Wavelet and fourier analysis of electric fluctuations in semiconductor and electrochemical systems (English)
National licence
- New search for: Budnikov, E. Yu.
- New search for: Kuboev, I. Yu.
- New search for: Maksimychev, A. V.
- New search for: Miroshnikova, I. N.
- New search for: Timashev, S. F.
- New search for: Gulyaev, A. M.
- New search for: Budnikov, E. Yu.
- New search for: Kuboev, I. Yu.
- New search for: Maksimychev, A. V.
- New search for: Miroshnikova, I. N.
- New search for: Timashev, S. F.
- New search for: Gulyaev, A. M.
In:
Measurement Techniques
;
42
, 11
;
1062-1067
;
1999
- Article (Journal) / Electronic Resource
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Title:Wavelet and fourier analysis of electric fluctuations in semiconductor and electrochemical systems
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Contributors:Budnikov, E. Yu. ( author ) / Kuboev, I. Yu. ( author ) / Maksimychev, A. V. ( author ) / Miroshnikova, I. N. ( author ) / Timashev, S. F. ( author ) / Gulyaev, A. M. ( author )
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Published in:Measurement Techniques ; 42, 11 ; 1062-1067
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Publisher:
- New search for: Kluwer Academic Publishers-Plenum Publishers
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Place of publication:New York
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Publication date:1999-11-01
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Size:6 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 42, Issue 11
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1009
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A central limit theorem for linear estimators of measurement resultsEremin, E. V. et al. | 1999
- 1017
-
Bayes method for complex processing of information in gravitational wave experimentGusev, A. V. / Milyukov, V. K. / Rudenko, V. N. et al. | 1999
- 1021
-
Method for detecting and rectifying modular errors in devices for storing and transmitting information in measurement technology microprocessorsPavlov, Aleksandr A. / Pavlov, A. A. et al. | 1999
- 1028
-
Relative information about reliability and methods of obtaining itRadaev, N. N. / Sakharov, M. V. et al. | 1999
- 1033
-
Simple algorithm for determining low-frequency fluctuation components of the frequency of a self-oscillatorGerasimova, N. V. / Kulikov, M. N. et al. | 1999
- 1037
-
Analysis of the ellipse of polarization by the senarmont method as the phase difference varies in the range 0–2πChmyrev, V. I. / Skorikov, V. M. et al. | 1999
- 1043
-
Digital recording and analysis of optical-polarization images of a domain structureGrechishkin, R. M. / Malyshkina, O. V. / Soshin, S. S. et al. | 1999
- 1047
-
Measurement of small amplitudes of vibration with a laser vibrometerAtavin, V. G. / Khudyakov, Yu. V. / Yurchik, E. F. et al. | 1999
- 1051
-
The effect of matched pairs of thermometers on the error in determining thermal energy using a commercial metering unitTarbeev, Yu. V. / Novitskii, P. V. / Mishustin, V. I. / Lupei, A. G. et al. | 1999
- 1057
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The metrological characteristics of automated magnetic measuring systemsKrokhin, V. V. et al. | 1999
- 1062
-
Wavelet and fourier analysis of electric fluctuations in semiconductor and electrochemical systemsBudnikov, E. Yu. / Kuboev, I. Yu. / Maksimychev, A. V. / Miroshnikova, I. N. / Timashev, S. F. / Gulyaev, A. M. et al. | 1999
- 1068
-
Improving the accuracy of experimental prediction of the detectability of nonlinear objects by radarBelyaev, V. V. / Mayunov, A. T. / Razin'kov, S. N. et al. | 1999
- 1075
-
Modification of the comparison method for the moving-source calibration of hydrophones in a shallow seaAgranovskii, A. V. / Korol'kov, G. N. / Rozenberg, A. V. / Sborshchikov, V. A. et al. | 1999
- 1080
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Dependence of the probability of detecting a moving source of ionizing radiation on various parametersKirillov, V. M. / Korolenko, E. A. / Neklyudov, A. A. et al. | 1999
- 1084
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Basic characteristics of a new type of reference electrode for pH measurementsZdorikov, N. N. / Karpov, O. V. / Maksimov, I. I. / Sobol', V. V. / Shavykin, A. V. et al. | 1999
- 1090
-
New regulations concerning the issue and use of reference materialsSemenko, N. G. et al. | 1999
- 1094
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Support from regulations on the development of reference materials for the compositions of pure organic substancesDobrovinskii, I. E. / Piterskikh, I. A. et al. | 1999
- 1097
-
Chemical changes in powder reference materials examined by accelerated ageing methodsLisienko, D. G. / Ul'yanova, N. V. et al. | 1999
- 1102
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Approval procedure for using foreign reference materialsDobrovinskii, I. E. / Semenko, N. G. / Burykina, É. G. et al. | 1999
- 1105
-
Stages in improving the metrological support to ultrasonic thickness gaugesYunnikova, V. V. / Romanko, A. A. et al. | 1999