron MicroscopeJirak, J. / Cernoch, P. / Nedela, V. / Spinka, J. et al. | 2008
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The stability of retained austenite in supermartensitic stainless steel (SMSS) examined by means of SEM/EBSDKarlsen, M. / Hjelen, J. / Grong, Ø. / Rørvik, G. / Chiron, R. / Schubert, U. et al. | 2008
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In-situ EBSD studies of hydrogen induced stress cracking (HISC) in pipelines of super-duplex stainless steelKarlsen, M. / Wåsjø, J. / Hjelen, J. / Grong, Ø. / Rørvik, G. / Chiron, R. / Schubert, U. et al. | 2008
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E-beam hardening SEM glue for fixation of small objects in the SEMKleindiek, S. / Rummel, A. / Schock, K. et al. | 2008
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Development of the charging reduction system by electron beam irradiation for scanning electron microscopesKono, Y. / Suzuki, O. / Honda, K. et al. | 2008
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Aberrations of the cathode lens combined with a focusing magnetic/immersion-magnetic lensKonvalina, I. / Müllerová, I. / Hovorka, M. et al. | 2008
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Identification possibilities of micro/nanoparticles and nanocomposites in forensic practiceKotrly, M. / Turkova, I. / Grunwaldova, V. et al. | 2008
- 287
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Mass thickness determination of thin specimens using high-resolution scanning electron microscopyKrzyzanek, V. / Reichelt, R. et al. | 2008
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Benefits of Low Vacuum SEM for EBSD ApplicationsKunze, K. / Buzzi, St. / Löffler, J. / Burg, J. -P. et al. | 2008
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In-situ combination of SEMPA, STM, and FIB for magnetic imaging and nanoscale structuringMennig, J. / Kollamana, J. / Gliga, S. / Cherifi, S. / Matthes, F. / Bürgler, D. E. / Schneider, C. M. et al. | 2008
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Characterisation of the subgrain structure of the aluminium alloy AA6082 after homogenization and hot forming by EBSDMitsche, S. / Sherstnev, P. / Sommitsch, C. / Ebner, T. / Hacksteiner, M. et al. | 2008
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An improved detection system for low energy Scanning Transmission Electron MicroscopyMorandi, V. / Migliori, A. / Maccagnani, P. / Ferroni, M. / Tamarri, F. et al. | 2008
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Thickness determination of thin samples by transmission measurements in a scanning electron microscopeMüller, E. et al. | 2008
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Role of the high-angle BSE in SEM imagingMüllerová, I. / Frank, L. et al. | 2008
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Experimental and simulated signal amplification in variable pressure SEMNeděla, V. / Jánský, P. / Lencová, B. / Zlámal, J. et al. | 2008
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Study of highly-aggressive samples using the variable pressure SEMRunštuk, J. / Neděla, V. et al. | 2008
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Characterization of the focusing properties of polycapillary X-ray lenses in the scanning electron microscopeNissen, J. / Berger, D. / Kanngießer, B. / Mantouvalou, I. / Wolff, T. et al. | 2008
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Numerical Simulation of Signal Transfer in Scintillator-Photomultiplier DetectorNovák, L. et al. | 2008
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In-situ Electrical Measurements on Nanostructures in a Scanning Electron MicroscopeNoyong, M. / Blech, K. / Juillerat, F. / Hofmann, H. / Simon, U. et al. | 2008
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3D Sculptures From SEM ImagesPintus, R. / Podda, S. / Vanzi, M. et al. | 2008
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Influence of tilt of sample on axial beam propertiesRadlička, T. / Lencová, B. et al. | 2008
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Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope.Rattenberger, J. / Wagner, J. / Schröttner, H. / Mitsche, S. / Schaffer, M. / Zankel, A. et al. | 2008
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Response function of the semiconductor detector of backscattered electrons in SEMRau, E. I. / Ditsman, S. A. / Luk’yanov, F. A. / Sennov, R. A. et al. | 2008
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Main principles of microtomography using backscattered electronsRau, E. I. et al. | 2008
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Considerations of some charging effects on dielectrics by electron beam irradiationRau, E. I. / Evstaf’eva, E. N. / Sennov, R. A. / Plies, E. et al. | 2008
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The reduction of pileup effects in spectra collected with silicon drift detectorsElam, T. / Anderhalt, R. / Sandborg, A. / Nicolosi, J. / Redfern, D. et al. | 2008
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High-temperature oxidation of steel in the ESEM with subsequent scale characterisation by Raman microscopyReichmann, A. / Poelt, P. / Brandl, C. / Chernev, B. / Wilhelm, P. et al. | 2008
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Method to determine image sharpness and resolution in Scanning Electron Microscopy imagesRieger, B. / van Veen, G. N. A et al. | 2008
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Instrumentation of an electron microscope for lithography and analysis of devices over a wide dimensional rangeRosolen, G. et al. | 2008
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Ultra-low energy, high-resolution scanning electron microscopyRoussel, L. Y. / Stokes, D. J. / Young, R. J. / Gestmann, I. et al. | 2008
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Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEMSasov, A. et al. | 2008
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A novel use of rf-GD sputtering for sample surface preparation for SEM: its impact on surface analysisShimizu, K. / Mitani, T. / Chapon, P. et al. | 2008
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Development of an ultra-fast EBSD detector systemSøfferud, M. / Hjelen, J. / Karlsen, M. / Breivik, T. / Krieger Lassen, N. C. / Schwarzer, R. et al. | 2008
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Future prospects on EBSD speeds using a 40 nA FESEMSøfferud, M. / Hjelen, J. / Karlsen, M. / Dingley, D. / Jaksch, H. et al. | 2008
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High pressure imaging in the environmental scanning electron microscope (ESEM)Stokes, D. J. / Chen, J. / Neijssen, W. A. J. / Baken, E. / Uncovsky, M. et al. | 2008
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Cathodoluminescence spectrum-imaging in the scanning electron microscope using automated stage controlStowe, D. J. / Thomas, P. J. / Galloway, S. A. et al. | 2008
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Low voltage, high resolution SEM imaging for mesoporous materialsTakagi, O. / Takeuchi, Shuichi / Miyaki, Atsushi / Ito, Hiroyuki / Sato, Hirofumi / Dan, Yukari / Nakagawa, Mine / Kataoka, Sho / Inagi, Yuki / Endo, Akira et al. | 2008
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New developments in state of the art silicon drift detectors (SDD) and multiple element SDDTerborg, R. / Rohde, M. et al. | 2008
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SEM in forensic scienceTurkova, I. / Kotrly, M. et al. | 2008
- 319
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Secondary electron imaging due to interface trapped charges for a buried SiO2 microstructureZhang, Hai-Bo / Li, Wei-Qin / Wu, Xing / Wu, Dan-Wei et al. | 2008
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HRSEM Secondary Electron Doping Contrast: Theory based on Band Bending and Electron Affinity MeasurementsZhebova, I. / Molotskii, M. / Barkay, Z. / Meshulam, G. / Grunbaum, E. / Rosenwaks, Y. et al. | 2008
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3D EBSD-based orientation microscopy and 3D materials simulation tools: an ideal combination to study microstructure formation processesZaefferer, S. et al. | 2008
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Capturing Sub-Nanosecond Quenching in DualBeam FIB/SEM Serial SectioningMoberlyChan, W. J. / Gash, A. E. et al. | 2008
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Deformation mechanisms in 1D nanostructures revealed by in situ tensile testing in an SEM/FIBGianola, D. S. / Mönig, R. / Kraft, O. / Volkert, C. A. et al. | 2008
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Focused Ion Beam Tomography of Insulating Biological and Geological MaterialsHumbel, B. M. / de Winter, D. A. M. / Schneijdenberg, C. T. W. M. / Lich, B. H. / Drury, M. R. / Verkleij, A. J. et al. | 2008
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Redeposition and differential sputtering of La in TEM samples of LaAlO3 / SrTiO3 multilayers prepared by FIBMontoya, Eduardo / Bals, Sara / Van Tendeloo, Gustaaf et al. | 2008
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Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam millingBlom, T. / Welch, K. / Strømme, M. / Coronel, E. / Leifer, K. et al. | 2008
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TEM sample preparation on photoresistCazzaniga, F. / Mondonico, E. / Ricci, E. / Sammiceli, F. / Somaschini, R. / Testai, S. / Zorz, M. et al. | 2008
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Advanced FIB preparation of semiconductor specimens for examination by off-axis electron holographyCooper, D. / Truche, R. / Twitchett-Harrison, A. C. / Midgley, P. A. / Dunin Borkowski, R. E. et al. | 2008
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Comparison of ion- and electron-beam-induced Pt nanodeposits: composition, volume per dose, microstructure, and in-situ resistanceCórdoba, R. / De Teresa, J. M. / Fernández-Pacheco, A. / Montero, O. / Strichovanec, P. / Ibarra, A. / Ibarra, M. R. et al. | 2008
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In-line FIB TEM sample preparation induced effects on advanced fully depleted silicon on insulator transistorsDelaye, V. / Andrieu, F. / Aussenac, F. / Carabasse, C. et al. | 2008
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The development of cryo-FIBSEM techniques for the sectioning and TEM analysis of the cell-biomaterial interfaceEdwards, H. K. / Fay, M. W. / Scotchford, C. A. / Grant, D. M. / Brown, P. D. et al. | 2008
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Three-slit interference experiments with electronsFrabboni, S. / Gazzadi, G. C. / Pozzi, G. et al. | 2008
- 333
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Contrast in ion induced secondary electron imagesGiannuzzi, Lucille A. / Utlaut, Mark / Swanson, Lynwood et al. | 2008
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Quantitative in situ thickness determination of FIB TEM lamella by using STEM in a SEMGolla-Schindler, U. et al. | 2008
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Analysis of ion diffusion in multilayer materials by depth profiling in a Crossbeam FIB-SIMS microscopeHospach, A. / Malik, A. M. / Nisch, W. / Burkhardt, C. et al. | 2008
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Growth of In2O3 islands on Y-stabilised ZrO2: a study by FIB and HRTEMHutchison, J. L. / Bourlange, A. / Egdell, R. / Schertel, A. et al. | 2008
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Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?Ke, X. / Bals, S. / Romo Negreira, A. / Hantschel, T. / Bender, H. / Van Tendeloo, G. et al. | 2008
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Advances in 3-dimensional material characterisation using simultaneous EDS and EBSD analysis in a combined FIB-SEM microscopede Kloe, René / Schulz, Hubert / Reinauer, Felix et al. | 2008
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Investigation of the effects of the TEM specimen preparation method on the analysis of the dielectric gate stack in GaAs based MOSFET devicesLongo, P. / Smith, W. / Miller, B. / Craven, A. J. et al. | 2008
- 340
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Manipulation and contacting of individual carbon nanotubes inside a FIB workstationMenze, S. B. / Vinzelberg, H. / Gemming, T. et al. | 2008
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High volume TEM-sample preparation using a wafer saving in-line preparation toolMuehle, U. / Jansen, S. / Schuetten, R. / Prang, R. / Schampers, R. / Lehmann, R. et al. | 2008
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The influence of beam defocus on volume growth rates for electron beam induced platinum depositionPlank, H. / Dienstleder, M. / Kothleitner, G. / Hofer, F. et al. | 2008
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Reducing of ion beam induced surface damaging using “low voltage” focused ion beam technique for transmission electron microscopy sample preparationSalzer, R. / Simon, M. / Graff, A. / Altmann, F. / Pastewka, L. / Moseler, M. et al. | 2008
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DualBeam FIB application of 3D EDXS for superalloy δ-phase characterizationWagner, J. / Schaffer, M. / Schroettner, H. / Mitsche, S. / Letofsky-Papst, I. / Stotter, Ch. / Sommitsch, Ch. et al. | 2008
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Time-resolved photoemission electron microscopySchönhense, Gerd et al. | 2008
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Quantitative 3D imaging of cells at 50 nm resolution using soft x-ray tomographyLarabell, C. / Parkinson, D. Y. / Gu, W. / Knoechel, C. / McDermott, G. / Le Gros, M. A. et al. | 2008
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STXM-NEXAFS of individual titanate-based nanoribbonBittencourt, C. / Felten, A. / Gillon, X. / Pireaux, J. -J. / Najafi, E. / Hitchcock, A. P. / Ke, X. / Van Tendeloo, G. / Ewels, C. P. / Umek, P. et al. | 2008
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The fine structure of bioreactor liver tissue seen through the eyes of X-ray micro-computed tomographyFernandes, C. / Dwarte, D. / Nagatsuma, K. / Saito, M. / Matsuura, T. / Braet, F. et al. | 2008
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Comparing the Si(Li)-detector and the silicon drift detector (SDD) using EDX in SEMGernert, U. et al. | 2008
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Enhancing contrast of Al traces on Si substrates using low-voltage SEM-hosted XRMGundrum, B. C. / Hunt, J. A. et al. | 2008
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An optical demonstration of ptychographical imaging of a single defect in a model crystalHurst, A. / Zhang, F. / Rodenburg, J. M. et al. | 2008
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HRTEM and STXM, a combined study of an individual focused-ion-beam patterned CNTFelten, A. / Ke, X. / Gillon, X. / Pireaux, J. -J. / Najafi, E. / Hitchcock, A. P. / Bittencourt, C. / Van Tendeloo, G. et al. | 2008
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Compact micro-CT/micro-XRF system for non-destructive 3D analysis of internal chemical compositionSasov, A. / Liu, X. / Rushmer, D. et al. | 2008
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NanoCT: Visualising of Internal 3D-Structures with Submicrometer ResolutionSieker, F. / Brunke, O. et al. | 2008
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Dynamics of nanostructures on surfaces revealed by high-resolution, fast-scanning STMBesenbacher, Flemming et al. | 2008
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Spin mapping on the atomic scaleWiesendanger, Roland et al. | 2008
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Researching the structure of the surface of undoped ZnO thin films by means of Atomic Force MicroscopyMuñoz Aguirre, N. / Tamayo Meza, P. / Martínez Pérez, L. et al. | 2008
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Improving the structural characterization of supported on glass gold nanoparticles using Atomic Force Microscopy on vacuum conditionsMuñoz Aguirre, N. / Rivera López, J. E. / Martínez Pérez, L. / Tamayo Meza, P. et al. | 2008
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CO and O2 chemisorption on Pd70Au30(110) : evolution of the surface studied by in situ STM and complementary surface analysis techniques at elevated pressuresLanguille, M. A. / Cadete Santos Aires, F. J. / Mun, B. S. / Jugnet, Y. / Saint-Lager, M. C. / Bluhm, H. / Robach, O. / Starr, D. E. / Rioche, C. / Dolle, P. et al. | 2008
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Height measurements on soft samples: applied force, molecules deformation and phase shiftAlbonetti, C. / Martínez, N. F. / Straub, A. / Biscarini, F. / Pérez, R. / García, R. et al. | 2008
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Effect of temperature on phase transition of cardiolipin liquid-crystalline aggregates studied by AFMAlessandrini, A. / Muscatello, U. et al. | 2008
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Investigating the influence of dynamic scattering on ptychographical iterative techniquesLiu, Cheng / Walther, T. / Rodenburg, J. M. et al. | 2008
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Determination of the lateral Resolution of a Cantilever based Solid Immersion Lens Near Field MicroscopeMerz, T. / Rebner, K. / Kessler, R. W. et al. | 2008
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LT-STM manipulation and spectroscopy of single copper and cobalt atomsZupanič, E. / Žitko, R. / van Midden, H. J. P. / Prodan, A. / Muševič, I. et al. | 2008
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3D atomic-scale chemical analysis of engineering alloysCerezo, A. / Marquis, E. A. / Saxey, D. W. / Williams, C. / Zandbergen, M. / Smith, G. D. W. et al. | 2008
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New Applications for Atom-Probe Tomography in Metals, Semiconductors and CeramicsKelly, Thomas F. / Larson, David J. / Alvis, Roger L. / Clifton, Peter H. / Gerstl, Stephan S. A. / Ulfig, Rob M. / Lawrence, Daniel / Olson, David P. / Reinhard, David A. / Stiller, Krystyna et al. | 2008
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Pulsed laser atom probe tomography analysis of advanced semiconductor nanostructuresMüller, M. / Cerezo, A. / Smith, G. D. W. / Chang, L. et al. | 2008
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Low Energy Electron Microscopy: A 10 Year OutlookTromp, Rudolf M. et al. | 2008
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Imaging of Surface Plasmon Waves in Nonlinear Photoemission MicroscopyMeyer zu Heringdorf, Frank -J. / Buckanie, N. M. / Chelaru, L. I. / Raß, N. et al. | 2008
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High resolution surface analysis of metallic and biological specimens by NanoSIMSGrovenor, C. R. M. et al. | 2008
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Elemental distribution profiles across Cu(In,Ga)Se2 solar-cell absorbers acquired by various techniquesAbou-Ras, D. / Kaufmann, C. A. / Schöpke, A. / Eicke, A. / Döbeli, M. / Gade, B. / Nunney, T. et al. | 2008
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High resolution Kelvin force microscopyFenner, Matthias A. / Alexander, John / Magonov, Sergei et al. | 2008
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High resolution in interferometric microscopyJobin, Marc / Foschia, Raphael et al. | 2008
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Effects of annealing on the microstructural evolution of copper films using texture analysisMoskvinova, A. / Schulze, S. / Hietschold, M. / Schubert, I. / Ecke, R. / Schulz, S. E. et al. | 2008
- 375
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Characterisation of Ga-distribution on a silicon wafer after inline FIB-preparation using inline ToFSIMSMuehle, U. / Gaertner, R. / Steinhoff, J. / Zahn, W. et al. | 2008
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First results in thin film analysis based on a new EDS software to determine composition and/or thickness of thin layers on substratesSempf, K. / Herrmann, M. / Bauer, F. et al. | 2008
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Calibration of RHEED patterns for the appraisal of titania surface crystallographyTao, T. / Walton, R. / Edwards, H. K. / Fay, M. W. / Grant, D. M. / Brown, P. D. et al. | 2008
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Surface orientation dependent termination and work-function of in situ annealed strontium titanateBarrett, N. / Zagonel, L. F. / Bailly, A. / Renault, O. / Leroy, J. / Cezar, J. C. / Brookes, N. / Shih, Shao-Ju / Cockayne, D. et al. | 2008
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Structure determination of zeolites by electron crystallographySun, Junliang / Zhang, Daliang / He, Zhanbing / Hovmöller, Sven / Zou, Xiaodong / Gramm, Fabian / Baerlocher, Christian / McCusker, Lynne B. et al. | 2008
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3D electron diffraction of protein crystals: data collection, cell determination and indexingGeorgieva, D. G. / Jiang, L. / Zandbergen, H. W. / Nicolopoulos, S. / Abrahams, J. P. et al. | 2008
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Self-assembly of cholesterol-based nonionic surfactants in water. Unusual micellar structure and transitionsAbezgauz, Ludmila / Portnaya, Irina / Danino, Dganit et al. | 2008
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Quantitative study of anode microstructure related to SOFC stack degradationFaes, A. / Hessler-Wyser, A. / Presvytes, D. / Brisse, A. / Vayenas, C. G. / Van Herle, J. et al. | 2008
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New considerations for exit wavefunction restoration under aberration corrected conditionsHaigh, S. J. / Chang, L -Y. / Sawada, H. / Young, N. P. / Kirkland, A. I. et al. | 2008
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High quality electron diffraction data by precessionHovmöller, Sven / Zhang, Daliang / Sun, Junliang / Zou, Xiaodong / Oleynikov, Peter et al. | 2008
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Optimal noise filters for high-resolution electron microscopy of non-ideal crystalsIshizuka, K. / Eilers, P. H. C. / Kogure, T. et al. | 2008
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Noise considerations in the application of the transport of intensity equation for phase recoveryMcVitie, S. et al. | 2008
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elmiX — An Electron Microscopy Software Collection for Data Analysis and EducationReinholdt, A. / Weirich, T. E. et al. | 2008
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Speed considerations when performing particle analysis and chemical classification by SEM/EDSScheller, S. et al. | 2008
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Morphological characterization of particles with very broad size distributions using program MDISTSlouf, M. / Lapcikova, M. / Vlkova, H. / Pavlova, E. / Hromadkova, J. et al. | 2008
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Multiple protein structures in one shot: maximum-likelihood image classification in 3D-EMScheres, S. H. W. / Carazo, J. M. et al. | 2008
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Compensation and evaluation of errors of 3D reconstructions from confocal microscopic imagesČapek, M. / Brůža, P. / Kocandová, L. / Janáček, J. / Kubínová, L. / Vagnerová, R. et al. | 2008
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High content image-based cytometry as a tool for nuclear fingerprintingDe Vos, W. H. / Dieriks, B. / Joss, G. / Van Oostveldt, P. et al. | 2008
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Measurement of surface area of biological structures, based on 3D microscopic image dataKubínová, L. / Janáček, J. et al. | 2008
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The imaging function for tilted samples: simulation, image analysis and correction strategiesMariani, V. / Schenk, A. / Engel, A. / Philippsen, A. et al. | 2008
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4D-MicroscopyMironov, Alexander A. / Micaroni, Massimo / Beznoussenko, Galina V. et al. | 2008
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Strategies for high content imaging screening and analysis of primary neuronsMunck, S. / Annaert, W. et al. | 2008
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Modelling and analysis of clustering and colocalization patterns in ultrastructural immunogold labelling of cell compartments based on 3-D image dataVyhnal, A. et al. | 2008
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Modern Methods of TEM Specimen Preparation in Material SciencePenkalla, H. J. et al. | 2008
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Ultramicrotomy in biology and materials science: an overviewGnaegi, H. / Studer, D. / Bos, E. / Peters, P. / Pierson, J. et al. | 2008
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Preparation of Biological Samples for Electron MicroscopySchwarz, H. / Humbel, B. M. et al. | 2008
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Web sample preparation guide for transmission electron microscopy (TEM)Ayache, Jeanne / Beaunier, Luc / Boumendil, Jacqueline / Ehret, Gabrielle / Laub, Danièle et al. | 2008
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Novel carbon nanosheets as support for ultrahigh resolution structural analysis of nanoparticlesBeyer, André / Nottbohm, Christoph / Sologubenko, Alla / Ennen, Inga / Hütten, Andreas / Rösner, Harald / Mayer, Joachim / Gölzhäuser, Armin et al. | 2008
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A new automated plunger for cryopreparation of proteins in defined - even oxygen free - atmospheresDepoix, F. / Meissner, U. / Markl, J. et al. | 2008
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A novel method for precipitates preparation using extraction replicas combined with focused ion beam techniquesDienstleder, M. / Plank, H. / Kothleitner, G. / Hofer, F. et al. | 2008
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An appraisal of FIBSEM and ultramicrotomy for the TEM analysis of the cell-biomaterial interfaceEdwards, H. K. / Fay, M. W. / Anderson, S. I. / Scotchford, C. A. / Grant, D. M. / Brown, P. D. et al. | 2008
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