Bounding fault detection probabilities in combinational circuits (English)
National licence
- New search for: Markowsky, George
- New search for: Markowsky, George
In:
Journal of Electronic Testing
;
2
, 4
;
315-323
;
1991
- Article (Journal) / Electronic Resource
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Title:Bounding fault detection probabilities in combinational circuits
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Contributors:Markowsky, George ( author )
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Published in:Journal of Electronic Testing ; 2, 4 ; 315-323
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Publisher:
- New search for: Kluwer Academic Publishers
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Place of publication:Dordrecht
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Publication date:1991-11-01
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Size:9 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 2, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 313
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Editorial| 1991
- 315
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Bounding fault detection probabilities in combinational circuitsMarkowsky, George et al. | 1991
- 325
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Bounds on the sizes of irredundant test sets and sequences for combinational logic networksDebany, Warren H. Jr. / Hartmann, Carlos R. P. et al. | 1991
- 339
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The minimum test set problem for circuits with nonreconvergent fanoutPomeranz, Irith / Kohavi, Zvi et al. | 1991
- 351
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Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labelingChatterjee, Abhijit / Abraham, Jacob A. et al. | 1991
- 373
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Analysis of Hamming count compaction schemeJone, Wen-Ben / Gleason, Anita et al. | 1991
- 385
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Model-based reasoning for electron-beam debugging of VLSI circuitsMarzouki, Meryem et al. | 1991
- 395
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Checkpoints in irredundant two-level combinational circuitsChen, Jwu E. / Lee, Chung Len / Shen, Wen Zen et al. | 1991
- 399
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Call for papers| 1991